FR2406823B1 - - Google Patents

Info

Publication number: FR2406823B1
Authority: FR; France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

FR7829821A

Other languages

Other versions

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Shionogi and Co Ltd

Original Assignee

Shionogi and Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1977-10-20

Filing date

1978-10-19

Publication date

1984-06-01

1978-10-19 Application filed by Shionogi and Co Ltd filed Critical Shionogi and Co Ltd

1979-05-18 Publication of FR2406823A1 publication Critical patent/FR2406823A1/en

1984-06-01 Application granted granted Critical

1984-06-01 Publication of FR2406823B1 publication Critical patent/FR2406823B1/fr

Status Granted legal-status Critical Current

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0409—Sample holders or containers
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
- H01J49/0427—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples using a membrane permeable to gases

Landscapes

Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Sampling And Sample Adjustment (AREA)
Electron Tubes For Measurement (AREA)

FR7829821A 1977-10-20 1978-10-19 SAMPLE SUPPORT ELEMENT FOR MASS SPECTROMETER Granted FR2406823A1 (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP52126455A JPS594661B2 (en)	1977-10-20	1977-10-20	Sample holder for mass spectrometer

Publications (2)

Publication Number	Publication Date
FR2406823A1 FR2406823A1 (en)	1979-05-18
FR2406823B1 true FR2406823B1 (en)	1984-06-01

Family

ID=14935636

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FR7829821A Granted FR2406823A1 (en)	1977-10-20	1978-10-19	SAMPLE SUPPORT ELEMENT FOR MASS SPECTROMETER

Country Status (9)

Country	Link
US (1)	US4267457A (en)
JP (1)	JPS594661B2 (en)
CA (1)	CA1116315A (en)
CH (1)	CH635681A5 (en)
DE (1)	DE2845780A1 (en)
FR (1)	FR2406823A1 (en)
GB (1)	GB2008434B (en)
IT (1)	IT1160868B (en)
NL (1)	NL191345C (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3125335A1 (en) *	1981-06-27	1983-01-13	Alfred Prof. Dr. 4400 Münster Benninghoven	METHOD FOR ANALYZING GASES AND LIQUIDS
US4491735A (en) *	1982-04-05	1985-01-01	The Perkin-Elmer Corporation	Restricted ion source of high current density
JPS6042653A (en) *	1983-08-17	1985-03-06	Shionogi & Co Ltd	Chromatography plate
US4908512A (en) *	1985-08-21	1990-03-13	Kratos Analytical Limited	Apparatus and methods of use in the mass analysis of chemical samples
US4820648A (en) *	1985-08-21	1989-04-11	Spectros Limited	Methods for use in the mass analysis of chemical samples
US4791292A (en) *	1986-04-24	1988-12-13	The Dow Chemical Company	Capillary membrane interface for a mass spectrometer
US4818863A (en) *	1986-12-27	1989-04-04	Jeol Ltd.	Ion source for use in a mass spectrometer
JP2953140B2 (en) *	1991-09-20	1999-09-27	株式会社村田製作所	Trance
US5827659A (en) *	1995-05-19	1998-10-27	Perseptive Biosystems, Inc.	Methods and apparatus for sequencing polymers using mass spectrometry
DE19754978C2 (en) *	1997-12-11	2000-07-13	Bruker Daltonik Gmbh	Sample holder for MALDI mass spectrometry along with the process for producing the plates and applying the samples
US6140639A (en) *	1998-05-29	2000-10-31	Vanderbilt University	System and method for on-line coupling of liquid capillary separations with matrix-assisted laser desorption/ionization mass spectrometry
DE10322701B4 (en) *	2003-05-20	2006-12-28	Humboldt-Universität Zu Berlin	Sample carriers using a porous film comprising metal oxide particles, methods for producing a sample carrier, use of the sample carrier and methods for the selective detection of phosphorylated / sulfated biopolymers, in particular peptides / proteins
US20070023678A1 (en) *	2004-02-27	2007-02-01	Yamanashi Tlo Co., Ltd.	Method and apparatus for ionization by cluster-ion impact
DE102007022337A1 (en) *	2007-05-12	2008-11-20	Semikron Elektronik Gmbh & Co. Kg	Sintered power semiconductor substrate and manufacturing method thereof
US8704167B2 (en) *	2009-04-30	2014-04-22	Purdue Research Foundation	Mass spectrometry analysis of microorganisms in samples
US20180079691A1 (en) *	2016-09-20	2018-03-22	Usg Interiors, Llc	Silicate coating for improved acoustical panel performance and methods of making same

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3336475A (en) *	1964-02-05	1967-08-15	Electro Optical Systems Inc	Device for forming negative ions from iodine gas and a lanthanum boride contact ionizer surface
US3852595A (en) *	1972-09-21	1974-12-03	Stanford Research Inst	Multipoint field ionization source

1977
- 1977-10-20 JP JP52126455A patent/JPS594661B2/en not_active Expired
1978
- 1978-09-29 CA CA000312386A patent/CA1116315A/en not_active Expired
- 1978-10-12 US US05/950,697 patent/US4267457A/en not_active Expired - Lifetime
- 1978-10-18 IT IT69395/78A patent/IT1160868B/en active
- 1978-10-19 CH CH1084678A patent/CH635681A5/en not_active IP Right Cessation
- 1978-10-19 NL NL7810482A patent/NL191345C/en not_active IP Right Cessation
- 1978-10-19 FR FR7829821A patent/FR2406823A1/en active Granted
- 1978-10-20 GB GB7841346A patent/GB2008434B/en not_active Expired
- 1978-10-20 DE DE19782845780 patent/DE2845780A1/en active Granted

Also Published As

Publication number	Publication date
DE2845780A1 (en)	1979-04-26
JPS5459983A (en)	1979-05-15
GB2008434A (en)	1979-06-06
FR2406823A1 (en)	1979-05-18
CA1116315A (en)	1982-01-12
NL191345C (en)	1995-06-01
GB2008434B (en)	1982-03-24
US4267457A (en)	1981-05-12
NL7810482A (en)	1979-04-24
CH635681A5 (en)	1983-04-15
IT1160868B (en)	1987-03-11
DE2845780C2 (en)	1987-10-15
JPS594661B2 (en)	1984-01-31
NL191345B (en)	1995-01-02
IT7869395A0 (en)	1978-10-18

Publication	Publication Date	Title
FR2406823B1 (en)	1984-06-01
AU3353778A (en)	1979-08-30
AU495917B2 (en)	1977-04-28
AU71461S (en)	1977-08-02
BE851449A (en)	1977-08-16
BE865722A (en)	1978-10-05
BE866391A (en)	1978-08-14
BE868323A (en)	1978-12-21
BE870787A (en)	1979-01-15
BE871419A (en)	1979-02-15
BE871991A (en)	1979-03-01
BE872973A (en)	1979-04-17
BE873002A (en)	1979-06-22
BG23438A1 (en)	1977-09-15
BG23462A1 (en)	1977-09-15
BG24331A1 (en)	1978-02-10
BG24713A1 (en)	1978-05-12
BG25808A1 (en)	1979-01-12
BG25809A1 (en)	1979-01-12
BG25810A1 (en)	1979-01-12
BG25811A1 (en)	1979-01-12
BG25812A1 (en)	1979-01-12
BG25813A1 (en)	1979-01-12
BG25815A1 (en)	1979-01-12
BG25819A1 (en)	1979-01-12