EP0257749A1 - Methods and apparatus for monitoring the diffuse reflectivity of a surface - Google Patents
Methods and apparatus for monitoring the diffuse reflectivity of a surface Download PDFInfo
- Publication number
- EP0257749A1 EP0257749A1 EP87305961A EP87305961A EP0257749A1 EP 0257749 A1 EP0257749 A1 EP 0257749A1 EP 87305961 A EP87305961 A EP 87305961A EP 87305961 A EP87305961 A EP 87305961A EP 0257749 A1 EP0257749 A1 EP 0257749A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- radiation
- sensing
- intensity
- positions
- diffuse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000002310 reflectometry Methods 0.000 title claims abstract description 17
- 238000012544 monitoring process Methods 0.000 title claims abstract description 15
- 230000005855 radiation Effects 0.000 claims abstract description 71
- 239000002689 soil Substances 0.000 claims abstract description 7
- 230000004044 response Effects 0.000 claims description 7
- 230000035945 sensitivity Effects 0.000 claims description 5
- 238000000926 separation method Methods 0.000 claims description 2
- 238000001914 filtration Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 7
- 238000001514 detection method Methods 0.000 abstract description 4
- 238000005286 illumination Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 230000001678 irradiating effect Effects 0.000 description 4
- 208000018999 crinkle Diseases 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 239000000428 dust Substances 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000000976 ink Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000000452 restraining effect Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
- G07D7/06—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency using wave or particle radiation
- G07D7/12—Visible light, infrared or ultraviolet radiation
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
- G07D7/06—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency using wave or particle radiation
- G07D7/12—Visible light, infrared or ultraviolet radiation
- G07D7/121—Apparatus characterised by sensor details
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
- G07D7/181—Testing mechanical properties or condition, e.g. wear or tear
- G07D7/187—Detecting defacement or contamination, e.g. dirt
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Definitions
- the invention relates to methods and apparatus for monitoring the diffuse reflectivity of a surface which, in the field of banknote handling, can provide a measure of the degree of soiling of banknotes.
- GB-A-2117897 An example of a known monitoring system is described in GB-A-2117897 in which a pair of sensors detect diffuse radiation reflected from a surface. This system is designed to look for discontinuities in the surface such as creases and requires a complex detection system to operate successfully.
- Another example of a known monitoring system is described in US-A-4,092,068 which is concerned with obtaining an indication of topographical surface characteristics such as roughness. In neither example is account taken of the practical problem of movement of the sheet towards or away from the sensing assembly. This is a real problem particularly in the case of high speed sheet feeding apparatus.
- a method of monitoring the diffuse reflectivity of a portion of a surface comprises exposing the surface portion to a beam of radiation; sensing the intensity of a part of the diffuse radiation, reflected by the surface portion, at a sensing position situated such that the intensity of the diffusely reflected radiation sensed at the sensing position is substantially invariant within a working range of distances between the sensing position and the surface portion; and determining from the sensed intensity a value representative of the diffuse reflectivity of the surface portion.
- apparatus for monitoring the diffuse reflectivity of a surface comprises a radiation beam source; a surface support member mounted such that the radiation impinges, in use, on a surface supported by the support member; and a radiation sensor for generating a signal for feeding to processing means; the signal corresponding to the intensity of a part of the diffuse radiation reflected by the surface and passing through a sensing position, and the sensing position being situated such that the intensity of the diffusely reflected radiation sensed at the sensing position is substantially invariant within a working range of distances between the sensing position and the surface.
- the diffuse reflection sensor which detects radiation at angles outside the latter angular range, is therefore relatively insensitive to specular reflection.
- the amount of the diffusely reflected radiation passing through a sensing position is proportional to the Lambertian distribution of the reflected radiation, the inverse square law and the area of the sensing position normal to the incident radiation. Calculation reduces these factors to a dependence on the perpendicular or working distance between the sensing position and the surface under examination, the displacement of the sensing position perpendicularly from the beam of radiation before diffuse reflection by the surface under examination, and the angle of inclination or orientation of the sensing position relatively to the surface under examination.
- a radiation sensor could be placed directly at the sensing position.
- an apertured mask is placed between a radiation sensor and the surface portion such that an aperture in the apertured mask is situated at the sensing position.
- radiation sensors are not readily available in a wide range of dimensions. It is therefore more convenient to manufacture an apertured mask to the precise dimensions required, and use this in conjunction with a readily available radiation sensor of standard size.
- the intensity of the diffuse radiation is sensed at two sensing positions, each of the sensing positions being situated such that the intensity of the diffusely reflected radiation sensed at the sensing position is substantially invariant within a working range of distances between the sensing position and the surface portion, and the sensed intensities are averaged to reduce sensitivity to variations in the angular inclination of the surface portion.
- Such variations can arise if the surface, particularly of a sheet, has folds or crinkles which have the effect of changing the angle of incidence of the irradiating beam on the surface.
- each sensor has substantially the same sensitivity since this will simplify the processing steps.
- the two sensing positions could be arranged symmetrically, the two sensing positions are preferably arranged asymmetrically relatively to the surface portion under examination to reduce sensitivity to variations within an extended working range of distances, between the two sensing positions and the surface under examination.
- the radiation may comprise white light but other forms of radiation such as infra-red or ultra-violet will also be used where appropriate.
- the light which reaches the radiation sensor or sensors is filtered to match the response of the system to that of the human eye.
- the apparatus will include a housing to which the radiation beam source and the sensors are mounted. This enables the apparatus to be formed as a compact head allowing precise orientations of the sensors and masks, where appropriate, to be achieved during manufacture. Separate mounting of the components is, however, also possible.
- the method further comprises, causing a reference surface to be exposed to the beam of radiation, sensing diffuse radiation reflected by the reference surface at the or each of the sensing positions to generate respective reference values, and subsequently normalising the intensities sensed at the or each of the sensing positions by comparison with the respective reference values.
- At least that part of the support member which is illuminated when no surface is supported may have a substantially uniform reflectance whereby radiation received at the or each of the sensing positions after reflection by said uniform reflectance part is used to set a reference.
- the methods and apparatus are used in conjunction with monitoring the surfaces of sheets, such as banknotes, fed past the apparatus, it is particularly advantageous to provide the support member with a uniform reflectance portion since the passage of sheets across the support member tends to clean the support member thus maintaining its uniform reflectance.
- the sensors will comprise photosensitive detectors, such as photodiodes or phototransistors.
- the soil detector shown in Figures 1 and 2 comprises a head having a light proof housing 1 inside which is mounted an incandescent bulb 2.
- a beam 9 defining an image of the filament of the bulb 2 is focussed onto a banknote 3 by means of a converging lens 4 and via a plain glass window 5. Since the light beam 9 impinges substantially normally on the banknote 3, it will be specularly reflected back towards the window 5. Proportions of the diffuse reflected light will, however, be received by two photodiodes 6, positioned behind two filter glass windows 7 whose centres are at a distance "b" apart from beam 9 thus forming a masked arrangement.
- the photodiodes 6 are angled towards each other so as to receive radiation from substantially the same portion 17 of the banknote 3.
- the filter glass is chosen so as to match the spectral response of the system to that of the human eye under natural light.
- banknotes are conveyed past the head on a conveyor 10.
- the two photodiodes 6 generate signals corresponding to the intensity of the incident light and these signals are fed to a microprocessor 11 where they are averaged to produce the average intensity which is used in further processing to obtain a measure of the diffuse reflectivity of the banknote.
- This processing takes into account the intensity signal generated by the photodiodes when no banknote 3 is present. In this case, light will impinge directly on the white surface of a hard impervious member (or tile) 8 placed close behind the nominal plane of the banknote. This surface is visible to the detector head between banknotes, and is used to standardise the output of the detector, and to compensate for dust build up on the windows of the head.
- the microcomputer 11 determines the diffuse reflectivity at a series of positions along the banknote and then performs on the determined reflectivities one or more algorithms to determine whether the banknote is acceptable or not.
- a signal representing this determination is fed to a diverter 12 downstream of the detector which causes the banknote to be fed to a dump along a path 13 if the banknote is unacceptable or towards further detection apparatus or an output station along a path 14 if the banknote is acceptable as indicated by a dashed line in Figure 3.
- the microprocessor 11 In operation ( Figure 5) the microprocessor 11 initially stores a threshold (step 18) for the banknotes to be fed. The apparatus then monitors for the arrival of a banknote by sensing the output of the photodiodes 6 (step 19). When a note is sensed, the outputs from the photodiodes 6 are regularly sampled (step 20), averaged and stored (step 21) in a memory of the microprocessor 11. A soil detection algorithm is then carried out. This algorithm assumes that the reflectance signal is sampled at fixed time intervals which represent fixed increments of distance along the document.
- the value of "n" is chosen at the time the system is configured for a particular document. A degree of control over the threshold value may be provided.
- the algorithm selects the lightest extended region of the document as being the most representative of the soiled state of the document, so as to match the type of analysis used by a human observer and also to minimise the effects of variation in the density of printing inks.
- the algorithm is as follows.
- FIG 4A shows the reason for positioning the photodiodes 6 and windows 7 in the locations shown in Figure 1.
- This shows the variation in intensity of reflected light with direction in accordance with the Lambertian Law.
- the direction of the incident light 9 is normal to the banknote 3.
- the variation in intensity of the remaining diffusely reflected light is generally symmetrical about the position 17 of the banknote 3 which is illuminated and about the region through which the specularly reflected radiation passes.
- the photodiodes 6 are positioned therefore at corresponding positions on each side of the line of symmetry.
- Figure 4B illustrates another example in which the angle of illumination is indicated by an arrow 9a.
- the sensors 6 are positioned at corresponding positions on either side of the line of symmetry 9b.
- the intensity of the surface illumination is arranged to be constant with variations of "a” (commonly achieved by collimation or focusing of the illumination) then the strength of the signal will be proportional to the following terms: cos ⁇ - Lambertian distribution of the reflected light. 1/r2 - inverse square law. L.cos( ⁇ - ⁇ ) - area of detector normal to incident light.
- FIG. 7 A family of curves derived from this equation is shown in Figure 7.
- Each of the curves uses a value for "b" of 10 mm and clearly shows a maximum at which the percentage variation of signal strength with variation of working distance is at a minimum.
- the curves become flatter as " ⁇ " is reduced, as shown, from 45° through 30° and 0° to -20°.
- All of the curves are for an unmasked sensor at the sensing position, apart from one in which the presence of the mask has given an effective value for " ⁇ " of 0°. In other words, the apertured mask is parallel to the surface under examination.
- the nominal working distance D between the housing 1 and the support 10 is set to correspond to a position at the centre of the plateau region of the curve for the chosen values of "b" and " ⁇ ". Thereafter, variations in the distance D during the feeding of the banknote 3 past the housing 1 will result in little change in the radiation received at each window 7.
- the windows 7 may be rectangular, and the illuminated area may be 10 mm by 2.5 mm.
- the or each of the sensing positions is situated at an angle of between +20° and -20° relatively to the surface 3, and/or at a separation distance "b" of between 10 mm and 17 mm perpendicularly to the beam of radiation 9 before diffuse reflection by the surface 3, for a working range of distances D of between 8 mm and 15 mm perpendicularly to the surface 3.
Landscapes
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Inspection Of Paper Currency And Valuable Securities (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
Description
- The invention relates to methods and apparatus for monitoring the diffuse reflectivity of a surface which, in the field of banknote handling, can provide a measure of the degree of soiling of banknotes.
- There is a well known requirement for the automated sorting of used banknotes based on the amount of dirt or contamination, otherwise known as soiling, which has built up on the notes. Notes deemed to be sufficiently clean are re-issued and the remainder are withdrawn from circulation. Methods which are used to reliably transport used banknotes are not normally compatible with restraining the plane of the banknote within better than about ±2mm from its nominal position while still allowing a clear view of its surface. The note itself may have fold lines and crinkles which locally remove its surface from the nominal position.
- It is important that any means of measurement should be able to make comparative measurements which are significantly more precise and repeatable than may be judged by the un-trained human eye, otherwise notes that are too soiled will be re-issued and notes that are too clean will be withdrawn.
- Previous attempts at measuring the soil state of banknotes have either accepted the large inaccuracy in measurement resulting from the uncertainty in the position of the plane of the note, or have used a long optical path between the note and the sensor, such that variations in the length of this path by a few mm do not produce a significant variation in the measured reflectivity. These long optical path length solutions imply large dimensions for the system, or a complex optical system to fold the optical path back on itself many times within small dimensions. Long optical path systems also suffer from an intrinsic lack of efficiency in collecting the reflected light, thereby requiring the use of high intensity illumination with the attendant problems of space and heat dissipation requirements.
- There are several other constraints on a system intended to measure the soil level of banknotes.
- 1. The system must have a resolution sufficiently high to enable measurements to be made on unprinted or very lightly printed areas of the note. This is because the human observer naturally makes a judgement on the basis of these unprinted areas, and also because an attempt to make measurements on areas containing significant printing would be significantly influenced by normal variations in the density of the inks.
- 2. The system should not be sensitive to light specularly reflected from the surface of the banknote. This is because specular reflection is highly angular dependent and would be greatly affected by any tilt in the plane of the banknote, and also because any shiny adhesive tape which may been used to repair the note would have the effect of making the note appear cleaner than it really is.
- An example of a known monitoring system is described in GB-A-2117897 in which a pair of sensors detect diffuse radiation reflected from a surface. This system is designed to look for discontinuities in the surface such as creases and requires a complex detection system to operate successfully. Another example of a known monitoring system is described in US-A-4,092,068 which is concerned with obtaining an indication of topographical surface characteristics such as roughness. In neither example is account taken of the practical problem of movement of the sheet towards or away from the sensing assembly. This is a real problem particularly in the case of high speed sheet feeding apparatus.
- In accordance with one aspect of the present invention, a method of monitoring the diffuse reflectivity of a portion of a surface comprises exposing the surface portion to a beam of radiation; sensing the intensity of a part of the diffuse radiation, reflected by the surface portion, at a sensing position situated such that the intensity of the diffusely reflected radiation sensed at the sensing position is substantially invariant within a working range of distances between the sensing position and the surface portion; and determining from the sensed intensity a value representative of the diffuse reflectivity of the surface portion.
- In accordance with a second aspect of the present invention, apparatus for monitoring the diffuse reflectivity of a surface comprises a radiation beam source; a surface support member mounted such that the radiation impinges, in use, on a surface supported by the support member; and a radiation sensor for generating a signal for feeding to processing means; the signal corresponding to the intensity of a part of the diffuse radiation reflected by the surface and passing through a sensing position, and the sensing position being situated such that the intensity of the diffusely reflected radiation sensed at the sensing position is substantially invariant within a working range of distances between the sensing position and the surface.
- We have investigated in some detail the way in which a surface reflects an incident radiation beam and have found that, at least in a plane containing the incident radiation beam, there is a substantially symmetrical distribution in intensity of the diffusely reflected radiation, and the specularly reflected radiation is reflected through a relatively small range of angles.
- By irradiating the surface with a narrow-angle incident beam of radiation, it is ensured that the specular reflection is substantially confined to a narrow angular range. The diffuse reflection sensor, which detects radiation at angles outside the latter angular range, is therefore relatively insensitive to specular reflection.
- It has been found, and will be discussed in more detail hereinafter, that the amount of the diffusely reflected radiation passing through a sensing position is proportional to the Lambertian distribution of the reflected radiation, the inverse square law and the area of the sensing position normal to the incident radiation. Calculation reduces these factors to a dependence on the perpendicular or working distance between the sensing position and the surface under examination, the displacement of the sensing position perpendicularly from the beam of radiation before diffuse reflection by the surface under examination, and the angle of inclination or orientation of the sensing position relatively to the surface under examination. In a consideration of the inter-dependence of these three variables, again as will be discussed in more detail hereinafter, it is found that there is relatively little change in the amount of the diffusely reflected radiation passing through a sensing position on either side of a maximum value over a relatively wide range of working distances between the sensing position and the surface under examination. Thus, carefully situating the sensing position compensates for the variations in the working distance which commonly occur particularly when the surface is provided by a sheet which is moving past the apparatus. By following the present invention it is possible to ensure that the sensitivity goes through a peak at the chosen working distance, and changes only slowly each side of this peak. Moreover, the nominal working distance between the sensing position and the surface under examination can be much smaller than has been the case in the past.
- A radiation sensor could be placed directly at the sensing position. Preferably, however, an apertured mask is placed between a radiation sensor and the surface portion such that an aperture in the apertured mask is situated at the sensing position. This gives substantially the same result, provided that all of the radiation reaching the aperture is collected by the radiation sensor, but has certain practical advantages. For example, it is often advantageous to introduce a window and/or filter in the mask aperture in front of the radiation sensor. Moreover, radiation sensors are not readily available in a wide range of dimensions. It is therefore more convenient to manufacture an apertured mask to the precise dimensions required, and use this in conjunction with a readily available radiation sensor of standard size.
- It would be possible to monitor diffuse reflectivity at just a single sensing position. Preferably, however, the intensity of the diffuse radiation is sensed at two sensing positions, each of the sensing positions being situated such that the intensity of the diffusely reflected radiation sensed at the sensing position is substantially invariant within a working range of distances between the sensing position and the surface portion, and the sensed intensities are averaged to reduce sensitivity to variations in the angular inclination of the surface portion. Such variations can arise if the surface, particularly of a sheet, has folds or crinkles which have the effect of changing the angle of incidence of the irradiating beam on the surface. It has been found by considering the distribution of intensity of the diffusely reflected radiation that this change in angle of incidence simply rotates the symmetrical region. This has the effect that at one sensing position the incident intensity will increase while at the other it will decrease. The average, however, will stay substantially the same and at the value previously obtained with a flat surface.
- This leads to high resolution combined with high efficiency and low power consumption within a confined space and avoids the need for the prior art arrangements which required long path lengths.
- Although sensors at the two sensing positions could have different responses, which could be compensated for by the processing means prior to generating the intensity values, preferably each sensor has substantially the same sensitivity since this will simplify the processing steps.
- Although the two sensing positions could be arranged symmetrically, the two sensing positions are preferably arranged asymmetrically relatively to the surface portion under examination to reduce sensitivity to variations within an extended working range of distances, between the two sensing positions and the surface under examination.
- The radiation may comprise white light but other forms of radiation such as infra-red or ultra-violet will also be used where appropriate.
- Preferably, the light which reaches the radiation sensor or sensors is filtered to match the response of the system to that of the human eye.
- Typically, the apparatus will include a housing to which the radiation beam source and the sensors are mounted. This enables the apparatus to be formed as a compact head allowing precise orientations of the sensors and masks, where appropriate, to be achieved during manufacture. Separate mounting of the components is, however, also possible.
- It is important in monitoring systems of this type to ensure that the radiation beam is at a substantially constant intensity or that the detected intensities are modified to compensate for variations in the irradiating beam intensity.
- One method which has been commonly used in the past is to sample the irradiating beam before it impinges on a surface and to monitor the intensity of the sampled portion. However, this system does not take into account the problem of build up of dust on the surface of the sensors themselves, as the process of transporting banknotes or the like inevitably produces large quantities of dust. In the past, to deal with this, the sensors have been positioned sufficiently far from the sheet position to allow cleaning.
- Preferably, therefore, the method further comprises, causing a reference surface to be exposed to the beam of radiation, sensing diffuse radiation reflected by the reference surface at the or each of the sensing positions to generate respective reference values, and subsequently normalising the intensities sensed at the or each of the sensing positions by comparison with the respective reference values.
- For example, at least that part of the support member which is illuminated when no surface is supported may have a substantially uniform reflectance whereby radiation received at the or each of the sensing positions after reflection by said uniform reflectance part is used to set a reference.
- Where the methods and apparatus are used in conjunction with monitoring the surfaces of sheets, such as banknotes, fed past the apparatus, it is particularly advantageous to provide the support member with a uniform reflectance portion since the passage of sheets across the support member tends to clean the support member thus maintaining its uniform reflectance.
- Typically, the sensors will comprise photosensitive detectors, such as photodiodes or phototransistors.
- In order that the invention may be better understood, an example of a preferred embodiment of a banknote soil detector according to the invention will now be described with reference to the accompanying drawings, in which:-
- Figure 1 is a longitudinal section through the detector;
- Figure 2 is a plan showing the detector connected to a microprocessor;
- Figure 3 illustrates schematically part of a banknote feed system incorporating the detector of Figure 1;
- Figures 4A and 4B are polar diagrams illustrating the variation in intensity of reflected light with reflectance angle for two different angles of incidence;
- Figure 5 is a flow diagram illustrating operation of the apparatus;
- Figure 6 is a diagram indicating the geometry of illuminating and receiving radiation from a surface;
- Figure 7 is a graph showing a family of curves showing the variation of the amount of the sensed diffusely reflected radiation with the perpendicular working distance of the sensing position from the surface under examination; and
- Figure 8 is a sketch indicating the effect of a non-symmetrical arrangement of two sensing positions.
- The soil detector shown in Figures 1 and 2 comprises a head having a
light proof housing 1 inside which is mounted anincandescent bulb 2. Abeam 9 defining an image of the filament of thebulb 2 is focussed onto abanknote 3 by means of a converginglens 4 and via aplain glass window 5. Since thelight beam 9 impinges substantially normally on thebanknote 3, it will be specularly reflected back towards thewindow 5. Proportions of the diffuse reflected light will, however, be received by twophotodiodes 6, positioned behind twofilter glass windows 7 whose centres are at a distance "b" apart frombeam 9 thus forming a masked arrangement. Thephotodiodes 6 are angled towards each other so as to receive radiation from substantially thesame portion 17 of thebanknote 3. The filter glass is chosen so as to match the spectral response of the system to that of the human eye under natural light. - As can be seen in Figure 2, banknotes are conveyed past the head on a
conveyor 10. - The two
photodiodes 6 generate signals corresponding to the intensity of the incident light and these signals are fed to amicroprocessor 11 where they are averaged to produce the average intensity which is used in further processing to obtain a measure of the diffuse reflectivity of the banknote. This processing takes into account the intensity signal generated by the photodiodes when nobanknote 3 is present. In this case, light will impinge directly on the white surface of a hard impervious member (or tile) 8 placed close behind the nominal plane of the banknote. This surface is visible to the detector head between banknotes, and is used to standardise the output of the detector, and to compensate for dust build up on the windows of the head. - The
microcomputer 11 determines the diffuse reflectivity at a series of positions along the banknote and then performs on the determined reflectivities one or more algorithms to determine whether the banknote is acceptable or not. A signal representing this determination is fed to adiverter 12 downstream of the detector which causes the banknote to be fed to a dump along apath 13 if the banknote is unacceptable or towards further detection apparatus or an output station along apath 14 if the banknote is acceptable as indicated by a dashed line in Figure 3. - In operation (Figure 5) the
microprocessor 11 initially stores a threshold (step 18) for the banknotes to be fed. The apparatus then monitors for the arrival of a banknote by sensing the output of the photodiodes 6 (step 19). When a note is sensed, the outputs from thephotodiodes 6 are regularly sampled (step 20), averaged and stored (step 21) in a memory of themicroprocessor 11. A soil detection algorithm is then carried out. This algorithm assumes that the reflectance signal is sampled at fixed time intervals which represent fixed increments of distance along the document. - The value of "n" is chosen at the time the system is configured for a particular document. A degree of control over the threshold value may be provided.
- The algorithm selects the lightest extended region of the document as being the most representative of the soiled state of the document, so as to match the type of analysis used by a human observer and also to minimise the effects of variation in the density of printing inks. The algorithm is as follows.
- 1. Calculate and store the sum of "n" successive samples, starting with the first sample of the document (step 22).
- 2.
Repeat step 1 for sums starting with the second sample, third, fourth sample, etc. - 3. Continue calculating the sums until the last sample of the document is included in a sum (step 23).
- 4. Select the maximum sum value as being the measure of the soiled state of the document (step 24).
- 5. Compare the maximum sum with the threshold value representing the borderline between fit and unfit documents to decide whether a sampled document is fit or unfit (step 25).
- If the maximum sum is less than the threshold this indicates an unfit note which is passed along
path 13 to the dump. Otherwise the note is passed alongpath 14 by suitably actuating thediverter 12. - The reason for positioning the
photodiodes 6 andwindows 7 in the locations shown in Figure 1 can be seen in Figure 4A. This shows the variation in intensity of reflected light with direction in accordance with the Lambertian Law. In this case, the direction of theincident light 9 is normal to thebanknote 3. There is a very high reflected intensity in line with this as indicated at 16 and this corresponds to the specularly reflected light. It will be noticed that the variation in intensity of the remaining diffusely reflected light is generally symmetrical about theposition 17 of thebanknote 3 which is illuminated and about the region through which the specularly reflected radiation passes. Thephotodiodes 6 are positioned therefore at corresponding positions on each side of the line of symmetry. If the angle of incidence should change due for example to a crinkle or fold in thebanknote 3 this will be equivalent to rotation of thebanknote 3 about the point ofillumination 17 resulting in rotation of the polar diagram. It is clear from this diagram that such a rotation will result in an increase in the intensity of diffuse radiation received by one sensor and a corresponding reduction at the other sensor. The average of the two sensors, will remain the same providing the degree of rotation is not such that significant specularly reflected light is received by one of the sensors. - Figure 4B illustrates another example in which the angle of illumination is indicated by an
arrow 9a. For the same reasons, thesensors 6 are positioned at corresponding positions on either side of the line ofsymmetry 9b. - The geometry of illuminating and receiving radiation from a surface is shown in Figure 6. The distances and angles need no explanation beyond confirming that "a" is the perpendicular distance between the centre of the sensing position (sensor) and the surface under examination, and that "b" is the perpendicular displacement between the beam of radiation from the point of illumination (source) and the centre of the sensing position.
- If the intensity of the surface illumination is arranged to be constant with variations of "a" (commonly achieved by collimation or focusing of the illumination) then the strength of the signal will be proportional to the following terms:
cos α - Lambertian distribution of the reflected light.
1/r² - inverse square law.
L.cos(α - β) - area of detector normal to incident light. - As L will be constant for any one detector, the total signal will be proportional to
(1/r²)cos α. cos (α - β) -
-
- A family of curves derived from this equation is shown in Figure 7. Each of the curves uses a value for "b" of 10 mm and clearly shows a maximum at which the percentage variation of signal strength with variation of working distance is at a minimum. The curves become flatter as "β" is reduced, as shown, from 45° through 30° and 0° to -20°. All of the curves are for an unmasked sensor at the sensing position, apart from one in which the presence of the mask has given an effective value for "β" of 0°. In other words, the apertured mask is parallel to the surface under examination.
- If two sensing positions are provided, and their displacements "b" are made slightly different from one another, then two separate curves for b₁ and b₂ are obtained which are displaced fron one another as shown in Figure 8. The sum of the two curves is then flatter than either of the constituent curves over an extended range of the working distances, although this does degrade somewhat the compensation for angular effects. In a similar manner, the two sensing positions could have different values for "a".
- Thus, in embodying the teachings of the present invention in the above described example, the nominal working distance D between the
housing 1 and thesupport 10 is set to correspond to a position at the centre of the plateau region of the curve for the chosen values of "b" and "β". Thereafter, variations in the distance D during the feeding of thebanknote 3 past thehousing 1 will result in little change in the radiation received at eachwindow 7. Thewindows 7 may be rectangular, and the illuminated area may be 10 mm by 2.5 mm. In typical examples, the or each of the sensing positions is situated at an angle of between +20° and -20° relatively to thesurface 3, and/or at a separation distance "b" of between 10 mm and 17 mm perpendicularly to the beam ofradiation 9 before diffuse reflection by thesurface 3, for a working range of distances D of between 8 mm and 15 mm perpendicularly to thesurface 3.
Claims (22)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8616334 | 1986-07-04 | ||
GB08616334A GB2193803A (en) | 1986-07-04 | 1986-07-04 | Monitoring diffuse reflectivity |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0257749A1 true EP0257749A1 (en) | 1988-03-02 |
EP0257749B1 EP0257749B1 (en) | 1992-04-22 |
Family
ID=10600566
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP87305961A Expired - Lifetime EP0257749B1 (en) | 1986-07-04 | 1987-07-06 | Methods and apparatus for monitoring the diffuse reflectivity of a surface |
Country Status (7)
Country | Link |
---|---|
US (1) | US4988206A (en) |
EP (1) | EP0257749B1 (en) |
JP (1) | JPH01500616A (en) |
DE (1) | DE3778453D1 (en) |
ES (1) | ES2031505T3 (en) |
GB (1) | GB2193803A (en) |
WO (1) | WO1988000338A1 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0426047A2 (en) * | 1989-10-30 | 1991-05-08 | Terumo Kabushiki Kaisha | Reflected light measuring instrument |
WO1994016412A1 (en) * | 1993-01-09 | 1994-07-21 | Mars, Incorporated | Detection of counterfeit objects |
NL9401796A (en) * | 1994-10-28 | 1996-06-03 | Tno | Document recognition apparatus |
WO1996035939A1 (en) * | 1995-05-07 | 1996-11-14 | Klaschka Gmbh & Co. | Apparatus for determining the powder density on a dusty printed article |
EP0892371A2 (en) * | 1997-07-18 | 1999-01-20 | Ncr International Inc. | An apparatus for validating sheets |
US5915518A (en) * | 1994-01-04 | 1999-06-29 | Mars, Incorporated | Detection of counterfeit objects, for instance counterfeit banknotes |
US5918960A (en) * | 1994-01-04 | 1999-07-06 | Mars Incorporated | Detection of counterfeit objects, for instance counterfeit banknotes |
EP1321904B2 (en) † | 2001-12-20 | 2020-04-08 | Crane Payment Innovations, Inc. | Apparatus for sensing optical characteristics of a banknote |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2805909B2 (en) * | 1989-11-10 | 1998-09-30 | 松下電器産業株式会社 | Electronic component lead measuring device and measuring method |
DE69411321T2 (en) * | 1993-04-27 | 1999-02-25 | The Furukawa Electric Co., Ltd., Tokio/Tokyo | Device for detecting fluorescence |
NZ286314A (en) * | 1995-05-25 | 1998-07-28 | Machinery Dev Co Pty Ltd | Feed roller for compressive removal of bark from a felled tree comprising a base portion and projecting engaging means in a generally helical arrangement |
US6118521A (en) * | 1996-01-02 | 2000-09-12 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US5966205A (en) | 1997-07-01 | 1999-10-12 | Lj Laboratories, Llc | Method and apparatus for detecting and preventing counterfeiting |
US6373573B1 (en) * | 2000-03-13 | 2002-04-16 | Lj Laboratories L.L.C. | Apparatus for measuring optical characteristics of a substrate and pigments applied thereto |
US6239868B1 (en) | 1996-01-02 | 2001-05-29 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US5745229A (en) * | 1996-01-02 | 1998-04-28 | Lj Laboratories, L.L.C. | Apparatus for determining optical characteristics of an object |
US5880826A (en) | 1997-07-01 | 1999-03-09 | L J Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of teeth |
US6254385B1 (en) | 1997-01-02 | 2001-07-03 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of teeth |
US5759030A (en) * | 1996-01-02 | 1998-06-02 | Lj Laboratories, L.L.C. | Method for determing optical characteristics of teeth |
US5926262A (en) * | 1997-07-01 | 1999-07-20 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6307629B1 (en) | 1997-08-12 | 2001-10-23 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6301004B1 (en) * | 2000-05-31 | 2001-10-09 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6233047B1 (en) | 1997-01-02 | 2001-05-15 | Lj Laboratories, L.L.C. | Apparatus and method for measuring optical characteristics of an object |
US6501542B2 (en) | 1998-06-30 | 2002-12-31 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6870616B2 (en) * | 1998-06-30 | 2005-03-22 | Jjl Technologies Llc | Spectrometer apparatus for determining an optical characteristic of an object or material having one or more sensors for determining a physical position or non-color property |
US6449041B1 (en) | 1997-07-01 | 2002-09-10 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6271913B1 (en) | 1997-07-01 | 2001-08-07 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6246471B1 (en) | 1998-06-08 | 2001-06-12 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
US6246479B1 (en) | 1998-06-08 | 2001-06-12 | Lj Laboratories, L.L.C. | Integrated spectrometer assembly and methods |
US6573984B2 (en) | 1998-06-30 | 2003-06-03 | Lj Laboratories Llc | Apparatus and method for measuring optical characteristics of teeth |
US6249348B1 (en) | 1998-11-23 | 2001-06-19 | Lj Laboratories, L.L.C. | Integrated spectrometer assembly and methods |
US6538726B2 (en) | 1998-07-10 | 2003-03-25 | Lj Laboratories, Llc | Apparatus and method for measuring optical characteristics of an object |
WO2001009588A1 (en) * | 1999-07-30 | 2001-02-08 | Umm Electronics Inc. | Method and apparatus to reduce reflectance errors due to non-uniform color development |
US6519037B2 (en) | 1999-12-23 | 2003-02-11 | Lj Laboratories, Llc | Spectrometer having optical unit including a randomized fiber optic implement |
US6362888B1 (en) | 1999-12-23 | 2002-03-26 | Lj Laboratories, L.L.C. | Spectrometer assembly |
US6414750B2 (en) | 2000-01-10 | 2002-07-02 | Lj Laboratories, L.L.C. | Spectrometric apparatus and method for measuring optical characteristics of an object |
US6903813B2 (en) * | 2002-02-21 | 2005-06-07 | Jjl Technologies Llc | Miniaturized system and method for measuring optical characteristics |
JP4033781B2 (en) * | 2002-05-29 | 2008-01-16 | シャープ株式会社 | Optical object identification device, processing system, and conveyance processing system |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1053386A (en) * | 1900-01-01 | |||
US3526777A (en) * | 1968-04-25 | 1970-09-01 | Hunter Associates Lab Inc | Reflectance measuring apparatus including a mask for compensating for movement of the specimen |
US3718399A (en) * | 1971-06-29 | 1973-02-27 | G Kalman | Distance compensated reflectance sensor |
US4189235A (en) * | 1976-11-29 | 1980-02-19 | G.A.O.Gesellschaft Fur Automation Und Organisation Mbh | Test device for dynamically measuring the degree of dirt accumulation on bank-notes |
EP0209860A2 (en) * | 1985-07-25 | 1987-01-28 | Firma Carl Zeiss | Apparatus for contactless reflection measurement |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB894570A (en) * | 1959-07-15 | 1962-04-26 | British Iron Steel Research | Improvements in or relating to the detection of surface abnormalities |
US3984189A (en) * | 1973-01-19 | 1976-10-05 | Hitachi Electronics, Ltd. | Method and apparatus for detecting defects in a surface regardless of surface finish |
US4092068A (en) * | 1976-05-05 | 1978-05-30 | Domtar Inc. | Surface sensor |
US4252443A (en) * | 1979-08-09 | 1981-02-24 | Domtar Inc. | Blackening sensor |
FR2465213A1 (en) * | 1979-09-13 | 1981-03-20 | Oreal | APPARATUS FOR DIGITAL COLORING OR COLOR MODIFICATION OF AN OBJECT |
JPS56148041A (en) * | 1980-04-18 | 1981-11-17 | Fujitsu General Ltd | Reflected light quantity detector |
US4583861A (en) * | 1981-08-12 | 1986-04-22 | Tokyo Shibaura Denki Kabushiki Kaisha | Surface condition judging apparatus |
GB2117897B (en) * | 1982-03-03 | 1986-04-16 | Sira Ltd | Detecting surface defects |
HU188795B (en) * | 1982-05-28 | 1986-05-28 | Koezponti Elelmiszeripari Kutato Intezet,Hu | Detecting arrangement for meassuring the intensity of radiation scattering at a given angle from a sample exposed to radiation of given angle of incidence |
DE3226372A1 (en) * | 1982-07-14 | 1984-01-19 | Compur-Electronic GmbH, 8000 München | METHOD AND DEVICE FOR MEASURING REMISSIONS |
DE3226370A1 (en) * | 1982-07-14 | 1984-01-19 | Compur-Electronic GmbH, 8000 München | REMISSION MEASURING HEAD |
JPS60149948A (en) * | 1984-01-18 | 1985-08-07 | Yaskawa Electric Mfg Co Ltd | Density detection apparatus |
DE3750963T2 (en) * | 1986-02-26 | 1995-05-18 | Fuji Photo Film Co Ltd | Reflectometer. |
-
1986
- 1986-07-04 GB GB08616334A patent/GB2193803A/en not_active Withdrawn
-
1987
- 1987-07-06 DE DE8787305961T patent/DE3778453D1/en not_active Expired - Lifetime
- 1987-07-06 JP JP62503994A patent/JPH01500616A/en active Pending
- 1987-07-06 WO PCT/GB1987/000474 patent/WO1988000338A1/en unknown
- 1987-07-06 ES ES198787305961T patent/ES2031505T3/en not_active Expired - Lifetime
- 1987-07-06 US US07/165,196 patent/US4988206A/en not_active Expired - Fee Related
- 1987-07-06 EP EP87305961A patent/EP0257749B1/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1053386A (en) * | 1900-01-01 | |||
US3526777A (en) * | 1968-04-25 | 1970-09-01 | Hunter Associates Lab Inc | Reflectance measuring apparatus including a mask for compensating for movement of the specimen |
US3718399A (en) * | 1971-06-29 | 1973-02-27 | G Kalman | Distance compensated reflectance sensor |
US4189235A (en) * | 1976-11-29 | 1980-02-19 | G.A.O.Gesellschaft Fur Automation Und Organisation Mbh | Test device for dynamically measuring the degree of dirt accumulation on bank-notes |
EP0209860A2 (en) * | 1985-07-25 | 1987-01-28 | Firma Carl Zeiss | Apparatus for contactless reflection measurement |
Non-Patent Citations (4)
Title |
---|
JENAER RUNDSCHAU, vol. 15, special no., 1970, pages 81-84; W. FALTA et al.: "Glanzmessansatz Ralpha/45-alpha zum SPEKOL" * |
PATENT ABSTRACTS OF JAPAN, vol. 6, no. 30 (P-103)[908], 23rd February 1982; & JP-A-56 148 041 (GENERAL K.K.) 17-11-1981 * |
PATENT ABSTRACTS OF JAPAN, vol. 9, no. 24 (P-331)[1747], 31st January 1985; & JP-A-59 168 311 (HAMAMATSU HOTONIKUSU K.K.) 22-09-1984 * |
PATENT ABSTRACTS OF JAPAN, vol. 9, no. 323 (P-414)[2046], 18th December 1985; & JP-A-60 149 948 (YASUKAWA DENKI SEISAKUSHO K.K.) 07-08-1985 * |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0426047A2 (en) * | 1989-10-30 | 1991-05-08 | Terumo Kabushiki Kaisha | Reflected light measuring instrument |
EP0426047A3 (en) * | 1989-10-30 | 1992-03-11 | Terumo Kabushiki Kaisha | Reflected light measuring instrument |
WO1994016412A1 (en) * | 1993-01-09 | 1994-07-21 | Mars, Incorporated | Detection of counterfeit objects |
US5915518A (en) * | 1994-01-04 | 1999-06-29 | Mars, Incorporated | Detection of counterfeit objects, for instance counterfeit banknotes |
US5918960A (en) * | 1994-01-04 | 1999-07-06 | Mars Incorporated | Detection of counterfeit objects, for instance counterfeit banknotes |
NL9401796A (en) * | 1994-10-28 | 1996-06-03 | Tno | Document recognition apparatus |
WO1996035939A1 (en) * | 1995-05-07 | 1996-11-14 | Klaschka Gmbh & Co. | Apparatus for determining the powder density on a dusty printed article |
EP0892371A2 (en) * | 1997-07-18 | 1999-01-20 | Ncr International Inc. | An apparatus for validating sheets |
EP0892371A3 (en) * | 1997-07-18 | 2000-01-12 | Ncr International Inc. | An apparatus for validating sheets |
EP1321904B2 (en) † | 2001-12-20 | 2020-04-08 | Crane Payment Innovations, Inc. | Apparatus for sensing optical characteristics of a banknote |
Also Published As
Publication number | Publication date |
---|---|
GB2193803A (en) | 1988-02-17 |
GB8616334D0 (en) | 1986-08-13 |
ES2031505T3 (en) | 1992-12-16 |
JPH01500616A (en) | 1989-03-01 |
WO1988000338A1 (en) | 1988-01-14 |
EP0257749B1 (en) | 1992-04-22 |
US4988206A (en) | 1991-01-29 |
DE3778453D1 (en) | 1992-05-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4988206A (en) | Methods are apparatus for monitoring the diffuse reflectivity of a surface | |
US5034616A (en) | Device for optically scanning sheet-like documents | |
EP0655978B1 (en) | Apparatus and method for checking an envelope for contents | |
EP0072236B1 (en) | Apparatus for detecting tape on sheets | |
US4019066A (en) | Measuring the surface roughness of a moving sheet material | |
JPH09510548A (en) | Method and device for detecting wrinkle position of packaging material | |
US20030042438A1 (en) | Methods and apparatus for sensing degree of soiling of currency, and the presence of foreign material | |
JP2002510102A (en) | Method and apparatus for inspecting articles | |
EP0374799B1 (en) | Apparatus for detecting number of packs included in bundle | |
US5932888A (en) | Web or sheet edge position measurement process and device | |
US7519213B2 (en) | Optical double feed detection | |
JP3604549B2 (en) | Paper sheet foreign matter detection device | |
EP0018505A2 (en) | Banknote condition monitoring apparatus | |
EP0244092B1 (en) | Optical apparatus and method for examining an object | |
US3634012A (en) | Method and apparatus for examining intaglio printing | |
EP0408337A1 (en) | Sheet inspection method and apparatus | |
RU2271576C2 (en) | Method for determining authenticity of bank notes and device for realization of said method | |
US5373365A (en) | Apparatus and method for measuring particle contamination | |
US5111037A (en) | Device for measuring light scattered by an information support | |
JP2004163129A (en) | Defect inspection method | |
JP3570488B2 (en) | Measurement method of alloying degree of galvanized steel sheet using laser beam | |
RU35455U1 (en) | Banknote authentication device | |
JP5082552B2 (en) | Optical measuring apparatus and optical measuring method | |
JPH0749930B2 (en) | Mounted board inspection device | |
JP3406951B2 (en) | Surface condition inspection device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE ES GB IT SE |
|
17P | Request for examination filed |
Effective date: 19880901 |
|
17Q | First examination report despatched |
Effective date: 19900522 |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): DE ES GB IT SE |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SE Effective date: 19920422 |
|
REF | Corresponds to: |
Ref document number: 3778453 Country of ref document: DE Date of ref document: 19920527 |
|
ITF | It: translation for a ep patent filed | ||
REG | Reference to a national code |
Ref country code: ES Ref legal event code: FG2A Ref document number: 2031505 Country of ref document: ES Kind code of ref document: T3 |
|
PLBI | Opposition filed |
Free format text: ORIGINAL CODE: 0009260 |
|
26 | Opposition filed |
Opponent name: GAO GESELLSCHAFT FUER AUTOMATION UND ORGANISATION Effective date: 19930122 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: ES Payment date: 19930701 Year of fee payment: 7 |
|
PLAB | Opposition data, opponent's data or that of the opponent's representative modified |
Free format text: ORIGINAL CODE: 0009299OPPO |
|
R26 | Opposition filed (corrected) |
Opponent name: GAO GESELLSCHAFT FUER AUTOMATION UND ORGANISATION Effective date: 19930122 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: ES Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 19940707 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 19970714 Year of fee payment: 11 |
|
RDAH | Patent revoked |
Free format text: ORIGINAL CODE: EPIDOS REVO |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 19980629 Year of fee payment: 12 |
|
RDAG | Patent revoked |
Free format text: ORIGINAL CODE: 0009271 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: PATENT REVOKED |
|
27W | Patent revoked |
Effective date: 19980312 |
|
GBPR | Gb: patent revoked under art. 102 of the ep convention designating the uk as contracting state |
Free format text: 980312 |