EP1440332A4 - X-ray image acquisition apparatus - Google Patents

X-ray image acquisition apparatus

Info

Publication number: EP1440332A4
Authority: EP; European Patent Office
Prior art keywords: image acquisition; ray image; acquisition apparatus; ray; image
Prior art date: 2001-11-02
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

EP02802814A

Other languages

German (de)

French (fr)

Other versions

EP1440332B1 (en

EP1440332A1 (en

Inventor

Edward J Seppi

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Varian Medical Systems Inc

Original Assignee

Varian Medical Systems Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2001-11-02

Filing date

2002-10-30

Publication date

2010-11-10

2002-10-30 Application filed by Varian Medical Systems Inc filed Critical Varian Medical Systems Inc

2004-07-28 Publication of EP1440332A1 publication Critical patent/EP1440332A1/en

2010-11-10 Publication of EP1440332A4 publication Critical patent/EP1440332A4/en

2018-10-03 Application granted granted Critical

2018-10-03 Publication of EP1440332B1 publication Critical patent/EP1440332B1/en

2022-10-30 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator

Landscapes

High Energy & Nuclear Physics (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
General Physics & Mathematics (AREA)
Molecular Biology (AREA)
Spectroscopy & Molecular Physics (AREA)
Crystallography & Structural Chemistry (AREA)
Chemical & Material Sciences (AREA)
Measurement Of Radiation (AREA)
Apparatus For Radiation Diagnosis (AREA)
Solid State Image Pick-Up Elements (AREA)
Transforming Light Signals Into Electric Signals (AREA)

EP02802814.0A 2001-11-02 2002-10-30 X-ray image acquisition apparatus Expired - Lifetime EP1440332B1 (en)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
US10/013,199 US6800858B1 (en)	2001-11-02	2001-11-02	X-ray image acquisition apparatus
US13199		2001-11-02
PCT/US2002/034962 WO2003040756A1 (en)	2001-11-02	2002-10-30	X-ray image acquisition apparatus

Publications (3)

Publication Number	Publication Date
EP1440332A1 EP1440332A1 (en)	2004-07-28
EP1440332A4 true EP1440332A4 (en)	2010-11-10
EP1440332B1 EP1440332B1 (en)	2018-10-03

Family

ID=21758766

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
EP02802814.0A Expired - Lifetime EP1440332B1 (en)	2001-11-02	2002-10-30	X-ray image acquisition apparatus

Country Status (4)

Country	Link
US (2)	US6800858B1 (en)
EP (1)	EP1440332B1 (en)
JP (1)	JP5016180B2 (en)
WO (1)	WO2003040756A1 (en)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6800858B1 (en) *	2001-11-02	2004-10-05	Varian Medical Systems Technologies, Inc.	X-ray image acquisition apparatus
US9958569B2 (en) *	2002-07-23	2018-05-01	Rapiscan Systems, Inc.	Mobile imaging system and method for detection of contraband
US7356115B2 (en) *	2002-12-04	2008-04-08	Varian Medical Systems Technology, Inc.	Radiation scanning units including a movable platform
US7672426B2 (en) *	2002-12-04	2010-03-02	Varian Medical Systems, Inc.	Radiation scanning units with reduced detector requirements
US7945021B2 (en) *	2002-12-18	2011-05-17	Varian Medical Systems, Inc.	Multi-mode cone beam CT radiotherapy simulator and treatment machine with a flat panel imager
DE10320862B4 (en) *	2003-05-09	2007-09-06	Siemens Ag	Method for automatically adjusting a diaphragm, as well as X-ray system
US7015479B2 (en) *	2003-07-31	2006-03-21	Eastman Kodak Company	Digital film grain
US7649981B2 (en) *	2003-10-15	2010-01-19	Varian Medical Systems, Inc.	Multi-energy x-ray source
US20050082491A1 (en) *	2003-10-15	2005-04-21	Seppi Edward J.	Multi-energy radiation detector
US7869862B2 (en)	2003-10-15	2011-01-11	Varian Medical Systems, Inc.	Systems and methods for functional imaging using contrast-enhanced multiple-energy computed tomography
US20070003010A1 (en)	2005-04-29	2007-01-04	Varian Medical Systems Technologies, Inc.	Radiation systems with imaging capability
US7561665B2 (en) *	2005-10-07	2009-07-14	Varian Medical Systems, Inc.	Dual pulse imaging
US7394889B2 (en)	2006-05-18	2008-07-01	Varian Medical Systems Technologies, Inc.	Contrast-enhanced cone beam X-ray imaging, evaluation, monitoring and treatment delivery
WO2008133765A2 (en)	2007-02-13	2008-11-06	Sentinel Scanning Corporation	Ct scanning and contraband detection
US7848488B2 (en) *	2007-09-10	2010-12-07	Varian Medical Systems, Inc.	Radiation systems having tiltable gantry
US20100128839A1 (en) *	2008-11-21	2010-05-27	Varian Medical Systems, Inc.	Structure and Procedure for X-Ray CT Guided Cancer Treatment
US8340245B2 (en)	2009-06-05	2012-12-25	Sentinel Scanning Corporation	Transportation container inspection system and method
US8822932B2 (en)	2012-01-17	2014-09-02	General Electric Company	Apparatus and system for inspecting structures
JP6025456B2 (en) *	2012-08-28	2016-11-16	キヤノン株式会社	Subject information acquisition apparatus, display method, and program
WO2016143401A1 (en) *	2015-03-10	2016-09-15	株式会社島津製作所	X-ray detector
US10806409B2 (en)	2016-09-23	2020-10-20	Varian Medical Systems International Ag	Medical systems with patient supports

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4362946A (en)	1977-11-21	1982-12-07	General Electric Company	Distributed phosphor scintillator structures
US4262202A (en)	1979-08-27	1981-04-14	General Electric Company	Scintillator detector array
JPS6243585A (en) *	1985-08-21	1987-02-25	Toshiba Corp	Detector for x ray ct
US4870667A (en) *	1985-08-29	1989-09-26	Picker International, Inc.	Radiation detector
JPH02291842A (en) *	1989-05-02	1990-12-03	Mitsubishi Electric Corp	X-ray ct apparatus
US5150394A (en) *	1989-12-05	1992-09-22	University Of Massachusetts Medical School	Dual-energy system for quantitative radiographic imaging
US5187369A (en) *	1990-10-01	1993-02-16	General Electric Company	High sensitivity, high resolution, solid state x-ray imaging device with barrier layer
US5144141A (en)	1991-08-19	1992-09-01	General Electric Company	Photodetector scintillator radiation imager
US5233990A (en) *	1992-01-13	1993-08-10	Gideon Barnea	Method and apparatus for diagnostic imaging in radiation therapy
GB9200828D0 (en)	1992-01-15	1992-03-11	Image Research Ltd	Improvements in and relating to material identification using x-rays
JP3075647B2 (en) *	1992-12-25	2000-08-14	株式会社日立製作所	Design method of X-ray inspection apparatus and X-ray inspection apparatus
JPH06289142A (en) *	1993-04-05	1994-10-18	Shin Etsu Chem Co Ltd	Detector of radioactive ray and device therefor
JPH07148148A (en) *	1993-11-29	1995-06-13	Toshiba Corp	Two-dimensional array shaped radiation detector for x-ray ct apparatus
US5636299A (en) *	1994-12-28	1997-06-03	Lockheed Missiles & Space Company, Inc.	Hybrid luminescent device and method for imaging penetrating radiation
JP3332200B2 (en) *	1995-11-29	2002-10-07	日立金属株式会社	Radiation detector for X-ray CT
CA2194942A1 (en) *	1996-01-18	1997-07-19	William P. Novak	Radiation detector with improved response
JP3339285B2 (en) *	1996-02-02	2002-10-28	松下電器産業株式会社	X-ray imaging device
US5854684A (en)	1996-09-26	1998-12-29	Sarnoff Corporation	Massively parallel detection
US5956382A (en) *	1997-09-25	1999-09-21	Eliezer Wiener-Avnear, Doing Business As Laser Electro Optic Application Technology Comp.	X-ray imaging array detector and laser micro-milling method for fabricating array
US6114703A (en) *	1997-10-21	2000-09-05	The Regents Of The University Of California	High resolution scintillation detector with semiconductor readout
US6236051B1 (en)	1998-03-27	2001-05-22	Kabushiki Kaisha Toshiba	Semiconductor radiation detector
US6429578B1 (en) *	1999-01-26	2002-08-06	Mats Danielsson	Diagnostic and therapeutic detector system for imaging with low and high energy X-ray and electrons
JP2001174564A (en) *	1999-12-15	2001-06-29	Ge Yokogawa Medical Systems Ltd	X-ray detector and x-ray computed tomograph
EP2311526A3 (en) *	2000-02-18	2011-12-07	William Beaumont Hospital	Cone-beam computerized tomography with a flat-panel imager
US6553092B1 (en) *	2000-03-07	2003-04-22	Koninklijke Philips Electronics, N.V.	Multi-layer x-ray detector for diagnostic imaging
US6630675B2 (en) *	2000-07-26	2003-10-07	Siemens Medical Solutions Usa, Inc.	X-ray scintillator compositions for X-ray imaging applications
US6487274B2 (en) *	2001-01-29	2002-11-26	Siemens Medical Solutions Usa, Inc.	X-ray target assembly and radiation therapy systems and methods
US6800858B1 (en) *	2001-11-02	2004-10-05	Varian Medical Systems Technologies, Inc.	X-ray image acquisition apparatus

2001
- 2001-11-02 US US10/013,199 patent/US6800858B1/en not_active Expired - Lifetime
2002
- 2002-10-30 WO PCT/US2002/034962 patent/WO2003040756A1/en active Application Filing
- 2002-10-30 EP EP02802814.0A patent/EP1440332B1/en not_active Expired - Lifetime
- 2002-10-30 JP JP2003542345A patent/JP5016180B2/en not_active Expired - Fee Related
2004
- 2004-10-04 US US10/959,034 patent/US7244943B2/en not_active Expired - Fee Related

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
No further relevant documents disclosed *

Also Published As

Publication number	Publication date
US20050045828A1 (en)	2005-03-03
JP2005508504A (en)	2005-03-31
EP1440332B1 (en)	2018-10-03
US7244943B2 (en)	2007-07-17
EP1440332A1 (en)	2004-07-28
WO2003040756A1 (en)	2003-05-15
US6800858B1 (en)	2004-10-05
JP5016180B2 (en)	2012-09-05

Publication	Publication Date	Title
HK1061594A1 (en)	2004-09-24	Image acquisition apparatus
AU4175801A (en)	2001-09-03	Improved imaging apparatus
EP1440332A4 (en)	2010-11-10	X-ray image acquisition apparatus
AU146268S (en)	2001-12-13	Image forming apparatus
EP1333667A4 (en)	2006-12-27	Iris imaging apparatus
AU2002348320A8 (en)	2003-06-10	X-ray fluoroscopic imaging
AU4082801A (en)	2001-09-24	Imaging apparatus
IL151845A0 (en)	2003-04-10	Panoramic image acquisition device
GB2383245B (en)	2005-05-18	Image processing apparatus
AU146251S (en)	2001-12-13	Image forming apparatus
GB2374267B (en)	2004-06-16	X-ray inspection apparatus
GB0110577D0 (en)	2001-06-20	Image analysis apparatus
EP1324021A4 (en)	2005-08-31	Imaging apparatus
EP1279058A4 (en)	2003-06-04	Image viewing apparatus
GB2378605B (en)	2003-12-31	Environmental imaging apparatus
GB0215248D0 (en)	2002-08-14	Imaging apparatus
AU2002222421A8 (en)	2008-01-10	Cmos imaging apparatus
EP1331526A4 (en)	2007-12-12	Imaging apparatus
HK1048667A1 (en)	2003-04-11	Image forming apparatus
GB2398449B (en)	2005-09-07	Imaging apparatus
GB0019394D0 (en)	2001-09-19	Imaging apparatus
GB0018017D0 (en)	2000-09-13	Imaging apparatus
TW510627U (en)	2002-11-11	Image scanning apparatus
GB0301800D0 (en)	2003-02-26	Portable x-ray imaging apparatus
GB0124608D0 (en)	2001-12-05	Image capture apparatus

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