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GB0805833D0 - Swap parition - Google Patents

Swap parition

Info

Publication number
GB0805833D0
GB0805833D0 GBGB0805833.1A GB0805833A GB0805833D0 GB 0805833 D0 GB0805833 D0 GB 0805833D0 GB 0805833 A GB0805833 A GB 0805833A GB 0805833 D0 GB0805833 D0 GB 0805833D0
Authority
GB
United Kingdom
Prior art keywords
parition
swap
swap parition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0805833.1A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Symbian Software Ltd
Original Assignee
Symbian Software Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Symbian Software Ltd filed Critical Symbian Software Ltd
Priority to GBGB0805833.1A priority Critical patent/GB0805833D0/en
Publication of GB0805833D0 publication Critical patent/GB0805833D0/en
Priority to GB0809929A priority patent/GB2458711A/en
Priority to PCT/GB2009/000798 priority patent/WO2009118527A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/816—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
    • G11C29/82—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for EEPROMs
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1883—Methods for assignment of alternate areas for defective areas
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • G11C29/765—Masking faults in memories by using spares or by reconfiguring using address translation or modifications in solid state disks
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B2220/00—Record carriers by type
    • G11B2220/20—Disc-shaped record carriers

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
GBGB0805833.1A 2008-03-26 2008-03-26 Swap parition Ceased GB0805833D0 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GBGB0805833.1A GB0805833D0 (en) 2008-03-26 2008-03-26 Swap parition
GB0809929A GB2458711A (en) 2008-03-26 2008-05-30 Replacing bad blocks in a main partition of memory with blocks from a secondary partition which can be used as a swap partition
PCT/GB2009/000798 WO2009118527A1 (en) 2008-03-26 2009-03-25 Swap partition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0805833.1A GB0805833D0 (en) 2008-03-26 2008-03-26 Swap parition

Publications (1)

Publication Number Publication Date
GB0805833D0 true GB0805833D0 (en) 2008-04-30

Family

ID=39387062

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0805833.1A Ceased GB0805833D0 (en) 2008-03-26 2008-03-26 Swap parition
GB0809929A Withdrawn GB2458711A (en) 2008-03-26 2008-05-30 Replacing bad blocks in a main partition of memory with blocks from a secondary partition which can be used as a swap partition

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB0809929A Withdrawn GB2458711A (en) 2008-03-26 2008-05-30 Replacing bad blocks in a main partition of memory with blocks from a secondary partition which can be used as a swap partition

Country Status (2)

Country Link
GB (2) GB0805833D0 (en)
WO (1) WO2009118527A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102100458B1 (en) * 2013-04-19 2020-04-13 삼성전자주식회사 Method for managing memory and an electronic device thereof

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58169662A (en) * 1982-03-31 1983-10-06 Fujitsu Ltd System operating system
AU746651B2 (en) * 1994-03-22 2002-05-02 Hyperchip Inc. Efficient direct cell replacement fault tolerant architecture supporting completely integrated systems with means for direct communication with system operator
JPH117505A (en) * 1997-06-17 1999-01-12 Fujitsu Ltd Card type storage media
KR100667729B1 (en) * 1998-11-10 2007-01-11 삼성전자주식회사 Free space for defect management and the disk with management information, allocation method of free space and defect management method
US6260156B1 (en) * 1998-12-04 2001-07-10 Datalight, Inc. Method and system for managing bad areas in flash memory
MY118342A (en) * 1999-02-01 2004-10-30 Matsushita Electric Ind Co Ltd Information recording medium, information recording method and information recording/reproducing system
TW448437B (en) * 1999-08-09 2001-08-01 Ind Tech Res Inst Dynamic defect management method for erasable compact disk
KR100622349B1 (en) * 2004-08-04 2006-09-14 삼성전자주식회사 A method for managing a defective block in a flash memory device and a flash memory device having a defective block management function.
US7366825B2 (en) * 2005-04-26 2008-04-29 Microsoft Corporation NAND flash memory management

Also Published As

Publication number Publication date
WO2009118527A1 (en) 2009-10-01
GB0809929D0 (en) 2008-07-09
GB2458711A (en) 2009-09-30

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)