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FR1383765A - Semiconductor device intended to check the continuity of several electrical circuits - Google Patents

Semiconductor device intended to check the continuity of several electrical circuits

Info

Publication number
FR1383765A
FR1383765A FR940016A FR940016A FR1383765A FR 1383765 A FR1383765 A FR 1383765A FR 940016 A FR940016 A FR 940016A FR 940016 A FR940016 A FR 940016A FR 1383765 A FR1383765 A FR 1383765A
Authority
FR
France
Prior art keywords
continuity
check
semiconductor device
electrical circuits
device intended
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR940016A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US207128A external-priority patent/US3213339A/en
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Priority to FR940016A priority Critical patent/FR1383765A/en
Application granted granted Critical
Publication of FR1383765A publication Critical patent/FR1383765A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/676—Combinations of only thyristors
FR940016A 1962-07-02 1963-07-01 Semiconductor device intended to check the continuity of several electrical circuits Expired FR1383765A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR940016A FR1383765A (en) 1962-07-02 1963-07-01 Semiconductor device intended to check the continuity of several electrical circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US207128A US3213339A (en) 1962-07-02 1962-07-02 Semiconductor device for controlling the continuity of multiple electric paths
FR940016A FR1383765A (en) 1962-07-02 1963-07-01 Semiconductor device intended to check the continuity of several electrical circuits

Publications (1)

Publication Number Publication Date
FR1383765A true FR1383765A (en) 1965-01-04

Family

ID=26202166

Family Applications (1)

Application Number Title Priority Date Filing Date
FR940016A Expired FR1383765A (en) 1962-07-02 1963-07-01 Semiconductor device intended to check the continuity of several electrical circuits

Country Status (1)

Country Link
FR (1) FR1383765A (en)

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