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FR2953927B1 - Dispositif et procede de fabrication d'echantillon a partir d'un liquide - Google Patents

Dispositif et procede de fabrication d'echantillon a partir d'un liquide

Info

Publication number
FR2953927B1
FR2953927B1 FR0958928A FR0958928A FR2953927B1 FR 2953927 B1 FR2953927 B1 FR 2953927B1 FR 0958928 A FR0958928 A FR 0958928A FR 0958928 A FR0958928 A FR 0958928A FR 2953927 B1 FR2953927 B1 FR 2953927B1
Authority
FR
France
Prior art keywords
liquid
manufacturing sample
sample
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0958928A
Other languages
English (en)
Other versions
FR2953927A1 (fr
Inventor
Frederic Chartier
Michel Tabarant
Olga Victorova-Leclerc
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR0958928A priority Critical patent/FR2953927B1/fr
Priority to PCT/EP2010/069661 priority patent/WO2011073206A1/fr
Priority to EP10787812A priority patent/EP2513625A1/fr
Publication of FR2953927A1 publication Critical patent/FR2953927A1/fr
Application granted granted Critical
Publication of FR2953927B1 publication Critical patent/FR2953927B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/12—Ion sources; Ion guns using an arc discharge, e.g. of the duoplasmatron type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/714—Sample nebulisers for flame burners or plasma burners

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR0958928A 2009-12-14 2009-12-14 Dispositif et procede de fabrication d'echantillon a partir d'un liquide Expired - Fee Related FR2953927B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR0958928A FR2953927B1 (fr) 2009-12-14 2009-12-14 Dispositif et procede de fabrication d'echantillon a partir d'un liquide
PCT/EP2010/069661 WO2011073206A1 (fr) 2009-12-14 2010-12-14 Dispositif et procede de fabrication d'echantillon a partir d'un liquide
EP10787812A EP2513625A1 (fr) 2009-12-14 2010-12-14 Dispositif et procede de fabrication d'echantillon a partir d'un liquide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0958928A FR2953927B1 (fr) 2009-12-14 2009-12-14 Dispositif et procede de fabrication d'echantillon a partir d'un liquide

Publications (2)

Publication Number Publication Date
FR2953927A1 FR2953927A1 (fr) 2011-06-17
FR2953927B1 true FR2953927B1 (fr) 2012-02-03

Family

ID=42313876

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0958928A Expired - Fee Related FR2953927B1 (fr) 2009-12-14 2009-12-14 Dispositif et procede de fabrication d'echantillon a partir d'un liquide

Country Status (3)

Country Link
EP (1) EP2513625A1 (fr)
FR (1) FR2953927B1 (fr)
WO (1) WO2011073206A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104964965A (zh) * 2015-05-28 2015-10-07 国家地质实验测试中心 一种便携式液体阴极辉光放电元素测定仪
CA3033530C (fr) * 2016-09-08 2023-03-07 Agnes OBUCHOWSKA Appareil d'analyse de la composition elementaire d'un echantillon liquide et ses procedes d'utilisation

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8614177D0 (en) * 1986-06-11 1986-07-16 Vg Instr Group Glow discharge mass spectrometer
GB8616940D0 (en) * 1986-07-11 1986-08-20 Vg Instr Group Discharge ionization mass spectrometer
JP2598566B2 (ja) * 1990-10-26 1997-04-09 株式会社日立製作所 質量分析計
US5223131A (en) 1991-10-08 1993-06-29 Hewlett-Packard Company Apparatus for interfacing liquid chromatography-mass spectrometry systems
US5663560A (en) * 1993-09-20 1997-09-02 Hitachi, Ltd. Method and apparatus for mass analysis of solution sample
US5917184A (en) * 1996-02-08 1999-06-29 Perseptive Biosystems Interface between liquid flow and mass spectrometer
US5896196A (en) * 1997-08-15 1999-04-20 Lockheed Martin Energy Research Corporation Plasma mixing glow discharge device for analytical applications
WO2000055600A2 (fr) * 1999-02-25 2000-09-21 Clemson University Echantillonnage et analyse de matiere particulaire portee par l'air a l'aide d'une emission atomique a decharge incandescente et de spectrometries de masse
ATE386335T1 (de) * 1999-10-29 2008-03-15 Mds Inc Through Its Mds Sciex Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie- massenspekrometrie
JP2002334663A (ja) * 2001-03-09 2002-11-22 Vacuum Products Kk 荷電粒子発生装置及びその発生方法
WO2002101788A1 (fr) * 2001-06-08 2002-12-19 Japan Science And Technology Corporation Dispositif de spectrometrie de masse de liquide refroidisseur
US20030062474A1 (en) * 2001-10-03 2003-04-03 Baranov Vladimir I. Electrospray ion source for mass spectrometry with atmospheric pressure desolvating capabilities
JP5718223B2 (ja) * 2008-05-30 2015-05-13 パーキンエルマー ヘルス サイエンス インコーポレイテッドＰｅｒｋｉｎｅｌｍｅｒ Ｈｅａｌｔｈ Ｓｃｉｅｎｃｅｓ Ｉｎｃ． 大気圧化学イオン化に使用する単純操作モードと多重操作モードのイオン源

Also Published As

Publication number Publication date
WO2011073206A1 (fr) 2011-06-23
EP2513625A1 (fr) 2012-10-24
FR2953927A1 (fr) 2011-06-17

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