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FR2501455B1 - - Google Patents

Info

Publication number
FR2501455B1
FR2501455B1 FR8104329A FR8104329A FR2501455B1 FR 2501455 B1 FR2501455 B1 FR 2501455B1 FR 8104329 A FR8104329 A FR 8104329A FR 8104329 A FR8104329 A FR 8104329A FR 2501455 B1 FR2501455 B1 FR 2501455B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8104329A
Other languages
French (fr)
Other versions
FR2501455A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Socapex SA
Original Assignee
Socapex SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Socapex SA filed Critical Socapex SA
Priority to FR8104329A priority Critical patent/FR2501455A1/en
Publication of FR2501455A1 publication Critical patent/FR2501455A1/en
Application granted granted Critical
Publication of FR2501455B1 publication Critical patent/FR2501455B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
FR8104329A 1981-03-04 1981-03-04 Automatic multi-point circuit board probe tester - is computer controlled and of bed-of-nails type with double-layer apertured board Granted FR2501455A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8104329A FR2501455A1 (en) 1981-03-04 1981-03-04 Automatic multi-point circuit board probe tester - is computer controlled and of bed-of-nails type with double-layer apertured board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8104329A FR2501455A1 (en) 1981-03-04 1981-03-04 Automatic multi-point circuit board probe tester - is computer controlled and of bed-of-nails type with double-layer apertured board

Publications (2)

Publication Number Publication Date
FR2501455A1 FR2501455A1 (en) 1982-09-10
FR2501455B1 true FR2501455B1 (en) 1983-04-15

Family

ID=9255861

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8104329A Granted FR2501455A1 (en) 1981-03-04 1981-03-04 Automatic multi-point circuit board probe tester - is computer controlled and of bed-of-nails type with double-layer apertured board

Country Status (1)

Country Link
FR (1) FR2501455A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3414968C2 (en) * 1984-04-19 1986-07-10 Siemens AG, 1000 Berlin und 8000 München Method for determining the unknown assignment of field coordinates of the contact needles of a contact needle field of a test object adapter to the addresses of the contact needles in an automatic wiring tester

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2341977A1 (en) * 1973-08-20 1975-03-06 Elektronische Bauelemente Veb Rational self-programming on wiring tester - is for electrical connections of circuit boards using punched tape control
CH560392A5 (en) * 1973-12-19 1975-03-27 Siemens Ag Albis Testing conductor plates having numerous soldered points etc. - plates are mounted on insulated carrier block
US4132948A (en) * 1977-03-17 1979-01-02 Teradyne, Inc. Test fixture using stock printed circuit board having test pins mounted thereon
US4171860A (en) * 1977-03-17 1979-10-23 Teradyne, Inc. Testing circuit boards

Also Published As

Publication number Publication date
FR2501455A1 (en) 1982-09-10

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Legal Events

Date Code Title Description
ST Notification of lapse