EP1066899B1 - Verfahren zur Herstellung eines Sputtertargets - Google Patents
Verfahren zur Herstellung eines Sputtertargets Download PDFInfo
- Publication number
- EP1066899B1 EP1066899B1 EP00114459A EP00114459A EP1066899B1 EP 1066899 B1 EP1066899 B1 EP 1066899B1 EP 00114459 A EP00114459 A EP 00114459A EP 00114459 A EP00114459 A EP 00114459A EP 1066899 B1 EP1066899 B1 EP 1066899B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- powder
- thermal plasma
- target
- sintering
- purity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005477 sputtering target Methods 0.000 title claims description 13
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 239000000843 powder Substances 0.000 claims description 96
- 238000000034 method Methods 0.000 claims description 34
- 238000005245 sintering Methods 0.000 claims description 30
- 229910052751 metal Inorganic materials 0.000 claims description 24
- 239000002184 metal Substances 0.000 claims description 24
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 21
- 239000001301 oxygen Substances 0.000 claims description 21
- 229910052760 oxygen Inorganic materials 0.000 claims description 21
- 239000012535 impurity Substances 0.000 claims description 13
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 10
- 238000001513 hot isostatic pressing Methods 0.000 claims description 3
- 238000007670 refining Methods 0.000 claims description 3
- 239000003870 refractory metal Substances 0.000 claims description 3
- 210000002381 plasma Anatomy 0.000 description 30
- 238000009832 plasma treatment Methods 0.000 description 30
- 238000002844 melting Methods 0.000 description 28
- 239000002994 raw material Substances 0.000 description 27
- 238000012856 packing Methods 0.000 description 22
- 239000002245 particle Substances 0.000 description 13
- 239000010408 film Substances 0.000 description 12
- 239000007789 gas Substances 0.000 description 11
- 230000008018 melting Effects 0.000 description 11
- 230000008569 process Effects 0.000 description 11
- 238000004544 sputter deposition Methods 0.000 description 10
- 229910052715 tantalum Inorganic materials 0.000 description 8
- 229910045601 alloy Inorganic materials 0.000 description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 7
- 239000010409 thin film Substances 0.000 description 7
- 239000000956 alloy Substances 0.000 description 6
- 230000004888 barrier function Effects 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 238000013461 design Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 239000001257 hydrogen Substances 0.000 description 6
- 229910052739 hydrogen Inorganic materials 0.000 description 6
- 238000005259 measurement Methods 0.000 description 5
- 229910052707 ruthenium Inorganic materials 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 238000005266 casting Methods 0.000 description 4
- 238000001000 micrograph Methods 0.000 description 4
- 238000005546 reactive sputtering Methods 0.000 description 4
- 238000006722 reduction reaction Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 239000012798 spherical particle Substances 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- 238000005275 alloying Methods 0.000 description 3
- 239000002775 capsule Substances 0.000 description 3
- 239000012159 carrier gas Substances 0.000 description 3
- 239000000460 chlorine Substances 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- 238000003754 machining Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- -1 Ta or Ru Chemical compound 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 2
- 150000001340 alkali metals Chemical class 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- FGIUAXJPYTZDNR-UHFFFAOYSA-N potassium nitrate Chemical compound [K+].[O-][N+]([O-])=O FGIUAXJPYTZDNR-UHFFFAOYSA-N 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910000975 Carbon steel Inorganic materials 0.000 description 1
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- 229910001362 Ta alloys Inorganic materials 0.000 description 1
- 229910052776 Thorium Inorganic materials 0.000 description 1
- 229910052770 Uranium Inorganic materials 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000010962 carbon steel Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- KFIKNZBXPKXFTA-UHFFFAOYSA-N dipotassium;dioxido(dioxo)ruthenium Chemical compound [K+].[K+].[O-][Ru]([O-])(=O)=O KFIKNZBXPKXFTA-UHFFFAOYSA-N 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 229910000765 intermetallic Inorganic materials 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 235000011118 potassium hydroxide Nutrition 0.000 description 1
- 239000004323 potassium nitrate Substances 0.000 description 1
- 235000010333 potassium nitrate Nutrition 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910001927 ruthenium tetroxide Inorganic materials 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C1/00—Making non-ferrous alloys
- C22C1/04—Making non-ferrous alloys by powder metallurgy
- C22C1/045—Alloys based on refractory metals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F1/00—Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
- B22F1/14—Treatment of metallic powder
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F2998/00—Supplementary information concerning processes or compositions relating to powder metallurgy
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F2999/00—Aspects linked to processes or compositions used in powder metallurgy
Definitions
- the present invention relates to a method of making a sputtering target comprising a refractory metal material, such as Ta and Ru, particularly for use in the manufacture of semiconductor LSIs.
- a refractory metal material such as Ta and Ru
- a TaN film formed by performing reactive sputtering in an atmosphere of argon and nitrogen through the use of a Ta sputtering target and a Ta-X-N film formed by performing reactive sputtering through the use of a Ta-X alloy target are considered good.
- Ta and Ta-X alloy sputtering targets for barrier metal application for semiconductor LSIs have been developed.
- any one of a melting-plastic working process and a powder sintering process can be selected, while the powder sintering process is most suited. Reasons for this are described below.
- Ta powders that can be industrially supplied are conventionally obtained by an ingot crushing process after performing the EB melting of a low-purity Ta raw material, and their purity is only a level of 4N at the most.
- the following method for example, is adopted as a process for industrially making Ru.
- Caustic potash and potassium nitrate are added to crude Ru, thereby converting Ru into soluble potassium ruthenate.
- This salt is extracted in water and is heated during chlorine gas injection under the formation of RuO 4 , which is then collected in dilute hydrochloric acid containing methyl alcohol. This liquid is evaporated and dried, and is then calcined in an oxygen atmosphere to form RuO 2 , with the result that Ru metal is finally obtained by reduction under heating in hydrogen.
- Ru powders made by this method contained low-melting metal impurities, alkali metals, and residues of halogen elements such as Cl and hence could not meet the purity required of capacitor electrode films. Moreover, powders made by this method were coral-like porous agglomerates and had very low packing densities in the case of sintering.
- JP-A-3-197940 discloses a method of plastically working an Ta ingot obtained by EB-melting.
- JP-A-6-264232 discloses a method of performing plastic working and heat treatment of Ta after the EB melting thereof.
- JP-A-11-61392 discloses a method of machining an ingot obtained by the EB melting of an Ru raw material and using it in a casting condition thereof.
- High purity may be realized by using the methods disclosed in the above literature.
- the presence of a large number of pores and casting defects cannot be neglected.
- the melting methods it is impossible to perform near-net-shape forming and the yield of noble metals is low.
- the melting methods proposed in the above literature are an unavoidable choice because high purity and low oxygen concentrations could not be realized in the powder sintering method.
- JP-A-3-173704 discloses a method for making a target for sputtering.
- a spherical Ta powder is produced by a Plasma Rotating Electrode Process (PREP) treatment, i.e., by bringing a thermal plasma into contact with a rotating electrode and thereby causing an electrode material to melt and splash.
- PREP Plasma Rotating Electrode Process
- the thermal plasma is given with the purpose of only spheroidizing performed by heating and melting, and the effect of purification of powder cannot be expected.
- It is an object of the invention is to provide a method of making a target made of high-melting metals or its alloy, which is producted by sintering a high-melting high-purity metal powder under pressure and which has high purity and low oxygen concentrations and besides shows high density and a fine and uniform micro-structure.
- the present inventors have conducted research energetically and found out that by applying thermal plasma treatment to a raw material powder, it is possible to spheroidize a high-melting metal powder and, at the same time, to obtain high purity and low oxygen concentrations. Further, the inventors have found out that by performing sintering under pressure through the use of this powder which is spherical and has high purity and a low oxygen concentration, it is possible to increase packing density, with the result that it is possible to obtain a sintered powder compact for sputtering targets, which has high purity and a low oxygen concentration and besides shows a high density and a uniform and fine micro-structure.
- the sintering under pressure is hot isostatic pressing.
- the sputtering target which shows high density and a uniform and fine micro-structure.
- the sputtering target produced according to the invention comprises a sintered powder compact with a relative density of not less than 99%, a purity of not less than 99.999% and an oxygen concentration of not more than 100 ppm.
- a thin film obtained by sputtering through the use of this target has high purity and is uniform so as to improve the reliability of products.
- the sputtering target according to the invention is obtained by introducing a powder into a thermal plasma into which hydrogen gas has been introduced. As a result of this, a thin film obtained by performing sputtering through the use of this target has high purity and is uniform so as to improve the reliability of products.
- the shape of particles of the powder introduced for sintering under pressure is spherical or analogous to a sphere.
- the target shows high density and a uniform and fine micro-structure, and the uniformity of a thin film obtained by performing sputtering through the use of this target increases.
- the above high-melting metal material is Ta.
- the above high-melting metal material is Ta.
- the above high-melting metal is Ru.
- the sputtering targed produced according to the invention has a purity of not less than 99.999% and an oxygen concentration of not more than 100 ppm and the shape of particles of the high-melting metal powder is spherical or analogous to a sphere.
- the packing density of the powder increases and it is possible to obtain a formed powder compact which shows high density and a uniform and fine micro-structure.
- the sputtering targed produced according to the invention is obtained by introducing a powder into a thermal plasma into which hydrogen gas has been introduced.
- the obtained high-melting metal powder material becomes a powder of spherical particles which has high purity and a low oxygen concentration, and by performing pressure forming through the use of this powder, it is possible to obtain a formed powder compact which has high purity and a low oxygen concentration and besides shows high density and a uniform and fine micro-structure.
- the greatest feature of the invention resides in the fact that a powder composed of a metallic material with a higher melting point than iron, particularly Ta or Ru, is introduced into a thermal plasma into which a hydrogen gas has been introduced, thereby to obtain a high-melting metal powder material which has high purity and a low oxygen concentration and the shape of whose particles is spherical or analogous to a sphere.
- RF radio-frequency
- the raw material powder (110) is melted and becomes spherical due to the action of the surface tension of the metal, and as a result of this process, the shape of the powder particles after the treatment becomes spherical.
- oxides and low-melting impurities contained in the raw material powder (110) evaporate in the thermal plasma high-temperature zone (105) because their vapor pressures are higher than those of Ta and Ru.
- the purity of the raw material powder (110) increases and, at the same time, its oxygen concentration decreases.
- the pressure of the plasma gas used here is almost atmospheric pressure and hence the effect of the evaporation of impurities is not great with an argon thermal plasma treatment alone.
- hydrogen is introduced thereinto, it is possible to further lower the oxygen concentration by the reduction reaction of hydrogen ions, excited atoms, etc.
- the introduction of hydrogen gas enables the effect of the evaporation of impurities to be remarkably improved.
- Hot pressing or hot isostatic pressing is performed through the use of a high-melting metal powder obtained in the manner shown above.
- HIP hot pressing or hot isostatic pressing
- a powder is packed in a capsule made of carbon steel on the bottom of which a piece of Mo foil is laid, and HIP is performed after deaeration and sealing in a vacuum. It is desirable that this powder be sintered under pressure at a temperature of not less than 1100°C and at a pressure of not less than 50 MPa.
- the above sintered powder compact is subjected to machining or surface grinding and is bonded to a packing plate, thereby to complete a target.
- Fig. 1 The treatment of Ta powders was actually carried out through the use of an apparatus of the structure shown in Fig. 1.
- the Ta raw material powders used in the treatment and thermal plasma treatment conditions are shown in Table 1.
- micrographs of Specimen 3, as an example, obtained by a scanning electron microscope are shown in Figs. 2A and 2B.
- Fig. 2A is a photograph of a raw material powder (before the thermal plasma treatment)
- Fig. 2B is a photograph of Specimen 3 (after thermal plasma treatment).
- the purity of Ta is increased from a level of 3N to levels of 4N and 5N by the thermal plasma treatment. From the foregoing it has become apparent that a Ta target obtained from a Ta powder subjected to the thermal plasma treatment by pressure sintering is most suited to the formation of a TaN film by reactive sputtering.
- the thermal plasma treatment through the use of a thermal plasma into which hydrogen is introduced, an increase in purity, a decrease in oxygen concentration, and the spheroidizing of high-melting metal powder materials of Ta, Ru, etc. can be simultaneously realized. Furthermore, by performing the sintering under pressure of an obtained powder, it is possible to realize a Ta or Ru target which shows high density and a fine and uniform micro-structure and which has high purity and a low oxygen concentration and to obtain an optimum sputtered thin film.
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Powder Metallurgy (AREA)
- Physical Vapour Deposition (AREA)
- Manufacture Of Metal Powder And Suspensions Thereof (AREA)
Claims (4)
- Verfahren zur Herstellung eines Sputtertargets, wobei ein aus einem feuerfesten Metall und Verunreinigungen bestehendes Pulvermaterial in ein thermisches Plasma, in das Sauerstoffgas eingeleitet wurde, eingebracht wird, so dass eine Raffination auf eine Sauerstoffkonzentration von nicht mehr als 100 ppm und Kugelformung erfolgen, und das erhaltenen Pulver unter Druck gesintert wird.
- Verfahren nach Anspruch 1, wobei das Drucksintern ein isostatisches Pressen ist.
- Verfahren nach Anspruch 1 oder 2, wobei das Metallpulvermaterial auf eine Reinheit von nicht weniger als 99.999% raffiniert wird.
- Verfahren nach einem der vorhergehenden Ansprüche, wobei das Metall Ta und/oder Ru ist.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19299499 | 1999-07-07 | ||
JP11192994A JP2001020065A (ja) | 1999-07-07 | 1999-07-07 | スパッタリング用ターゲット及びその製造方法ならびに高融点金属粉末材料 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1066899A2 EP1066899A2 (de) | 2001-01-10 |
EP1066899A3 EP1066899A3 (de) | 2004-03-17 |
EP1066899B1 true EP1066899B1 (de) | 2007-04-25 |
Family
ID=16300465
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00114459A Expired - Lifetime EP1066899B1 (de) | 1999-07-07 | 2000-07-05 | Verfahren zur Herstellung eines Sputtertargets |
Country Status (4)
Country | Link |
---|---|
US (2) | US6589311B1 (de) |
EP (1) | EP1066899B1 (de) |
JP (1) | JP2001020065A (de) |
DE (1) | DE60034513T2 (de) |
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US8491959B2 (en) | 2007-05-04 | 2013-07-23 | H.C. Starck Inc. | Methods of rejuvenating sputtering targets |
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US6569397B1 (en) * | 2000-02-15 | 2003-05-27 | Tapesh Yadav | Very high purity fine powders and methods to produce such powders |
JP2001303240A (ja) * | 2000-04-26 | 2001-10-31 | Toshiba Corp | スパッタリングターゲット |
US6506289B2 (en) | 2000-08-07 | 2003-01-14 | Symmorphix, Inc. | Planar optical devices and methods for their manufacture |
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JP2002275625A (ja) * | 2001-03-19 | 2002-09-25 | Hitachi Metals Ltd | Ruターゲット材およびその製造方法 |
US7469558B2 (en) | 2001-07-10 | 2008-12-30 | Springworks, Llc | As-deposited planar optical waveguides with low scattering loss and methods for their manufacture |
US6770154B2 (en) * | 2001-09-18 | 2004-08-03 | Praxair S.T. Technology, Inc. | Textured-grain-powder metallurgy tantalum sputter target |
US7081148B2 (en) * | 2001-09-18 | 2006-07-25 | Praxair S.T. Technology, Inc. | Textured-grain-powder metallurgy tantalum sputter target |
US7404877B2 (en) * | 2001-11-09 | 2008-07-29 | Springworks, Llc | Low temperature zirconia based thermal barrier layer by PVD |
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Also Published As
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US6589311B1 (en) | 2003-07-08 |
US6676728B2 (en) | 2004-01-13 |
US20030019326A1 (en) | 2003-01-30 |
EP1066899A3 (de) | 2004-03-17 |
EP1066899A2 (de) | 2001-01-10 |
DE60034513D1 (de) | 2007-06-06 |
DE60034513T2 (de) | 2008-01-03 |
JP2001020065A (ja) | 2001-01-23 |
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