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FR2252570B1 - - Google Patents

Info

Publication number
FR2252570B1
FR2252570B1 FR7435493A FR7435493A FR2252570B1 FR 2252570 B1 FR2252570 B1 FR 2252570B1 FR 7435493 A FR7435493 A FR 7435493A FR 7435493 A FR7435493 A FR 7435493A FR 2252570 B1 FR2252570 B1 FR 2252570B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7435493A
Other versions
FR2252570A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Syntex USA LLC
Original Assignee
Syntex USA LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Syntex USA LLC filed Critical Syntex USA LLC
Publication of FR2252570A1 publication Critical patent/FR2252570A1/fr
Application granted granted Critical
Publication of FR2252570B1 publication Critical patent/FR2252570B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Details Of Measuring And Other Instruments (AREA)
FR7435493A 1973-10-24 1974-10-22 Expired FR2252570B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US409098A US3860815A (en) 1973-10-24 1973-10-24 X-ray diffractometer having means for cooling crystal mounted thereon

Publications (2)

Publication Number Publication Date
FR2252570A1 FR2252570A1 (fr) 1975-06-20
FR2252570B1 true FR2252570B1 (fr) 1976-10-22

Family

ID=23619040

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7435493A Expired FR2252570B1 (fr) 1973-10-24 1974-10-22

Country Status (7)

Country Link
US (1) US3860815A (fr)
JP (1) JPS5735421B2 (fr)
DE (1) DE2449399C3 (fr)
FR (1) FR2252570B1 (fr)
GB (1) GB1480477A (fr)
IT (1) IT1024656B (fr)
NL (1) NL180881C (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992624A (en) * 1975-04-29 1976-11-16 The United States Of America As Represented By The Secretary Of The Army Apparatus and method of X-ray topography at cryogenic temperature
DE8423909U1 (de) * 1984-08-11 1985-01-03 Kernforschungsanlage Jülich GmbH, 5170 Jülich Eulerwiege fuer tieftemperatur-diffraktometrie
US6404849B1 (en) * 1999-08-11 2002-06-11 Abbott Laboratories Automated sample handling for X-ray crystallography

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3189741A (en) * 1963-09-06 1965-06-15 Picker X Ray Corp Goniostat

Also Published As

Publication number Publication date
NL7413948A (nl) 1975-04-28
JPS50113284A (fr) 1975-09-05
JPS5735421B2 (fr) 1982-07-29
IT1024656B (it) 1978-07-20
DE2449399B2 (de) 1979-02-01
GB1480477A (en) 1977-07-20
FR2252570A1 (fr) 1975-06-20
DE2449399C3 (de) 1979-09-27
DE2449399A1 (de) 1975-05-07
US3860815A (en) 1975-01-14
NL180881C (nl) 1987-05-04

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse