FR2782385B1 - Determination de la tache de mesure dans l'analyse par fluorescence x - Google Patents
Determination de la tache de mesure dans l'analyse par fluorescence xInfo
- Publication number
- FR2782385B1 FR2782385B1 FR9910162A FR9910162A FR2782385B1 FR 2782385 B1 FR2782385 B1 FR 2782385B1 FR 9910162 A FR9910162 A FR 9910162A FR 9910162 A FR9910162 A FR 9910162A FR 2782385 B1 FR2782385 B1 FR 2782385B1
- Authority
- FR
- France
- Prior art keywords
- determining
- fluorescence analysis
- measurement task
- task
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012921 fluorescence analysis Methods 0.000 title 1
- 238000005259 measurement Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19836884A DE19836884C1 (de) | 1998-08-14 | 1998-08-14 | Bestimmung des Meßflecks bei der Röntgenfluoreszenzanalyse |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2782385A1 FR2782385A1 (fr) | 2000-02-18 |
FR2782385B1 true FR2782385B1 (fr) | 2004-11-05 |
Family
ID=7877533
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9910162A Expired - Fee Related FR2782385B1 (fr) | 1998-08-14 | 1999-08-03 | Determination de la tache de mesure dans l'analyse par fluorescence x |
Country Status (5)
Country | Link |
---|---|
US (1) | US6364528B1 (fr) |
JP (1) | JP2000065767A (fr) |
DE (1) | DE19836884C1 (fr) |
FR (1) | FR2782385B1 (fr) |
GB (1) | GB9917798D0 (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7180981B2 (en) * | 2002-04-08 | 2007-02-20 | Nanodynamics-88, Inc. | High quantum energy efficiency X-ray tube and targets |
DE10320361B3 (de) * | 2003-05-07 | 2004-12-16 | Siemens Ag | Vorrichtung mit einem in einem Fluid eingetauchten Drehkörper, insbesondere Röntgenstrahler |
US7916834B2 (en) * | 2007-02-12 | 2011-03-29 | Thermo Niton Analyzers Llc | Small spot X-ray fluorescence (XRF) analyzer |
US8610019B2 (en) * | 2009-02-27 | 2013-12-17 | Mineral Separation Technologies Inc. | Methods for sorting materials |
CN103962317B (zh) * | 2010-02-25 | 2016-05-25 | 矿物分离技术股份有限公司 | 材料分选方法 |
US9114433B2 (en) | 2012-01-17 | 2015-08-25 | Mineral Separation Technologies, Inc. | Multi-fractional coal sorter and method of use thereof |
JP6185697B2 (ja) * | 2012-08-16 | 2017-08-23 | 株式会社堀場製作所 | X線分析装置 |
DE102014102684A1 (de) * | 2014-02-28 | 2015-09-03 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Verfahren zur Messung eines Messobjektes mittels Röntgenfluoreszenz |
DE102021116258A1 (de) | 2021-06-23 | 2022-12-29 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Messobjekt, Verfahren und Vorrichtung zum Betreiben einer Röntgenquelle |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6239707A (ja) * | 1985-08-15 | 1987-02-20 | Furukawa Electric Co Ltd:The | 複合金属材の幅検出方法 |
JPS6239706A (ja) * | 1985-08-15 | 1987-02-20 | Furukawa Electric Co Ltd:The | 複合金属条の幅検出方法 |
US4803644A (en) * | 1985-09-20 | 1989-02-07 | Hughes Aircraft Company | Alignment mark detector for electron beam lithography |
JPH01307629A (ja) * | 1988-06-07 | 1989-12-12 | Toshiba Corp | ビーム位置決め装置 |
JP3377109B2 (ja) * | 1993-04-19 | 2003-02-17 | セイコーインスツルメンツ株式会社 | X線ビーム幅測定方法 |
JP3278012B2 (ja) * | 1993-10-29 | 2002-04-30 | セイコーインスツルメンツ株式会社 | X線マッピング分析方法 |
-
1998
- 1998-08-14 DE DE19836884A patent/DE19836884C1/de not_active Expired - Fee Related
-
1999
- 1999-07-30 GB GBGB9917798.2A patent/GB9917798D0/en not_active Ceased
- 1999-08-03 FR FR9910162A patent/FR2782385B1/fr not_active Expired - Fee Related
- 1999-08-11 JP JP11227269A patent/JP2000065767A/ja active Pending
- 1999-08-13 US US09/374,331 patent/US6364528B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB9917798D0 (en) | 1999-09-29 |
US6364528B1 (en) | 2002-04-02 |
JP2000065767A (ja) | 2000-03-03 |
DE19836884C1 (de) | 2000-06-21 |
FR2782385A1 (fr) | 2000-02-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
CD | Change of name or company name | ||
ST | Notification of lapse |
Effective date: 20100430 |