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EP4143870A4 - DIRECT ELECTRON MANIPULATION X-RAY TRANSMISSION SYSTEM AND METHODS OF USE - Google Patents

DIRECT ELECTRON MANIPULATION X-RAY TRANSMISSION SYSTEM AND METHODS OF USE Download PDF

Info

Publication number
EP4143870A4
EP4143870A4 EP22799636.0A EP22799636A EP4143870A4 EP 4143870 A4 EP4143870 A4 EP 4143870A4 EP 22799636 A EP22799636 A EP 22799636A EP 4143870 A4 EP4143870 A4 EP 4143870A4
Authority
EP
European Patent Office
Prior art keywords
methods
transmission system
ray transmission
direct electron
manipulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP22799636.0A
Other languages
German (de)
French (fr)
Other versions
EP4143870A1 (en
Inventor
Justin CZERNIAWSKI
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rad Source Technologies Inc
Original Assignee
Rad Source Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rad Source Technologies Inc filed Critical Rad Source Technologies Inc
Publication of EP4143870A1 publication Critical patent/EP4143870A1/en
Publication of EP4143870A4 publication Critical patent/EP4143870A4/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/204—Sources of radiation source created from radiated target
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters
EP22799636.0A 2021-05-05 2022-05-05 DIRECT ELECTRON MANIPULATION X-RAY TRANSMISSION SYSTEM AND METHODS OF USE Pending EP4143870A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202163184537P 2021-05-05 2021-05-05
PCT/US2022/027943 WO2022235985A1 (en) 2021-05-05 2022-05-05 Through transmission x-ray system with electron manipulation and methods of use

Publications (2)

Publication Number Publication Date
EP4143870A1 EP4143870A1 (en) 2023-03-08
EP4143870A4 true EP4143870A4 (en) 2024-05-15

Family

ID=83932293

Family Applications (1)

Application Number Title Priority Date Filing Date
EP22799636.0A Pending EP4143870A4 (en) 2021-05-05 2022-05-05 DIRECT ELECTRON MANIPULATION X-RAY TRANSMISSION SYSTEM AND METHODS OF USE

Country Status (4)

Country Link
EP (1) EP4143870A4 (en)
JP (1) JP2024541777A (en)
CN (1) CN117529793A (en)
WO (1) WO2022235985A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0319912A2 (en) * 1987-12-07 1989-06-14 Nanodynamics, Incorporated Method and apparatus for investigating materials with X-rays
US20010050972A1 (en) * 2000-06-08 2001-12-13 Medixtec Japan Corporation X-ray generator, X-ray inspector and X-ray generation method
US20080240344A1 (en) * 2005-11-07 2008-10-02 Alfred Reinhold X-ray tomosynthesis device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6333968B1 (en) * 2000-05-05 2001-12-25 The United States Of America As Represented By The Secretary Of The Navy Transmission cathode for X-ray production
EP2742779B1 (en) * 2011-06-09 2017-04-26 Rapiscan Systems, Inc. System and method for x-ray source weight reduction
JP5896649B2 (en) * 2011-08-31 2016-03-30 キヤノン株式会社 Target structure and X-ray generator
US10008359B2 (en) * 2015-03-09 2018-06-26 Varex Imaging Corporation X-ray tube having magnetic quadrupoles for focusing and magnetic dipoles for steering
US9818569B2 (en) * 2014-12-31 2017-11-14 Rad Source Technologies, Inc High dose output, through transmission target X-ray system and methods of use

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0319912A2 (en) * 1987-12-07 1989-06-14 Nanodynamics, Incorporated Method and apparatus for investigating materials with X-rays
US20010050972A1 (en) * 2000-06-08 2001-12-13 Medixtec Japan Corporation X-ray generator, X-ray inspector and X-ray generation method
US20080240344A1 (en) * 2005-11-07 2008-10-02 Alfred Reinhold X-ray tomosynthesis device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2022235985A1 *

Also Published As

Publication number Publication date
EP4143870A1 (en) 2023-03-08
JP2024541777A (en) 2024-11-13
CN117529793A (en) 2024-02-06
WO2022235985A1 (en) 2022-11-10

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A4 Supplementary search report drawn up and despatched

Effective date: 20240415

RIC1 Information provided on ipc code assigned before grant

Ipc: H01J 35/14 20060101ALI20240409BHEP

Ipc: G01N 23/2251 20180101ALI20240409BHEP

Ipc: G01N 23/04 20180101ALI20240409BHEP

Ipc: H01J 35/08 20060101ALI20240409BHEP

Ipc: H01J 35/06 20060101ALI20240409BHEP

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