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ES2197796B1 - CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY. - Google Patents

CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.

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Publication number
ES2197796B1
ES2197796B1 ES200200306A ES200200306A ES2197796B1 ES 2197796 B1 ES2197796 B1 ES 2197796B1 ES 200200306 A ES200200306 A ES 200200306A ES 200200306 A ES200200306 A ES 200200306A ES 2197796 B1 ES2197796 B1 ES 2197796B1
Authority
ES
Spain
Prior art keywords
calibration
sensors
quartz
crystal
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES200200306A
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Spanish (es)
Other versions
ES2197796A1 (en
Inventor
Antonio ARNAU VIVES
Yolanda Jimenez Jimenez
Tomas Sogorb Devesa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad Politecnica de Valencia
Original Assignee
Universidad Politecnica de Valencia
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad Politecnica de Valencia filed Critical Universidad Politecnica de Valencia
Priority to ES200200306A priority Critical patent/ES2197796B1/en
Publication of ES2197796A1 publication Critical patent/ES2197796A1/en
Application granted granted Critical
Publication of ES2197796B1 publication Critical patent/ES2197796B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

Sistema de caracterización de sensores de cristal de cuarzo resonante en medios fluidos, y procedimiento de calibración y compensación de la capacidad del cristal de cuarzo. El sistema de la invención suministra continua y automáticamente la frecuencia de resonancia serie y la resistencia de la rama dinámica y de un resonador de cuarzo. La frecuencia suministrada es independiente de la resistencia dinámica y de la capacidad estática del cristal. El sistema está diseñado para compensar los efectos capacitivos en paralelo con el sensor, incorporando un bucle de enganche de fase y un circuito que proporciona la resistencia dinámica del resonador, además, incluye procedimientos para la calibración del circuito externo al sensor y para la compensación capacitiva. La invención tiene utilidad en aplicaciones en que se utilizan resonadores de cuarzo como sensores, tales como: para la determinación de las propiedades visco-elásticas de fluidos, para la detección de especies químicas específicas en entorno gaseoso o en disolución mediante el recubrimiento adecuado del sensor, entre otras.Characterization system of sensors of resonant quartz crystal in fluid media, and procedure of calibration and compensation of the capacity of the quartz crystal. The system of the invention continuously and automatically supplies the series resonance frequency and the resistance of the dynamic branch and a quartz resonator. The frequency supplied is independent of the dynamic resistance and static capacity of the crystal. The system is designed to compensate for capacitive effects in parallel with the sensor, incorporating a phase-locked loop and a circuit that provides the dynamic resistance of the resonator, in addition, it includes procedures for calibration of the circuit external to the sensor and for capacitive compensation . The invention has utility in applications in which quartz resonators are used as sensors, such as: for the determination of visco-elastic properties of fluids, for the detection of specific chemical species in a gaseous environment or in solution by the appropriate coating of the sensor , among other.

ES200200306A 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY. Expired - Fee Related ES2197796B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES200200306A ES2197796B1 (en) 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES200200306A ES2197796B1 (en) 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.

Publications (2)

Publication Number Publication Date
ES2197796A1 ES2197796A1 (en) 2004-01-01
ES2197796B1 true ES2197796B1 (en) 2005-02-16

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
ES200200306A Expired - Fee Related ES2197796B1 (en) 2002-01-31 2002-01-31 CHARACTERIZATION SYSTEM OF RESISTANT CRYSTAL SENSORS IN FLUID MEDIA, AND CALIBRATION AND COMPENSATION PROCEDURE OF THE QUARTZ CRYSTAL CAPACITY.

Country Status (1)

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ES (1) ES2197796B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2333088B2 (en) 2009-06-23 2011-02-07 Universidad Politecnica De Valencia METHOD AND DEVICE OF NANOGRAVIMETRY IN FLUID MEDIA BASED ON PIEZOELECTRIC RESONATORS.

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4447782A (en) * 1982-03-17 1984-05-08 Transat Corp. Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators
US5117192A (en) * 1990-01-12 1992-05-26 Leybold Inficon Inc. Control circuitry for quartz crystal deposition monitor
SE504199C2 (en) * 1995-05-04 1996-12-02 Bengt Kasemo Device for measuring resonant frequency and / or dissipation factor of a piezoelectric crystal microwave
ES2153740B1 (en) * 1998-07-08 2001-10-01 Univ Valencia Politecnica SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

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Publication number Publication date
ES2197796A1 (en) 2004-01-01

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