EP0636261A1 - Improved method for interpreting complex data and detecting abnormal instrument or process behavior - Google Patents
Improved method for interpreting complex data and detecting abnormal instrument or process behaviorInfo
- Publication number
- EP0636261A1 EP0636261A1 EP93912297A EP93912297A EP0636261A1 EP 0636261 A1 EP0636261 A1 EP 0636261A1 EP 93912297 A EP93912297 A EP 93912297A EP 93912297 A EP93912297 A EP 93912297A EP 0636261 A1 EP0636261 A1 EP 0636261A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- data
- baseline
- sub
- multivariate data
- multivariate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/86—Signal analysis
- G01N30/8624—Detection of slopes or peaks; baseline correction
- G01N30/8641—Baseline
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/129—Using chemometrical methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/86—Signal analysis
- G01N30/8624—Detection of slopes or peaks; baseline correction
- G01N30/8631—Peaks
- G01N30/8637—Peak shape
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
- G06F2218/02—Preprocessing
Definitions
- This invention relates to a method of analyzing multivariate data generated by an instrument in order to determine whether abnormal features are present. More particularly, this invention relates to an improved method for rapidly identifying instrumentation or process failures in a chemical system.
- On-line analytical instrumentation generates data that is used in a wide variety of applications, such as closed-loop control of a process, quality assurance of a product, or environmental and safety functions. Often, this data is in the form of multivariate data such as o absorbance readings at various wavelengths, a detector response at various times, or any other set of data that consists of multiple measured values on each individual sample. The reliability of the data depends largely upon the performance of the instrument used to generate the data. If the instrument fails to work properly, the data generated may contain little if any valid information. 5 Problems with analytical instruments are often first detected when an individual notices that unusual data is being generated.
- computers are widely used to collect the data generated by on-line instruments, and so are readily available to perform routine monitoring. Unlike an analyst, however, computers cannot perform any "unconscious" activity. Accordingly, in order to monitor the data for abnormal 0 features, the computer must first be programmed to identify normal features in a spectrum or chromatogram.
- Pattern recognition techniques are typically used to sort sets of data into groups having similar features. In outlier 5 identification, however, only one group is identified which is defined by the features in a set of data containing only sets of multivariate data which are known to be normal.
- Outlier identification is accomplished by first teaching the computer to recognize "normal”, “acceptable” or “expected” features in multivariate data known to be normal. When a new spectrum or chromatogram is obtained, its features are compared to what is expected. If the data has additional features, or lacks significantfeatures, it is labelled “abnormal”, “unacceptable”, or an “outlier”. Outliers may be the result of many different causes such as instrument failures, mechanical problems or process problems such as impurities in the analyzed materials. Pattern recognition techniques are able to identify any changes in the appearance of the data, regardless of its source, whereas simpler systems which are programmed to signal the operator whenever certain unwanted values are reached, can only be used to detect foreseen problems.
- PCA Principal Component Analysis
- the number of measurements which make up the original spectrum or chromatogram defines the number of dimensions in the new coordinate system.
- a group of calibration chromatograms or spectra which the analyst has determined to be representative of the expected spectra or chromatograms can be placed in this coordinate system forming a cloud of points in the multidimensional space.
- PCA mathematically describes this cloud of points using as fewdimensions (or principal components) as possible.
- Residual sets of multivariate data (residuals) which identify the portion of each calibration spectrum or chromatogram which was not contained withinthe model are then calculated.
- the sum of the squares (SS) of the residuals are then compared with the SS of the residuals obtained for unknown samples to see if the unknown samples are within the proper range.
- the average of the residual spectra is used as a reference point rather than the origin. Consequently, this approach avoids overfitting by reducing the number of principal components and increases the sensitivity for detecting abnormal features or outliers by using the average residual spectrum as a reference point.
- Still another object of this invention is to provide a method for separating a set of multivariate data into various sub-parts, so that each sub-part may be evaluated separately, thereby increasing the sensitivity of an analysis such as outlier detection.
- the present invention is directed to an improved method for detecting outliers in a system which collects sets of multi ariate data such as chromatograms or spectra.
- the method involves using a procedure such as Principal Component Analysis to create a model describing a calibration set of spectra or chromatograms which is known to be normal, and to create residuals describing the portion of a particular spectrum or chromatogram which is not described by the model.
- the improvement comprises using an average residual calculated for the calibration set, rather than the origin of the model as a reference point for comparing a spectrum or chromatogram obtained from an unknown sample. This improvement allows increased sensitivity towards detecting outliers.
- the present invention is also directed to separating a complex set of data into various sub-parts such as sub-chromatograms or sub-spectra.
- the invention is directed towards a method for dividing a chromatogram into the sub-parts of peak information, baseline shape, baseline offset, and noise. Dividing a set of multivariate data in this way allows the detection of outliers to be more sensitive to changes in one or more of the sub-parts.
- the invention is also directed towards an improved method for carrying out an automated chemical reaction.
- the method incorporates the method for detecting outliers as a wayof checking for changes in the feedstock, chemical process and instruments. If any ofthese items fails, multivariate data produced In the course of the process will reflect the failure.
- the current invention allows these changes to be automatically detected as soon as they occur.
- Figure 1 is a flow chart of a preferred embodiment of the method for separating a set of multivariate data into sub-parts, illustrating how a chromatogram can be broken up into the sub-chromatograms of peak information, baseline shape, baseline offset, and noise;
- Figure 2 is a copy of an unaltered chromatogram used to demonstrate how such a chromatogram can be broken up into separate sub-chromatograms;
- Figure 3 is the peak information sub-chromatogram, which has been separated from the unaltered chromatogram in Figure 2 according to the present invention
- Figure 4 shows the chromatogram remaining after removing the peak information shown in Figure 3 from the unaltered chromatogram of Figure 2, so thatthe noise and baseline shape ma be determined;
- Figure 5 is the noise obtained from the chromatogram in Figure 4, separated according to the present invention.
- Figure 6 is the baseline information obtained by removing the noise and baseline offset from the chromatogram in Figure 4. It should be understood thatthe method of this invention can be applied to any set of multivariate data capable of being measured such as chromatograms or spectra. For purposes of this discussion, however, it will be assumed thatthe data being analyzed is a spectrum consisting of absorbance data at various wavelengths.
- the first step is collecting a set of representative multivariate data.
- This set of data will be used to teach the computer what features are contained in "normal" spectra or chromatograms. Therefore, the spectra should be manually selected to ensure that they are representative of the type of spectra expected to be obtained.
- PCA principal component analysis
- the number of dimensions needed is equal to the number of absorbance data points in the traditional system.
- Each member of the calibration set is plotted in the same multidimensional space, creating a cloud of points, each point representing one spectrum. The more similar the original spectra were, the tighter the cloud will be.
- This cloud can be exactly described using at most r principal components, where r is determined by the lesser of the number of dimensions in the multidimensional space, and the number of points making up the cloud.
- Much of the variability of the cloud can be described using many fewer principal components, as the original spectra are largely similar.
- PCA is used to create a model describing the cloud of points using as few principal components as possible, while still ensuring that a large percentage of the cloud is described. This percentage can be varied depending on the analyst's needs.
- PCA modeling has been more completely described by G. H. Golub and C. F. Van
- V U S V
- U is an mxr matrix of eigenvectors for the matrix XX'
- S is an rxr diagonal matrix containing singular values
- V is an rxn matrix of eigenvectors for the matrix X'X
- r is the rank of the matrix X.
- X V U S
- the eigenvectors in V describe the orientation of the principal component hyperplane in the wavelength space that contains the calibration samples.
- the product of the matrices U and S forms a matrix called the score matrix.
- This matrix contains the projections of the spectra on the new coordinate system defined by the eigenvectors.
- the rank, r defines the dimensionality of the space required to contain all of the points in the space.
- the number of eigenvectors and the dimensionality of the PCA model will always be less than the full rank of X. This means that there will always be a finite residual spectrum that was not described by the PCA model.
- Resid X (l- V k V k ') where Resid is an mxn matrix of residual spectra; X is the mxn matrix of original spectra; I is an nxn identity matrix; and Vk is an nxk matrix containing the first k columns of V (where k is less than rand k defines the dimensionality of the PCA model).
- the first step is to calculate the average calibration residual spectrum, which ⁇ sthe spectrum formed by averaging the absorption values at each wavelength for all calibration residual spectra.
- the Euclidian distance of each calibration residual spectrum from the average calibration residual spectrum was then calculated. Any sample having a residual (calculated as described above) whose Euclidean distance from the average residual isstatisticallydifferent from the group of Euclidean distances obtained for the calibration set can be labeled an outlier.
- "Statistically different" as used herein includes any situation where a sample (or a series of samples) produces a Euclidean distance which would not be expected given the variances observed in the calibration set.
- t-d ⁇ stance a value herein termed the "t-d ⁇ stance" can be calculated for each member of the calibration set according to the following formula:
- a leave-one-out cross-validation technique can be used. This process operates by removing one of the members of the calibration set, recalculating the model, and then treating the removed calibration set member as an unknown. If this results in a t-distance greater than preselected value (e.g three if the t-distances are assumed to be approximately normally distributed), then either the spectrum was incorrectly chosen as a calibration set member or the model is too precise and a principal component should be removed.
- preselected value e.g three if the t-distances are assumed to be approximately normally distributed
- chromatograms could be broken up into separate sub- parts (sub-chromatograms), and that each of these sub-chromatograms could be individually modeled using a technique such as PCA.
- a chromatogram can be thought of as a function of time F(t), which can be written as the sum of a series of separate functions containing unique information.
- F(t) the sum of a series of separate functions containing unique information.
- a chromatogram can be represented as the sum of the baseline offset, the baseline shape, the peak information, and the typically higher frequency noise. Evaluating each of these sub-chromatograms separately results in a more sensitive analysis, and the analyst can see which component of the chromatogram is abnormal. Accordingly, if the baseline shape changes over time, the analyst will be made aware of the change, but will know that valid peak information is still being generated.
- this method comprises first identifying the portions of the multivariate data which contain peak information. The portions so identified are then subtracted from the set of multivariate data. These removed portions are then replaced using linear interpolation or some other method to approximate what the baseline would have been without the peaks. Finally, this approximation ofthe baseline is subtracted from the unaltered set of multivariate data, thereby forming a set of data containing peak information.
- the peak information can be subtracted from the unaltered set of multivariate data to form a set of data containing baseline shape.
- Noise and the baseline offset can be removed from this set of data to provide greater separation.
- a preferred embodiment of accomplishing the method for a chromatogram is set out in the following paragraphs for exemplary purposes. It should be understood, however, that the following is only one way of accomplishing the method and that each individual step may be accomplished by other equivalent methods known in the art (e.g. a cubic spline fit can be used to obtain the second derivative, or smoothing techniques can be used to remove the noise).
- the preferred embodiment described below contains specific parameters for exemplary purposes only. These parameters were used to adequately separate the chromatogram shown in FIG 2 into sub-chromatograms as seen in FIGS.3-6. Practitioners in the art will understand that these parameters can be varied to suit the needs ofthe individual analysis.
- the second derivative was obtained using the Savitsky-Golay method (Abraham Savitsky, Marcel Golay, Analytical Chemistry, 36, No.8, pg. 1627 July, 1964), with a moving window for the second derivative containing 31 points (parameter 1).
- the firstfifty points (parameter 2) contained no peak information and that this region was typical ofthe noise and baseline offsetseen inthe whole chromatogram.
- sub-chromatogram A a sub-chromatogram containing the baseline shape, the baseline offset and noise
- Sub-chromatogram A was then subjected to a Fourier transformation, and the resultant interferogram was subjected to a boxcar filter.
- the boxcar filter used zeros for all Fourier coefficients above coefficient 101 (parameter 6).
- an inverse Fourier transformation was performed. This resulted in a sub-chromatogram (sub-chromatogram B) which contained only the baseline shape and baseline offset.
- Sub-chromatogram B was subtracted from sub-chromatogram A yielding the noise sub-chromatogram (FIG. 5).
- the least positive point in sub-chromatogram B was defined o as the baseline offset and was subtracted from sub-chromatogram B yielding the baseline shape sub-chromatogram (FIG. 6).
- any combination of the three sub-chromatograms (peak, noise and baseline shape) and the offset can be used to form a new sub-chromatogram if the separation into four parts is not appropriate. 5 Any resulting sub-chromatogram containing baseline shape and/or peak information can be evaluated using the PCA modeling method previously discussed.
- the offset value by itself is not multivariate and is therefore not amenable to PCA modeling.
- Standard control chart techniques can be used to monitor the offset.
- a sub-chromatogram containing only noise or noise with the baseline offset should contain only random variation o and consequently is not suited to PCA modeling.
- Control chart techniques can be used to monitor various statistics (e.g. maximum value, minimum value, standard deviation, sum of absolute values, and mean value) of these sub-chromatograms in orderto detect outliers.
- a spectrum or chromatogram can be broken up into sub-parts such as peak information, noise, baseline offset, and baseline shape.
- Each ofthe sub-parts can be 5 monitored to see if it is within the normal range expected for the analysis. In thiswaythe observer can tell which type of feature in the multivariate data is abnormal.
- dividing up the multivariate data makes the analysis more sensitive. For example, in chromatography if the baseline offset drifts from run to run, then the cloud of points in the multidimensional space will necessarily be more spread out, reflecting the fact that identical 0 samples could have different responses at a particular time after sample injection depending on the baseline offset. Spreading out the cloud of points may hide some slight variation which has occurred in some other feature in the chromatogram for which little variation is expected. Consequently, separating the data into various sub-chromatograms allows the system to confidently classify as outliers, samples with slight variations in a sub-chromatogram for which 5 there should be little or no variation.
- a computing device can be programmed to make the necessary calculations described above. This computing device can then evaluate the chromatograms or spectra which are routinely generated for samples of chemical processes. When an outlier is detected, the computi ng means can signal an operator and/or shut down the process, so that no resources are wasted producing material which does not meet the required specifications.
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US869607 | 1986-06-02 | ||
US86960792A | 1992-04-16 | 1992-04-16 | |
PCT/US1993/003635 WO1993021592A1 (en) | 1992-04-16 | 1993-04-16 | Improved method for interpreting complex data and detecting abnormal instrument or process behavior |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0636261A1 true EP0636261A1 (en) | 1995-02-01 |
EP0636261A4 EP0636261A4 (en) | 1998-03-25 |
Family
ID=25353906
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP93912297A Withdrawn EP0636261A4 (en) | 1992-04-16 | 1993-04-16 | Improved method for interpreting complex data and detecting abnormal instrument or process behavior. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5592402A (en) |
EP (1) | EP0636261A4 (en) |
JP (1) | JPH08500898A (en) |
CA (1) | CA2133412A1 (en) |
WO (1) | WO1993021592A1 (en) |
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WO1984003563A1 (en) * | 1983-03-07 | 1984-09-13 | Bruce Noble Colby | Automated pcb analyzer system |
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EP0255026A3 (en) * | 1986-07-23 | 1988-10-19 | Takeda Chemical Industries, Ltd. | Automatic analysis method and apparatus for enzyme reaction |
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US4941101A (en) * | 1987-09-01 | 1990-07-10 | Hewlett-Packard Company | Method for analyzing chromatograms |
JPH01182740A (en) * | 1988-01-16 | 1989-07-20 | Toshiba Corp | Method for analyzing reaction speed in chemical analysis |
US4893253A (en) * | 1988-03-10 | 1990-01-09 | Indiana University Foundation | Method for analyzing intact capsules and tablets by near-infrared reflectance spectrometry |
US4916645A (en) * | 1988-06-02 | 1990-04-10 | The Perkin-Elmer Corporation | Continuous monochrometer drift compensation of a spectral monochromator |
US5121443A (en) * | 1989-04-25 | 1992-06-09 | Spectra-Physics, Inc. | Neural net system for analyzing chromatographic peaks |
GB2243211A (en) * | 1990-04-20 | 1991-10-23 | Philips Electronic Associated | Analytical instrument and method of calibrating an analytical instrument |
US5121337A (en) * | 1990-10-15 | 1992-06-09 | Exxon Research And Engineering Company | Method for correcting spectral data for data due to the spectral measurement process itself and estimating unknown property and/or composition data of a sample using such method |
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1993
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- 1993-04-16 CA CA002133412A patent/CA2133412A1/en not_active Abandoned
- 1993-04-16 WO PCT/US1993/003635 patent/WO1993021592A1/en not_active Application Discontinuation
- 1993-04-16 EP EP93912297A patent/EP0636261A4/en not_active Withdrawn
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1995
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EP0636261A4 (en) | 1998-03-25 |
CA2133412A1 (en) | 1993-10-28 |
JPH08500898A (en) | 1996-01-30 |
US5592402A (en) | 1997-01-07 |
WO1993021592A1 (en) | 1993-10-28 |
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