[go: up one dir, main page]

ES2153740A1 - System for compensating the effects of viscous friction in the measurement of the resonance frequency in a piezometric crystal in a liquid - Google Patents

System for compensating the effects of viscous friction in the measurement of the resonance frequency in a piezometric crystal in a liquid

Info

Publication number
ES2153740A1
ES2153740A1 ES009801475A ES9801475A ES2153740A1 ES 2153740 A1 ES2153740 A1 ES 2153740A1 ES 009801475 A ES009801475 A ES 009801475A ES 9801475 A ES9801475 A ES 9801475A ES 2153740 A1 ES2153740 A1 ES 2153740A1
Authority
ES
Spain
Prior art keywords
measurement
crystal
frequency
piezometric
fluid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES009801475A
Other languages
Spanish (es)
Other versions
ES2153740B1 (en
Inventor
Vives Antonio Arnau
Devesa Tomas Sogorb
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universidad Politecnica de Valencia
Original Assignee
Universidad Politecnica de Valencia
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad Politecnica de Valencia filed Critical Universidad Politecnica de Valencia
Priority to ES9801475A priority Critical patent/ES2153740B1/en
Publication of ES2153740A1 publication Critical patent/ES2153740A1/en
Application granted granted Critical
Publication of ES2153740B1 publication Critical patent/ES2153740B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

Sistema para compensar los efectos de rozamiento viscoso en la medida de la frecuencia de resonancia de un cristal piezométrico en un fluido. Sistema de medida para conocer los parámetros eléctricos de un cristal piezoeléctrico en estado de resonancia y sumergido en un fluido, e indirectamente, medir los cambios de masa superficial del sensor y de variaciones de las propiedades físicas del medio fluido tales como densidad y viscosidad o rozamiento viscoso. Se emplea un método de medida de tipo pasivo donde el resonador es excitado por una fuente externa de frecuencia variable, y que está basado en puentes de impedancia y en líneas de transmisión. El circuito de medida tiene, entre otros, un oscilador controlado por tensión o un sintetizador de frecuencia, un detector de fase y un integrador o convertidor analógicodigital con microprocesador. Se mide la capacidad estática del cristal piezoeléctrico y se compensa mediante un ajuste en componentes pasivos asociados, que varía la frecuencia deenganche. Pertenece al campo de los sensores microgravimétricos y microbalanzas de precisión.System to compensate the effects of viscous friction in the measurement of the resonance frequency of a piezometric crystal in a fluid. Measurement system to know the electrical parameters of a piezoelectric crystal in a state of resonance and immersed in a fluid, and indirectly, to measure the changes in surface mass of the sensor and variations in the physical properties of the fluid medium such as density and viscosity or friction. viscous. A passive type measurement method is used where the resonator is excited by an external source of variable frequency, and which is based on impedance bridges and transmission lines. The measurement circuit has, among others, a voltage controlled oscillator or a frequency synthesizer, a phase detector and an integrator or analog-to-digital converter with a microprocessor. The static capacitance of the piezoelectric crystal is measured and compensated for by an adjustment in associated passive components, which varies the pickup frequency. It belongs to the field of microgravimetric sensors and precision microbalances.

ES9801475A 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID Expired - Fee Related ES2153740B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES9801475A ES2153740B1 (en) 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES9801475A ES2153740B1 (en) 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

Publications (2)

Publication Number Publication Date
ES2153740A1 true ES2153740A1 (en) 2001-03-01
ES2153740B1 ES2153740B1 (en) 2001-10-01

Family

ID=8304487

Family Applications (1)

Application Number Title Priority Date Filing Date
ES9801475A Expired - Fee Related ES2153740B1 (en) 1998-07-08 1998-07-08 SYSTEM TO COMPENSATE THE EFFECTS OF VISCOSE RUSHING IN THE MEASUREMENT OF THE FREQUENCY OF RESONANCE OF A PIEZOMETRIC GLASS IN A FLUID

Country Status (1)

Country Link
ES (1) ES2153740B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2197796A1 (en) * 2002-01-31 2004-01-01 Univ Valencia Politecnica CIRCUIT FOR THE CHARACTERIZATION OF RESISTANT QUARTZ CRYSTAL SENSORS IN FLUID MEDIA.
ES2333088A1 (en) * 2009-06-23 2010-02-16 Universidad Politecnica De Valencia METHOD AND DEVICE OF NANOGRAVIMETRY IN FLUID MEDIA BASED ON PIEZOELECTRIC RESONATORS.

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4447782A (en) * 1982-03-17 1984-05-08 Transat Corp. Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators
US5112642A (en) * 1990-03-30 1992-05-12 Leybold Inficon, Inc. Measuring and controlling deposition on a piezoelectric monitor crystal
US5117192A (en) * 1990-01-12 1992-05-26 Leybold Inficon Inc. Control circuitry for quartz crystal deposition monitor
US5201215A (en) * 1991-10-17 1993-04-13 The United States Of America As Represented By The United States Department Of Energy Method for simultaneous measurement of mass loading and fluid property changes using a quartz crystal microbalance
WO1996035103A1 (en) * 1995-05-04 1996-11-07 Michael Rodahl A piezoelectric crystal microbalance device
US5734098A (en) * 1996-03-25 1998-03-31 Nalco/Exxon Energy Chemicals, L.P. Method to monitor and control chemical treatment of petroleum, petrochemical and processes with on-line quartz crystal microbalance sensors
EP0849907A2 (en) * 1996-09-10 1998-06-24 Tektronix, Inc. Phase measurement apparatus and method
JPH10177049A (en) * 1996-12-18 1998-06-30 Rion Co Ltd Piezoelectric element characteristic test equipment

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4447782A (en) * 1982-03-17 1984-05-08 Transat Corp. Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators
US5117192A (en) * 1990-01-12 1992-05-26 Leybold Inficon Inc. Control circuitry for quartz crystal deposition monitor
US5112642A (en) * 1990-03-30 1992-05-12 Leybold Inficon, Inc. Measuring and controlling deposition on a piezoelectric monitor crystal
US5201215A (en) * 1991-10-17 1993-04-13 The United States Of America As Represented By The United States Department Of Energy Method for simultaneous measurement of mass loading and fluid property changes using a quartz crystal microbalance
WO1996035103A1 (en) * 1995-05-04 1996-11-07 Michael Rodahl A piezoelectric crystal microbalance device
US5734098A (en) * 1996-03-25 1998-03-31 Nalco/Exxon Energy Chemicals, L.P. Method to monitor and control chemical treatment of petroleum, petrochemical and processes with on-line quartz crystal microbalance sensors
EP0849907A2 (en) * 1996-09-10 1998-06-24 Tektronix, Inc. Phase measurement apparatus and method
JPH10177049A (en) * 1996-12-18 1998-06-30 Rion Co Ltd Piezoelectric element characteristic test equipment

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2197796A1 (en) * 2002-01-31 2004-01-01 Univ Valencia Politecnica CIRCUIT FOR THE CHARACTERIZATION OF RESISTANT QUARTZ CRYSTAL SENSORS IN FLUID MEDIA.
ES2333088A1 (en) * 2009-06-23 2010-02-16 Universidad Politecnica De Valencia METHOD AND DEVICE OF NANOGRAVIMETRY IN FLUID MEDIA BASED ON PIEZOELECTRIC RESONATORS.
WO2010149811A1 (en) * 2009-06-23 2010-12-29 Universidad Politécnica De Valencia Method and device for nanogravimetry in fluid media using piezoelectric resonators
CN102625906A (en) * 2009-06-23 2012-08-01 巴伦西亚理工大学 Method and apparatus for nanogravimetry in fluid media using piezoelectric resonators
US8869617B2 (en) 2009-06-23 2014-10-28 Universidad Politecnica De Valencia Method and device for nanogravimetry in fluid media using piezoelectric resonators

Also Published As

Publication number Publication date
ES2153740B1 (en) 2001-10-01

Similar Documents

Publication Publication Date Title
Zeisel et al. A precise and robust quartz sensor based on tuning fork technology for (SF6)-gas density control
Liu et al. Measurement of density and viscosity of dodecane and decane with a piezoelectric tuning fork over 298–448 K and 0.1–137.9 MPa
US10365194B2 (en) High temperature densitometer device and steam quality measurement method and device
Zotov et al. Utilization of mechanical quadrature in silicon MEMS vibratory gyroscope to increase and expand the long term in-run bias stability
ATE487132T1 (en) DEVICE WITH A PIEZOACOUSTIC RESONATOR ELEMENT AND THE USE THEREOF FOR OUTPUTING A SIGNAL DEPENDENT ON A RESONANCE FREQUENCY
JP4126017B2 (en) Apparatus for measuring viscosity and / or density
US20150308911A1 (en) Mechanical resonator sensor
ES2153740A1 (en) System for compensating the effects of viscous friction in the measurement of the resonance frequency in a piezometric crystal in a liquid
US20060232281A1 (en) Method and device for determining the resonant frequency of resonant piezoelectric sensors
CN104180919B (en) High-precision temperature measuring system based on micro resonator
Stokich et al. An instrument for precise measurement of viscoelastic properties of low viscosity dilute macromolecular solutions at frequencies from 20 to 500 kHz
Prikhodko et al. Achieving long-term bias stability in high-Q inertial MEMS by temperature self-sensing with a 0.5 millicelcius precision
JP2006292733A (en) Quartz crystal microbalance sensor
Zhang et al. Shear-mode PMN-PT piezoelectric single crystal resonator for microfluidic applications
Wu et al. Low-power ovenization of fused silica resonators for temperature-stable oscillators
Bund et al. Signal oscillations of a piezoelectric quartz crystal in liquids caused by compressional waves
Prikhodko et al. Thermal calibration of silicon MEMS gyroscopes
US20040189153A1 (en) Piezoelectric resonator element of cyrstallographic point group 32
Han et al. Electrostatic stabilization of thermal variation in quality factor using anchor loss modulation
Tu et al. Ambient temperature and bias conditions induced frequency drifts in an uncompensated SOI piezoresistive resonator
BR0012394B1 (en) A process for reducing inharmonic noise effects that distorts a volume acoustic wave sensor signal, and a sensor circuit for use in measuring concentrations of an analyte in a fluid.
JP2014219373A (en) Resonance detection sensor
Kwon et al. Precise Local Temperature Measurement of Fully Encapsulated Ovenized MEMS Device
US6615664B1 (en) Method of measuring pressure by means of a pressure gauge having a resonant element
JPH0290036A (en) Apparatus for measuring mechanical loss of piezoelectric oscillating element

Legal Events

Date Code Title Description
EC2A Search report published

Date of ref document: 20010301

Kind code of ref document: A1

Effective date: 20010301

FD2A Announcement of lapse in spain

Effective date: 20181026