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FR1220334A - Chi ray flaw detection method - Google Patents

Chi ray flaw detection method

Info

Publication number
FR1220334A
FR1220334A FR787093A FR787093A FR1220334A FR 1220334 A FR1220334 A FR 1220334A FR 787093 A FR787093 A FR 787093A FR 787093 A FR787093 A FR 787093A FR 1220334 A FR1220334 A FR 1220334A
Authority
FR
France
Prior art keywords
detection method
flaw detection
ray flaw
chi
chi ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR787093A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Application granted granted Critical
Publication of FR1220334A publication Critical patent/FR1220334A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F99/00—Subject matter not provided for in other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
FR787093A 1958-02-19 1959-02-18 Chi ray flaw detection method Expired FR1220334A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US1220334XA 1958-02-19 1958-02-19

Publications (1)

Publication Number Publication Date
FR1220334A true FR1220334A (en) 1960-05-24

Family

ID=22400189

Family Applications (1)

Application Number Title Priority Date Filing Date
FR787093A Expired FR1220334A (en) 1958-02-19 1959-02-18 Chi ray flaw detection method

Country Status (1)

Country Link
FR (1) FR1220334A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110118817A (en) * 2019-05-31 2019-08-13 云谷（固安）科技有限公司 Conducting wire testing apparatus and its detection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110118817A (en) * 2019-05-31 2019-08-13 云谷（固安）科技有限公司 Conducting wire testing apparatus and its detection method

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