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FR3104745B1 - Filtre optique adapté pour corriger le bruit électronique d'un capteur - Google Patents

Filtre optique adapté pour corriger le bruit électronique d'un capteur Download PDF

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Publication number
FR3104745B1
FR3104745B1 FR1914198A FR1914198A FR3104745B1 FR 3104745 B1 FR3104745 B1 FR 3104745B1 FR 1914198 A FR1914198 A FR 1914198A FR 1914198 A FR1914198 A FR 1914198A FR 3104745 B1 FR3104745 B1 FR 3104745B1
Authority
FR
France
Prior art keywords
optical filter
sensor
correcting
electronic noise
filter suitable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1914198A
Other languages
English (en)
Other versions
FR3104745A1 (fr
Inventor
Benjamin Bouthinon
Pierre Muller
Noémie Ballot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Isorg SA
Original Assignee
Isorg SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Isorg SA filed Critical Isorg SA
Priority to FR1914198A priority Critical patent/FR3104745B1/fr
Priority to PCT/EP2020/085380 priority patent/WO2021116231A1/fr
Priority to US17/783,782 priority patent/US20230009844A1/en
Priority to JP2022535771A priority patent/JP2023505887A/ja
Priority to EP20817443.3A priority patent/EP4073427A1/fr
Priority to CN202022982773.8U priority patent/CN214586079U/zh
Publication of FR3104745A1 publication Critical patent/FR3104745A1/fr
Application granted granted Critical
Publication of FR3104745B1 publication Critical patent/FR3104745B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/806—Optical elements or arrangements associated with the image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/182—Colour image sensors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/208—Filters for use with infrared or ultraviolet radiation, e.g. for separating visible light from infrared and/or ultraviolet radiation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/12—Fingerprints or palmprints
    • G06V40/13—Sensors therefor
    • G06V40/1318—Sensors therefor using electro-optical elements or layers, e.g. electroluminescent sensing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/024—Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/806—Optical elements or arrangements associated with the image sensors
    • H10F39/8063—Microlenses

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Optics & Photonics (AREA)
  • Human Computer Interaction (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Abstract

Filtre optique adapté pour corriger le bruit électronique d'un capteur La présente description concerne un filtre optique (17) pour capteur d'images comprenant des premières zones (263), opaques, occupant chacune une surface égale à la surface d'au moins une première lentille (253) comprise dans cette même première zone (263). Figure pour l'abrégé : Fig. 7
FR1914198A 2019-12-11 2019-12-11 Filtre optique adapté pour corriger le bruit électronique d'un capteur Active FR3104745B1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FR1914198A FR3104745B1 (fr) 2019-12-11 2019-12-11 Filtre optique adapté pour corriger le bruit électronique d'un capteur
PCT/EP2020/085380 WO2021116231A1 (fr) 2019-12-11 2020-12-09 Filtre optique adapté pour corriger le bruit électronique d'un capteur
US17/783,782 US20230009844A1 (en) 2019-12-11 2020-12-09 Optical filter suitable for correcting the electronic noise of a sensor
JP2022535771A JP2023505887A (ja) 2019-12-11 2020-12-09 センサの電子ノイズの補正に適した光学フィルタ
EP20817443.3A EP4073427A1 (fr) 2019-12-11 2020-12-09 Filtre optique adapté pour corriger le bruit électronique d'un capteur
CN202022982773.8U CN214586079U (zh) 2019-12-11 2020-12-11 用于图像传感器的光学滤波器、系统和指纹传感器

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1914198A FR3104745B1 (fr) 2019-12-11 2019-12-11 Filtre optique adapté pour corriger le bruit électronique d'un capteur
FR1914198 2019-12-11

Publications (2)

Publication Number Publication Date
FR3104745A1 FR3104745A1 (fr) 2021-06-18
FR3104745B1 true FR3104745B1 (fr) 2023-04-28

Family

ID=69903411

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1914198A Active FR3104745B1 (fr) 2019-12-11 2019-12-11 Filtre optique adapté pour corriger le bruit électronique d'un capteur

Country Status (6)

Country Link
US (1) US20230009844A1 (fr)
EP (1) EP4073427A1 (fr)
JP (1) JP2023505887A (fr)
CN (1) CN214586079U (fr)
FR (1) FR3104745B1 (fr)
WO (1) WO2021116231A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3125920B1 (fr) * 2021-07-27 2023-11-24 St Microelectronics Grenoble 2 Capteur optique

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7452743B2 (en) * 2005-09-01 2008-11-18 Aptina Imaging Corporation Microelectronic imaging units and methods of manufacturing microelectronic imaging units at the wafer level
WO2014143234A1 (fr) * 2013-03-14 2014-09-18 Integrated Plasmonics Corporation Filtre spatial auto-aligné
JP2016001682A (ja) * 2014-06-12 2016-01-07 ソニー株式会社 固体撮像装置およびその製造方法、並びに電子機器
JP6687014B2 (ja) * 2015-03-04 2020-04-22 日本精機株式会社 レンズアレイ及び映像投影装置
JP6601098B2 (ja) * 2015-09-29 2019-11-06 株式会社Ｊｖｃケンウッド 光源装置及び画像投射装置
NL2019924A (en) * 2016-12-14 2018-06-18 Asml Netherlands Bv An optical device and associated systems
DE102017203180B4 (de) * 2017-02-27 2022-11-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zum Herstellen eines optischen Mikrolinsenarrays und Mikrolinsenarray
US10165211B1 (en) * 2017-08-22 2018-12-25 Semiconductor Components Industries, Llc Image sensors with optically black pixels
KR102534002B1 (ko) * 2018-02-14 2023-05-19 삼성전자주식회사 복수 개의 수신부들을 이용하여 생체 정보를 감지하는 센서를 포함하는 전자 장치 및 제어 방법

Also Published As

Publication number Publication date
JP2023505887A (ja) 2023-02-13
FR3104745A1 (fr) 2021-06-18
US20230009844A1 (en) 2023-01-12
WO2021116231A1 (fr) 2021-06-17
CN214586079U (zh) 2021-11-02
EP4073427A1 (fr) 2022-10-19

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