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EP3524969A4 - X-RAY INSPECTION DEVICE - Google Patents

X-RAY INSPECTION DEVICE Download PDF

Info

Publication number
EP3524969A4
EP3524969A4 EP17858203.7A EP17858203A EP3524969A4 EP 3524969 A4 EP3524969 A4 EP 3524969A4 EP 17858203 A EP17858203 A EP 17858203A EP 3524969 A4 EP3524969 A4 EP 3524969A4
Authority
EP
European Patent Office
Prior art keywords
inspection device
ray inspection
ray
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP17858203.7A
Other languages
German (de)
French (fr)
Other versions
EP3524969C0 (en
EP3524969A1 (en
EP3524969B1 (en
Inventor
Noriaki Ikeda
Sachihiro NAKAGAWA
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
System Square Inc
Original Assignee
System Square Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=61831446&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP3524969(A4) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by System Square Inc filed Critical System Square Inc
Publication of EP3524969A1 publication Critical patent/EP3524969A1/en
Publication of EP3524969A4 publication Critical patent/EP3524969A4/en
Application granted granted Critical
Publication of EP3524969C0 publication Critical patent/EP3524969C0/en
Publication of EP3524969B1 publication Critical patent/EP3524969B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array
    • G01N2223/5015—Detectors array linear array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
EP17858203.7A 2016-10-04 2017-09-20 X-ray inspecting apparatus Active EP3524969B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016196714 2016-10-04
PCT/JP2017/033982 WO2018066364A1 (en) 2016-10-04 2017-09-20 X-ray inspecting device

Publications (4)

Publication Number Publication Date
EP3524969A1 EP3524969A1 (en) 2019-08-14
EP3524969A4 true EP3524969A4 (en) 2020-08-12
EP3524969C0 EP3524969C0 (en) 2024-08-21
EP3524969B1 EP3524969B1 (en) 2024-08-21

Family

ID=61831446

Family Applications (1)

Application Number Title Priority Date Filing Date
EP17858203.7A Active EP3524969B1 (en) 2016-10-04 2017-09-20 X-ray inspecting apparatus

Country Status (6)

Country Link
US (1) US10859516B2 (en)
EP (1) EP3524969B1 (en)
JP (1) JP6569070B2 (en)
CN (1) CN109804239B (en)
PL (1) PL3524969T3 (en)
WO (1) WO2018066364A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6569070B2 (en) * 2016-10-04 2019-09-04 株式会社 システムスクエア X-ray inspection equipment
EP3797057A4 (en) * 2018-05-21 2022-02-23 Rombakh, Volodymyr Pavlovich Non-invasive monitoring of atomic reactions to detect structural failure
JP7123989B2 (en) * 2020-01-30 2022-08-23 アンリツ株式会社 X-ray inspection device
JP2023132587A (en) 2022-03-11 2023-09-22 株式会社イシダ X-ray inspection device and adjustment method therefor
WO2024180606A1 (en) * 2023-02-27 2024-09-06 株式会社システムスクエア X-ray inspection device and program
JP2024132563A (en) 2023-03-17 2024-10-01 株式会社イシダ X-ray inspection apparatus and sensitivity correction method for X-ray inspection apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100119040A1 (en) * 2008-11-11 2010-05-13 Hamamatsu Photonics K.K. Radiation detection device, radiation image acquiring system, and method for detecting radiation
WO2015052000A1 (en) * 2013-10-09 2015-04-16 Koninklijke Philips N.V. Method and device for generating an energy-resolved x-ray image with adapted energy threshold
US20150287193A1 (en) * 2012-12-19 2015-10-08 Kabushiki Kaisha Toshiba X-ray ct apparatus, image processing apparatus, and image processing method

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0810250A (en) 1994-06-30 1996-01-16 Toshiba Corp X-ray ct scanner
JP4665358B2 (en) 2001-07-31 2011-04-06 株式会社島津製作所 X-ray equipment
JP2004008460A (en) 2002-06-06 2004-01-15 Kawasaki Heavy Ind Ltd X-ray energy analysis imaging device
DE102005037367B3 (en) * 2005-08-08 2007-04-05 Siemens Ag Method for an X-ray device
JP4519789B2 (en) * 2006-03-01 2010-08-04 アンリツ産機システム株式会社 X-ray inspection equipment
CN101210971A (en) * 2006-12-31 2008-07-02 同方威视技术股份有限公司 Radioactive matter ray spectral range recognition method and ray spectral range probe system
JP2009014624A (en) * 2007-07-06 2009-01-22 Hamamatsu Photonics Kk Radiation detection apparatus and radiation detection method
JP5297142B2 (en) * 2008-10-09 2013-09-25 アンリツ産機システム株式会社 Foreign object detection method and apparatus
JP2011203160A (en) * 2010-03-26 2011-10-13 Tokyo Institute Of Technology Method and program for reconstruction of x-ray ct image
CN103200873B (en) * 2011-08-18 2015-05-20 株式会社东芝 Photon-counting x-ray computed tomography system and scatter correction method
US9285326B2 (en) * 2012-06-19 2016-03-15 Kabushiki Kaisha Toshiba Sparse and energy discriminating collimated detector elements to assist scatter evaluation in CT imaging
DE102013204264A1 (en) * 2013-03-12 2014-09-18 Siemens Aktiengesellschaft Method for taking an X-ray image and X-ray system
CN104422704B (en) * 2013-08-21 2017-07-25 同方威视技术股份有限公司 Method for decomposing energy spectrum information of X-ray energy spectrum CT and corresponding reconstruction method
JP6569070B2 (en) * 2016-10-04 2019-09-04 株式会社 システムスクエア X-ray inspection equipment

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100119040A1 (en) * 2008-11-11 2010-05-13 Hamamatsu Photonics K.K. Radiation detection device, radiation image acquiring system, and method for detecting radiation
US20150287193A1 (en) * 2012-12-19 2015-10-08 Kabushiki Kaisha Toshiba X-ray ct apparatus, image processing apparatus, and image processing method
WO2015052000A1 (en) * 2013-10-09 2015-04-16 Koninklijke Philips N.V. Method and device for generating an energy-resolved x-ray image with adapted energy threshold

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2018066364A1 *

Also Published As

Publication number Publication date
JP6569070B2 (en) 2019-09-04
CN109804239B (en) 2021-10-15
PL3524969T3 (en) 2024-10-14
JPWO2018066364A1 (en) 2019-03-22
WO2018066364A1 (en) 2018-04-12
EP3524969C0 (en) 2024-08-21
US10859516B2 (en) 2020-12-08
CN109804239A (en) 2019-05-24
EP3524969A1 (en) 2019-08-14
US20190212464A1 (en) 2019-07-11
EP3524969B1 (en) 2024-08-21

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