EP2278336A3 - Probenverarbeitungsvorrichtung und Steuerungsverfahren dafür - Google Patents

Probenverarbeitungsvorrichtung und Steuerungsverfahren dafür Download PDF

Info

Publication number: EP2278336A3
Authority: EP; European Patent Office
Prior art keywords: specimen processing; processing apparatus; control method; same; specimen
Prior art date: 2009-07-24
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

EP10170607.5A

Other languages

English (en)

French (fr)

Other versions

EP2278336A2 (de

EP2278336B1 (de

Inventor

Takashi Yamato

Hiroshi Kurono

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Sysmex Corp

Original Assignee

Sysmex Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2009-07-24

Filing date

2010-07-23

Publication date

2017-11-15

2010-07-23 Application filed by Sysmex Corp filed Critical Sysmex Corp

2011-01-26 Publication of EP2278336A2 publication Critical patent/EP2278336A2/de

2017-11-15 Publication of EP2278336A3 publication Critical patent/EP2278336A3/de

2019-06-19 Application granted granted Critical

2019-06-19 Publication of EP2278336B1 publication Critical patent/EP2278336B1/de

Status Active legal-status Critical Current

2030-07-23 Anticipated expiration legal-status Critical

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/0092—Scheduling
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
- G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
- G01N35/1011—Control of the position or alignment of the transfer device
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D3/00—Control of position or direction
- G05D3/12—Control of position or direction using feedback
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/25—Chemistry: analytical and immunological testing including sample preparation

Landscapes

Chemical & Material Sciences (AREA)
General Physics & Mathematics (AREA)
Physics & Mathematics (AREA)
General Health & Medical Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
Life Sciences & Earth Sciences (AREA)
Health & Medical Sciences (AREA)
Immunology (AREA)
Pathology (AREA)
Chemical Kinetics & Catalysis (AREA)
Engineering & Computer Science (AREA)
Automation & Control Theory (AREA)
Automatic Analysis And Handling Materials Therefor (AREA)
Analysing Materials By The Use Of Radiation (AREA)

EP10170607.5A 2009-07-24 2010-07-23 Probenverarbeitungsvorrichtung und Steuerungsverfahren dafür Active EP2278336B1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP2009172945A JP5441544B2 (ja)	2009-07-24	2009-07-24	試料分析装置および準備方法

Publications (3)

Publication Number	Publication Date
EP2278336A2 EP2278336A2 (de)	2011-01-26
EP2278336A3 true EP2278336A3 (de)	2017-11-15
EP2278336B1 EP2278336B1 (de)	2019-06-19

Family

ID=43053911

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
EP10170607.5A Active EP2278336B1 (de)	2009-07-24	2010-07-23	Probenverarbeitungsvorrichtung und Steuerungsverfahren dafür

Country Status (4)

Country	Link
US (1)	US9395380B2 (de)
EP (1)	EP2278336B1 (de)
JP (1)	JP5441544B2 (de)
CN (1)	CN101963621B (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP5553554B2 (ja) *	2009-08-27	2014-07-16	シスメックス株式会社	検体分析装置
JP5430615B2 (ja) *	2011-06-28	2014-03-05	株式会社椿本チエイン	試料載置場所読取装置及びコンピュータプログラム
JP5872816B2 (ja) *	2011-08-03	2016-03-01	シスメックス株式会社	検体分析装置
HU228711B1 (en)	2011-08-22	2013-05-28	Diagon Kft	Method and apparatus for feeding cuvetta comprising assay and reagent
US9381524B2 (en)	2011-11-08	2016-07-05	Becton, Dickinson And Company	System and method for automated sample preparation
JP5863550B2 (ja) *	2012-04-24	2016-02-16	株式会社椿本チエイン	試料載置場所読取装置及びコンピュータプログラム
JP6636047B2 (ja) *	2016-01-13	2020-01-29	株式会社日立ハイテクノロジーズ	自動分析装置及びその制御方法
CN107290560B (zh) *	2016-04-05	2022-08-30	深圳迈瑞生物医疗电子股份有限公司	用于多瓶试剂的试剂吸取方法、装置和样本分析仪
JP6948158B2 (ja)	2017-05-29	2021-10-13	シスメックス株式会社	試料処理装置及び試料処理方法
EP3633386B1 (de) *	2017-06-02	2024-06-05	Hitachi High-Tech Corporation	Automatisches analysegerät und analyseverfahren
JP6979054B2 (ja) *	2018-06-27	2021-12-08	シスメックス株式会社	検体分析装置
JP6637550B2 (ja) *	2018-06-27	2020-01-29	シスメックス株式会社	検体分析装置
CN110308269B (zh) *	2019-07-26	2021-05-14	重庆德方信息技术有限公司	用于健康检测装置的检测卡推动机构
US20230114608A1 (en) *	2020-02-21	2023-04-13	Hitachi High-Tech Corporation	Automatic analyzer

Citations (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US20060178763A1 (en) *	2005-02-04	2006-08-10	Fujitsu Limited	Positioning apparatus and method of controlling positioning apparatus
US20080011106A1 (en) *	2006-06-30	2008-01-17	Nobuhiro Kitagawa	Sample analyzer and sample analyzing method
EP1975630A2 (de) *	2007-03-29	2008-10-01	Sysmex Corporation	Probenanalysegerät, Reagensansaugverfahren und Computerprogrammprodukt

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP3500111B2 (ja) *	2000-05-18	2004-02-23	アロカ株式会社	位置ずれ検出装置及び分注装置
JP2004301760A (ja) *	2003-03-31	2004-10-28	Japan Science & Technology Agency	サンプル管理方法、サンプル管理装置、端末装置、サンプル管理プログラムおよびそれを記録したコンピュータ読み取り可能な記録媒体
JP4152351B2 (ja) *	2004-06-17	2008-09-17	シスメックス株式会社	臨床検体処理装置および臨床検体処理システム
US7448487B2 (en) *	2005-03-28	2008-11-11	Sysmex Corporation	Transporting apparatus
ATE405842T1 (de) *	2005-09-21	2008-09-15	Hoffmann La Roche	Verfahren und vorrichtung zur präzisen positionierung einer pipettiervorrichtung
JP4768409B2 (ja) *	2005-11-15	2011-09-07	シスメックス株式会社	試料分析装置、試料分析本体装置、及び試料容器供給装置
JP3122073U (ja) *	2006-03-20	2006-06-01	株式会社日立ハイテクノロジーズ	自動分析装置
JP5009684B2 (ja) *	2006-06-30	2012-08-22	シスメックス株式会社	試料分析装置
JP4906431B2 (ja) *	2006-08-04	2012-03-28	株式会社日立ハイテクノロジーズ	自動分析装置
JP4578519B2 (ja)	2007-12-28	2010-11-10	シスメックス株式会社	臨床検体処理装置および臨床検体処理システム
JP4672034B2 (ja)	2008-02-12	2011-04-20	株式会社日立ハイテクノロジーズ	自動分析装置

2009
- 2009-07-24 JP JP2009172945A patent/JP5441544B2/ja active Active
2010
- 2010-07-23 CN CN2010102347634A patent/CN101963621B/zh active Active
- 2010-07-23 EP EP10170607.5A patent/EP2278336B1/de active Active
- 2010-07-23 US US12/842,566 patent/US9395380B2/en active Active

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US20060178763A1 (en) *	2005-02-04	2006-08-10	Fujitsu Limited	Positioning apparatus and method of controlling positioning apparatus
US20080011106A1 (en) *	2006-06-30	2008-01-17	Nobuhiro Kitagawa	Sample analyzer and sample analyzing method
EP1975630A2 (de) *	2007-03-29	2008-10-01	Sysmex Corporation	Probenanalysegerät, Reagensansaugverfahren und Computerprogrammprodukt

Also Published As

Publication number	Publication date
JP2011027522A (ja)	2011-02-10
CN101963621B (zh)	2013-11-06
CN101963621A (zh)	2011-02-02
US20110020948A1 (en)	2011-01-27
US9395380B2 (en)	2016-07-19
EP2278336A2 (de)	2011-01-26
JP5441544B2 (ja)	2014-03-12
EP2278336B1 (de)	2019-06-19

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