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FR2926636B1 - Instrument et procede de caracterisation d'un systeme optique - Google Patents

Instrument et procede de caracterisation d'un systeme optique

Info

Publication number
FR2926636B1
FR2926636B1 FR0850336A FR0850336A FR2926636B1 FR 2926636 B1 FR2926636 B1 FR 2926636B1 FR 0850336 A FR0850336 A FR 0850336A FR 0850336 A FR0850336 A FR 0850336A FR 2926636 B1 FR2926636 B1 FR 2926636B1
Authority
FR
France
Prior art keywords
characterizing
instrument
optical system
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0850336A
Other languages
English (en)
Other versions
FR2926636A1 (fr
Inventor
Xavier Levecq
Guillaume Dovillaire
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Imagine Optic SA
Original Assignee
Imagine Optic SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imagine Optic SA filed Critical Imagine Optic SA
Priority to FR0850336A priority Critical patent/FR2926636B1/fr
Priority to JP2010542669A priority patent/JP5390534B2/ja
Priority to PCT/FR2009/050064 priority patent/WO2009092975A2/fr
Priority to DE112009000132.7T priority patent/DE112009000132B4/de
Priority to US12/863,058 priority patent/US8593623B2/en
Publication of FR2926636A1 publication Critical patent/FR2926636A1/fr
Application granted granted Critical
Publication of FR2926636B1 publication Critical patent/FR2926636B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FR0850336A 2008-01-18 2008-01-18 Instrument et procede de caracterisation d'un systeme optique Expired - Fee Related FR2926636B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR0850336A FR2926636B1 (fr) 2008-01-18 2008-01-18 Instrument et procede de caracterisation d'un systeme optique
JP2010542669A JP5390534B2 (ja) 2008-01-18 2009-01-16 光学系を特性評価するための機器及び方法
PCT/FR2009/050064 WO2009092975A2 (fr) 2008-01-18 2009-01-16 Instrument et procede de caracterisation d'un systeme optique
DE112009000132.7T DE112009000132B4 (de) 2008-01-18 2009-01-16 Instrument und Verfahren zur Charakterisierung eines optischen Systems
US12/863,058 US8593623B2 (en) 2008-01-18 2009-01-16 Instrument and method for characterising an optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0850336A FR2926636B1 (fr) 2008-01-18 2008-01-18 Instrument et procede de caracterisation d'un systeme optique

Publications (2)

Publication Number Publication Date
FR2926636A1 FR2926636A1 (fr) 2009-07-24
FR2926636B1 true FR2926636B1 (fr) 2010-09-17

Family

ID=39714172

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0850336A Expired - Fee Related FR2926636B1 (fr) 2008-01-18 2008-01-18 Instrument et procede de caracterisation d'un systeme optique

Country Status (5)

Country Link
US (1) US8593623B2 (fr)
JP (1) JP5390534B2 (fr)
DE (1) DE112009000132B4 (fr)
FR (1) FR2926636B1 (fr)
WO (1) WO2009092975A2 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011119806B4 (de) * 2011-11-25 2020-10-15 Carl Zeiss Vision International Gmbh Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
DE102013008645B3 (de) * 2013-05-21 2014-08-21 Alsitec S.A.R.L. Bearbeitungskopf für eine Laserbearbeitungsvorrichtung, Laserbearbeitungsvorrichtung sowie Verfahren zum Messen von Veränderungen der Brennweite einer in einem Bearbeitungskopf enthaltenen Fokussieroptik
FR3017964B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour reperer au moins un point caracteristique d'une lentille ophtalmique
FR3017963B1 (fr) * 2014-02-27 2016-03-25 Essilor Int Instrument optique pour identifier et localiser des microgravures presentes sur une lentille ophtalmique
JP7298360B2 (ja) 2019-07-23 2023-06-27 凸版印刷株式会社 包装容器
CN113916507B (zh) * 2021-10-11 2024-03-08 北京环境特性研究所 小空间高集成度红外共孔径光学系统测试装置及方法
DE102023200924A1 (de) * 2023-02-06 2024-02-22 Carl Zeiss Smt Gmbh Messvorrichtung zur interferometrischen Bestimmung einer Oberflächenform

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1403911A (en) * 1972-07-26 1975-08-28 Sira Institute Method and apparatus for testing optical components
JP3040140B2 (ja) * 1990-07-12 2000-05-08 株式会社リコー 色収差測定方法及び測定装置
US6148097A (en) * 1995-06-07 2000-11-14 Asahi Kogaku Kogyo Kabushiki Kaisha Optical member inspecting apparatus and method of inspection thereof
US5847822A (en) * 1995-08-29 1998-12-08 Asahi Kogaku Kogyo Kabushiki Kaisha Optical element inspecting apparatus
JP3613906B2 (ja) * 1996-09-20 2005-01-26 株式会社ニコン 波面収差測定装置
JP3823266B2 (ja) * 1997-05-13 2006-09-20 株式会社トプコン 光学特性測定装置
IL136239A0 (en) * 1997-11-21 2001-05-20 Autonomous Technologies Corp Objective measurement and correction of optical systems using wavefront analysis
CN1168971C (zh) * 1998-04-22 2004-09-29 株式会社理光 双折射测定方法及其装置
US6687396B1 (en) * 1998-07-29 2004-02-03 Pentax Corporation Optical member inspection apparatus, image-processing apparatus, image-processing method, and computer readable medium
TW550377B (en) * 2000-02-23 2003-09-01 Zeiss Stiftung Apparatus for wave-front detection
JP3730831B2 (ja) * 2000-03-31 2006-01-05 パイオニア株式会社 収差測定装置及び調整装置
US6382795B1 (en) * 2000-05-20 2002-05-07 Carl Zeiss, Inc. Method and apparatus for measuring refractive errors of an eye
US6827442B2 (en) * 2001-09-12 2004-12-07 Denwood F. Ross Ophthalmic wavefront measuring devices
US6575572B2 (en) * 2001-09-21 2003-06-10 Carl Zeiss Ophthalmic Systems, Inc. Method and apparatus for measuring optical aberrations of an eye
WO2003102519A1 (fr) * 2002-05-31 2003-12-11 Wavefront Sciences, Inc. Procede et systeme de detection et d'analyse du front d'onde d'un systeme de transmission optique
JP4343559B2 (ja) * 2003-03-07 2009-10-14 キヤノン株式会社 収差測定装置
JP4245967B2 (ja) * 2003-04-23 2009-04-02 オリンパス株式会社 レンズ軸上軸外点像観察装置および方法
DE10333426B4 (de) 2003-07-17 2006-02-09 Carl Zeiss Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
JP4229782B2 (ja) * 2003-09-05 2009-02-25 オリンパス株式会社 波面収差測定装置
US20050105044A1 (en) * 2003-11-14 2005-05-19 Laurence Warden Lensometers and wavefront sensors and methods of measuring aberration
JP2007069283A (ja) * 2005-09-05 2007-03-22 Nikon Corp 加工装置および加工装置を用いた製造方法

Also Published As

Publication number Publication date
WO2009092975A3 (fr) 2009-09-17
FR2926636A1 (fr) 2009-07-24
JP5390534B2 (ja) 2014-01-15
WO2009092975A2 (fr) 2009-07-30
JP2011510286A (ja) 2011-03-31
DE112009000132B4 (de) 2019-04-11
US20110134417A1 (en) 2011-06-09
DE112009000132T5 (de) 2010-12-09
US8593623B2 (en) 2013-11-26

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