EP1225972A4 - Pattern dependent surface profile evolution of electrochemically deposited metal - Google Patents
Pattern dependent surface profile evolution of electrochemically deposited metalInfo
- Publication number
- EP1225972A4 EP1225972A4 EP00975648A EP00975648A EP1225972A4 EP 1225972 A4 EP1225972 A4 EP 1225972A4 EP 00975648 A EP00975648 A EP 00975648A EP 00975648 A EP00975648 A EP 00975648A EP 1225972 A4 EP1225972 A4 EP 1225972A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- surface profile
- deposited metal
- electrochemically deposited
- pattern dependent
- dependent surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
- C25D5/611—Smooth layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76877—Filling of holes, grooves or trenches, e.g. vias, with conductive material
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Electroplating Methods And Accessories (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15595999P | 1999-09-24 | 1999-09-24 | |
US155959P | 1999-09-24 | ||
PCT/US2000/040985 WO2001021294A2 (en) | 1999-09-24 | 2000-09-25 | Pattern dependent surface profile evolution of electrochemically deposited metal |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1225972A2 EP1225972A2 (en) | 2002-07-31 |
EP1225972A4 true EP1225972A4 (en) | 2006-08-30 |
Family
ID=22557472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00975648A Withdrawn EP1225972A4 (en) | 1999-09-24 | 2000-09-25 | Pattern dependent surface profile evolution of electrochemically deposited metal |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP1225972A4 (en) |
WO (1) | WO2001021294A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10223957B4 (en) * | 2002-05-31 | 2006-12-21 | Advanced Micro Devices, Inc., Sunnyvale | An improved method of electroplating copper on a patterned dielectric layer |
EP1475463B2 (en) * | 2002-12-20 | 2017-03-01 | Shipley Company, L.L.C. | Reverse pulse plating method |
DE10314502B4 (en) * | 2003-03-31 | 2008-06-12 | Advanced Micro Devices, Inc., Sunnyvale | Process for the electrolytic coating of a semiconductor structure |
DE102004041813A1 (en) * | 2004-08-26 | 2006-03-02 | Siemens Ag | Surface having an adhesion reducing microstructure and method of making the same |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989007162A1 (en) * | 1988-01-27 | 1989-08-10 | Jct Controls Limited | Electrochemical processes |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3770598A (en) * | 1972-01-21 | 1973-11-06 | Oxy Metal Finishing Corp | Electrodeposition of copper from acid baths |
US4396467A (en) * | 1980-10-27 | 1983-08-02 | General Electric Company | Periodic reverse current pulsing to form uniformly sized feed through conductors |
US5223118A (en) * | 1991-03-08 | 1993-06-29 | Shipley Company Inc. | Method for analyzing organic additives in an electroplating bath |
US5972192A (en) * | 1997-07-23 | 1999-10-26 | Advanced Micro Devices, Inc. | Pulse electroplating copper or copper alloys |
-
2000
- 2000-09-25 WO PCT/US2000/040985 patent/WO2001021294A2/en active Application Filing
- 2000-09-25 EP EP00975648A patent/EP1225972A4/en not_active Withdrawn
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989007162A1 (en) * | 1988-01-27 | 1989-08-10 | Jct Controls Limited | Electrochemical processes |
Also Published As
Publication number | Publication date |
---|---|
WO2001021294A2 (en) | 2001-03-29 |
WO2001021294A3 (en) | 2001-10-04 |
EP1225972A2 (en) | 2002-07-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20020412 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20060802 |
|
17Q | First examination report despatched |
Effective date: 20090313 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20090924 |