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FR2565737B3 - Element de contact pour adaptateur de controle pour effectuer des controles electriques de pieces a controler notamment de circuits imprimes - Google Patents

Element de contact pour adaptateur de controle pour effectuer des controles electriques de pieces a controler notamment de circuits imprimes

Info

Publication number
FR2565737B3
FR2565737B3 FR8508245A FR8508245A FR2565737B3 FR 2565737 B3 FR2565737 B3 FR 2565737B3 FR 8508245 A FR8508245 A FR 8508245A FR 8508245 A FR8508245 A FR 8508245A FR 2565737 B3 FR2565737 B3 FR 2565737B3
Authority
FR
France
Prior art keywords
workpieces
contact element
printed circuits
test adapter
performing electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8508245A
Other languages
English (en)
Other versions
FR2565737A1 (fr
Inventor
Gustav Kruger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Feinmetall GmbH
Original Assignee
Feinmetall GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall GmbH filed Critical Feinmetall GmbH
Publication of FR2565737A1 publication Critical patent/FR2565737A1/fr
Application granted granted Critical
Publication of FR2565737B3 publication Critical patent/FR2565737B3/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
FR8508245A 1984-06-12 1985-05-31 Element de contact pour adaptateur de controle pour effectuer des controles electriques de pieces a controler notamment de circuits imprimes Expired FR2565737B3 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3421720 1984-06-12

Publications (2)

Publication Number Publication Date
FR2565737A1 FR2565737A1 (fr) 1985-12-13
FR2565737B3 true FR2565737B3 (fr) 1986-09-19

Family

ID=6238138

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8508245A Expired FR2565737B3 (fr) 1984-06-12 1985-05-31 Element de contact pour adaptateur de controle pour effectuer des controles electriques de pieces a controler notamment de circuits imprimes

Country Status (2)

Country Link
US (1) US4707655A (fr)
FR (1) FR2565737B3 (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5425649A (en) * 1989-06-13 1995-06-20 General Datacomm, Inc. Connector system having switching and testing functions using tapered spring contact elements and actuators therefor
US5366380A (en) * 1989-06-13 1994-11-22 General Datacomm, Inc. Spring biased tapered contact elements for electrical connectors and integrated circuit packages
US5256073A (en) * 1989-06-13 1993-10-26 General Datacomm, Inc. Electrical connectors for direct connection to plated through holes in circuit board
US5215471A (en) * 1989-06-13 1993-06-01 General Datacomm, Inc. Electrical connectors having tapered spring contact elements for direct mating to holes
US4966556A (en) * 1989-06-13 1990-10-30 General Datacomm, Inc. Electrical connector for direct connection to plated through holes in circuit board
US5134364A (en) * 1990-06-19 1992-07-28 Prime Computer, Inc. Elastomeric test probe
US5239260A (en) * 1991-06-28 1993-08-24 Digital Equipment Corporation Semiconductor probe and alignment system
ES2070750B1 (es) * 1993-05-17 1998-02-16 Sistel Sa Elemento de ajuste.
US6246247B1 (en) 1994-11-15 2001-06-12 Formfactor, Inc. Probe card assembly and kit, and methods of using same
US20020053734A1 (en) 1993-11-16 2002-05-09 Formfactor, Inc. Probe card assembly and kit, and methods of making same
US7073254B2 (en) 1993-11-16 2006-07-11 Formfactor, Inc. Method for mounting a plurality of spring contact elements
US6624648B2 (en) 1993-11-16 2003-09-23 Formfactor, Inc. Probe card assembly
US5600259A (en) * 1993-12-17 1997-02-04 International Business Machines Corporation Method and apparatus for reducing interference in a pin array
US6483328B1 (en) * 1995-11-09 2002-11-19 Formfactor, Inc. Probe card for probing wafers with raised contact elements
US8033838B2 (en) 1996-02-21 2011-10-11 Formfactor, Inc. Microelectronic contact structure
US7458837B2 (en) * 2006-01-13 2008-12-02 Advantest Corporation Connector housing block, interface member and electronic device testing apparatus
CN101634683B (zh) * 2008-07-25 2012-11-21 深圳富泰宏精密工业有限公司 测试模组
DE102009016181A1 (de) * 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten
DE102011102791A1 (de) * 2011-05-27 2012-11-29 Feinmetall Gmbh Federkontaktstiftanordnung
US9674943B2 (en) * 2012-12-06 2017-06-06 Intel Corporation Actuation mechanisms for electrical interconnections
US11067601B2 (en) * 2013-03-08 2021-07-20 Donald DeMille High accuracy electrical test interconnection device and method for electrical circuit board testing
DE102019220311A1 (de) * 2019-12-19 2021-06-24 Feinmetall Gesellschaft mit beschränkter Haftung Kontakteinrichtung

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1329448A (en) * 1916-04-05 1920-02-03 Post Adolf Von Electrical coupling
US3676776A (en) * 1970-01-19 1972-07-11 Siemens Ag Testing probe construction
SU723703A1 (ru) * 1976-09-01 1980-03-25 Предприятие П/Я Г-4833 Электрический контакт
US4321532A (en) * 1978-03-16 1982-03-23 Luna L Jack Repairable spring probe assembly
DE3240916C2 (de) * 1982-11-05 1985-10-31 Luther, Erich, Ing.(Grad.), 3003 Ronnenberg Vorrichtung zum Prüfen von elektrischen Leiterplatten
JPS6049270A (ja) * 1983-08-27 1985-03-18 Kyoei Sangyo Kk プリント配線板検査機用アダプタ
US4535536A (en) * 1983-11-03 1985-08-20 Augat Inc. Method of assembling adaptor for automatic testing equipment
US4560223A (en) * 1984-06-29 1985-12-24 Pylon Company, Inc. Self-cleaning tri-cusp signal contact

Also Published As

Publication number Publication date
US4707655A (en) 1987-11-17
FR2565737A1 (fr) 1985-12-13

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Legal Events

Date Code Title Description
ST Notification of lapse