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FR2275022A2 - Dispositif pour le controle de la position, de l'intensite, de l'homogeneite et de la directivite d'un faisceau de rayonnement ionisant - Google Patents

Dispositif pour le controle de la position, de l'intensite, de l'homogeneite et de la directivite d'un faisceau de rayonnement ionisant

Info

Publication number
FR2275022A2
FR2275022A2 FR7420719A FR7420719A FR2275022A2 FR 2275022 A2 FR2275022 A2 FR 2275022A2 FR 7420719 A FR7420719 A FR 7420719A FR 7420719 A FR7420719 A FR 7420719A FR 2275022 A2 FR2275022 A2 FR 2275022A2
Authority
FR
France
Prior art keywords
directivity
homogeneity
intensity
monitoring
radiation beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7420719A
Other languages
English (en)
Other versions
FR2275022B2 (fr
Inventor
Rene Boux
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CGR MEV SA
Original Assignee
CGR MEV SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CGR MEV SA filed Critical CGR MEV SA
Priority to FR7420719A priority Critical patent/FR2275022A2/fr
Priority to US05/585,506 priority patent/US3997788A/en
Priority to GB25121/75A priority patent/GB1488555A/en
Priority to NL7506940.A priority patent/NL164999C/xx
Priority to DE2526116A priority patent/DE2526116C2/de
Priority to CA229,349A priority patent/CA1036717A/fr
Priority to CH771675A priority patent/CH588085A5/xx
Priority to JP50071867A priority patent/JPS6225996B2/ja
Publication of FR2275022A2 publication Critical patent/FR2275022A2/fr
Application granted granted Critical
Publication of FR2275022B2 publication Critical patent/FR2275022B2/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Electron Tubes For Measurement (AREA)
  • Electron Sources, Ion Sources (AREA)
FR7420719A 1974-06-14 1974-06-14 Dispositif pour le controle de la position, de l'intensite, de l'homogeneite et de la directivite d'un faisceau de rayonnement ionisant Granted FR2275022A2 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR7420719A FR2275022A2 (fr) 1974-06-14 1974-06-14 Dispositif pour le controle de la position, de l'intensite, de l'homogeneite et de la directivite d'un faisceau de rayonnement ionisant
US05/585,506 US3997788A (en) 1974-06-14 1975-06-10 Device for monitoring the position, intensity, uniformity and directivity of an ionizing radiation beam
NL7506940.A NL164999C (nl) 1974-06-14 1975-06-11 Verbetering van een inrichting voor de controle van een bundel ioniserende straling.
DE2526116A DE2526116C2 (de) 1974-06-14 1975-06-11 Vorrichtung zur Kontrolle der Homogenität der Intensitätsverteilung eines Bündels ionisierender Strahlung
GB25121/75A GB1488555A (en) 1974-06-14 1975-06-11 Device capable of monitoring the centring intensity and uniformity of an ionizing radiation beam
CA229,349A CA1036717A (fr) 1974-06-14 1975-06-13 Dispositif de surveillance de la position, de l'intensite, de l'uniformite et de la directivite d'un rayonnement ionisant
CH771675A CH588085A5 (fr) 1974-06-14 1975-06-13
JP50071867A JPS6225996B2 (fr) 1974-06-14 1975-06-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7420719A FR2275022A2 (fr) 1974-06-14 1974-06-14 Dispositif pour le controle de la position, de l'intensite, de l'homogeneite et de la directivite d'un faisceau de rayonnement ionisant

Publications (2)

Publication Number Publication Date
FR2275022A2 true FR2275022A2 (fr) 1976-01-09
FR2275022B2 FR2275022B2 (fr) 1979-09-28

Family

ID=9140075

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7420719A Granted FR2275022A2 (fr) 1974-06-14 1974-06-14 Dispositif pour le controle de la position, de l'intensite, de l'homogeneite et de la directivite d'un faisceau de rayonnement ionisant

Country Status (8)

Country Link
US (1) US3997788A (fr)
JP (1) JPS6225996B2 (fr)
CA (1) CA1036717A (fr)
CH (1) CH588085A5 (fr)
DE (1) DE2526116C2 (fr)
FR (1) FR2275022A2 (fr)
GB (1) GB1488555A (fr)
NL (1) NL164999C (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2357989A1 (fr) * 1976-07-09 1978-02-03 Cgr Mev Dispositif d'irradiation utilisant un faisceau de particules chargees
US4131799A (en) * 1977-04-01 1978-12-26 Applied Radiation Corporation Ionization chamber
US4092535A (en) * 1977-04-22 1978-05-30 Bell Telephone Laboratories, Incorporated Damping of optically levitated particles by feedback and beam shaping
JPS54156683A (en) * 1978-05-31 1979-12-10 Nippon Telegr & Teleph Corp <Ntt> Beam intensity distribution measuring apparatus in electron beam apparatus
JPS614856Y2 (fr) * 1979-01-23 1986-02-14
JPS5599087A (en) * 1979-01-23 1980-07-28 Shimadzu Corp Emission type tomography
US4514633A (en) * 1983-11-17 1985-04-30 Siemens Medical Laboratories, Inc. Ionization chamber for measuring the profile of a radiation field of electron or X-ray radiation
DE3844716C2 (de) * 1987-08-24 2001-02-22 Mitsubishi Electric Corp Partikelstrahlmonitorvorrichtung
US4803368A (en) * 1987-12-28 1989-02-07 Siemens Medical Laboratories, Inc. Assembly and method for monitoring the lateral position of a beam of ionizing radiation
JPH01285889A (ja) * 1988-05-13 1989-11-16 Mitsubishi Electric Corp 放射線線量モニタ
CN115373014A (zh) * 2015-07-22 2022-11-22 优瑞技术公司 用于辐射测量的离子室

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2054433A1 (fr) * 1969-05-23 1971-04-23 Commissariat Energie Atomique
US3612858A (en) * 1970-02-10 1971-10-12 Atomic Energy Commission Device for measuring the position, size and intensity of high-energy particles
US3626184A (en) * 1970-03-05 1971-12-07 Atomic Energy Commission Detector system for a scanning electron microscope
FR2134296B1 (fr) * 1971-04-30 1974-03-22 Thomson Csf
US3852610A (en) * 1973-02-26 1974-12-03 Varian Associates Transmission ion chamber

Also Published As

Publication number Publication date
CA1036717A (fr) 1978-08-15
JPS5116982A (fr) 1976-02-10
NL164999B (nl) 1980-09-15
NL164999C (nl) 1981-02-16
JPS6225996B2 (fr) 1987-06-05
GB1488555A (en) 1977-10-12
DE2526116A1 (de) 1976-01-02
DE2526116C2 (de) 1986-07-24
US3997788A (en) 1976-12-14
CH588085A5 (fr) 1977-05-31
NL7506940A (nl) 1975-12-16
FR2275022B2 (fr) 1979-09-28

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