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GB0900534D0 - Thin-film radiation detector - Google Patents

Thin-film radiation detector

Info

Publication number
GB0900534D0
GB0900534D0 GBGB0900534.9A GB0900534A GB0900534D0 GB 0900534 D0 GB0900534 D0 GB 0900534D0 GB 0900534 A GB0900534 A GB 0900534A GB 0900534 D0 GB0900534 D0 GB 0900534D0
Authority
GB
United Kingdom
Prior art keywords
thin
radiation detector
film radiation
film
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB0900534.9A
Other versions
GB2466946A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STICHTING FUND OND MATERIAL
Universiteit Leiden
Stichting voor Fundamenteel Onderzoek der Materie
Original Assignee
STICHTING FUND OND MATERIAL
Universiteit Leiden
Stichting voor Fundamenteel Onderzoek der Materie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STICHTING FUND OND MATERIAL, Universiteit Leiden, Stichting voor Fundamenteel Onderzoek der Materie filed Critical STICHTING FUND OND MATERIAL
Priority to GB0900534A priority Critical patent/GB2466946A/en
Publication of GB0900534D0 publication Critical patent/GB0900534D0/en
Priority to PCT/EP2009/009134 priority patent/WO2010081522A1/en
Publication of GB2466946A publication Critical patent/GB2466946A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0477—Prisms, wedges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • H01L39/10—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/80—Constructional details
    • H10N60/84—Switching means for devices switchable between superconducting and normal states

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Polarising Elements (AREA)
GB0900534A 2009-01-14 2009-01-14 Thin-film radiation detector Withdrawn GB2466946A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB0900534A GB2466946A (en) 2009-01-14 2009-01-14 Thin-film radiation detector
PCT/EP2009/009134 WO2010081522A1 (en) 2009-01-14 2009-12-18 Thin-film radiation detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0900534A GB2466946A (en) 2009-01-14 2009-01-14 Thin-film radiation detector

Publications (2)

Publication Number Publication Date
GB0900534D0 true GB0900534D0 (en) 2009-02-11
GB2466946A GB2466946A (en) 2010-07-21

Family

ID=40379525

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0900534A Withdrawn GB2466946A (en) 2009-01-14 2009-01-14 Thin-film radiation detector

Country Status (2)

Country Link
GB (1) GB2466946A (en)
WO (1) WO2010081522A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111129279A (en) * 2019-12-23 2020-05-08 中国科学院紫金山天文台 Superconducting TES single-photon detector with integrated multilayer optical film and preparation method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103840035B (en) * 2014-03-20 2016-03-16 中国科学院上海微系统与信息技术研究所 Reduce method and the device of the extrinsic dark counting of nanowire single photon detector part
CN104064631B (en) * 2014-07-15 2016-08-31 中国科学院上海微系统与信息技术研究所 Reduce method and the device of the extrinsic dark counting of superconducting nano-wire single-photon detectors
CN108169183B (en) * 2017-12-11 2021-02-02 中国科学院上海光学精密机械研究所 Metal film measuring device and method based on surface plasma resonance

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3436159A (en) * 1966-02-04 1969-04-01 Bausch & Lomb Internal reflection element for spectroscopy with film optical cavity to enhance absorption
US6812464B1 (en) 2000-07-28 2004-11-02 Credence Systems Corporation Superconducting single photon detector
FR2891400B1 (en) 2005-09-28 2007-10-26 Commissariat Energie Atomique ULTRASENSITIVE OPTICAL DETECTOR WITH HIGH TIME RESOLUTION USING A LEAKAGE MODE OF A PLANAR WAVEGUIDE AND METHODS OF MAKING SAME

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111129279A (en) * 2019-12-23 2020-05-08 中国科学院紫金山天文台 Superconducting TES single-photon detector with integrated multilayer optical film and preparation method
CN111129279B (en) * 2019-12-23 2023-07-18 中国科学院紫金山天文台 Superconducting TES single-photon detector integrated with multilayer optical film and preparation method

Also Published As

Publication number Publication date
WO2010081522A1 (en) 2010-07-22
GB2466946A (en) 2010-07-21

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)