EP1774374A2 - Measuring spectral lines from an analyte using multiplexed holograms and polarization manipulation - Google Patents
Measuring spectral lines from an analyte using multiplexed holograms and polarization manipulationInfo
- Publication number
- EP1774374A2 EP1774374A2 EP05776433A EP05776433A EP1774374A2 EP 1774374 A2 EP1774374 A2 EP 1774374A2 EP 05776433 A EP05776433 A EP 05776433A EP 05776433 A EP05776433 A EP 05776433A EP 1774374 A2 EP1774374 A2 EP 1774374A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- polarization
- light
- holographic
- stage
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1838—Holographic gratings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/447—Polarisation spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N2021/216—Polarisation-affecting properties using circular polarised light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N2021/3129—Determining multicomponents by multiwavelength light
- G01N2021/3137—Determining multicomponents by multiwavelength light with selection of wavelengths after the sample
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/317—Special constructive features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/317—Special constructive features
- G01N2021/3177—Use of spatially separated filters in simultaneous way
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/203—Filters having holographic or diffractive elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/32—Holograms used as optical elements
Definitions
- This invention relates generally to measuring analytes in samples based on an electromagnetic spectrum that is characteristic of the analyte and, more specifically, doing so by use of multiplexed holograms and polarization manipulation.
- U.S. Patent No. 5,768,040 presents a spectrometer arrangement which as a composite has a wide field of view.
- the apparatus is composed of multiple spectrometers, each of which is based on spherical convex holographic diffraction gratings and associated reflection optics.
- the cost of the whole apparatus is comprised of a multiplicity of these spectrometers and is prohibitive for many applications.
- the size of such an apparatus would preclude its use where the available space is limited.
- a solution where effectively multiple spectrometers can be multiplexed in the same available space and the cost does not scale strongly with the field of view would be preferable.
- Multiple reflection holograms multiplexed in a single recording medium, can advantageously be used to reflect each useful spectral line of the analyte to either a single detector or to multiple detectors.
- the limiting aperture of the optical system becomes an appreciable fraction of the diameter of the collecting lenses or mirrors, it is unavoidable that the holograms will be illuminated with light distributed over a range of angles rather than by perfectly collimated light.
- the holograms however, have limited acceptance angle over which they have adequate diffraction efficiency. Hence, the amount of light to be collected will typically scale positively with the acceptance angle of the holograms. The range of angles can be reduced at the expense of using larger diameter optics, but with detrimental effects on cost and size.
- a large field of view for the holograms can obviate the need for larger optics or, for a given optics size, can increase the amount of light which is collected. It can be readily shown that for plane holograms, the field of view is maximized for near normal incidence illumination with respect to the fringes that comprise the hologram. However, it can be exceptionally awkward to illuminate reflection holograms at near 90° with respect to the surface, for the reflected light will then return substantially along the same path as the illuminating light and the two beams may be difficult to separate. [07] In addition, it is has been found experimentally that certain scattering processes may produce scattered light which is predominantly polarized.
- the polarization may be well- preserved, even after passing through a turbid medium (such as human tissue) if the scattered light has not been deflected substantially from its original direction.
- a turbid medium such as human tissue
- Inelastic processes such as Raman scattering can provide scattered spectra which contain characteristic spectral signatures of various analytes of interest. If the Raman scattered radiation is collected from a depth within the turbid sample, which is not excessive, it has been found that the scattered radiation is highly polarized.
- Fluorescence arising from the excitation of substances which absorb at the exciting laser wavelength is often the dominant source of noise.
- the fluorescence is generally found to be only weakly polarized, but may be orders of magnitude greater in amplitude than the Raman signals. If a quantitative estimate of the concentration of an analyte is desired, it is desirable to devise an accurate method of subtracting the fluorescence signal from the Raman signal. In addition, it is desirable to preferentially attenuate the fluorescence with respect to the Raman signal in order to improve the signal to noise ratio. It is therefore desirable to find a method whereby the preferential polarization of scattered signals which occurs in some favorable circumstances can be fully exploited to improve signal to noise ratio, and accurately extract the interfering unpolarized radiation.
- spectral lines of the solvent in which the analyte is dissolved it is often very useful to observe spectral lines of the solvent in which the analyte is dissolved to determine the quantity of the solvent in the scattering volume.
- the absolute concentration of the analyte can be determined.
- observation of many spectral lines has required the implementation of a spectrograph with a linear array of detectors to observe the whole spectrum. This can be expensive when a large detector array is required.
- the dark current noise of multiple detectors is additive. Hence, the large array may have inferior signal to noise as compared with a smaller array or a single detector.
- the present invention provides for an optical apparatus in which multiplexed holograms are used to achieve the wavelength selectivity and polarization manipulation is used to facilitate near-normal incidence of light on the holograms.
- the polarization manipulation allows light reflected from the holograms to be separated from the light incident on the holograms.
- One benefit of normal incidence is an expanded angular field of view for the holograms.
- the expanded field of view permits the use of smaller light gathering optics and/or larger apertures within the optical collection system. Larger apertures can be used to increase the size of the scattering volume being imaged, thus increasing the signal produced by the analyte of interest.
- a polarization-sensitive assembly separates the incoming light by polarization.
- a polarization beam splitter may separate incoming light into orthogonal linear polarizations.
- the polarization-separated light is incident on one or more holographic assemblies.
- the holographic assemblies contain multiplexed holograms that reflect light within selected wavelength bands; other light is transmitted.
- the wavelength bands may be selected based on the spectral lines of an analyte to be detected.
- the reflected light is separated from the incoming light by the polarization-sensitive assembly, thus allowing normal incidence on the multiplexed holograms.
- the apparatus may also include one or more detectors positioned to receive the reflected light. Different polarizations and/or wavelength bands may be routed to different detectors. In one embodiment, all polarizations and all wavelength bands are received by a single detector. In another embodiment, the wavelength bands are divided. Certain wavelength bands are received by one detector, other wavelengths bands by a second detector, and so on. This can be achieved by orienting the corresponding holograms at different angles. In another embodiment, different polarizations are received by different detectors. Combinations of these can also be implemented.
- the signals arising from the orthogonal polarization can be used to subtract the noise arising from unwanted radiation sources which are substantially present in both polarizations.
- unwanted radiation sources may include fluorescence from biological samples.
- the polarization containing the scattered signal from the analyte is received at one detector and the orthogonal polarization (mostly noise with low to no analyte scatter signal) is received at a separate detector.
- the two detector signals can then be processed to remove noise from the signal containing the scattered signal from the analyte.
- the same holographic assembly is used for both polarizations.
- One polarization is incident on the front side; the other is incident on the back side. In this way, both polarizations will experience the same hologram diffraction efficiency, field of view, etc.
- the incident and reflected beams from the holographic assembly are separated by using a quarterwave plate.
- the polarization of the incident beam passes through the quarterwave plate and is converted from linear polarization to circular polarization.
- the beam then reflects off the multiplexed holograms.
- the reflected beam again passes through the quarterwave plate and is converted from circular to linear polarization, but orthogonal to the incident beam. The difference in polarization is used to separate the two beams.
- more than one set of wavelength bands can be interrogated.
- Different holographic assemblies contain multiplexed holograms that implement different sets of wavelength bands.
- one holographic assembly may select wavelength bands based on the spectral lines of a target analyte
- another holographic assembly may select wavelength bands based on the spectra lines for some other substance that may be present
- a third holographic assembly may select wavelength bands for the solvent in which the analyte is dissolved.
- the different polarizations can be routed to different combinations of these holographic assemblies and/or the reflected light can be routed to different combinations of detectors.
- the routings can also vary as a function of time (i.e., time multiplexing).
- active polarization rotators change which holographic assemblies are used, thus changing the wavelength composition of the reflected light.
- an active polarization rotator is switched between two states. In one state, the analyte wavelengths are routed to a detector. In the other state, the analyte wavelengths plus other wavelengths (e.g., of a confounding substance that partially overlaps with the analyte signal) are routed to the detector. By comparing the two signals, the strength of the analyte and/or the other substance can be determined.
- the system is designed in a modular fashion, using cascadeable stages.
- the basic design of a stage is modular, allowing additional stages to be added. Thus, one stage may be designed to detect a first set of wavelength bands, but additional stages could be added to detect second, third, etc. sets of wavelength bands.
- the methods for routing wavelengths and polarizations of the scattered signals from analytes are equally applicable to the routing of multiple wavelengths and polarizations to different destinations from optical sources, such as lasers. In any particular system, similar techniques can be used to route both source wavelengths and polarizations to different destinations and/or scattered wavelengths and polarizations to different detectors.
- Other aspects of the invention include methods and applications corresponding to the devices and systems described above.
- Figure 1 is a block diagram of a device according to the invention.
- Figures 2a and 2b are diagrams illustrating wavelength routing by the wavelength router of Figure 1.
- Figure 3 is a diagram of an optical spectroscopic device according to the invention.
- Figure 4 is a graph of reflectivity as a function of wavelength for the multiplexed reflection holograms.
- Figure 5 is a diagram which shows the relationship between the aperture in the optical system and the focal length of the light gathering optic in establishing the field of view.
- Figure 6 shows a variation of the optical spectroscopic apparatus of Figure 3, in which incident radiation in two substantially orthogonal linear polarizations is diverted to two distinct detectors.
- Figure 7 shows a variation of the optical spectroscopic apparatus of Figure 3, in which a common holographic assembly is used to diffract both orthogonal linear polarizations.
- Figure 8 is a diagram of another optical spectroscopic device according to the invention.
- Figure 9 shows a variation of the optical spectroscopic apparatus of Figure 8.
- Figure 1 is a high-level block diagram of a device according to the invention, primarily showing the optical functionality of the major components within the device.
- the device includes four sources S1-S4, two detectors 1140A-B 5 a reference cell 1125 and shutter 1120, a sample 1135 and shutter 1130, and a wavelength/polarization router 1110.
- the device operates as follows.
- the sources S1-S4 produce light that is routed by the wavelength/polarization router 1110 to the reference cell 1125 and/or sample 1135 via the respective shutter 1120,130.
- the shutters 1120,130 allow time gating of the illumination.
- Light scattered from the reference cell 1125 and/or sample 1135 is routed by the router 1110 to the detectors 1140.
- the sources S1-S4 are shown as having a diversity of wavelengths and polarizations (wavelengths 1-2 and polarizations 1-2 in Figure 1).
- the wavelength/polarization router 1110 directs a linear combination of the incident light from the sources S1-S4 via the shutters 1120,130 to the sample 1135 and/or to the reference cell 1125. If Ikj is the intensity of the kth source in the jth polarization, then the intensity I r that illuminates the reference cell 1125 and the intensity I s that illuminates the sample 1135 are given by:
- the wavelength/polarization router 1110 performs passive power splitting of the incoming light to the different outputs.
- the specific functionality can be chosen to route substantially all of a given wavelength and/or polarization to either the reference cell 1125 or sample 1135 by designing the wavelength/polarization router 1110 so that the appropriate coefficient is nominally equal to l or O.
- FIG. 2a is a diagram that shows the wavelength/polarization routing in a pictorial diagram.
- the four arrows on the lefthand side represent illuminating light produced by the four sources S1-S4. Each arrow represents a specific combination of wavelength and polarization.
- Each path from a source to a destination (either reference cell 1125 or sample 1135) represents a predetermined fraction of each input wavelength and polarization diverted to the appropriate destination.
- Light from sources Sl, S2 and S4 is routed by the router 1110 to the reference cell 1125.
- Light from sources S2 and S3 is routed by the router 1110 to the sample 1135.
- each destination is also represented by arrows; the number of arrows is not meant to have a particular meaning for the destinations.
- the number of arrows also is not meant to imply characteristics about the physical location or direction of the optical beams.
- a single arrow does not necessarily correspond to a single physical location or a single incident angle.
- the corresponding light could be contained in a single optical beam illuminating a single location, or a number of separate optical beams illuminating different locations and/or incident at different angles.
- light coming from a source may also be contained in multiple optical beams.
- a scattering signal When light from the router 1110 illuminates either the reference cell 1125 or the sample 1135, a scattering signal is generated.
- the signal typically consists of a multiplicity of spectral lines from the various substances within the reference cell 1125 or the sample 1135. Processes which generate these spectral lines include but are not limited to Raman scattering, second harmonic generation, third harmonic generation, four wave mixing and fluorescence. Any of these processes may produce a spectrum which is characteristic of the analyte to be measured.
- Each incident wavelength from a source can produce a multiplicity of scattered wavelengths by one or several of the above processes.
- each incident wavelength will generate scattered wavelengths at frequencies which are given by the difference of the incident frequency and the characteristic Raman frequencies of the substance. This process is referred to as Stokes Raman scattering. Sum frequency generation also occurs and is referred to as Anti-Stokes Raman scattering.
- the routing scheme be a non-blocking architecture.
- the fraction of light that is diverted to a particular destination at a given wavelength and in a given polarization is substantially independent of the fraction of light that is diverted at any other wavelength and any other polarization or to any other destination (subject to conservation of energy, of course).
- the coefficients A k j need not be correlated and the coefficients B ⁇ need not be correlated.
- the architecture also permits broadcasting, which can be defined as the diversion of a fraction of a given wavelength and polarization to more than one destination.
- the resulting architecture therefore preferably can be a completely general linear non-blocking passive network with broadcast capability.
- the direction of propagation is usually shown as a solid arrow.
- a solid line with arrowheads on both ends usually indicates two optical beams: one propagating in one direction and another propagating in the opposite direction (e.g., as may be the case upon normally incident reflection from a hologram or mirror).
- Linear polarization is usually shown as a dashed arrow if in the plane of the paper and by a circle with an x if orthogonal to the plane of the paper.
- Circular polarization is usually shown by a circle without an x.
- Figure 3 is a diagram of one embodiment illustrating routing of wavelengths from a sample (not shown) to a detector 100.
- Scattered light 5 from the sample is imaged by lens 20.
- the scattered light 5 may contain substantial amounts of radiation in both orthogonal polarizations, as indicated by the dashed arrow 5B and the circle with x 5A.
- the corresponding solid arrows indicate that the scattered light is propagating from left to right in the figure.
- the light 5 is shown as having originated from an aperture 10.
- the aperture need not be located in the position shown, and need not be a physical aperture. In general, the aperture is defined by the optical element which constrains the size of the scattering volume which is imaged by the optical system.
- a polarization beam splitter 30 directs the two orthogonal linear polarizations to different directions, shown as optical beams 32A and 32B.
- the two separate beams of linear polarized light 32A and 32B pass through quarter waveplates 60 and 70, respectively, which transforms the linear polarization to circular polarization, as shown by symbols 62 A and 62B.
- Holographic assemblies 50 and 80 each of which contains a number of multiplexed reflection holograms, reflect the light in selected wavelength bands substantially in the reverse direction (as represented by the return arrowheads in symbols 62A and 62B).
- the polarization is converted from circular to linear polarization, as shown by symbols 64 A and 64B.
- the linear polarizations of the reflected beams 64 A and 64B are orthogonal to the polarization of the original beams 32A and 32B, respectively.
- incident beam 64A passes through as beam 66A
- incident beam 64B is reflected as beam 66B.
- the polarization manipulation results in an output beam 66 that is not propagating along the same path as the incident beam 5.
- the difference in angle between the input beam 5 and output beam 66 is illustrated as being substantially 90°. However, other angles are possible, for example by choosing a different angular orientation of the polarization beam splitter 30 with respect to the direction of propagation. Beams 66 A and 66B have orthogonal polarizations but propagate in the same direction as a result of the operation of polarization beam splitter 30.
- the composite light 66 is focused onto detector 100 by lens 90.
- each holographic assembly contains a number of multiplexed reflection holograms, each hologram having a reflection band.
- Each reflection band is selected preferentially to correspond to a useful spectral line of the analyte or analytes of interest.
- the width of the reflection band is preferentially selected to be approximately the same as the width of the spectral line of the analyte.
- the magnitude of the reflectivity is preferentially selected to be near 100%.
- the holograms In order to diffract substantially all the light originating in the aperture, the holograms should have a field of angular view which exceeds ⁇ . If the field of view is large, then from Eqn. (5) it can be seen that the aperture can be large. The amount of signal that can be collected will scale positively with the size of the limiting aperture of the system. Alternatively, the focal length can be small. For a lens which collects from a fixed solid angle, the diameter of the lenses will scale with the focal length. Accordingly a small focal length lens will have smaller diameter. The cost of optics is a steep function of size. Hence, the reduced diameter of the collection optics can be especially important. Also, some applications are space-constrained, for example where a noninvasive diagnostic instrument must be worn on the body. In these applications, optics size is also especially important.
- the field of view ⁇ defined as the angular deviation from optimal angle for which the diffraction efficiency will go to zero, can be obtained by expanding the Bragg diffraction equation to second order in the angular deviation with result:
- ⁇ is the angle that the incident light makes with the hologram's fringes
- d ⁇ is the angular deviation from nominal
- ⁇ /l is the wavelength deviation from the optimal wavelength ⁇ a, which causes the diffraction efficiency to go to zero.
- the field of view is therefore maximized for angles near 90° where the linear term in Eqn. (6) goes to zero.
- the apparatus of Figure 3 is suitable for increasing the field of view of the holograms because normal incidence is readily achieved, and the retro- reflected light is spatially separated from the incident beam so as to make detection convenient.
- FIG. 6 An example design suitable for separately monitoring the signals in two orthogonal polarizations is shown in Figure 6.
- the apparatus is identical to that of Figure 3, except that polarization beam splitter 40, lens 85, and detector 95 have been added.
- one polarization 66A passes through the polarization beam splitter 40 to produce beam 68A, which is collected by detector 100 as before.
- the other polarization 66B is reflected as beam 68B, which is separately collected by lens 85 and detector 95.
- polarization component 5 A of the incoming light is routed to detector 100 and polarization component 5B is routed to detector 95.
- the spectrum of the scattered light is sampled in each of the two orthogonal polarizations.
- the signal that is desired to be measured is polarized predominantly in one direction and will be substantially detected by one of the two detectors 95, 100.
- the multiplexed holograms 50 and 80 are chosen to be substantially identical.
- the noise is present in both polarizations and hence will be detected by both detectors. If the noise is entirely unpolarized and the signal is entirely polarized, subtraction of the signals emerging from detectors 95 and 100 will extract the noise from the signal.
- the noise may not be perfectly unpolarized.
- the fluorescence noise is split between the two polarizations in the ratio of approximately 47 to 53%.
- this ratio for the class of samples to be measured can be ascertained as can the optical to electrical transfer characteristics of the apparatus for the two polarizations.
- a scaling factor can be introduced between the signals emerging from detectors 95 and 100 prior to subtraction.
- the scaling factor is preferentially calculated such that if only noise was present, the difference between the scaled signal from one detector and the actual signal from the other detector would be nominally zero, except for the irreducible variance in the signals being subtracted which will still contribute to the noise. Such a choice will cause the noise to be significantly cancelled upon subtraction when the signal is present, which is a significant benefit.
- Processing of the two detector signals can be achieved by circuitry, software or other types of conventional logic.
- FIG. 1 An alternate optical arrangement using this approach is presented in Figure 1, where one polarization illuminates the multiplexed holograms from the front and the orthogonal polarization illuminates the multiplexed holograms from the rear.
- This is accomplished through use of mirrors 210 and 220, in conjunction with polarization beam splitter 230, all of which are configured to divert one polarization so as to be incident on the multiplexed holograms 80 from the direction opposite to that of the orthogonal polarization.
- the combination of quarter waveplate 190 with holographic assembly 80 accomplishes the same function as the combination of quarter waveplate 70 with holographic assembly 80.
- the multiplexed holograms 80 will function essentially identically when illuminated from either the front or the rear. Hence, the advantageous objective of creating identical optical transfer functions from the holograms for the two orthogonal polarizations for more accurate subtraction is realized.
- the polarization component 5B is routed in the same manner as in Figure 3.
- Optical beam 5B passes through beam splitter 30, resulting in beam 32B. This passes through wave plate 70, is reflected from holographic assembly 80 and passes back through wave plate 70, resulting in beam 64B. This reflects off beam splitter 30, producing beam 66B which is collected by lens 90 and detector 100.
- Polarization component 5A is routed differently to illuminate the opposite side of holographic assembly 80 (rather than a different holographic assembly 50 as in Figure 3).
- Reflected beam 32A is routed by mirrors 210 and 220 to polarization beam splitter 230.
- This incident beam is reflected by the beam splitter 230 towards the back side of the multiplexed holograms 80 (beam 72A).
- This beam 72A propagates through wave plate 190, is reflected from holographic assembly 80 and passes back through wave plate 190, resulting in beam 74B.
- Beam 74B is orthogonally polarized relative to beam 72A, so it passes through the polarization beam splitter 230 (beam 76B) and is collected by lens 240 and detector 250.
- the multiplexed holograms preferably are manufactured with reflection holograms having a reflection-band width in the range 10-100 cm "1 .
- the pass-band widths are selected by matching them to the actual spectral widths of the lines being measured with appropriate allowances for tolerances.
- Quarter waveplates are advantageously obtained from crystalline quartz, and are preferably anti-reflection (AR) coated on both faces. Lenses should also be similarly coated. Polarization beam splitters are conveniently obtained from dichroic multilayer coatings. The surface upon which the polarization beam splitting coating is not deposited is preferably also AR coated.
- the devices in Figures 3-7 have many commonalities. For example, they all contain some sort of polarization-sensitive assembly that separates the incoming light by polarization and then manipulates the polarization as necessary to achieve the desired routing. In Figure 3, this is achieved elements 30, 60 and 70; in Figure 6, by elements 30, 60, 70 and 90; and in Figure 7, primarily by elements 30,70, 190 and 230.
- the entry for the incoming light is to the right of lens 20 in all three figures; the exit is where the outgoing light leaves the polarization-sensitive assembly to be collected by the detector.
- the wavelength selectivity is achieved by a holographic assembly that contains multiplexed holograms, and the wavelength selection occurs after the incoming light has been separated by polarization.
- Other designs that follow these principles will be apparent.
- the amplitude of these lines then provides a measure of concentration of the confounding substance and may permit accurate subtraction of the spectrum of that substance at each wavelength where there is overlap with the target analyte.
- a more general algorithm may be developed based on regression in which the best fit to the observed spectrum is derived by finding the concentrations of each substance which when summed best match the data.
- inverse methods such as principle components regression, or partial least squares regression can be used based on a training set which contains a range of independently measured concentrations. These techniques typically require additional spectral data distinct from the spectrum of the analyte alone.
- a related problem is that of finding the absolute concentration of the analyte when there is not precise knowledge of the sample volume being measured.
- a ratio of the magnitudes of the spectra of analyte and solvent with appropriate scalings based on the different scattering cross-sections may suffice to obtain the absolute concentration of the analyte.
- additional spectral data is required, in this case that of the solvent.
- FIGS 8 and 9 show devices that include active polarization rotators.
- the active polarization rotators switch the device between two different modes. In one mode, the signal in selected wavelength bands is detected. In the other mode, the signal at those wavelength bands plus signal at additional wavelength bands is detected.
- the wavelength bands that are always present will be referred to as the persistent wavelength bands and the additional wavelength bands will be referred to as the auxiliary wavelength bands.
- the persistent wavelength bands are based on the spectral lines of the target analyte and the auxiliary wavelength bands are based on the spectral lines of some other substance (e.g., the confounding spectra of other substances or the spectra of the solvent).
- the summed spectrum of lines distinct from the analyte can be obtained. If the roles of analyte and other substance are reversed, then the summed spectrum for the analyte can be obtained.
- elements 50 and 80 are holographic assemblies that contain multiplexed holograms. The reflection bands of the multiplexed holograms determine the persistent wavelength bands.
- Element 290 is another holographic assembly that contains multiplexed holograms, the reflection bands of which determine the auxiliary wavelength bands.
- Element 260 is the active polarization rotator.
- the active polarization rotator 260 is advantageously chosen to be a liquid crystal variable retarder with an integral quarter waveplate and may be procured as an assembly.
- Faraday rotator 410 is preferably a magneto-optic crystal in a strong magnetic field or in the case of latching materials, with a built in magnetic field.
- YIG and garnet films are suitable choices. Garnet films can be obtained in latching form obviating the need for a magnet, but are not transparent at all wavelengths of potential interest. YIG is usually suitable if garnet films are not desirable.
- polarization symbols in short dashes indicate components in the persistent wavelength bands.
- Polarization symbols in long dashes indicate components in the auxiliary wavelength bands.
- the incoming light may be unpolarized with both persistent and auxiliary wavelengths.
- the orthogonal polarization components in the persistent band are represented by 5 A and 5B.
- the orthogonal polarization components in the auxiliary band are represented by 105 A and 105B.
- the device in Figure 8 operates the same as the device in Figure 3.
- the physical structure with elements 30, 50, 60, 70, 80, 90 and 100 is the same as in Figure 3.
- the incoming light in the persistent band with polarization 5 A is routed to detector 100 as follows: reflects off beam splitter 30, passes through quarter waveplate 60, reflects off holographic assembly 50, passes back through quarter waveplate 60 (but with orthogonal polarization), and passes through beam splitter 30 on to detector 100.
- the incoming light in the persistent band with polarization 5B is routed to detector 100 as follows: passes through beam splitter 30, passes through quarter waveplate 70, reflects off holographic assembly 80, passes back through quarter waveplate 70 (but with orthogonal polarization), and reflects off beam splitter 30 on to detector 100. [073]
- the remainder of the device is for handling the auxiliary wavelength bands 105.
- polarization 105B is routed to the holographic assembly 290, which selectively reflects the auxiliary wavelength band. The reflected light is then routed to the detector 100.
- component 105B is routed to a beam dump 330.
- component 105A is always routed to beam dump 330.
- Three- quarter waveplate 255 restores the original linear polarization 184B.
- Active polarization rotator 260 either leaves the polarization unchanged 186B or, when turned on, rotates the polarization by 90° as indicated by 286B.
- the on-state of the active polarization rotator 260 results in the light 286B being reflected from polarization beam splitter 270.
- the light 288B is then dumped into the beam dump 330.
- the active polarization rotator 260 is in the off-state, the light 186B is passed by device 270.
- This light 188B passes through quarter waveplate 280.
- Light in the auxiliary band reflects off multiplexed reflection holograms 290 and passes back through quarter waveplate 280.
- the resulting light 192B is orthogonally polarized relative to beam 188B.
- This light 192B is reflected by polarization beam splitter 270.
- It 194B is reflected by mirror 300 and passes through quarter- waveplate 310, which transforms the polarization to circular 196B.
- the circular polarization is restored to linear polarization 198B by quarter waveplate 60, with direction orthogonal to the polarization of the light 194B at mirror 300.
- Polarization beam splitter 30 passes this light, which together with radiation in both polarizations from the persistent band is focused onto detector 100 by lens 90.
- polarization 105 A in this example, is not used.
- This component is routed to holographic assembly 50 (same as component 5A).
- the holographic assembly 50 passes the component.
- the quarter waveplate 60 converts the polarization from circular to linear 172A.
- the beam splitter 270 passes the light to beam dump 330.
- the portion of the apparatus for the auxiliary bands is activated and both the persistent bands 5 and the one polarization of the auxiliary band 105B are routed to the detector 100. Therefore, if the signal obtained in the on-state is subtracted from the signal obtained in the off-state, one obtains a difference signal which is the sum of the wavelength components in the auxiliary wavelength band for one polarization. If the persistent band is selected based on the spectral lines of a target analyte and the auxiliary band is selected based on other spectral lines of some other substance, then the difference will be a measure of the other substance.
- Figure 9 shows one variant. With respect to component 105B, three-quarter waveplate 255 in Figure 8 is replaced with the following elements in sequence from left to right: quarter-waveplate 400, non-reciprocal polarization rotator (e.g., a Faraday rotator) 410 which rotates the polarization by 45°, and half waveplate 420 oriented so as to rotate polarization by 45°. Quarter waveplate 280 from Figure 8 is removed.
- quarter-waveplate 400 non-reciprocal polarization rotator (e.g., a Faraday rotator) 410 which rotates the polarization by 45°
- half waveplate 420 oriented so as to rotate polarization by 45°.
- Quarter waveplate 400 converts circular polarized light 182B to linear polarized light 952B, which is orthogonal to the polarization that is observed for this light just to the left of element 70.
- Faraday rotator 410 rotates the polarization by 45° (symbol 954B).
- Half waveplate 420 rotates the polarization by an additional 45° for light traveling from left to right, yielding beam 956B.
- device 260 When device 260 is on, it rotates the polarization and the resulting light is reflected off beam splitter 270 to beam dump 330.
- the light 966B now has the same polarization and direction as the corresponding component from 5B.
- Polarization beam splitter 30 directs the radiation to lens 90 and thence to detector 100.
- component 105 A is routed to a beam dump 430 directly after holographic assembly 50. This is possible because the device has been modified so that component 105B is routed back through holographic assembly 80 to the detector 100, and not via holographic assembly 50 as was the case in Figure 8.
- FIG. 9 the "arm" to the right of device 80 can be essentially duplicated below device 50 to allow observation of both polarizations 105 A and 105B for the incoming light in the auxiliary wavelength.
- all four incoming components (5 A, 5B, 105 A, 105B) would be routed to a single detector 100.
- different components or combinations of components could be routed to different detectors, thus allowing the comparison and/or combination of various signals.
- a useful variation of this form is to use holographic assemblies with different reflection bands for the two auxiliary arms that emerge from polarization beam splitter 30 (i.e., the arm to the left of holographic assembly 80 and the arm added below holographic assembly 50).
- This permits the use of two different auxiliary wavelength bands, which can provide additional important data for the extraction of confounding spectra or for calibration.
- the architecture in Figure 9 can also be extended to multiple auxiliary wavelength bands by replicating the structure of 260, 270 and 290 but using different reflection bands for each holographic assembly. Consider each combination of 260, 270 and 290 to be a stage. Figure 9 then has a single stage. Now replace the beam dump 330 with a second stage that has different reflection bands.
- polarization rotator 260 in stage 1 is in the off-state, then the light is routed to holographic assembly 290 of stage 1 and the auxiliary band for stage 1 is implemented. If the polarization rotator 260 in stage 1 is in the on-state, then the light is routed to stage 2. If the polarization rotator 260 in stage 2 is in the off-state, then the light is routed to the holographic assembly 290 of stage 2 and the auxiliary band for stage 2 would be implemented. If the polarization rotator 260 in stage 2 is in the on-state, then the light could be routed to a stage 3, and so on. The resulting device can be used to sample different auxiliary bands on a time-multiplexed basis (i.e., different auxiliary bands sampled by the same detector at different times).
- the basic design of Figure 3 could also be cascaded to implement spatial multiplexing (i.e., different bands sampled by different detectors). Wavelengths outside the reflection bands of holographic assembly 80 are passed by the holographic assembly. This can be treated as incoming light (with known polarization) and the basic structure of Figure 3 can be cascaded to sample a different set of wavelength bands by using holographic assemblies with different reflection bands.
- the spatial and time multiplexing approaches can also be combined.
- holograms 290 and beam dump 330 could be transposed, and holograms 290 can be illuminated when 260 is on rather than when it is off. Further, the role of the holograms for the analyte and for interfering substances could be switched. However, analyte signal is usually at a premium and it is preferable to have the analyte signal traverse the minimum number of optical elements. [086] Multiplexed reflection holograms can be of arbitrary diffraction efficiency range from 0 too very near unity. It is therefore possible to write a set of multiplexed holograms having a spectrum which can be written as:
- R( ⁇ ) is the reflection coefficient at wavelength
- ⁇ is the reflection coefficient of each hologram which is designed to diffract each of the wavelengths
- N is the total number of lines it is desired to observe.
- an interfering substance has a spectral line distinct from the analyte as well as overlapping spectral lines. Its interference at the observed wavelengths for the analyte are proportional to the strength of the observed signal at the spectral line distinct from the analyte. The constant of proportionality is a fixed property of the substance and can be measured. Therefore by subtracting from the signal a quantity proportional to the light observed at the distinct spectral line of the interfering substance, the interference can be extracted from the analyte signal. If there are multiple interfering substances this operation can be performed for each. The operation can be represented mathematically as follows:
- D k F E k (9) then a properly weighted measure of the contributions of all the interferers can be obtained directly by choosing the diffraction efficiency of each hologram appropriately.
- the overall constant of proportionality, F in Eqn. (9) is chosen so that the coefficients D k can always be ⁇ 1.0 as is required. It is a fixed number than can be stored in memory and applied to Eqn. (8) as indicated. Note that there is no requirement that only one spectral line for each interferer be selected.
- the holographic assembly 290 in Figures 8 or 9 it is possible also to choose the holographic assembly 290 in Figures 8 or 9 to correspond to advantageous spectral lines of the solvent in which the analyte is dissolved. That permits a straightforward measurement of the quantity of solvent in the scattering volume. The ratio of these signals with that of the analyte yields a correct estimate of the absolute concentration, provided that the ratios of the total scattering cross-sections for the summed lines of the solvent and for the analyte are taken into account through use of a scaling factor.
- holograms having different wavelengths of reflection can be disposed at different angles such that the reflected light can be imaged onto different portions of a detector array. This makes it possible to obtain more detailed spectral information that is otherwise possible.
- Some examples could include the illumination of more than one target location on the sample, or the illumination of a reference cell which has known concentration of analytes of interest.
- the scattered signals can provide useful calibration information, enabling an absolute measure of the concentration of one or more analytes.
- a given device may employ these embodiments in combination to route both source and scattered wavelengths and polarizations to desired multiple destinations.
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US11/187,350 US7277210B2 (en) | 2005-07-21 | 2005-07-21 | Measuring spectral lines from an analyte using multiplexed holograms and polarization manipulation |
PCT/US2005/026039 WO2006012514A2 (en) | 2004-07-22 | 2005-07-22 | Measuring spectral lines from an analyte using multiplexed holograms and polarization manipulation |
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EP0930485A2 (en) * | 1998-01-16 | 1999-07-21 | Thilo Weitzel | Device to detect or to create optical signals |
US5999282A (en) * | 1995-11-08 | 1999-12-07 | Victor Company Of Japan, Ltd. | Color filter and color image display apparatus employing the filter |
WO2002001268A1 (en) * | 2000-06-27 | 2002-01-03 | Optichrom Inc. | Optical spectrum analyzer |
US6525846B1 (en) * | 2000-09-26 | 2003-02-25 | Aoc Technologies, Inc. | Wavelength division multiplex/demultiplexing device |
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CA2337097C (en) * | 1998-07-13 | 2008-12-23 | James L. Lambert | Non-invasive glucose monitor |
US6542134B1 (en) * | 1999-03-24 | 2003-04-01 | Intel Corporation | Projection system |
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US5999282A (en) * | 1995-11-08 | 1999-12-07 | Victor Company Of Japan, Ltd. | Color filter and color image display apparatus employing the filter |
EP0930485A2 (en) * | 1998-01-16 | 1999-07-21 | Thilo Weitzel | Device to detect or to create optical signals |
WO2002001268A1 (en) * | 2000-06-27 | 2002-01-03 | Optichrom Inc. | Optical spectrum analyzer |
US6525846B1 (en) * | 2000-09-26 | 2003-02-25 | Aoc Technologies, Inc. | Wavelength division multiplex/demultiplexing device |
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