FI20070846L - Releliitin - Google Patents

Releliitin Download PDF

Info

Publication number: FI20070846L
Authority: FI; Finland
Prior art keywords: relay connector; relay; connector
Prior art date: 2006-11-10

Application number

FI20070846A

Other languages

English (en)

Swedish (sv)

Other versions

FI121100B (fi

FI20070846A0 (fi

Inventor

Hisashi Suzuki

Ryoichi Hirako

Original Assignee

Yokowo Seisakusho Kk

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2006-11-10

Filing date

2007-11-08

Publication date

2008-05-11

2007-10-11 Priority claimed from JP2007265372A external-priority patent/JP4906666B2/ja

2007-11-08 Application filed by Yokowo Seisakusho Kk filed Critical Yokowo Seisakusho Kk

2007-11-08 Publication of FI20070846A0 publication Critical patent/FI20070846A0/fi

2008-05-11 Publication of FI20070846L publication Critical patent/FI20070846L/fi

2010-06-30 Application granted granted Critical

2010-06-30 Publication of FI121100B publication Critical patent/FI121100B/fi

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
Manufacturing & Machinery (AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Tests Of Electronic Circuits (AREA)

FI20070846A 2006-11-10 2007-11-08 Releliitin FI121100B (fi)

Applications Claiming Priority (4)

Application Number	Priority Date	Filing Date	Title
JP2006305363		2006-11-10
JP2006305363		2006-11-10
JP2007265372A JP4906666B2 (ja)	2006-11-10	2007-10-11	中継コネクター
JP2007265372		2007-10-11

Publications (3)

Publication Number	Publication Date
FI20070846A0 FI20070846A0 (fi)	2007-11-08
FI20070846L true FI20070846L (fi)	2008-05-11
FI121100B FI121100B (fi)	2010-06-30

Family

ID=38786633

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FI20070846A FI121100B (fi)	2006-11-10	2007-11-08	Releliitin

Country Status (2)

Country	Link
US (1)	US7656179B2 (fi)
FI (1)	FI121100B (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
TWM354211U (en) *	2008-09-08	2009-04-01	Hon Hai Prec Ind Co Ltd	Electrical connector
JP5393498B2 (ja) *	2010-01-19	2014-01-22	株式会社ヨコオ	中継コネクタ
JP5579547B2 (ja) *	2010-09-07	2014-08-27	株式会社ヨコオ	コネクタ接続用検査治具
US9113781B2 (en)	2013-02-07	2015-08-25	Siemens Aktiengesellschaft	Method and system for on-site learning of landmark detection models for end user-specific diagnostic medical image reading
US9459312B2 (en) *	2013-04-10	2016-10-04	Teradyne, Inc.	Electronic assembly test system
US20140340107A1 (en) *	2013-05-17	2014-11-20	Expert International Mercantile Corporation	Bga test socket
KR101444774B1 (ko) *	2014-03-11	2014-09-26	주식회사 티씨에스	전자부품 테스트용 소켓
CN107782923A (zh) *	2016-08-24	2018-03-09	神讯电脑(昆山)有限公司	测试板对接装置
CN107834254B (zh) *	2017-11-20	2023-09-22	河南思维轨道交通技术研究院有限公司	一种连接器后出线定位结构
KR102698227B1 (ko) *	2019-05-16	2024-08-27	삼성디스플레이 주식회사	커넥터
CN110815095B (zh) *	2019-12-13	2024-04-26	深圳奥维德机电有限公司	一种薄板通用加工治具

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3787768A (en) *	1970-12-25	1974-01-22	Matsushita Electric Ind Co Ltd	Inspection apparatus for printed circuit boards
US4225819A (en) *	1978-10-12	1980-09-30	Bell Telephone Laboratories, Incorporated	Circuit board contact contamination probe
US5572144A (en) *	1993-02-22	1996-11-05	Seagate Technology	Test jig and method for probing a printed circuit board
GB2276281B (en)	1993-03-03	1995-04-12	Centalic Tech Dev Ltd	Testing apparatus for printed circuit boards and the like
JPH08213128A (ja) *	1995-02-08	1996-08-20	Texas Instr Japan Ltd	ソケット
US6046597A (en) *	1995-10-04	2000-04-04	Oz Technologies, Inc.	Test socket for an IC device
US5788526A (en) *	1996-07-17	1998-08-04	Minnesota Mining And Manufacturing Company	Integrated circuit test socket having compliant lid and mechanical advantage latch
JPH11183521A (ja)	1997-12-22	1999-07-09	Yokowo Co Ltd	クリップ式中継コネクタ
US6734690B1 (en) *	2000-04-29	2004-05-11	Hewlett-Packard Development Company, L.P.	Back pressure test fixture to allow probing of integrated circuit package signals
JP2003059602A (ja) *	2001-08-08	2003-02-28	Yamaichi Electronics Co Ltd	半導体装置用ソケット
US6844749B2 (en) *	2002-07-18	2005-01-18	Aries Electronics, Inc.	Integrated circuit test probe
JP2004309441A (ja) *	2003-02-18	2004-11-04	Yamaha Corp	プローブヘッド及びその組立方法並びにプローブカード
JP2004273192A (ja)	2003-03-06	2004-09-30	Yokowo Co Ltd	コネクタ検査用治具
US6856156B2 (en) *	2003-03-26	2005-02-15	Taiwan Semiconductor Manufacturing Co., Ltd	Automatically adjustable wafer probe card
WO2005106512A1 (ja) *	2004-04-30	2005-11-10	Advantest Corporation	マニュアル試験用器具
JP2007294146A (ja)	2006-04-21	2007-11-08	Yamaichi Electronics Co Ltd	位置決め治具
TWM312105U (en) *	2006-05-02	2007-05-11	Hon Hai Prec Ind Co Ltd	Electrical connector
JP2008145248A (ja) *	2006-12-08	2008-06-26	Yokowo Co Ltd	中継コネクタ

2007
- 2007-11-08 US US11/979,851 patent/US7656179B2/en active Active
- 2007-11-08 FI FI20070846A patent/FI121100B/fi active IP Right Grant

Also Published As

Publication number	Publication date
FI121100B (fi)	2010-06-30
US20080129321A1 (en)	2008-06-05
US7656179B2 (en)	2010-02-02
FI20070846A0 (fi)	2007-11-08

Publication	Publication Date	Title
DE602007012332D1 (de)	2011-03-17	Steckverbinder
FR2896094B1 (fr)	2015-05-15	Structure de connecteur
FI20065069L (fi)	2007-08-01	Liitinmekanismi
FI20070636L (fi)	2008-02-24	Liitin
DK1969279T3 (da)	2013-02-04	Koblingsdel til stikforbindelsesindretning
FR2923952B1 (fr)	2015-04-10	Connecteur blinde
DE602007012475D1 (de)	2011-03-24	Relaisserver
EP1930989A4 (en)	2012-04-04	INTERCONNECTS
FI20060131A0 (fi)	2006-02-13	Yhteysjärjestelmä
DE602007004041D1 (de)	2010-02-11	Endgerät
DE602007002124D1 (de)	2009-10-08	Drehbarer Verbinder
DK2038966T3 (da)	2012-12-10	Kompressionsstik
FI20070637L (fi)	2008-02-24	Liitin
DE602006021235D1 (de)	2011-05-19	Kristallglasgegenstand
DE112007002161T8 (de)	2009-09-17	Steckverbindung
DE602006020301D1 (de)	2011-04-07	Schnellverbinder
DE602007010442D1 (de)	2010-12-23	Dispergierbare feuchttücher
DE602007000189D1 (de)	2008-12-04	Hebelsteckverbinder
EP1993243A4 (en)	2011-04-13	TERMINAL
FI20070846L (fi)	2008-05-11	Releliitin
EP1872418A4 (en)	2012-07-25	MECHANICAL AND ELECTRIC CONNECTING LINK
FR2922054B1 (fr)	2011-12-30	Connecteur blinde
FR2905805B1 (fr)	2017-01-27	Connecteur
DK1969280T3 (da)	2009-09-21	Stikdel for stikforbinderindretning
DE102007038963B8 (de)	2010-12-30	Steckverbindereinheit

Legal Events

Date	Code	Title	Description
2010-06-30	FG	Patent granted	Ref document number: 121100 Country of ref document: FI

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