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FR2573531B1 - Appareil pour realiser le controle automatique d'objets. - Google Patents

Appareil pour realiser le controle automatique d'objets.

Info

Publication number
FR2573531B1
FR2573531B1 FR8516108A FR8516108A FR2573531B1 FR 2573531 B1 FR2573531 B1 FR 2573531B1 FR 8516108 A FR8516108 A FR 8516108A FR 8516108 A FR8516108 A FR 8516108A FR 2573531 B1 FR2573531 B1 FR 2573531B1
Authority
FR
France
Prior art keywords
object control
performing automatic
automatic object
control
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8516108A
Other languages
English (en)
Other versions
FR2573531A1 (fr
Inventor
Hajime Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hajime Industries Ltd
Original Assignee
Hajime Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hajime Industries Ltd filed Critical Hajime Industries Ltd
Publication of FR2573531A1 publication Critical patent/FR2573531A1/fr
Application granted granted Critical
Publication of FR2573531B1 publication Critical patent/FR2573531B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
FR8516108A 1984-11-22 1985-10-30 Appareil pour realiser le controle automatique d'objets. Expired FR2573531B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59247743A JPH0616013B2 (ja) 1984-11-22 1984-11-22 自動検査装置

Publications (2)

Publication Number Publication Date
FR2573531A1 FR2573531A1 (fr) 1986-05-23
FR2573531B1 true FR2573531B1 (fr) 1987-07-17

Family

ID=17168006

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8516108A Expired FR2573531B1 (fr) 1984-11-22 1985-10-30 Appareil pour realiser le controle automatique d'objets.

Country Status (7)

Country Link
US (1) US4692800A (fr)
JP (1) JPH0616013B2 (fr)
AU (1) AU576398B2 (fr)
CA (1) CA1267219A (fr)
DE (1) DE3535400A1 (fr)
FR (1) FR2573531B1 (fr)
GB (1) GB2167553B (fr)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4649621A (en) * 1986-02-21 1987-03-17 Artos Engineering Company Wire processing apparatus having control means
US4771468A (en) * 1986-04-17 1988-09-13 International Business Machines Corporation System for automatic inspection of periodic patterns
US4787715A (en) * 1987-06-22 1988-11-29 Westinghouse Electric Corp. Fuel assembly grid inspection apparatus
US4865800A (en) * 1987-06-22 1989-09-12 Westinghouse Electric Corp. Fuel assembly grid inspection method
US4929893A (en) * 1987-10-06 1990-05-29 Canon Kabushiki Kaisha Wafer prober
DE3737869A1 (de) * 1987-11-09 1989-05-24 Wagner Hans Juergen Dipl Ing Verfahren und einrichtung zum optischen pruefen von gegenstaenden
US4991007A (en) * 1989-05-05 1991-02-05 Corley Ferrand D E Image evaluation of at least one characteristic of an object, and method of evaluation
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
IL107603A (en) † 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
DE19534716C2 (de) * 1995-09-19 1999-06-17 Autronic Bildverarbeitung Einrichtung zum Erfassen von Fehlstellen auf einer glatten Oberfläche
US6883711B2 (en) * 2001-08-17 2005-04-26 Borgwarner Inc. Missing link/part detector employing scanning engine
US11010841B2 (en) 2008-10-02 2021-05-18 Ecoatm, Llc Kiosk for recycling electronic devices
US7881965B2 (en) 2008-10-02 2011-02-01 ecoATM, Inc. Secondary market and vending system for devices
CN102246384B (zh) 2008-10-02 2015-09-23 埃科亚特姆公司 针对设备的二手市场和自动售货系统
US10401411B2 (en) 2014-09-29 2019-09-03 Ecoatm, Llc Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices
EP4446968A3 (fr) 2014-10-02 2024-12-25 ecoATM, LLC Kiosque activé sans fil pour recycler des dispositifs consommateurs
CA2964223C (fr) 2014-10-02 2020-04-14 ecoATM, Inc. Application pour l'evaluation de dispositif et d'autres procedes associes au recyclage de dispositif
US10445708B2 (en) 2014-10-03 2019-10-15 Ecoatm, Llc System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods
EP3213280B1 (fr) 2014-10-31 2021-08-18 ecoATM, LLC Systèmes et procédés pour recycler des dispositifs électroniques grand public
WO2016069742A1 (fr) 2014-10-31 2016-05-06 ecoATM, Inc. Procédés et systèmes pour faciliter des processus associés à des services d'assurance et/ou d'autres services pour dispositifs électroniques
US10860990B2 (en) 2014-11-06 2020-12-08 Ecoatm, Llc Methods and systems for evaluating and recycling electronic devices
WO2016094789A1 (fr) 2014-12-12 2016-06-16 ecoATM, Inc. Systèmes et procédés pour le recyclage de dispositifs électroniques grand public
US10127647B2 (en) 2016-04-15 2018-11-13 Ecoatm, Llc Methods and systems for detecting cracks in electronic devices
WO2017192496A1 (fr) * 2016-05-06 2017-11-09 ecoATM, Inc. Procédés et systèmes permettant de détecter des dommages dans des régions de bord de dispositifs électroniques mobiles
US9885672B2 (en) 2016-06-08 2018-02-06 ecoATM, Inc. Methods and systems for detecting screen covers on electronic devices
US10269110B2 (en) 2016-06-28 2019-04-23 Ecoatm, Llc Methods and systems for detecting cracks in illuminated electronic device screens
WO2020132128A1 (fr) 2018-12-19 2020-06-25 Ecoatm, Llc Systèmes et procédés de vente et/ou d'achat de téléphones mobiles et d'autres dispositifs électroniques
EP3924917A1 (fr) 2019-02-12 2021-12-22 ecoATM, LLC Support de connecteur pour kiosque de dispositif électronique
US11482067B2 (en) 2019-02-12 2022-10-25 Ecoatm, Llc Kiosk for evaluating and purchasing used electronic devices
EP3928254A1 (fr) 2019-02-18 2021-12-29 ecoATM, LLC Évaluation d'état physique de dispositifs électronique basée sur un réseau neuronal, et systèmes et procédés associés
US11922467B2 (en) 2020-08-17 2024-03-05 ecoATM, Inc. Evaluating an electronic device using optical character recognition
WO2022040668A1 (fr) 2020-08-17 2022-02-24 Ecoatm, Llc Évaluation d'un dispositif électronique à l'aide d'une reconnaissance optique de caractères

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3647961A (en) * 1970-04-09 1972-03-07 Western Electric Co T.v. -aided flaw detection using rotating image techniques
DE2256617C3 (de) * 1971-11-19 1978-08-31 Hitachi, Ltd., Tokio Einrichtung zur Analyse einer Vorlage
US4056716A (en) * 1976-06-30 1977-11-01 International Business Machines Corporation Defect inspection of objects such as electronic circuits
DE2803653C3 (de) * 1978-01-27 1986-05-28 Texas Instruments Deutschland Gmbh, 8050 Freising Ausrichtvorrichtung
US4247203A (en) * 1978-04-03 1981-01-27 Kla Instrument Corporation Automatic photomask inspection system and apparatus
JPS55125439A (en) * 1979-03-22 1980-09-27 Hajime Sangyo Kk Defect inspection device
US4345312A (en) * 1979-04-13 1982-08-17 Hitachi, Ltd. Method and device for inspecting the defect of a pattern represented on an article
US4437116A (en) * 1980-12-22 1984-03-13 Owens-Illinois, Inc. Method and apparatus for comparing data signals in a container inspection device
US4492476A (en) * 1981-02-20 1985-01-08 Kirin Beer Kabushiki Kaisha Defect detecting method and apparatus
DE3116802C2 (de) * 1981-04-28 1983-05-05 Krauser Kraftfahrzeugzubehör Vertriebs-GmbH, 8905 Mering Vierventil-Zylinderkopf für einen Viertaktmotor
EP0070017B1 (fr) * 1981-07-14 1986-10-29 Hitachi, Ltd. Système de reconnaissance de dessins
JPS5821146A (ja) * 1981-07-30 1983-02-07 Kirin Brewery Co Ltd 欠陥検査方法および装置
JPS5863838A (ja) * 1981-10-14 1983-04-15 Fuji Electric Co Ltd 欠陥検出回路
US4532650A (en) * 1983-05-12 1985-07-30 Kla Instruments Corporation Photomask inspection apparatus and method using corner comparator defect detection algorithm
JPH0236896B2 (ja) * 1983-10-31 1990-08-21 Matsushita Electric Works Ltd Jikutaishobutsutainoketsukankensasochi

Also Published As

Publication number Publication date
GB2167553A (en) 1986-05-29
FR2573531A1 (fr) 1986-05-23
JPS61126454A (ja) 1986-06-13
JPH0616013B2 (ja) 1994-03-02
AU576398B2 (en) 1988-08-25
AU4921885A (en) 1986-05-29
US4692800A (en) 1987-09-08
DE3535400A1 (de) 1986-05-22
CA1267219A (fr) 1990-03-27
GB2167553B (en) 1989-04-12
GB8524540D0 (en) 1985-11-06

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Legal Events

Date Code Title Description
ST Notification of lapse