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EP0852774A1 - Chip module - Google Patents

Chip module

Info

Publication number
EP0852774A1
EP0852774A1 EP96929186A EP96929186A EP0852774A1 EP 0852774 A1 EP0852774 A1 EP 0852774A1 EP 96929186 A EP96929186 A EP 96929186A EP 96929186 A EP96929186 A EP 96929186A EP 0852774 A1 EP0852774 A1 EP 0852774A1
Authority
EP
European Patent Office
Prior art keywords
chip
chip module
contacts
carrier tape
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP96929186A
Other languages
German (de)
French (fr)
Other versions
EP0852774B1 (en
Inventor
Detlef Houdeau
Josef Kirschbauer
Hans-Georg Mensch
Peter Stampka
Hans-Hinnerk Steckhan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
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Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Publication of EP0852774A1 publication Critical patent/EP0852774A1/en
Application granted granted Critical
Publication of EP0852774B1 publication Critical patent/EP0852774B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
    • G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
    • G06K19/0772—Physical layout of the record carrier
    • G06K19/07728—Physical layout of the record carrier the record carrier comprising means for protection against impact or bending, e.g. protective shells or stress-absorbing layers around the integrated circuit
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
    • G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
    • G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
    • G06K19/07743—External electrical contacts
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
    • G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
    • G06K19/07745—Mounting details of integrated circuit chips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
    • H01L23/24—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49855—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers for flat-cards, e.g. credit cards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001—Core members of the layer connector
    • H01L2224/29099—Material
    • H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319—Arrangement of the layer connectors prior to mounting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838—Bonding techniques
    • H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01005—Boron [B]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01006—Carbon [C]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01023—Vanadium [V]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01033—Arsenic [As]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01079—Gold [Au]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01082—Lead [Pb]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06—Polymers
    • H01L2924/0665—Epoxy resin
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06—Polymers
    • H01L2924/078—Adhesive characteristics other than chemical
    • H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits

Definitions

  • the invention relates to a chip module for installation in a basic card body of a chip card.
  • Chip cards are well known in the prior art. The possible uses of chip cards are extremely versatile and continue to increase with the increasing computing power and storage capacity of the available integrated circuits contained therein. However, this goes hand in hand with an enlargement of the integrated circuits (electronic components, chips) to be installed.
  • the structure of a chip card is determined by a large number of features, some of which are specified by appropriate standards. This concerns, for example, the resilience of the card with regard to UV radiation, X-rays, the mechanical resilience of the card body and the electrical contacts, and also the temperature resistance.
  • the chip is first mounted on a flexible film.
  • This film contains the necessary ones
  • the individual chip modules are then punched out of the fully assembled film.
  • the chips are indirectly attached to the module carrier in the card. This has the advantage that bending forces are kept away from the chip.
  • the back of the chip is mounted on the flexible film.
  • the electrical connection surfaces located on its front side are connected via bonding wires to contacts which are connected to the card contacts through the flexible film.
  • the front of the chip including the mentioned wires is in the
  • chip modules for contact-based chip cards are assembled using three basic technologies: a) cyanoacrylate adhesive technology b) hot-melt adhesive technology c) contact-adhesive adhesive technology.
  • the technique mentioned under c) is also called pressure sensitive adhesive.
  • the shear stress generated by mechanical pressure in the adhesive layer leads to a reduction in the viscosity of the adhesive, which causes physical contact with the connecting element, e.g. Map body, manufactures or improves.
  • the German patent application DE 36 39 630 provides an example of a single-layer hot-melt adhesive technology.
  • the European patent application EP 0 527 438 provides an example of a multi-layer cyanoacrylate adhesive technology.
  • the quality of the connection between the chip module and the card body is particularly decisive for the durability of a chip card. If, for example, a chip module is inserted into a recess milled into a card body and glued in there, this can be done with an essential
  • Temperature load may be associated if, for example, a hot melt adhesive is used.
  • Chip module is understood to mean a chip carrier which has eight contacts on the contact side. A semiconductor chip is placed on the opposite side, which is located between these contacts of the chip card, that is, seen laterally, directly opposite. While the cyanoacrylate and the contact adhesive technology use low process temperatures for module assembly, a key characteristic of the hot melt technology is the comparatively high installation temperature. Usual temperatures are in the range of 200 to 250 ° C. With this procedure, a large amount of heat is injected into the chip module during the module implantation, which takes less than 1.5 seconds. This not only heats the adhesive layer that connects the chip module to the card base, but also the chip carrier element, the semiconductor chip and the masking compound.
  • the structure of a chip module contains several components made of different materials.
  • the flexible film, the carrier can consist of an epoxy resin.
  • the contacts applied thereon on one side consist of a metal, the semiconductor chip made of a crystal, for example silicon, the bonding wires made of metal and the covering compound provided for the front of the chip made of a plastic. If this system is subjected to a larger temperature fluctuation, so-called delaminations, ie separations between adjacent layers, can result.
  • the connection usually an adhesive connection, between the chip and the carrier is not critical.
  • the masking compounds that harden under ultraviolet light are particularly susceptible to delamination.
  • the reason for this is the thermally induced voltages in the overall system of the chip module. These voltages exist due to dilathermal mismatches between the semiconductor chip, Chip carrier element and masking compound.
  • the relevant temperature expansion coefficients behave in the same temperature ranges as 2.5: 10: 18.
  • the probability of the occurrence of delaminations increases with the enlargement of the semiconductor chip and the increase in the transport and storage time.
  • the covering compound absorbs moisture from the ambient air, which leads to material expansion, which is also referred to as swelling.
  • the swelling of the masking compound and the brief, strong heating of the module when it is installed in the basic card body are responsible for high rejection rates after installation. This is particularly the case with chip modules that have a large-area chip. Such chips are called microcontrollers and / or cryptocontrollers.
  • the invention has for its object to provide a chip module for installation in chip cards, in which a delamination between a masking compound and an electronic component, with the resultant loss of function of the chip module in a connection method between chip module and card body, is prevented.
  • a certain amount of heat has to be introduced from the outside in various methods. This happens through external heat, for example generated in a stamp, which is transferred to the chip module by placing the stamp on it.
  • the purpose of the introduction of heat is to increase the temperature at those locations or areas where, for example, an adhesive connection is to be established between the carrier of the chip module and the card body. Heat conduction into other areas of the chip module should be minimized. Since a heat-emitting hollow stamp is placed on the contacts arranged on the flexible film and an amount of heat is injected into the chip module during the production of an adhesive connection, however, substantial heat conduction towards the chip cannot be prevented.
  • a thermal insulation layer is introduced between the adhesive layer and the chip.
  • a further solution to the problem provides specifically placed recesses in the metallic contacts, on which a hollow stamp for heat introduction is placed. If the use of a heat insulation layer between the chip and the adhesive layer that connects the chip to the module prevents heat conduction within the module in the direction of the chip, cutouts in the metallic contacts prevent the lateral, i.e. lying in the area of the metal contacts
  • the layer of metallic contacts which has the best thermal conductivity, is thus partially interrupted in the corresponding direction.
  • the epoxy-glass fiber composite layer present on the inside of a chip module has an order of magnitude lower thermal conductivity, as a result of which this layer has no significance with regard to the above-mentioned objective.
  • Recesses are usually elongated holes in order to represent a correspondingly wide heat barrier within the outline of a hollow punch.
  • FIG. 1 shows a sectional illustration with the relative positioning of a hollow stamp when installing a chip module in a card body
  • FIG. 2 shows a representation corresponding to FIG. 1 with an additional heat insulation layer between the flexible carrier film and the chip
  • FIG. 3 shows a sectional illustration of a chip module, 10 recesses 11 being present within the layer of the metal contacts,
  • FIG. 4 schematically shows the top view of the metal contacts, the cutouts and the outline of the chip being indicated.
  • a chip module according to FIG. 1 is glued to the card body by means of a hollow stamp 1 with a relatively high temperature of, for example, 200 ° C. under the action of force with appropriate time control.
  • FIG. 1 shows in detail the hollow stamp 1 which is placed on the flexible carrier tape 2 of the chip module. Since the externally visible metal contacts are positioned at this point, the hollow punch 1 is placed on them.
  • the chip module has an adhesive layer 8, by means of which the chip 3 is positioned and fixed on the carrier tape 2.
  • a stiffening frame 4 is also arranged on the carrier tape 2 and surrounds the chip 3.
  • the covering compound 51 protects the chip 3 and its electrical connections to the contacts from corrosion and mechanical influence from outside.
  • the chip module is glued into the card body 7 by means of the hot-melt adhesive 6.
  • a heat insulating layer 9 is additionally introduced in the illustration of FIG. 2 corresponding to FIG been.
  • the chip for example silicon
  • masking compound and flexible carrier tape prevents the different coefficients of thermal expansion of the chip (for example silicon), masking compound and flexible carrier tape from having an effect and causing damage by strong thermomechanical forces at a high temperature. These forces occur when high temperatures are introduced into the overall system, for example when the chip module is being installed. This can be too Cause delaminations.
  • the masking compound can detach itself from the chip and causes functional failures of the module, for example by damaging the electrical conductors between the chip and the external contacts.
  • polyimide By applying a polyimide layer on the back of the chip, the delamination appearances can be eliminated.
  • Polyimide has a low thermal conductivity, so that polyimide can be used as a heat barrier. As a result, the thermo-mechanical forces between chip 3 and covering mass 5 are reduced. During this time, the heat of the heating stamp 1 necessary for the adhesive will flow into the hot-melt adhesive 6 in order to make the connection.
  • the polyimide is applied to the back of the wafer in the wafer process.
  • the thermal thermal conductivity of polyimide is so low that even a layer thickness of only 10 ⁇ m polyimide is sufficient, as preliminary tests have shown.
  • the thermal insulation layer 9 is preferably a polyimide layer due to the material characteristics for the thermal conductivity.
  • the use of other heat insulators is also possible. Since the polyimide can be applied to the back of the wafer in a simple manner in the wafer process, this material selection is very advantageous.
  • FIG. 3 shows a chip module in connection with a hollow stamp 1 on top.
  • the carrier tape 2 has on one side the metal contacts 10 and, on the opposite side, is arranged approximately concentrically with the chip 3.
  • the masking compound 52 protects the active side of the chip 3, as well as its contact with the metal contacts 10. It is clearly visible that A lateral, in the image directed laterally, heat flow from the hollow punch 1 in the direction of the chip is prevented by means of cutouts 11. An average heat flow from top to bottom from the hollow stamp 1 via the metal contacts 10 and the carrier tape 2 is not hindered.
  • the currently usual contacts of a chip card are shown in FIG.
  • the metal contacts 10 are essentially arranged in two rows opposite to the chip 3.
  • the chip outline 12 indicates the central position of the chip 3.
  • the inner contour 13 of the hollow stamp 1 and the outer contour 14 of the hollow stamp 1 form concentrically interlocking rectangles.
  • the recesses 11 designed as an elongated hole prevent the heat flow inwards at the points where there are no interruptions in the metal layer to limit the individual metal contacts 10 anyway, ie in the direction of the chip 3 mounted opposite to the recess 11.
  • the invention can be applied both to modules with a gold island and to other modules which do not have such a gold island.

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Credit Cards Or The Like (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Die Bonding (AREA)

Abstract

The object of the invention is to prevent delamination between the covering compound and the chip in the hot-melt assembly process. According to the invention, this object is achieved in that the heat flow introduced from the exterior into the chip module is controlled in a deliberate manner, either by a heat-insulating layer (9) interposed between the flexible carrier strip (2) of the chip module and the chip (3) bonded thereon, or by recesses (11) in the surface or layer of the metal contacts (10) such that heat is prevented from flowing from a hollow stamp (1) placed in the outer region of the metal contacts (10) in the direction of the centrally-mounted chip (3).

Description

Besehreibung Description

ChipmodulChip module

Die Erfindung betrifft ein Chipmodul zum Einbau in einen Kartengrundkörper einer Chipkarte.The invention relates to a chip module for installation in a basic card body of a chip card.

Chipkarten sind im Stand der Technik hinlänglich bekannt. Die Anwendungsmöglichkeiten von Chipkarten sind äußerst vielsei- tig und nehmen mit der steigenden Rechenleistung und Spei¬ cherkapazität der verfügbaren, darin enthaltenen integrierten Schaltungen noch stetig zu. Damit geht jedoch eine Vergröße¬ rung der einzubauenden integrierten Schaltungen (elektronische Bauelemente, Chips) einher.Chip cards are well known in the prior art. The possible uses of chip cards are extremely versatile and continue to increase with the increasing computing power and storage capacity of the available integrated circuits contained therein. However, this goes hand in hand with an enlargement of the integrated circuits (electronic components, chips) to be installed.

Der Aufbau einer Chipkarte wird durch eine Vielzahl von Merkmalen bestimmt, die teilweise durch entsprechende Normen vorgegeben sind. Dies betrifft beispielsweise die Belastbar¬ keit der Karte in Bezug auf UV-Strahlung, Röntgenstrahlung, sowie die mechanische Belastbarkeit des Kartenkörperε und der elektrischen Kontakte oder auch die Temperaturbeständigkeit.The structure of a chip card is determined by a large number of features, some of which are specified by appropriate standards. This concerns, for example, the resilience of the card with regard to UV radiation, X-rays, the mechanical resilience of the card body and the electrical contacts, and also the temperature resistance.

Bei der überwiegenden Anzahl der Herstellungsverfahren für Chipkarten wird der Chip zunächst auf einen flexiblen Film montiert. Auf diesem Film befinden sich die notwendigenIn the vast majority of chip card manufacturing processes, the chip is first mounted on a flexible film. This film contains the necessary ones

Kartenkontakte. Aus dem fertig montierten Film werden dann die einzelnen Chipmodule ausgestanzt. Die Chips sind dabei mittelbar über den Träger des Modules in der Karte befestigt. Dies hat den Vorteil, daß Biegekräfte vom Chip ferngehalten werden. Der Chip ist dabei mit seiner Rückseite auf dem flexiblen Film montiert. Die auf seiner Vorderseite befindli¬ chen elektrischen Anschlußflächen werden über Bonddrähte mit Kontaktierungen verbunden, die durch den flexiblen Film hindurch mit den Kartenkontakten verbunden sind. Die Chipvor- derseite einschließlich der genannten Drähte wird in derCard contacts. The individual chip modules are then punched out of the fully assembled film. The chips are indirectly attached to the module carrier in the card. This has the advantage that bending forces are kept away from the chip. The back of the chip is mounted on the flexible film. The electrical connection surfaces located on its front side are connected via bonding wires to contacts which are connected to the card contacts through the flexible film. The front of the chip including the mentioned wires is in the

Regel mit einer Abdeckung, beispielsweise einer Kunststoff¬ masse, vor Korrosionseinflüssen geschützt. Die genannten Ausführungen sind Teile von üblichen Verfahren zur Verpackung von Chips in Standardgehäusen.Usually protected from corrosion by a cover, for example a plastic compound. The above Versions are part of common procedures for packaging chips in standard packages.

Chipmodule für kontaktbehaftete Chipkarten werden nach dem heutigen Stand der Technik durch drei Grundtechnologien montiert: a) Cyanacrylat-Klebetechnik b) Hot-Melt-Klebetechnik c) Contact-Adhäsiv-Klebetechnik. Die unter c) genannte Technik wird auch Pressure-Sensitive- Klebung genannt. Dabei führt die durch mechanischen Druck erzeugte Scherspannung in der Klebeschicht zu einer Visosi- tätserniedrigung des Klebstoffes, der den physikalischen Kontakt zum Verbindungselement, z.B. Kartengrundkörper, herstellt bzw. verbessert. Ein Beispiel für eine einlagige Hot-Melt-Klebetechnik liefert die deutsche Offenlegungs¬ schrift DE 36 39 630. Ein Beispiel einer mehrlagigen Cyanacrylat-Klebetechnik liefert die europäische Patentanmel¬ dung EP 0 527 438.According to the current state of the art, chip modules for contact-based chip cards are assembled using three basic technologies: a) cyanoacrylate adhesive technology b) hot-melt adhesive technology c) contact-adhesive adhesive technology. The technique mentioned under c) is also called pressure sensitive adhesive. The shear stress generated by mechanical pressure in the adhesive layer leads to a reduction in the viscosity of the adhesive, which causes physical contact with the connecting element, e.g. Map body, manufactures or improves. The German patent application DE 36 39 630 provides an example of a single-layer hot-melt adhesive technology. The European patent application EP 0 527 438 provides an example of a multi-layer cyanoacrylate adhesive technology.

Für die Dauerhaltbarkeit einer Chipkarte ist insbesondere die Qualität der Verbindung zwischen dem Chipmodul und dem Kar¬ tenkörper maßgebend. Wird beispielsweise ein Chipmodul in eine in einen Kartenkörper ausgefräste Ausnehmung eingesetzt und dort eingeklebt, so kann dies mit einer wesentlichenThe quality of the connection between the chip module and the card body is particularly decisive for the durability of a chip card. If, for example, a chip module is inserted into a recess milled into a card body and glued in there, this can be done with an essential

Temperaturbelastung verbunden sein, wenn beispielsweise ein Hot-Melt-Klebstoff eingesetzt wird.Temperature load may be associated if, for example, a hot melt adhesive is used.

Unter Chipmodul wird ein Chipträger verstanden, der auf der Kontaktseite acht Kontakte aufweist. Auf der gegenüberliegen¬ den Seite ist ein Halbleiterchip plaziert, der sich zwischen diesen Kontakten der Chipkarte befindet, d.h., der lateral gesehen, direkt gegenüber liegt. Während die Cyanacrylat- und die Contact-Adhäsiv-Klebetechnik mit niedrigen Prozeßtempera- turen zur Modulmontage auskommen, ist ein wesentliches Kenn¬ zeichen der Hot-Melt-Klebetechnik die vergleichsweise hohe Einbautemperatur. Übliche Temperaturen liegen im Bereich von 200 bis 250°C. Während der Modulimplantation, die weniger als 1,5 Sekunden dauert, wird bei dieser Verfahrensweise eine große Wärmemenge in das Chipmodul eingekoppelt. Damit wird nicht nur die Klebstoffschicht erwärmt, die das Chipmodul mit dem Kartengrundkörper verbindet, sondern auch das Chipträge¬ relement, der Halbleiterchip und die Abdeckmasse. Dabei ist gleichzeitig zu berücksichtigen, daß der Aufbau eines Chipmo¬ dules mehrere Bestandteile aus unterschiedlichen Werkstoffen beinhaltet. So kann die flexible Folie, der Träger, bei- spielsweise aus einem Epoxidharz bestehen. Die einseitig darauf aufgebrachten Kontakte bestehen aus einem Metall, der Halbleiterchip aus einem Kristall, beispielsweise Silizium, die Bonddrähte aus Metall und die für die Chipvorderseite vorgesehene Abdeckmasse aus einem Kunststoff. Wird dieses System einer größeren Temperaturschwankung unterworfen, so können sog. Delaminationen, d.h. Auftrennungen zwischen aneinanderliegenden Schichten, die Folge sein. Bei einem Chipmodul der genannten Art ist die Verbindung, in der Regel eine Klebeverbindung, zwischen Chip und Träger unkritisch. Die kurzzeitige Erwärmung des gesamten Systemes führt aber nach längeren Lager- und Transportzeiten der Module zu loka¬ len Defekten in der Abdeckmasse, die als Delamination be¬ zeichnet werden. Delaminationen zwischen dem Chip und der Abdeckmasse können zu Fehlfunktionen oder zum Ausfall des Chipmodules führen. Dies iεt darin begründet, daß eine Dela¬ mination in diesem Bereich ein Abreißen von elektrischen Leitern, nämlich den Bonddrähten, durch die der Chip mit den äußeren Kontakten verbunden ist, nach sich zieht. Das obenge¬ nannte Hot-Melt-Verfahren zum Einkleben eines Chipmodules in einen Kartenkorper ist mit einer entsprechend hohen Wärmebe¬ lastung des Chipmodules verbunden.Chip module is understood to mean a chip carrier which has eight contacts on the contact side. A semiconductor chip is placed on the opposite side, which is located between these contacts of the chip card, that is, seen laterally, directly opposite. While the cyanoacrylate and the contact adhesive technology use low process temperatures for module assembly, a key characteristic of the hot melt technology is the comparatively high installation temperature. Usual temperatures are in the range of 200 to 250 ° C. With this procedure, a large amount of heat is injected into the chip module during the module implantation, which takes less than 1.5 seconds. This not only heats the adhesive layer that connects the chip module to the card base, but also the chip carrier element, the semiconductor chip and the masking compound. At the same time, it must be taken into account that the structure of a chip module contains several components made of different materials. For example, the flexible film, the carrier, can consist of an epoxy resin. The contacts applied thereon on one side consist of a metal, the semiconductor chip made of a crystal, for example silicon, the bonding wires made of metal and the covering compound provided for the front of the chip made of a plastic. If this system is subjected to a larger temperature fluctuation, so-called delaminations, ie separations between adjacent layers, can result. In a chip module of the type mentioned, the connection, usually an adhesive connection, between the chip and the carrier is not critical. However, the brief heating of the entire system leads to local defects in the masking compound after longer storage and transport times of the modules, which defects are referred to as delamination. Delamination between the chip and the masking compound can lead to malfunctions or failure of the chip module. This is due to the fact that delamination in this area results in the tearing off of electrical conductors, namely the bonding wires, through which the chip is connected to the external contacts. The above-mentioned hot-melt method for gluing a chip module into a card body is associated with a correspondingly high thermal load on the chip module.

Die unter ultraviolettem Licht aushärtenden Abdeckmassen sind besonders anfällig in bezug auf eine Delamination. Ursache hierfür sind die thermisch induzierten Spannungen im Gesamt¬ system des Chipmodules. Diese Spannungen existieren auf Grund von dilathermischen Fehlanpassungen zwischen Halbleiterchip, Chipträgerelement und Abdeckmasse. Die diesbezüglichen Tempe- raturauεdehnungεkoeffizienten verhalten εich in gleichen Temperaturbereichen wie 2,5:10:18. Die Wahrεcheinlichkeit des Auftretens von Delaminationen steigt mit der Vergrößerung des Halbleiterchips und der Erhöhung der Transport- und Lager¬ zeit. In der genannten Zeit nimmt die Abdeckmasse aus der Umgebungsluft Feuchtigkeit auf, die zu einer Materialausdeh¬ nung führt, was auch als Quellung bezeichnet wird. Die Quel¬ lung der Abdeckmasse und die kurzzeitige starke Erwärmung des Modules beim Einbau in den Kartengrundkörper, sind verant¬ wortlich für hohe Ausschußraten nach dem Einbau. Dies ist inεbeεondere bei Chipmodulen der Fall, die einen großflächi¬ gen Chip besitzen. Solche Chips werden als Mikrokontroller und/oder Cryptokontroller bezeichnet.The masking compounds that harden under ultraviolet light are particularly susceptible to delamination. The reason for this is the thermally induced voltages in the overall system of the chip module. These voltages exist due to dilathermal mismatches between the semiconductor chip, Chip carrier element and masking compound. The relevant temperature expansion coefficients behave in the same temperature ranges as 2.5: 10: 18. The probability of the occurrence of delaminations increases with the enlargement of the semiconductor chip and the increase in the transport and storage time. During this time, the covering compound absorbs moisture from the ambient air, which leads to material expansion, which is also referred to as swelling. The swelling of the masking compound and the brief, strong heating of the module when it is installed in the basic card body are responsible for high rejection rates after installation. This is particularly the case with chip modules that have a large-area chip. Such chips are called microcontrollers and / or cryptocontrollers.

Bisherige Maßnahmen, die Nachteile aus dem Stand der Technik auεzuschalten, bestanden in der Entwicklung, Auswahl und Erprobung von Abdeckmasεen, die eine geringe Aufnahme von Feuchtigkeit besitzen, sowie in Maßnahmen, die zu einer Erhöhung der Abdeckmassenadhäsion, wie beispielsweise höherer Rauhigkeit der Chipträgeroberfläche, führen. So wurden bei¬ spielsweise Abdeckmassen eingesetzt, die mit Haftvermittler (Silan-/Siloxan-Basis) versehen sind.Previous measures to eliminate the disadvantages of the prior art consisted in the development, selection and testing of masking compounds which have a low absorption of moisture, and in measures which lead to an increase in masking compound adhesion, such as, for example, higher roughness of the chip carrier surface . For example, masking compositions were used which are provided with adhesion promoters (silane / siloxane base).

Der Erfindung liegt die Aufgabe zugrunde, ein Chipmodul für den Einbau in Chipkarten bereitzustellen, bei dem eine Dela¬ mination zwischen einer Abdeckmasse und einem elektronischen Bauelement mit daraus resultierendem Funktionsverlust des Chipmoduls bei einem Verbindungsverfahren zwischen Chipmodul und Kartenkorper unterbunden wird.The invention has for its object to provide a chip module for installation in chip cards, in which a delamination between a masking compound and an electronic component, with the resultant loss of function of the chip module in a connection method between chip module and card body, is prevented.

Die Lösung dieser Aufgabe geschieht durch Chipmodule mit den Merkmalen der Ansprüche 1 oder 4.This problem is solved by chip modules with the features of claims 1 or 4.

Zum Einbau eines Chipmodules in den Kartenkorper einer Chip¬ karte muß bei verschiedenen Verfahren eine bestimmte Wärme¬ menge von außen eingebracht werden. Dies geschieht durch externe, beispielsweise in einem Stempel erzeugte, Wärme, die durch Aufsetzen des Stempels auf das Chipmodul in dieses übergeleitet wird. Die Wärmeeinbringung hat die Temperaturer¬ höhung an den Orten bzw. Flächen zum Ziel, an denen etwa eine KlebeVerbindung zwischen dem Träger des Chipmodules und dem Kartenkörper herzustellen ist. Eine Wärmeleitung in andere Bereiche deε Chipmodules sollte minimiert werden. Da bei der Herstellung einer KlebeVerbindung ein wärmeabgebender Hohl- stempel auf den auf der flexiblen Folie angeordneten Kontak- ten aufsetzt und über diese die Wärmemenge in das Chipmodul einkoppelt wird, kann jedoch eine wesentliche Wärmeleitung in Richtung auf den Chip nicht unterbunden werden. Da die Wärmeleitfähigkeit der ebenfalls mit der flexiblen Trägerfo¬ lie in Kontakt stehenden Abdeckmasεe gering iεt, geht eine wesentliche Menge der eingebrachten Energie von der flexiblen Trägerfolie über eine Klebstoffschicht in den Chip. Dies führt nicht nur zur Erhitzung des Chips, sondern auch zur Delamination in dem Kontaktbereich zwischen Chip und Abdeck¬ masse.To install a chip module in the card body of a chip card, a certain amount of heat has to be introduced from the outside in various methods. This happens through external heat, for example generated in a stamp, which is transferred to the chip module by placing the stamp on it. The purpose of the introduction of heat is to increase the temperature at those locations or areas where, for example, an adhesive connection is to be established between the carrier of the chip module and the card body. Heat conduction into other areas of the chip module should be minimized. Since a heat-emitting hollow stamp is placed on the contacts arranged on the flexible film and an amount of heat is injected into the chip module during the production of an adhesive connection, however, substantial heat conduction towards the chip cannot be prevented. Since the thermal conductivity of the masking mass, which is likewise in contact with the flexible carrier film, is low, a substantial amount of the energy introduced goes from the flexible carrier film via an adhesive layer into the chip. This leads not only to the heating of the chip, but also to delamination in the contact area between the chip and masking compound.

Um dies zu unterbinden, wird eine Wärmeisolierschicht zwi¬ schen der Klebstoffεchicht und dem Chip eingebracht. Eine weitere Lösung der Aufgabe sieht gezielt plazierte Aussparun¬ gen in den metallischen Kontakten vor, auf die ein Hohlstem- pel zur Wärmeeinleitung aufsetzt. Verhindert der Einεatz einer Wärmeisolierschicht zwischen dem Chip und der Kleb- εtoffschicht, die den Chip mit dem Modul verbindet, die Wärmeleitung innerhalb deε Moduleε in Richtung Chip, εo verhindern Auεεparungen in den metalliεchen Kontakten die laterale, d.h. in der Fläche der Metallkontakte liegendeIn order to prevent this, a thermal insulation layer is introduced between the adhesive layer and the chip. A further solution to the problem provides specifically placed recesses in the metallic contacts, on which a hollow stamp for heat introduction is placed. If the use of a heat insulation layer between the chip and the adhesive layer that connects the chip to the module prevents heat conduction within the module in the direction of the chip, cutouts in the metallic contacts prevent the lateral, i.e. lying in the area of the metal contacts

Wärmeleitung. Nachdem der Hohlεtempel annähernd ringförmig in dem äußeren Bereich deε Chipmoduls auf den metallischen Kontakten aufsetzt, und der Chip auf der gegenüberliegenden Seite des Trägers des Chipmodules annähernd konzentrisch zu den metallischen Kontakten angeordnet ist, liegt der Chip auch im inneren Bereich relativ zum Hohlstempel betrachtet. Davon ausgehend ist ersichtlich, daß ein senkrecht durch das flächig ausgebildete Modul hindurchgeführter Wärmestrom zur Herstellung einer Hot-Melt-Klebung gewünεcht iεt. Die Ausεpa- rungen innerhalb der metallischen Kontakte sind derart pla¬ ziert, daß eine parallel zum flächig auεgebildeten Chipmodul geführte Wärmeleitung innerhalb der elektrischen Kontakte nach innen durch die eingebrachten Ausεparungen unterbunden wird. Dadurch wird die Durchwärmung deε Chipmodules während der kurzzeitigen Hot-Melt-Einbauzeit durch konstruktive Maßnahmen verhindert. Die Schicht der metallischen Kontakte, die die beste Wärmeleitfähigkeit aufweist, wird somit in der entsprechenden Richtung teilweise unterbrochen. Die auf der Innenseite eines Chipmodules vorliegende Epoxy-Glasfaser- Verbundεchicht besitzt eine um Größenordnungen geringere thermische Leitfähigkeit, wodurch diese Schicht hinsichtlich der oben genannten Zielsetzung keine Bedeutung hat. DieHeat conduction. After the hollow die is placed in an approximately ring-shaped manner in the outer area of the chip module on the metallic contacts and the chip on the opposite side of the carrier of the chip module is arranged approximately concentrically with the metallic contacts, the chip is also viewed in the inner area relative to the hollow die. From this it can be seen that a vertical through the Flat-shaped module of heat flow passed through for the production of a hot-melt adhesive is desired. The recesses within the metallic contacts are placed in such a way that heat conduction inside the electrical contacts parallel to the planar chip module is prevented by the recesses introduced. As a result, the heating of the chip module during the short hot-melt installation time is prevented by constructive measures. The layer of metallic contacts, which has the best thermal conductivity, is thus partially interrupted in the corresponding direction. The epoxy-glass fiber composite layer present on the inside of a chip module has an order of magnitude lower thermal conductivity, as a result of which this layer has no significance with regard to the above-mentioned objective. The

Aussparungen sind in der Regel Langlöcher, um eine entspre¬ chend breite Wärmebarriere innerhalb des Umrisses eines Hohlstempels darzustellen.Recesses are usually elongated holes in order to represent a correspondingly wide heat barrier within the outline of a hollow punch.

Vorteilhafte Ausgestaltungen εind den Unteranεprüchen zu entnehmen.Advantageous configurations can be found in the subclaims.

Im folgenden werden anhand von εchematischen Figuren Ausfüh¬ rungsbeispiele beschrieben.Exemplary embodiments are described below with the aid of schematic figures.

Figur 1 zeigt eine ausschnittεweise Schnittdarstellung mit der relativen Positionierung eines Hohlstempelε beim Einbau eineε Chipmoduleε in einen Kartenkorper,FIG. 1 shows a sectional illustration with the relative positioning of a hollow stamp when installing a chip module in a card body,

Figur 2 zeigt eine Darstellung entsprechend Figur l mit einer zusätzlichen Wärmeisolierschicht zwischen flexibler Trägerfolie und Chip,FIG. 2 shows a representation corresponding to FIG. 1 with an additional heat insulation layer between the flexible carrier film and the chip,

Figur 3 zeigt eine Schnittdarstellung eines Chipmodules, wobei innerhalb der Schicht der Metallkontakte 10 Ausεparungen 11 vorhanden εind, Figur 4 zeigt εchematiεch die Draufεicht auf die Metallkon¬ takte, wobei die Aussparungen und der Umriß des Chips angedeutet sind.FIG. 3 shows a sectional illustration of a chip module, 10 recesses 11 being present within the layer of the metal contacts, FIG. 4 schematically shows the top view of the metal contacts, the cutouts and the outline of the chip being indicated.

Mittels der Erfindung ist eine Delamination der Abdeckmasse im Chipbereich beim Hot-Melt-Einbauverfahren beim Einbau von Modulen mit einer Goldinsel in die Kartenkörper vermeidbar. Bei dem Hot-Melt-Moduleinbauverfahren wird mittels eines Hohlstempels 1 mit relativ hoher Temperatur von beispielswei- εe 200° C unter Krafteinwirkung mit entsprechender Zeitsteue¬ rung ein Chipmodul entsprechend Figur 1 auf den Kartenkörper geklebt. Die Figur l zeigt dabei im einzelnen den Hohlstempel 1, der auf dem flexiblen Trägerband 2 des Chipmoduls auf¬ setzt. Da an dieser Stelle die nach außen sichtbaren Metall- kontakte positioniert sind, wird der Hohlstempel l auf diese aufεetzen. Nach innen weiεt das Chipmodul eine Klebstoff- schicht 8 auf, mittels der der Chip 3 auf dem Trägerband 2 positioniert und fixiert ist. Ein Versteifungεrahmen 4 ist ebenfalls auf dem Trägerband 2 angeordnet und umgibt den Chip 3. Die Abdeckmasse 51 schützt den Chip 3 und seine zu den Kontakten geführten elektrischen Verbindungen vor Korrosion und mechanischem Einfluß von außen. Das Chipmodul wird mittels des Hot-Melt-Klebstoffeε 6 in den Kartenkörper 7 eingeklebt.By means of the invention, delamination of the masking compound in the chip area can be avoided in the hot-melt installation process when installing modules with a gold island in the card body. In the hot-melt module installation method, a chip module according to FIG. 1 is glued to the card body by means of a hollow stamp 1 with a relatively high temperature of, for example, 200 ° C. under the action of force with appropriate time control. FIG. 1 shows in detail the hollow stamp 1 which is placed on the flexible carrier tape 2 of the chip module. Since the externally visible metal contacts are positioned at this point, the hollow punch 1 is placed on them. On the inside, the chip module has an adhesive layer 8, by means of which the chip 3 is positioned and fixed on the carrier tape 2. A stiffening frame 4 is also arranged on the carrier tape 2 and surrounds the chip 3. The covering compound 51 protects the chip 3 and its electrical connections to the contacts from corrosion and mechanical influence from outside. The chip module is glued into the card body 7 by means of the hot-melt adhesive 6.

Um die in Figur l vorhandene Möglichkeit, daß eine weεentli- che Wärmemenge vom Hohlstempel 1 über daε Trägerband 2 und den Klebstoff 8 direkt in den Chip 3 fließt, auszuschließen, ist in der der Figur 1 entsprechenden Darstellung der Figur 2 zusätzlich eine Wärmeisolierschicht 9 eingebracht worden.In order to exclude the possibility in FIG. 1 that a substantial amount of heat flows from the hollow stamp 1 via the carrier tape 2 and the adhesive 8 directly into the chip 3, a heat insulating layer 9 is additionally introduced in the illustration of FIG. 2 corresponding to FIG been.

Damit wird verhindert, daß die unterschiedlichen thermischen Ausdehnungskoeffizienten von Chip (beispielsweiεe Silizium) , Abdeckmasse und flexiblem Trägerband zum Tragen kommen und Schäden durch starke thermomechanische Kräfte bei einer hohen Temperatur verursachen. Diese Kräfte treten auf, wenn hohe Temperaturen, beispielsweise beim Einbauverfahren des Chip¬ moduls in das Gesamtεystem eingebracht werden. Dies kann zu Delaminierungen führen. Die Abdeckmasse kann sich dabei vom Chip lösen und verursacht Funktionsauεfälle deε Moduleε, beiεpielεweise durch Beschädigung der elektrischen Leiter zwischen Chip und Außenkontakten.This prevents the different coefficients of thermal expansion of the chip (for example silicon), masking compound and flexible carrier tape from having an effect and causing damage by strong thermomechanical forces at a high temperature. These forces occur when high temperatures are introduced into the overall system, for example when the chip module is being installed. This can be too Cause delaminations. The masking compound can detach itself from the chip and causes functional failures of the module, for example by damaging the electrical conductors between the chip and the external contacts.

Durch Aufbringen einer Polyimidschicht auf die Chiprückseite können die Delaminierungserscheinen eliminiert werden. Polyi¬ mid weist einen niedrigen Wärmeleitwert auf, so daß Polyimid alε Hitzebarriere einsetzbar ist. Dadurch werden die thermo- mechanischen Kräfte zwischen Chip 3 und Abdeckmaεse 5 redu¬ ziert. Während dessen wird die für die Klebung notwendige Wärme des Heizstempelε 1 in den Hot-Melt-Klebεtoff 6 fließen, um die Verbindung herzuεtellen. Das Polyimid wird im Wafer- prozeß auf die Scheibenrückseite aufgebracht. Die thermische Wärmeleitfähigkeit von Polyimid ist so gering, daß selbst eine Schichtdicke von nur 10 μm Polyimid ausreicht, wie Vorversuche ergeben haben.By applying a polyimide layer on the back of the chip, the delamination appearances can be eliminated. Polyimide has a low thermal conductivity, so that polyimide can be used as a heat barrier. As a result, the thermo-mechanical forces between chip 3 and covering mass 5 are reduced. During this time, the heat of the heating stamp 1 necessary for the adhesive will flow into the hot-melt adhesive 6 in order to make the connection. The polyimide is applied to the back of the wafer in the wafer process. The thermal thermal conductivity of polyimide is so low that even a layer thickness of only 10 μm polyimide is sufficient, as preliminary tests have shown.

Die Wärmeiεolierschicht 9 ist aufgrund des Materialkennwerteε für die Wärmeleitfähigkeit vorzugεweiεe eine Polyimidεchicht. Die Verwendung von anderen Wärmeisolatoren ist jedoch genauso möglich. Da das Polyimid in einfacher Weise im Waferprozeß auf die Waferrückseite aufgebracht werden kann, ist diese Materialauswahl sehr vorteilhaft.The thermal insulation layer 9 is preferably a polyimide layer due to the material characteristics for the thermal conductivity. However, the use of other heat insulators is also possible. Since the polyimide can be applied to the back of the wafer in a simple manner in the wafer process, this material selection is very advantageous.

In Figur 3 ist ein Chipmodul in Verbindung mit einem aufsit¬ zenden Hohlstempel 1 dargestellt. Daε Trägerband 2 weiεt auf der einen Seite die Metallkontakte 10 auf und gegenüberlie¬ gend ungefähr konzentriεch dazu angeordnet, den Chip 3. Die Abdeckmasse 52 schützt die aktive Seite des Chips 3, εowie dessen Kontaktierung mit den Metallkontakten 10. Es ist deutlich sichtbar, daß mittels Aussparungen 11 ein lateraler, im Bild seitlich gerichteter, Wärmefluß vom Hohlstempel 1 in Richtung auf den Chip unterbunden wird. Ein im Schnitt von oben nach unten ausgerichteter Wärmefluß vom HohlStempel 1 über die Metallkontakte 10 und über das Trägerband 2, wird nicht behindert. In der Figur 4 werden die derzeit üblichen Kontakte einer Chipkarte dargeεtellt. Die Metallkontakte 10 sind im wesent¬ lichen in zwei, relativ zum Chip 3 gegenüberliegenden Reihen angeordnet. Der Chipumriß 12 deutet die zentrale Lage des Chips 3 an. Der innere Umriß 13 des Hohlstempelε 1 und der äußere Umriß 14 deε Hohlstempels 1 bilden konzentrisch inein- anderliegende Rechtecke. Die als Langloch auεgebildeten Auεεparungen 11 verhindern an den Stellen, an denen nicht ohnehin zur Begrenzung der einzelnen Metallkontakte 10 vor¬ handene Unterbrechungen in der Metallεchicht vorgesehen sind, den Wärmefluß nach innen, d.h. in Richtung auf den relativ zur Auεεparung 11 gegenüberliegend montierten Chip 3.FIG. 3 shows a chip module in connection with a hollow stamp 1 on top. The carrier tape 2 has on one side the metal contacts 10 and, on the opposite side, is arranged approximately concentrically with the chip 3. The masking compound 52 protects the active side of the chip 3, as well as its contact with the metal contacts 10. It is clearly visible that A lateral, in the image directed laterally, heat flow from the hollow punch 1 in the direction of the chip is prevented by means of cutouts 11. An average heat flow from top to bottom from the hollow stamp 1 via the metal contacts 10 and the carrier tape 2 is not hindered. The currently usual contacts of a chip card are shown in FIG. The metal contacts 10 are essentially arranged in two rows opposite to the chip 3. The chip outline 12 indicates the central position of the chip 3. The inner contour 13 of the hollow stamp 1 and the outer contour 14 of the hollow stamp 1 form concentrically interlocking rectangles. The recesses 11 designed as an elongated hole prevent the heat flow inwards at the points where there are no interruptions in the metal layer to limit the individual metal contacts 10 anyway, ie in the direction of the chip 3 mounted opposite to the recess 11.

Die Erfindung kann εowohl auf Module mit einer Goldinεel angewandt werden, alε auch auf andere Module, die keine derartige Goldinsel aufweisen. The invention can be applied both to modules with a gold island and to other modules which do not have such a gold island.

Claims

Patentansprüche claims 1. Chipmodul zum Einbau in einem Kartengrundkörper (7) einer Chipkarte, bestehend aus - einem flexiblen Trägerband (2) ,1. chip module for installation in a basic card body (7) of a chip card, consisting of - a flexible carrier tape (2), - einseitig auf dem Trägerband (2) aufgebrachten flächigen Metallkontakten (10) ,- Flat metal contacts (10) applied on one side to the carrier tape (2), - mindestens einem auf der den Kontakten gegenüberliegenden Seite des Trägerbandes (2) aufgebrachten elektronischen Bauelement (3) , das elektrisch mit den Kontakten verbunden ist, und- At least one on the opposite side of the contacts of the carrier tape (2) applied electronic component (3) which is electrically connected to the contacts, and - einer vorgegebenen Fläche auf dem Trägerband (2) , über die das Chipmodul mit dem Kartengrundkörper (7) verbindbar ist, wobei zwischen dem elektronischen Bauelement (3) und dem Trä- gerband (2) eine Wärmeisolierschicht vorhanden ist.- A predetermined area on the carrier tape (2), via which the chip module can be connected to the card base body (7), a heat insulation layer being present between the electronic component (3) and the carrier tape (2). 2. Chipmodul nach Anspruch 1, worin die Wärmeisolierschicht (9) aus Polyimid besteht.2. Chip module according to claim 1, wherein the heat insulating layer (9) consists of polyimide. 3. Chipmodul nach Anspruch 2, worin die Polyimidschicht eine Stärke von 10 μm aufweist.3. Chip module according to claim 2, wherein the polyimide layer has a thickness of 10 microns. 4. Chipmodul zum Einbau in einem Kartengrundkörper (7) einer Chipkarte, bestehend aus - einem flexiblen Trägerband (2) ,4. Chip module for installation in a basic card body (7) of a chip card, consisting of - a flexible carrier tape (2), - einseitig auf dem Trägerband (2) aufgebrachten flächigen Metallkontakten (10) ,- Flat metal contacts (10) applied on one side to the carrier tape (2), - mindestenε einem auf der den Kontakten gegenüberliegenden Seite des Trägerbandes (2) aufgebrachten elektronischen Bauelement (3) , das elektrisch mit den Kontakten verbunden ist, und- At least one on the side of the carrier tape (2) opposite the contacts applied electronic component (3) which is electrically connected to the contacts, and - einer vorgegebenen Fläche auf dem Trägerband (2) , über die das Chipmodul mit dem Kartengrundkörper (7) verbindbar ist, wobei innerhalb der Fläche der Metallkontakte (10) Aussparun- gen (11) vorgesehen sind, die den Wärmefluß eines ringförmig im Außenbereich der Metallkontakte (10) aufsetzenden Hohl- stempeis (1) in Richtung auf das zentral montierte elektroni¬ sche Bauelement (3) unterbinden. - A predetermined area on the carrier tape (2), via which the chip module can be connected to the card base body (7), recesses (11) being provided within the area of the metal contacts (10), which reduce the heat flow of a ring in the outer area of the Metal contacts (10) Prevent stempeis (1) in the direction of the centrally mounted electronic component (3).
EP96929186A 1995-09-27 1996-09-12 Chip module Expired - Lifetime EP0852774B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19535989 1995-09-27
DE19535989A DE19535989C3 (en) 1995-09-27 1995-09-27 chip module
PCT/DE1996/001725 WO1997012341A1 (en) 1995-09-27 1996-09-12 Chip module

Publications (2)

Publication Number Publication Date
EP0852774A1 true EP0852774A1 (en) 1998-07-15
EP0852774B1 EP0852774B1 (en) 1999-02-03

Family

ID=7773352

Family Applications (1)

Application Number Title Priority Date Filing Date
EP96929186A Expired - Lifetime EP0852774B1 (en) 1995-09-27 1996-09-12 Chip module

Country Status (11)

Country Link
EP (1) EP0852774B1 (en)
JP (1) JP3199747B2 (en)
KR (1) KR100438876B1 (en)
CN (1) CN1153174C (en)
AT (1) ATE176537T1 (en)
DE (2) DE19535989C3 (en)
ES (1) ES2128872T3 (en)
IN (1) IN188648B (en)
RU (1) RU2145732C1 (en)
UA (1) UA44809C2 (en)
WO (1) WO1997012341A1 (en)

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DE19602436B4 (en) * 1996-01-24 2006-09-14 Infineon Technologies Ag Method for mounting a frame on a carrier material and device for carrying out the method
DE19731737A1 (en) * 1997-07-23 1998-09-17 Siemens Ag Chip-module mounting method e.g. for manufacture of chip card
DE102005032489B3 (en) * 2005-07-04 2006-11-16 Schweizer Electronic Ag Circuit board multi-layer structure with integrated electric component, has insert embedded between two flat electrically insulating liquid resin structures
DE102006060411B3 (en) 2006-12-20 2008-07-10 Infineon Technologies Ag Chip module and method for producing a chip module
DE102007048237A1 (en) * 2007-10-08 2009-04-09 Giesecke & Devrient Gmbh Chip module for chip card
DE102013106181A1 (en) * 2013-06-13 2014-12-18 Bundesdruckerei Gmbh Chip card and method for producing a chip card
CN112216622B (en) * 2019-07-10 2022-09-30 广东精毅科技股份有限公司 Device for sticking chip by cold glue and working method thereof

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DE3639630A1 (en) * 1986-11-20 1988-06-01 Gao Ges Automation Org DATA CARRIER WITH INTEGRATED CIRCUIT AND METHOD FOR PRODUCING THE SAME
FR2617668B1 (en) * 1987-07-03 1995-07-07 Radiotechnique Compelec DEVICE COMPRISING AN ELECTRONIC CIRCUIT MOUNTED ON A FLEXIBLE SUPPORT AND FLEXIBLE CARD INCLUDING THE SAME
FR2626846B1 (en) * 1988-02-04 1990-06-15 Saint Gobain Vitrage DEVICE FOR HANDLING SHEET ITEMS
FR2639763B1 (en) * 1988-11-29 1992-12-24 Schlumberger Ind Sa METHOD FOR PRODUCING AN ELECTRONIC MODULE AND ELECTRONIC MODULE AS OBTAINED BY THIS PROCESS
FR2645680B1 (en) * 1989-04-07 1994-04-29 Thomson Microelectronics Sa Sg ENCAPSULATION OF ELECTRONIC MODULES AND MANUFACTURING METHOD
DE4232625A1 (en) * 1992-09-29 1994-03-31 Siemens Ag Method of assembling integrated semiconductor circuits
DE4325458A1 (en) * 1993-07-29 1995-02-09 Orga Bond Technik Gmbh Support element for an IC module
DE4325712C2 (en) * 1993-07-30 1996-03-21 Siemens Ag Process for encapsulating electrical or electronic components or assemblies and encapsulating electrical or electronic components or assemblies
DE4427309C2 (en) * 1994-08-02 1999-12-02 Ibm Production of a carrier element module for installation in chip cards or other data carrier cards
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Also Published As

Publication number Publication date
EP0852774B1 (en) 1999-02-03
KR19990063588A (en) 1999-07-26
CN1198229A (en) 1998-11-04
DE59601281D1 (en) 1999-03-18
DE19535989A1 (en) 1997-04-03
UA44809C2 (en) 2002-03-15
JP3199747B2 (en) 2001-08-20
CN1153174C (en) 2004-06-09
ES2128872T3 (en) 1999-05-16
WO1997012341A1 (en) 1997-04-03
IN188648B (en) 2002-10-26
RU2145732C1 (en) 2000-02-20
JPH10512380A (en) 1998-11-24
ATE176537T1 (en) 1999-02-15
KR100438876B1 (en) 2004-07-16
DE19535989C3 (en) 2003-03-27
DE19535989C2 (en) 1997-07-17

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