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FR1543387A - Method and apparatus for measuring the thickness of an object without material contact therewith - Google Patents

Method and apparatus for measuring the thickness of an object without material contact therewith

Info

Publication number
FR1543387A
FR1543387A FR120560A FR120560A FR1543387A FR 1543387 A FR1543387 A FR 1543387A FR 120560 A FR120560 A FR 120560A FR 120560 A FR120560 A FR 120560A FR 1543387 A FR1543387 A FR 1543387A
Authority
FR
France
Prior art keywords
measuring
thickness
contact therewith
material contact
therewith
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR120560A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
British Iron and Steel Research Association BISRA
Original Assignee
British Iron and Steel Research Association BISRA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by British Iron and Steel Research Association BISRA filed Critical British Iron and Steel Research Association BISRA
Priority to FR120560A priority Critical patent/FR1543387A/en
Application granted granted Critical
Publication of FR1543387A publication Critical patent/FR1543387A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
FR120560A 1967-09-11 1967-09-11 Method and apparatus for measuring the thickness of an object without material contact therewith Expired FR1543387A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR120560A FR1543387A (en) 1967-09-11 1967-09-11 Method and apparatus for measuring the thickness of an object without material contact therewith

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR120560A FR1543387A (en) 1967-09-11 1967-09-11 Method and apparatus for measuring the thickness of an object without material contact therewith

Publications (1)

Publication Number Publication Date
FR1543387A true FR1543387A (en) 1968-10-25

Family

ID=8638074

Family Applications (1)

Application Number Title Priority Date Filing Date
FR120560A Expired FR1543387A (en) 1967-09-11 1967-09-11 Method and apparatus for measuring the thickness of an object without material contact therewith

Country Status (1)

Country Link
FR (1) FR1543387A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113281352A (en) * 2021-06-08 2021-08-20 浙江双元科技股份有限公司 Resonant microwave moisture detection device and method based on frequency sweep technology

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113281352A (en) * 2021-06-08 2021-08-20 浙江双元科技股份有限公司 Resonant microwave moisture detection device and method based on frequency sweep technology
CN113281352B (en) * 2021-06-08 2023-11-10 浙江双元科技股份有限公司 Resonant microwave moisture detection device and method based on sweep frequency technology

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