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FR1424778A - Procédé de mesure par rayons x - Google Patents

Procédé de mesure par rayons x

Info

Publication number
FR1424778A
FR1424778A FR5677A FR5677A FR1424778A FR 1424778 A FR1424778 A FR 1424778A FR 5677 A FR5677 A FR 5677A FR 5677 A FR5677 A FR 5677A FR 1424778 A FR1424778 A FR 1424778A
Authority
FR
France
Prior art keywords
measurement method
ray measurement
ray
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR5677A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Corning Glass Works
Original Assignee
Corning Glass Works
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Glass Works filed Critical Corning Glass Works
Priority to FR5677A priority Critical patent/FR1424778A/fr
Application granted granted Critical
Publication of FR1424778A publication Critical patent/FR1424778A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
FR5677A 1964-02-17 1965-02-16 Procédé de mesure par rayons x Expired FR1424778A (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR5677A FR1424778A (fr) 1964-02-17 1965-02-16 Procédé de mesure par rayons x

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US34532364A 1964-02-17 1964-02-17
FR5677A FR1424778A (fr) 1964-02-17 1965-02-16 Procédé de mesure par rayons x

Publications (1)

Publication Number Publication Date
FR1424778A true FR1424778A (fr) 1966-01-14

Family

ID=26162067

Family Applications (1)

Application Number Title Priority Date Filing Date
FR5677A Expired FR1424778A (fr) 1964-02-17 1965-02-16 Procédé de mesure par rayons x

Country Status (1)

Country Link
FR (1) FR1424778A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2550333A1 (fr) * 1983-08-02 1985-02-08 Fuji Electric Co Ltd Appareil utilisant une source de rayonnement pour mesurer l'epaisseur de paroi de tubes pendant la fabrication

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2550333A1 (fr) * 1983-08-02 1985-02-08 Fuji Electric Co Ltd Appareil utilisant une source de rayonnement pour mesurer l'epaisseur de paroi de tubes pendant la fabrication

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