ES525877A0 - Un dispositivo para medir el tiempo de vida de los portadores en obleas semiconductoras - Google Patents

Un dispositivo para medir el tiempo de vida de los portadores en obleas semiconductoras

Info

Publication number: ES525877A0
Authority: ES; Spain
Prior art keywords: semiconductive; lifetime; waves; carriers; measure
Prior art date: 1982-09-24
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

ES525877A

Other languages

English (en)

Other versions

ES8500511A1 (es

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

ExxonMobil Technology and Engineering Co

Original Assignee

Exxon Research and Engineering Co

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1982-09-24

Filing date

1983-09-23

Publication date

1984-10-01

1983-09-23 Application filed by Exxon Research and Engineering Co filed Critical Exxon Research and Engineering Co

1984-10-01 Publication of ES525877A0 publication Critical patent/ES525877A0/es

1984-10-01 Publication of ES8500511A1 publication Critical patent/ES8500511A1/es

Status Expired legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/265—Contactless testing
- G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S136/00—Batteries: thermoelectric and photoelectric
- Y10S136/29—Testing, calibrating, treating, e.g. aging

Landscapes

Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Electromagnetism (AREA)
Toxicology (AREA)
General Physics & Mathematics (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)
Testing Of Individual Semiconductor Devices (AREA)

ES525877A 1982-09-24 1983-09-23 Un dispositivo para medir el tiempo de vida de los portadores en obleas semiconductoras Expired ES8500511A1 (es)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US06/422,669 US4578641A (en)	1982-09-24	1982-09-24	System for measuring carrier lifetime of semiconductor wafers

Publications (2)

Publication Number	Publication Date
ES525877A0 true ES525877A0 (es)	1984-10-01
ES8500511A1 ES8500511A1 (es)	1984-10-01

Family

ID=23675867

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
ES525877A Expired ES8500511A1 (es)	1982-09-24	1983-09-23	Un dispositivo para medir el tiempo de vida de los portadores en obleas semiconductoras

Country Status (6)

Country	Link
US (1)	US4578641A (es)
EP (1)	EP0104889A3 (es)
JP (1)	JPS5982742A (es)
AU (1)	AU1951283A (es)
CA (1)	CA1225435A (es)
ES (1)	ES8500511A1 (es)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4809196A (en) *	1986-04-10	1989-02-28	International Business Machines Corporation	Method for designating/sorting semiconductor wafers according to predicted oxygen precipitation behavior
US4827212A (en) *	1988-01-20	1989-05-02	Semitest, Inc.	Noninvasive method and apparatus for characterization of semiconductors
IT1216540B (it) *	1988-03-29	1990-03-08	Sgs Thomson Microelectronics	Metodo e apparecchiatura per la misura del tempo di vita su giunzioni p_n a semiconduttore tramite effetto fotovoltaiico.
JP2889307B2 (ja) *	1990-03-26	1999-05-10	株式会社東芝	▲ｉｖ▼族半導体のキャリアライフタイム測定法
US5381103A (en) *	1992-10-13	1995-01-10	Cree Research, Inc.	System and method for accelerated degradation testing of semiconductor devices
US5485101A (en) *	1993-04-14	1996-01-16	Hynes; Mark	Frequency analyzer for sub-microsecond testing
JP2970505B2 (ja) *	1995-11-21	1999-11-02	日本電気株式会社	半導体デバイスの配線電流観測方法、検査方法および装置
US20020171441A1 (en) *	2001-05-17	2002-11-21	First Solar Llc	Method and apparatus for accelerated life testing of a solar cell
US7456032B2 (en) *	2005-06-21	2008-11-25	Semicaps Pte Ltd.	Method and system for measuring laser induced phenomena changes in a semiconductor device
US20110169520A1 (en) *	2010-01-14	2011-07-14	Mks Instruments, Inc.	Apparatus for measuring minority carrier lifetime and method for using the same
US20120286806A1 (en) *	2010-01-14	2012-11-15	Francisco Machuca	Measuring Bulk Lifetime
US10564215B2 (en)	2014-07-01	2020-02-18	Raja Technologies Inc.	System and method of semiconductor characterization
US10352989B2 (en) *	2014-07-01	2019-07-16	Raja Technologies Inc.	System and method of semiconductor characterization
DE102016005478B3 (de) *	2016-05-03	2016-12-29	Lpcon Gmbh	Verfahren und Anordnung zur Messung der Lebensdauer von Ladungsträgern in Halbleitern
CN107192933B (zh) *	2017-05-10	2019-07-23	西安工业大学	一种半导体材料载流子有效寿命测量方法
CN113960385B (zh) *	2020-12-29	2024-02-13	广州昆德半导体测试技术有限公司	一种移动式高频光电导载流子寿命测试探头

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US2215213A (en) *	1937-12-11	1940-09-17	Francis C Ellis	Electrode for measuring electrolytic effects
DE1136017B (de) *	1959-09-24	1962-09-06	Telefunken Patent	Verfahren zur Messung der elektrischen Groessen eines Halbleiterkristalls
US3437929A (en) *	1965-08-05	1969-04-08	Electroglas Inc	Automatically indexed probe assembly for testing semiconductor wafers and the like
DE2215138A1 (de) *	1972-03-28	1973-10-04	Siemens Ag	Messplatz fuer kontaktlose lebensdauermessung von minoritaetstraegern an halbleitereinkristallen
DE2328589C3 (de) *	1973-06-05	1981-10-08	Siemens AG, 1000 Berlin und 8000 München	Anordnung zum zerstörungsfreien Messen des örtlichen Verlaufs der Trägerlebensdauer einer Halbleiterscheibe
US4122383A (en) *	1977-12-16	1978-10-24	Nasa	Method and apparatus for measuring minority carrier lifetimes and bulk diffusion length in P-N junction solar cells
US4286215A (en) *	1979-05-18	1981-08-25	Bell Telephone Laboratories, Incorporated	Method and apparatus for the contactless monitoring carrier lifetime in semiconductor materials
JPS579495A (en) *	1980-06-18	1982-01-18	Sanyo Electric Co	Washing machine

1982
- 1982-09-24 US US06/422,669 patent/US4578641A/en not_active Expired - Fee Related
1983
- 1983-09-09 CA CA000436423A patent/CA1225435A/en not_active Expired
- 1983-09-22 EP EP83305617A patent/EP0104889A3/en not_active Withdrawn
- 1983-09-23 AU AU19512/83A patent/AU1951283A/en not_active Abandoned
- 1983-09-23 ES ES525877A patent/ES8500511A1/es not_active Expired
- 1983-09-24 JP JP58175228A patent/JPS5982742A/ja active Pending

Also Published As

Publication number	Publication date
EP0104889A2 (en)	1984-04-04
JPS5982742A (ja)	1984-05-12
EP0104889A3 (en)	1984-12-05
CA1225435A (en)	1987-08-11
US4578641A (en)	1986-03-25
ES8500511A1 (es)	1984-10-01
AU1951283A (en)	1984-03-29

Publication	Publication Date	Title
ES525877A0 (es)	1984-10-01	Un dispositivo para medir el tiempo de vida de los portadores en obleas semiconductoras
ES523148A0 (es)	1984-03-16	Perfeccionamientos en los dispositivos para el calculo previo de la direccion de movimiento y potencia de un vehiculo acuatico
AT345952B (de)	1978-10-10	Zusatzstoffe fuer oelhaltige gemische
AR213572A1 (es)	1979-02-15	Aparato flotante para generar electricidad
IT1193251B (it)	1988-06-15	Dispositivo tenditore per catene
ES525262A0 (es)	1984-11-16	Aparato para maquinar con laser
ES527646A0 (es)	1984-08-16	Perfeccionamientos en los dispositivos de transferencia de soportes para objetos
AR214898A1 (es)	1979-08-15	Vaina para cargas propulsoras
NO832816L (no)	1984-02-07	Festeinnretning for ankermutter
ES542627A0 (es)	1986-09-16	Dispositivo mecanico para sujetar piezas
MX150721A (es)	1984-07-05	Mejoras en aparato para el soporte de cavidades subterraneas
AT356013B (de)	1980-04-10	Unterdusche fuer klosetts
DE3363371D1 (de)	1986-06-12	Autofunction voltmeter
ES252878Y (es)	1982-01-16	Un dispositivo para uso en el reticulo-omaso de un rumiante
BR7705116A (pt)	1978-05-02	Instalacao para exploracao de jazidas petroliferas maritimas
BR8202699A (pt)	1983-04-19	Dispositivo para entesar uma cinta para envolvimento com aros
IT1110483B (it)	1985-12-23	Dispositivo per il trasporto di nastri
AT380756B (de)	1986-07-10	Dreieckgenerator
AT369842B (de)	1983-02-10	Spanndrahthalter fuer zaeune
ES528785A0 (es)	1984-10-01	Sonda para medir el nivel de un liquido
IT1063590B (it)	1985-02-11	Dispositivo di calettamento per corpi rotanti
MX156490A (es)	1988-08-29	Dispositivo para conexion
ES490446A0 (es)	1980-12-16	Aparato para el anclaje de elementos de fijacion
AR220648A1 (es)	1980-11-14	Cepillo para los dientes
IT1164923B (it)	1987-04-15	Dispositivo tenditore per catene