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FR2506929A1 - METHOD FOR DETERMINING COATING RATES - Google Patents

METHOD FOR DETERMINING COATING RATES

Info

Publication number
FR2506929A1
FR2506929A1 FR8209514A FR8209514A FR2506929A1 FR 2506929 A1 FR2506929 A1 FR 2506929A1 FR 8209514 A FR8209514 A FR 8209514A FR 8209514 A FR8209514 A FR 8209514A FR 2506929 A1 FR2506929 A1 FR 2506929A1
Authority
FR
France
Prior art keywords
radiation
paper
coating
detector
coating layers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8209514A
Other languages
French (fr)
Other versions
FR2506929B1 (en
Inventor
Heikki Venalainen
Rauno Rantanen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Stora Enso Oyj
Original Assignee
Enso Gutzeit Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enso Gutzeit Oy filed Critical Enso Gutzeit Oy
Publication of FR2506929A1 publication Critical patent/FR2506929A1/en
Application granted granted Critical
Publication of FR2506929B1 publication Critical patent/FR2506929B1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Paper (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

LA PRESENTE INVENTION CONCERNE UN PROCEDE DE MESURE DES QUANTITES DE REVETEMENT DE COUCHES DEPOSEES SUR LES DEUX FACES D'UN PAPIER, D'UN CARTON OU MATERIAU EQUIVALENT 2 DANS LE CAS OU LES DEUX COUCHES 1, 3 CONTIENNENT LE MEME COMPOSANT EMETTANT UN RAYONNEMENT CARACTERISTIQUE. DANS LE CAS LE PLUS COURAMMENT RENCONTRE, LES DEUX COUCHES DE REVETEMENT SONT CONSTITUEES DU MEME MATERIAU. DANS LE PROCEDE, DEUX PAIRES DE SOURCEDETECTEUR DE RAYONNEMENT INDEPENDANTES S, D; S, D SONT UTILISEES, ENTRE LESQUELLES EST PLACE LE PAPIER OU LE MATERIAU REVETU. SEPAREMENT, AVEC CHAQUE PAIRE DE SOURCEDETECTEUR DE RAYONNEMENT, SONT EFFECTUEES L'EXCITATION DU RAYONNEMENT FLUORESCENT DANS LES DEUX COUCHES DE REVETEMENT ET LA MESURE DE L'INTENSITE TOTALE DU RAYONNEMENT EXCITE PRESENT AU DETECTEUR. SI LE POIDS DE BASE DU PAPIER EST CONNU, LES TAUX DE REVETEMENT PEUVENT ETRE CALCULES A PARTIR DES RESULTATS DE LA MESURE. CE POIDS DE BASE EST DES PLUS AVANTAGEUSEMENT MESURE AVANT L'ETAPE DE REVETEMENT A L'AIDE D'UNE SOURCE SEPAREE DE RAYONNEMENT S ET D'UN DETECTEUR DE TRANSMISSION DTRREFTHE PRESENT INVENTION CONCERNS A METHOD OF MEASURING THE QUANTITIES OF COATING LAYERS DEPOSITED ON BOTH SIDES OF PAPER, CARDBOARD OR MATERIAL EQUIVALENT 2 IN THE CASE BOTH LAYERS 1, 3 CONTAIN THE SAME COMPONENT EMITTING RADIATION CHARACTERISTICS . IN THE MOST COMMON CASE, THE TWO COATING LAYERS ARE MADE OF THE SAME MATERIAL. IN THE PROCESS, TWO PAIRS OF INDEPENDENT RADIATION SENSOR S, D; S, D ARE USED, BETWEEN WHICH PAPER OR COATED MATERIAL IS PLACED. SEPARATELY, WITH EACH PAIR OF RADIATION DETECTOR, THE EXCITATION OF THE FLUORESCENT RADIATION IS CARRIED OUT IN THE TWO COATING LAYERS AND THE MEASUREMENT OF THE TOTAL INTENSITY OF THE EXCITED RADIATION PRESENT AT THE DETECTOR. IF THE BASE WEIGHT OF THE PAPER IS KNOWN, THE COATING RATES MAY BE CALCULATED FROM THE MEASUREMENT RESULTS. THIS BASE WEIGHT IS MOST BENEFULLY MEASURED BEFORE THE COATING STEP USING A SEPARATE RADIATION SOURCE AND A DTRREF TRANSMISSION DETECTOR

FR8209514A 1981-05-29 1982-06-01 METHOD FOR DETERMINING COATING RATES Expired FR2506929B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI811652A FI62420C (en) 1981-05-29 1981-05-29 FOERFARANDE FOER ATT MAETA BELAEGGNINGSMAENGD

Publications (2)

Publication Number Publication Date
FR2506929A1 true FR2506929A1 (en) 1982-12-03
FR2506929B1 FR2506929B1 (en) 1986-09-26

Family

ID=8514438

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8209514A Expired FR2506929B1 (en) 1981-05-29 1982-06-01 METHOD FOR DETERMINING COATING RATES

Country Status (7)

Country Link
CA (1) CA1189638A (en)
DE (1) DE3219962A1 (en)
FI (1) FI62420C (en)
FR (1) FR2506929B1 (en)
GB (1) GB2099994B (en)
NO (1) NO154570C (en)
SE (1) SE449137B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI68321C (en) * 1982-12-01 1985-08-12 Valtion Teknillinen FOERFARANDE Før by means of the ATT STRAOLNING UTSAEND AV ETT ROENTGENROER utan att FOERSTOERA sample was MAETA FOERDELNINGEN FYLL- audio and / or BELAEGGNINGSMEDEL I TJOCKLEKSRIKTNINGEN of paper in Cardboard or the like OCH Halten from these two MEDEL Før TILLAEMPANDE of devices for the AV FOERFARANDET SAMT ANVAENDNINGAR of devices for the AV FOERFARANDET OCH
FI68320C (en) * 1982-12-01 1985-08-12 Valtion Teknillinen FOERFARANDE Før by means of the ATT STRAOLNING FRAON A RADIOISOTOPKAELLA utan att FOERSTOERA sample was MAETA FOERDELNINGEN fyll audio-and / or BELAEGGNINGSMEDEL I TJOCKLEKSRIKTNINGEN audio PAPP ERARTONG or the like OCH Halten from these two MEDEL arranged RGAFOER TILLAEMPANDE audio FOERFARANDET SAMT ANVAENDNINGAR of devices for the AV ERFOARANDET OCH
DE3890059T1 (en) * 1987-02-06 1989-01-19
DE4106313A1 (en) * 1991-02-28 1992-09-03 Heidelberger Druckmasch Ag METHOD AND DEVICE FOR DETERMINING THE QUANTITY OR RELATING TO THE LAYER THICKNESS OF A FLUID
SE509846C2 (en) * 1996-12-17 1999-03-15 Toolex Alpha Ab Method for optical thickness measurement of an adhesive layer and optical disk and its manufacture and adhesive and its use
US6508956B1 (en) 2001-07-25 2003-01-21 Lexmark International, Inc Paper coating test method and composition

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE925197C (en) * 1953-11-11 1955-03-14 Exatest Ges Fuer Messtechnik M Method for the non-contact thickness measurement of strip-shaped, preferably hot-rolled material by means of hard electromagnetic radiation
FR1495097A (en) * 1966-09-22 1967-09-15 Atomic Energy Authority Uk Feeler gauges operating by transmission
US3530296A (en) * 1967-04-01 1970-09-22 Valmet Oy Method for measuring quantities associated with the filler distribution of paper
US4037104A (en) * 1976-04-29 1977-07-19 Nucleonic Data Systems, Inc. Dual beam X-ray thickness gauge
US4081676A (en) * 1976-12-17 1978-03-28 Sentrol Systems Ltd. On-line system for monitoring sheet material additives
US4147931A (en) * 1976-12-13 1979-04-03 Pertti Puumalainen Procedure for measuring unit area weights

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3405267A (en) * 1964-06-17 1968-10-08 Industrial Nucleonics Corp Inner layer displacement measuring method and apparatus
CH457875A (en) * 1965-09-22 1968-06-15 Atomic Energy Authority Uk Method for measuring the thickness of moving sheet material
FI53757C (en) * 1976-12-13 1978-07-10 Pertti Puumalainen FOERFARANDE FOER MAETNING AV YTVIKTERNA
FI59489C (en) * 1978-11-21 1981-08-10 Enso Gutzeit Oy FOERFARANDE FOER MAETNING AV BELAEGGNINGSMAENGDER

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE925197C (en) * 1953-11-11 1955-03-14 Exatest Ges Fuer Messtechnik M Method for the non-contact thickness measurement of strip-shaped, preferably hot-rolled material by means of hard electromagnetic radiation
FR1495097A (en) * 1966-09-22 1967-09-15 Atomic Energy Authority Uk Feeler gauges operating by transmission
US3530296A (en) * 1967-04-01 1970-09-22 Valmet Oy Method for measuring quantities associated with the filler distribution of paper
US4037104A (en) * 1976-04-29 1977-07-19 Nucleonic Data Systems, Inc. Dual beam X-ray thickness gauge
US4147931A (en) * 1976-12-13 1979-04-03 Pertti Puumalainen Procedure for measuring unit area weights
US4081676A (en) * 1976-12-17 1978-03-28 Sentrol Systems Ltd. On-line system for monitoring sheet material additives

Also Published As

Publication number Publication date
NO154570B (en) 1986-07-14
DE3219962A1 (en) 1982-12-16
FR2506929B1 (en) 1986-09-26
SE449137B (en) 1987-04-06
NO821806L (en) 1982-11-30
FI62420B (en) 1982-08-31
FI62420C (en) 1982-12-10
NO154570C (en) 1986-10-22
GB2099994A (en) 1982-12-15
GB2099994B (en) 1985-02-20
SE8203315L (en) 1982-11-30
CA1189638A (en) 1985-06-25

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