FR2216579A1 - - Google Patents
Info
- Publication number
- FR2216579A1 FR2216579A1 FR7403284A FR7403284A FR2216579A1 FR 2216579 A1 FR2216579 A1 FR 2216579A1 FR 7403284 A FR7403284 A FR 7403284A FR 7403284 A FR7403284 A FR 7403284A FR 2216579 A1 FR2216579 A1 FR 2216579A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US32815473A | 1973-01-31 | 1973-01-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2216579A1 true FR2216579A1 (en) | 1974-08-30 |
| FR2216579B3 FR2216579B3 (en) | 1976-11-26 |
Family
ID=23279749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7403284A Expired FR2216579B3 (en) | 1973-01-31 | 1974-01-31 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3787691A (en) |
| JP (1) | JPS49107588A (en) |
| CA (1) | CA984063A (en) |
| DE (1) | DE2404618A1 (en) |
| FR (1) | FR2216579B3 (en) |
| GB (1) | GB1456098A (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1461270A (en) * | 1973-05-16 | 1977-01-13 | Nat Esearch Dev Corp | Chemical analysis of flowing materials |
| JPS56500667A (en) | 1979-06-07 | 1981-05-14 | ||
| US5274688A (en) * | 1992-04-07 | 1993-12-28 | Lee Grodzins | Lead-paint detector |
| WO2009033089A1 (en) * | 2007-09-06 | 2009-03-12 | Thermo Niton Analyzers Llc | Differentiation of lead in surface layers and in bulk samples by x-ray fluoresence |
| US8155268B2 (en) * | 2009-04-23 | 2012-04-10 | Thermo Niton Analyzers Llc | Rapid screening for lead concentration compliance by X-ray fluorescence (XRF) analysis |
| US20160103230A1 (en) * | 2014-10-13 | 2016-04-14 | Honeywell International Inc. | Apparatus and method for measuring alpha radiation from liquids |
| WO2024202197A1 (en) * | 2023-03-30 | 2024-10-03 | 株式会社島津製作所 | X-ray analysis device and control method for x-ray analysis device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3011060A (en) * | 1958-01-31 | 1961-11-28 | Philips Electronics Inc | X-ray spectrograph |
-
1973
- 1973-01-31 US US00328154A patent/US3787691A/en not_active Expired - Lifetime
-
1974
- 1974-01-15 CA CA190,174A patent/CA984063A/en not_active Expired
- 1974-01-17 GB GB222174A patent/GB1456098A/en not_active Expired
- 1974-01-31 DE DE2404618A patent/DE2404618A1/en active Pending
- 1974-01-31 JP JP49013280A patent/JPS49107588A/ja active Pending
- 1974-01-31 FR FR7403284A patent/FR2216579B3/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| FR2216579B3 (en) | 1976-11-26 |
| JPS49107588A (en) | 1974-10-12 |
| US3787691A (en) | 1974-01-22 |
| CA984063A (en) | 1976-02-17 |
| DE2404618A1 (en) | 1974-08-01 |
| GB1456098A (en) | 1976-11-17 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |