EP2910334A4 - Polishing method and method for producing alloy material - Google Patents
Polishing method and method for producing alloy materialInfo
- Publication number
- EP2910334A4 EP2910334A4 EP13844066.4A EP13844066A EP2910334A4 EP 2910334 A4 EP2910334 A4 EP 2910334A4 EP 13844066 A EP13844066 A EP 13844066A EP 2910334 A4 EP2910334 A4 EP 2910334A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- alloy material
- producing alloy
- polishing
- polishing method
- producing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/015—Temperature control
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012221448 | 2012-10-03 | ||
PCT/JP2013/076647 WO2014054611A1 (en) | 2012-10-03 | 2013-10-01 | Polishing method and method for producing alloy material |
Publications (2)
Publication Number | Publication Date |
---|---|
EP2910334A1 EP2910334A1 (en) | 2015-08-26 |
EP2910334A4 true EP2910334A4 (en) | 2016-08-03 |
Family
ID=50434937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP13844066.4A Withdrawn EP2910334A4 (en) | 2012-10-03 | 2013-10-01 | Polishing method and method for producing alloy material |
Country Status (7)
Country | Link |
---|---|
US (1) | US20150251293A1 (en) |
EP (1) | EP2910334A4 (en) |
JP (1) | JPWO2014054611A1 (en) |
KR (1) | KR20150065757A (en) |
CN (1) | CN104684684A (en) |
TW (1) | TW201424933A (en) |
WO (1) | WO2014054611A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6415569B2 (en) * | 2014-08-07 | 2018-10-31 | 株式会社フジミインコーポレーテッド | Composition for polishing titanium alloy material |
JP6085708B1 (en) * | 2016-04-01 | 2017-02-22 | 株式会社フジミインコーポレーテッド | Polishing composition for alloy material and method for polishing alloy material |
JP6760880B2 (en) * | 2017-03-31 | 2020-09-23 | 株式会社フジミインコーポレーテッド | Magnesium or magnesium alloy polishing composition and polishing method using it |
KR102349153B1 (en) * | 2019-12-16 | 2022-01-10 | 주식회사 포스코 | Polishing composition for aluminum alloy, manufacturing method thereof, and polishing method using thereof |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001323254A (en) * | 2000-05-12 | 2001-11-22 | Kao Corp | Polishing liquid composition |
JP2004243518A (en) * | 2004-04-08 | 2004-09-02 | Toshiba Corp | Polishing device |
US20060112647A1 (en) * | 2004-11-30 | 2006-06-01 | Kao Corporation | Polishing composition |
US20070010098A1 (en) * | 2005-06-30 | 2007-01-11 | Cabot Microelectronics Corporation | Use of CMP for aluminum mirror and solar cell fabrication |
US20100227435A1 (en) * | 2009-03-09 | 2010-09-09 | Joon-Sang Park | Chemical-mechanical polishing method for polishing phase-change material and method of fabricating phase-change memory device using the same |
JP2010205796A (en) * | 2009-02-27 | 2010-09-16 | Ebara Corp | Substrate processing device and method, semiconductor manufacturing device, semiconductor manufacturing device engineering system, and system |
JP2011219358A (en) * | 2004-02-25 | 2011-11-04 | Hoya Corp | Method for manufacturing glass substrate for mask blank, method for manufacturing mask blank, method for manufacturing exposure mask, method for manufacturing reflective mask blank and method for manufacturing reflective mask blank |
US20120058709A1 (en) * | 2010-09-08 | 2012-03-08 | Makoto Fukushima | Polishing apparatus and method |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01246068A (en) | 1988-03-29 | 1989-10-02 | Kobe Steel Ltd | Mirror face finishing of aluminum alloy substrate |
JPH03228564A (en) | 1990-02-02 | 1991-10-09 | Nkk Corp | Specular finishing method for magnetic disc substrate made of titanium |
JPH07142430A (en) * | 1993-09-24 | 1995-06-02 | Fujitsu Ltd | Semiconductor substrate polishing equipment |
JP3788810B2 (en) * | 1995-02-20 | 2006-06-21 | 株式会社東芝 | Polishing equipment |
US5597442A (en) * | 1995-10-16 | 1997-01-28 | Taiwan Semiconductor Manufacturing Company Ltd. | Chemical/mechanical planarization (CMP) endpoint method using measurement of polishing pad temperature |
JP2005056987A (en) * | 2003-08-01 | 2005-03-03 | Nitta Haas Inc | Polishing apparatus and method |
US8075372B2 (en) * | 2004-09-01 | 2011-12-13 | Cabot Microelectronics Corporation | Polishing pad with microporous regions |
TWI385050B (en) * | 2005-02-18 | 2013-02-11 | Nexplanar Corp | Customized polishing pads for cmp and methods of fabrication and use thereof |
CN101628389A (en) * | 2008-07-17 | 2010-01-20 | 西北工业大学 | Method for grinding plane of TC17 titanium alloy |
WO2010138724A1 (en) * | 2009-05-27 | 2010-12-02 | Rogers Corporation | Polishing pad, polyurethane layer therefor, and method of polishing a silicon wafer |
JP2012148376A (en) * | 2011-01-20 | 2012-08-09 | Ebara Corp | Polishing method and polishing apparatus |
US8821215B2 (en) * | 2012-09-07 | 2014-09-02 | Cabot Microelectronics Corporation | Polypyrrolidone polishing composition and method |
-
2013
- 2013-10-01 WO PCT/JP2013/076647 patent/WO2014054611A1/en active Application Filing
- 2013-10-01 EP EP13844066.4A patent/EP2910334A4/en not_active Withdrawn
- 2013-10-01 US US14/432,905 patent/US20150251293A1/en not_active Abandoned
- 2013-10-01 KR KR1020157010719A patent/KR20150065757A/en not_active Application Discontinuation
- 2013-10-01 JP JP2014539746A patent/JPWO2014054611A1/en active Pending
- 2013-10-01 CN CN201380051652.1A patent/CN104684684A/en active Pending
- 2013-10-02 TW TW102135673A patent/TW201424933A/en unknown
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001323254A (en) * | 2000-05-12 | 2001-11-22 | Kao Corp | Polishing liquid composition |
JP2011219358A (en) * | 2004-02-25 | 2011-11-04 | Hoya Corp | Method for manufacturing glass substrate for mask blank, method for manufacturing mask blank, method for manufacturing exposure mask, method for manufacturing reflective mask blank and method for manufacturing reflective mask blank |
JP2004243518A (en) * | 2004-04-08 | 2004-09-02 | Toshiba Corp | Polishing device |
US20060112647A1 (en) * | 2004-11-30 | 2006-06-01 | Kao Corporation | Polishing composition |
US20070010098A1 (en) * | 2005-06-30 | 2007-01-11 | Cabot Microelectronics Corporation | Use of CMP for aluminum mirror and solar cell fabrication |
JP2010205796A (en) * | 2009-02-27 | 2010-09-16 | Ebara Corp | Substrate processing device and method, semiconductor manufacturing device, semiconductor manufacturing device engineering system, and system |
US20100227435A1 (en) * | 2009-03-09 | 2010-09-09 | Joon-Sang Park | Chemical-mechanical polishing method for polishing phase-change material and method of fabricating phase-change memory device using the same |
US20120058709A1 (en) * | 2010-09-08 | 2012-03-08 | Makoto Fukushima | Polishing apparatus and method |
Non-Patent Citations (1)
Title |
---|
See also references of WO2014054611A1 * |
Also Published As
Publication number | Publication date |
---|---|
US20150251293A1 (en) | 2015-09-10 |
KR20150065757A (en) | 2015-06-15 |
EP2910334A1 (en) | 2015-08-26 |
JPWO2014054611A1 (en) | 2016-08-25 |
WO2014054611A1 (en) | 2014-04-10 |
CN104684684A (en) | 2015-06-03 |
TW201424933A (en) | 2014-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20150428 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
AX | Request for extension of the european patent |
Extension state: BA ME |
|
DAX | Request for extension of the european patent (deleted) | ||
RA4 | Supplementary search report drawn up and despatched (corrected) |
Effective date: 20160630 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: B24B 37/015 20120101AFI20160624BHEP |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20170131 |