EP1891407A4 - Verstärkungsgeräte und verfahren zu ihrer verwendung - Google Patents

Verstärkungsgeräte und verfahren zu ihrer verwendung

Info

Publication number: EP1891407A4
Authority: EP; European Patent Office
Prior art keywords: methods; boost devices; boost; devices
Prior art date: 2005-06-17
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Ceased

Application number

EP06784915A

Other languages

English (en)

French (fr)

Other versions

EP1891407A2 (de

Inventor

Peter J Morrisroe

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Revvity Inc

Original Assignee

PerkinElmer Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2005-06-17

Filing date

2006-06-15

Publication date

2009-09-23

2005-06-17 Priority claimed from US11/156,249 external-priority patent/US8622735B2/en

2005-06-17 Priority claimed from US11/156,274 external-priority patent/US7742167B2/en

2006-06-15 Application filed by PerkinElmer Inc filed Critical PerkinElmer Inc

2008-02-27 Publication of EP1891407A2 publication Critical patent/EP1891407A2/de

2009-09-23 Publication of EP1891407A4 publication Critical patent/EP1891407A4/de

Status Ceased legal-status Critical Current

Classifications

- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/26—Plasma torches
- H05H1/30—Plasma torches using applied electromagnetic fields, e.g. high frequency or microwave energy
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
- B23K20/106—Features related to sonotrodes
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/72—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flame burners
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7206—Mass spectrometers interfaced to gas chromatograph
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G01N30/724—Nebulising, aerosol formation or ionisation
- G01N30/7246—Nebulising, aerosol formation or ionisation by pneumatic means
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
- G01N30/7273—Desolvation chambers

Landscapes

Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
Plasma & Fusion (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Mechanical Engineering (AREA)
Electromagnetism (AREA)
Spectroscopy & Molecular Physics (AREA)
Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Physical Or Chemical Processes And Apparatus (AREA)
Plasma Technology (AREA)

EP06784915A 2005-06-17 2006-06-15 Verstärkungsgeräte und verfahren zu ihrer verwendung Ceased EP1891407A4 (de)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
US11/156,249 US8622735B2 (en)	2005-06-17	2005-06-17	Boost devices and methods of using them
US11/156,274 US7742167B2 (en)	2005-06-17	2005-06-17	Optical emission device with boost device
PCT/US2006/023277 WO2006138441A2 (en)	2005-06-17	2006-06-15	Boost devices and methods of using them

Publications (2)

Publication Number	Publication Date
EP1891407A2 EP1891407A2 (de)	2008-02-27
EP1891407A4 true EP1891407A4 (de)	2009-09-23

Family

ID=37571144

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
EP06784915A Ceased EP1891407A4 (de)	2005-06-17	2006-06-15	Verstärkungsgeräte und verfahren zu ihrer verwendung

Country Status (6)

Country	Link
EP (1)	EP1891407A4 (de)
JP (1)	JP2008544454A (de)
CN (1)	CN102291921B (de)
AU (1)	AU2006259381B2 (de)
CA (1)	CA2608528C (de)
WO (1)	WO2006138441A2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US7511246B2 (en)	2002-12-12	2009-03-31	Perkinelmer Las Inc.	Induction device for generating a plasma
US7742167B2 (en)	2005-06-17	2010-06-22	Perkinelmer Health Sciences, Inc.	Optical emission device with boost device
US8622735B2 (en)	2005-06-17	2014-01-07	Perkinelmer Health Sciences, Inc.	Boost devices and methods of using them
DE102009004410B4 (de) *	2009-01-13	2011-06-01	Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V.	Vorrichtung und Verfahren von in einer Elektrolytlösung enthaltenen Analytsubstanzen
CN102843851B (zh) *	2012-05-04	2015-01-28	上海华力微电子有限公司	一种等离子发生装置及方法
WO2014011919A2 (en)	2012-07-13	2014-01-16	Perkinelmer Health Sciences, Inc.	Torches and methods of using them
WO2014184947A1 (ja) *	2013-05-17	2014-11-20	株式会社島津製作所	電子捕獲検出器
US10475626B2 (en)	2015-03-17	2019-11-12	Applied Materials, Inc.	Ion-ion plasma atomic layer etch process and reactor
CN110430943A (zh) *	2017-03-21	2019-11-08	诺信公司	改装灯组件和具有集成或改装灯的粉末喷枪
CN109443406B (zh) *	2018-10-19	2021-04-09	中国科学院深圳先进技术研究院	声学流体传感器
CN112782174A (zh) *	2020-12-25	2021-05-11	西南化工研究设计院有限公司	一种高频无极氩放电离子化检测器及气体中硫、磷化合物的分析方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4955717A (en) *	1986-12-02	1990-09-11	Geochemical Services, Inc.	Demand modulated atomization apparatus and method for plasma spectroscopy
US5194731A (en) *	1990-07-24	1993-03-16	Varian Associates, Inc.	Inductively coupled plasma spectroscopy
EP0673186A1 (de) *	1994-03-17	1995-09-20	Fuji Electric Co., Ltd.	Verfahren und Vorrichtung zur Erzeugung eines induzierten Plasmas
US20030080097A1 (en) *	2001-10-05	2003-05-01	Maher Boulos	Multi-coil induction plasma torch for solid state power supply
US20040001295A1 (en) *	2002-05-08	2004-01-01	Satyendra Kumar	Plasma generation and processing with multiple radiation sources

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US3492074A (en) *	1967-11-24	1970-01-27	Hewlett Packard Co	Atomic absorption spectroscopy system having sample dissociation energy control
JPS5532317A (en) *	1978-08-28	1980-03-07	Asahi Chemical Ind	High frequency magnetic field coupling arc plasma reactor
DE2947542A1 (de) *	1979-11-26	1981-06-04	Leybold-Heraeus GmbH, 5000 Köln	Einrichtung zur ueberwachung und/oder steuerung von plasmaprozessen
US4300834A (en) *	1980-05-22	1981-11-17	Baird Corporation	Inductively coupled plasma atomic fluorescence spectrometer
JPS61161138A (ja) *	1985-01-09	1986-07-21	Natl Inst For Res In Inorg Mater	プラズマ利用化学反応装置
DE3521529A1 (de) *	1985-06-15	1987-01-02	Harald Dipl Chem Dr Berndt	Vorrichtung zum zerstaeuben von probenfluessigkeit fuer spektroskopische zwecke
JPS62213056A (ja) *	1986-03-14	1987-09-18	Yokogawa Electric Corp	高周波誘導結合プラズマを用いた分析装置
JPH0624112B2 (ja) *	1986-04-16	1994-03-30	横河電機株式会社	高周波誘導結合プラズマ・質量分析計
JPS62273047A (ja) *	1986-05-22	1987-11-27	Natl Inst For Res In Inorg Mater	燃焼炎複合高周波熱プラズマ発生装置
JPS63158799A (ja) *	1986-12-22	1988-07-01	日本高周波株式会社	多段無電極高周波プラズマ反応装置
JPH0781953B2 (ja) *	1990-02-07	1995-09-06	川崎製鉄株式会社	分析試料の原子化方法
GB9226335D0 (en) *	1992-12-17	1993-02-10	Fisons Plc	Inductively coupled plasma spectrometers and radio-frequency power supply therefor
JPH05119006A (ja) *	1991-10-30	1993-05-14	Mitsubishi Heavy Ind Ltd	炭化水素濃度測定装置
JPH05142200A (ja) *	1991-11-20	1993-06-08	Sumitomo Electric Ind Ltd	元素分析法
US5217362A (en) *	1991-12-30	1993-06-08	Thompson Richard E	Method for enhanced atomization of liquids
JP3116151B2 (ja) *	1993-03-05	2000-12-11	セイコーインスツルメンツ株式会社	加熱気化誘導結合プラズマ質量分析装置
US6639227B1 (en) *	2000-10-18	2003-10-28	Applied Materials, Inc.	Apparatus and method for charged particle filtering and ion implantation
CN2482075Y (zh) *	2001-04-25	2002-03-13	王澎蛟	原子吸收分光光度计
JP2003168594A (ja) *	2001-11-29	2003-06-13	High Frequency Heattreat Co Ltd	高周波熱プラズマ装置
JP2003168595A (ja) *	2001-11-29	2003-06-13	High Frequency Heattreat Co Ltd	高周波熱プラズマ装置
EP1483775B1 (de) *	2002-03-08	2017-10-11	Analytik Jena AG	Plasmamassenspektrometer

2006
- 2006-06-15 EP EP06784915A patent/EP1891407A4/de not_active Ceased
- 2006-06-15 WO PCT/US2006/023277 patent/WO2006138441A2/en active Application Filing
- 2006-06-15 CA CA2608528A patent/CA2608528C/en not_active Expired - Fee Related
- 2006-06-15 JP JP2008517097A patent/JP2008544454A/ja active Pending
- 2006-06-15 CN CN201110096122.1A patent/CN102291921B/zh not_active Expired - Fee Related
- 2006-06-15 AU AU2006259381A patent/AU2006259381B2/en not_active Ceased

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4955717A (en) *	1986-12-02	1990-09-11	Geochemical Services, Inc.	Demand modulated atomization apparatus and method for plasma spectroscopy
US5194731A (en) *	1990-07-24	1993-03-16	Varian Associates, Inc.	Inductively coupled plasma spectroscopy
EP0673186A1 (de) *	1994-03-17	1995-09-20	Fuji Electric Co., Ltd.	Verfahren und Vorrichtung zur Erzeugung eines induzierten Plasmas
US20030080097A1 (en) *	2001-10-05	2003-05-01	Maher Boulos	Multi-coil induction plasma torch for solid state power supply
US20040001295A1 (en) *	2002-05-08	2004-01-01	Satyendra Kumar	Plasma generation and processing with multiple radiation sources

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2006138441A2 *

Also Published As

Publication number	Publication date
CA2608528C (en)	2014-12-23
EP1891407A2 (de)	2008-02-27
WO2006138441A2 (en)	2006-12-28
JP2008544454A (ja)	2008-12-04
CN102291921B (zh)	2014-09-17
CN102291921A (zh)	2011-12-21
AU2006259381A1 (en)	2006-12-28
AU2006259381B2 (en)	2012-01-19
WO2006138441A3 (en)	2007-11-08
CA2608528A1 (en)	2006-12-28

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Legal Events

Date	Code	Title	Description
2008-01-25	PUAI	Public reference made under article 153(3) epc to a published international application that has entered the european phase	Free format text: ORIGINAL CODE: 0009012
2008-02-27	17P	Request for examination filed	Effective date: 20071029
2008-02-27	AK	Designated contracting states	Kind code of ref document: A2 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
2008-02-27	AX	Request for extension of the european patent	Extension state: AL BA HR MK YU
2008-04-09	RAX	Requested extension states of the european patent have changed	Extension state: RS Extension state: MK Extension state: HR Extension state: BA Extension state: AL
2008-09-24	DAX	Request for extension of the european patent (deleted)
2009-09-23	A4	Supplementary search report drawn up and despatched	Effective date: 20090820
2009-09-23	RIC1	Information provided on ipc code assigned before grant	Ipc: H05H 1/30 20060101ALI20090814BHEP Ipc: H01J 49/10 20060101ALI20090814BHEP Ipc: G01J 3/30 20060101AFI20071115BHEP
2010-01-20	17Q	First examination report despatched	Effective date: 20091216
2016-11-11	STAA	Information on the status of an ep patent application or granted ep patent	Free format text: STATUS: EXAMINATION IS IN PROGRESS
2020-11-17	STAA	Information on the status of an ep patent application or granted ep patent	Free format text: STATUS: EXAMINATION IS IN PROGRESS
2021-11-18	REG	Reference to a national code	Ref country code: DE Ref legal event code: R003
2022-02-25	STAA	Information on the status of an ep patent application or granted ep patent	Free format text: STATUS: THE APPLICATION HAS BEEN REFUSED
2022-03-30	18R	Application refused	Effective date: 20211118