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FR2324124A1 - PROCESS FOR THE REALIZATION OF A CHARGE TRANSMISSION DEVICE AND CHARGING DEVICE THUS REALIZED - Google Patents

PROCESS FOR THE REALIZATION OF A CHARGE TRANSMISSION DEVICE AND CHARGING DEVICE THUS REALIZED

Info

Publication number
FR2324124A1
FR2324124A1 FR7627116A FR7627116A FR2324124A1 FR 2324124 A1 FR2324124 A1 FR 2324124A1 FR 7627116 A FR7627116 A FR 7627116A FR 7627116 A FR7627116 A FR 7627116A FR 2324124 A1 FR2324124 A1 FR 2324124A1
Authority
FR
France
Prior art keywords
realization
realized
charge transmission
transmission device
charging device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7627116A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of FR2324124A1 publication Critical patent/FR2324124A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/60Electrodes characterised by their materials
    • H10D64/66Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
    • H10D64/665Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of elemental metal contacting the insulator, e.g. tungsten or molybdenum
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body (electrodes)
    • H01L23/485Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body (electrodes) consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00Charge transfer devices
    • H10D44/40Charge-coupled devices [CCD]
    • H10D44/45Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/60Electrodes characterised by their materials
    • H10D64/66Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
    • H10D64/661Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0198Integrating together multiple components covered by H10D44/00, e.g. integrating charge coupled devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Solid State Image Pick-Up Elements (AREA)
FR7627116A 1975-09-09 1976-09-09 PROCESS FOR THE REALIZATION OF A CHARGE TRANSMISSION DEVICE AND CHARGING DEVICE THUS REALIZED Withdrawn FR2324124A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7510586A NL7510586A (en) 1975-09-09 1975-09-09 PROCEDURE FOR MANUFACTURING A CARGO TRANSFER DEVICE AND CARGO TRANSFER DEVICE MANUFACTURED USING THE PROCEDURE.

Publications (1)

Publication Number Publication Date
FR2324124A1 true FR2324124A1 (en) 1977-04-08

Family

ID=19824439

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7627116A Withdrawn FR2324124A1 (en) 1975-09-09 1976-09-09 PROCESS FOR THE REALIZATION OF A CHARGE TRANSMISSION DEVICE AND CHARGING DEVICE THUS REALIZED

Country Status (7)

Country Link
JP (1) JPS5233487A (en)
CA (1) CA1061471A (en)
DE (1) DE2639479A1 (en)
FR (1) FR2324124A1 (en)
GB (1) GB1495377A (en)
IT (1) IT1063690B (en)
NL (1) NL7510586A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0000743A1 (en) * 1977-08-06 1979-02-21 International Business Machines Corporation Method for fabricating tantalum contacts on a N-type conducting silicon semiconductor substrate

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL186886C (en) * 1980-11-28 1992-03-16 Philips Nv SEMICONDUCTOR DEVICE.
JP4739703B2 (en) * 2004-07-14 2011-08-03 富士フイルム株式会社 Manufacturing method of solid-state imaging device
TWI701768B (en) * 2019-08-28 2020-08-11 力晶積成電子製造股份有限公司 Method of manufacturing interconnect structure

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2409664A1 (en) * 1973-02-28 1974-10-17 Hitachi Ltd CHARGE TRANSFER SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING IT

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS579227B2 (en) * 1973-02-28 1982-02-20
US3911560A (en) * 1974-02-25 1975-10-14 Fairchild Camera Instr Co Method for manufacturing a semiconductor device having self-aligned implanted barriers with narrow gaps between electrodes

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2409664A1 (en) * 1973-02-28 1974-10-17 Hitachi Ltd CHARGE TRANSFER SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING IT

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0000743A1 (en) * 1977-08-06 1979-02-21 International Business Machines Corporation Method for fabricating tantalum contacts on a N-type conducting silicon semiconductor substrate

Also Published As

Publication number Publication date
DE2639479A1 (en) 1977-04-14
CA1061471A (en) 1979-08-28
JPS5233487A (en) 1977-03-14
NL7510586A (en) 1977-03-11
IT1063690B (en) 1985-02-11
GB1495377A (en) 1977-12-14

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Legal Events

Date Code Title Description
ST Notification of lapse