[go: up one dir, main page]

FR3138701B1 - Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage - Google Patents

Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage Download PDF

Info

Publication number
FR3138701B1
FR3138701B1 FR2208165A FR2208165A FR3138701B1 FR 3138701 B1 FR3138701 B1 FR 3138701B1 FR 2208165 A FR2208165 A FR 2208165A FR 2208165 A FR2208165 A FR 2208165A FR 3138701 B1 FR3138701 B1 FR 3138701B1
Authority
FR
France
Prior art keywords
response
waiting time
component
stabilized
learning algorithm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR2208165A
Other languages
English (en)
Other versions
FR3138701A1 (fr
Inventor
Philippe Lejeune
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bealach Na Bo Finne Teoranta
Original Assignee
Bealach Na Bo Finne Teoranta
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bealach Na Bo Finne Teoranta filed Critical Bealach Na Bo Finne Teoranta
Priority to FR2208165A priority Critical patent/FR3138701B1/fr
Priority to PCT/EP2023/071377 priority patent/WO2024033176A1/fr
Publication of FR3138701A1 publication Critical patent/FR3138701A1/fr
Application granted granted Critical
Publication of FR3138701B1 publication Critical patent/FR3138701B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

L’invention concerne un procédé de test de composants électroniques comportant les étapes suivantes : excitation (4) d’un composant,mesure (6), après un temps d’attente réduit (5), d’une réponse anticipée de ce composant,estimation (7) d’une réponse stabilisée, correspondant à une réponse qui aurait été mesurée après un temps d’attente nominal, à partir de la réponse anticipée,vérification (8) d’une condition d’acceptation, pour la valeur de réponse stabilisée estimée, permettant d’évaluer la qualité du composant, l’estimation (7) est réalisée par un algorithme d’apprentissage, préalablement entraîné selon les étapes suivantes : mesure (34) de plusieurs valeurs de réponse de chaque composant d’un ensemble de composant de référence, pour chaque temps d’attente, lors d’une diminution progressive dudit temps d’attente,à partir des mesures obtenues :détermination (36) du temps d’attente réduit,entraînement (37) de l’algorithme d’apprentissage à estimer une valeur de réponse stabilisée. Figure pour l’abrégé : Figure 1
FR2208165A 2022-08-08 2022-08-08 Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage Active FR3138701B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR2208165A FR3138701B1 (fr) 2022-08-08 2022-08-08 Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage
PCT/EP2023/071377 WO2024033176A1 (fr) 2022-08-08 2023-08-02 Procédé de test de composants électroniques optimisé par un algorithme d'apprentissage

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2208165A FR3138701B1 (fr) 2022-08-08 2022-08-08 Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage
FR2208165 2022-08-08

Publications (2)

Publication Number Publication Date
FR3138701A1 FR3138701A1 (fr) 2024-02-09
FR3138701B1 true FR3138701B1 (fr) 2024-07-19

Family

ID=84569133

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2208165A Active FR3138701B1 (fr) 2022-08-08 2022-08-08 Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage

Country Status (2)

Country Link
FR (1) FR3138701B1 (fr)
WO (1) WO2024033176A1 (fr)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2749396B1 (fr) * 1996-05-29 1998-08-07 Softlink Outil d'aide pour appareil de test de composants electroniques
FR2812401B1 (fr) * 2000-07-28 2002-10-11 Bealach Bo No Finne Teo Ta Gal Procede de test de composants electroniques tenant compte de la derive de la moyenne
US20110178967A1 (en) * 2001-05-24 2011-07-21 Test Advantage, Inc. Methods and apparatus for data analysis
US7908109B2 (en) * 2008-07-08 2011-03-15 Advanced Micro Devices, Inc. Identifying manufacturing disturbances using preliminary electrical test data

Also Published As

Publication number Publication date
WO2024033176A1 (fr) 2024-02-15
FR3138701A1 (fr) 2024-02-09

Similar Documents

Publication Publication Date Title
Glass Analysis of data on the Connecticut speeding crackdown as a time-series quasi-experiment
FR3138701B1 (fr) Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage
KR850002317A (ko) 고무의 경화 및 시험방법
RU2730541C1 (ru) Способ прогнозирования интенсивности отказов трубопровода
JPH07159289A (ja) 異常現象の原因診断方法
Mayrbaurl Wire test results for three suspension bridge cables
MX2024010435A (es) Determinacion de las caracteristicas estructurales de un objeto.
Barrans Jr et al. An improved method for determining bimolecular association constants from NMR titration experiments
JP6346991B2 (ja) Ｎｍｒ測定の結果に信号として含まれる情報を抽出するための方法
CN116761989A (zh) 用于表征试验台的方法以及用于检验和制造部件的相关方法
JP3554445B2 (ja) 異音判定装置
RU2761126C1 (ru) Способ автоматизированного контроля остаточного ресурса транспортного средства в процессе его эксплуатации и устройство для его осуществления
CN116559210B (zh) 一种矿产品物相检测方法及系统
CN115497198B (zh) 一种营运车辆燃料消耗量的不确定度评估方法
CN117095068B (zh) 番茄贮藏温度调控方法、装置、电子设备及存储介质
Manhertz et al. Managing measured vibration data for malfunction detection of an assembled mechanical coupling
RU2823652C1 (ru) Способ определения дефектности объекта
RU2721217C1 (ru) Способ поиска неисправного блока в непрерывной динамической системе на основе смены позиции входного сигнала и анализа знаков передач
Coşar et al. Minimization Of The Noise In The Calculated Pressure Derivative Data For The Interpretation Of Transient Tests
SU1037126A1 (ru) Способ оценки усталостной прочности материала
Méjane et al. A data processing method for noise measurements of snowmobiles and their sub-systems on test bench
Henderson¹ Pumping Viscosity by Mini-Rotary Viscometer: Critical Aspects
SU166915A1 (ru) Способ определения сопротивления деформации
SU197004A1 (ru) Способ измерения быстро меняющегося напряжения
FR3135787B1 (fr) Procédé de formation d’une image d’un corps au moyen d’un dispositif irm

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 2

PLSC Publication of the preliminary search report

Effective date: 20240209

PLFP Fee payment

Year of fee payment: 3