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EP0049754A1 - High speed temperature controlled electrometer - Google Patents

High speed temperature controlled electrometer Download PDF

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Publication number
EP0049754A1
EP0049754A1 EP81106685A EP81106685A EP0049754A1 EP 0049754 A1 EP0049754 A1 EP 0049754A1 EP 81106685 A EP81106685 A EP 81106685A EP 81106685 A EP81106685 A EP 81106685A EP 0049754 A1 EP0049754 A1 EP 0049754A1
Authority
EP
European Patent Office
Prior art keywords
temperature
amplifier
electrometer
preamplifier
thermo
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP81106685A
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German (de)
French (fr)
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EP0049754B1 (en
Inventor
Wayne J. Whistler
Robert S. Loveland
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Applied Biosystems Inc
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Perkin Elmer Corp
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Publication of EP0049754A1 publication Critical patent/EP0049754A1/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24Arrangements for measuring quantities of charge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0023Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32Compensating for temperature change
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R5/00Instruments for converting a single current or a single voltage into a mechanical displacement
    • G01R5/28Electrostatic instruments

Definitions

  • This invention relates to electrometers and has for its principal object the reduction of the effects of environmental changes on high impedance electrometers operating in hostile environments such as temperature changes, vibration, contamination, and humidity and the increase substantially the speed of response.
  • a detector must operate with high speed and be highly sensitive to detect such small current values.
  • Today's measuring devices have been unable to meet this criteria. For example, today's detectors respond to an input current change in 30 to 100 milliseconds (10% to 90% time) whereas with this invention not only is it able to measure low values of current (I femto amp) but is able to do so in less than I millisecond response time. With this invention the capabilities of a mass spectrometer are no longer inhibited since the response time of the electrometer is now typically 100 times faster than the prior art electrometer.
  • an object of this invention is to provide a very sensitive high impedance electrometer capable of operating with a mass spectrometer so as to measure extremely low current values and which has a fast response time so as to improve the operation of mass spectrometers.
  • Another object of this invention is to provide a high impedance electrometer having improved performance (speed and sensitivity) due to the minimization of the effects of internal shunt capacitances in and around the high impedance components.
  • the high speed temperature controlled electrometer of this invention which meets the foregoing objects and which is an improvement over prior art devices of this type comprises a preamplifier having a very high resistance feedback resistor (a small "chip" type) all mounted on a temperature controlled substrate.
  • the temperature of the substrate is controlled by a thermo-electric module which uses the Peltier effect to cool the substrate on which the substrate is mounted in heat exchange relationship and which is controlled by a temperature control circuit connected to a temperature sensor.
  • the temperature sensor is also mounted on the substrate and, the substrate and thermo-electric module are all enclosed in a hermetically sealed housing.
  • FIG. 1 there is shown a high speed temperature controlled electrometer comprising this invention indicated in its entirety as 10.
  • the electrometer components are enclosed in a housing 12 formed, in part, by a metallic heat sink 14 which extends beyond one wall of the housing (also metallic) to be connected to another heat conductive means (not shown).
  • a lid 16 is hermetrically sealed to the housing to form an enclosure in which an inert gas, such as dry nitrogen, is placed.
  • an inert gas such as dry nitrogen
  • the electrometer components comprise a plurality of input and output, respectively, pins 18 with one pair 20 and 22 forming the input and output of the electrometer, shown as conductor lines more clearly in Figure 2 while others form connections to a temperature controller circuit 24 which is also enclosed in a housing shown as a dashed block diagram 26.
  • a high resistance feedback resistor R I is connected to lines 20 and 22 and in parallel between the input 28 and output 30 of a preamplifier 32.
  • the feedback resistor R1 which can be considered as part of the preamplifier 32 are mounted on o substrate 34 together with a temperature sensor 36 which senses the temperature of the substrate 34 and thus senses the temperature of the feedback resistor R1 and preamplifier 32.
  • Substrate 34 is mounted in heat conducting relationship on a thermo-electric module 38 which controls the temperature of the substrate.
  • the thermo-electric module is mounted in heat conducting relationship on the heat sink tab 14.
  • the heat sink tab may be mounted in a heat conducting relationship to a heat absorbing element (not shown).
  • Potentiometer R2 is used to set the substrate 34 to a desired temperature.
  • thermo-electric module 38 Any variation from the temperature selected for the substrate is sensed by the temperature sensor which sends an error signal to the temperature controller 24 and this deviation from the selected temperature is fed back as a correction signal to the thermo-electric module 38 to return the substrate to the selected temperature.
  • This is very important because the resistance of the feedback resistor R1 and other components in the preamplifier change their characteristics significantly due to changes in temperature.
  • this thermo-electric module operating on the Peltier effect cools the substrate and the temperature is controlled to within + 0.05°C over an ambient change of at least 40 0 .
  • thermo-electric module 38 All of the components enclosed within the dashed block 12 representing the housing, except for the thermo-electric module 38, comprises the preamplifier 32 and all of the components in the second dashed block 26 representing the controller housing comprise the temperature controller 24 and the two are interconnected by any suitable means such as by an interconnect cable 40.
  • any suitable means such as by an interconnect cable 40.
  • the output from the mass spectrometer or any other device, (input 20) is coupled to a first amplifier stage 50 comprising a pair of J-FET transistors Q 1 and Q2 shown as a chip AD 833A from Analog Devices Inc.
  • Input 20 is connected to the gate electrode of transistor QI and the source electrode of the transistor is coupled in common with the source electrode of the second transistor Q2.
  • the drain electrodes of each of these two transistors are connected to the emitter electrodes of a pair of bipolar NPN transistors Q3 and Q4 disclosed as chip AD 810 from Analog Devices Inc. and which comprises a second amplifier 52 and is the load for the first amplifier 50.
  • the base electrodes are respectively connected in common and their collector electrodes are coupled to a positive voltage source through a pair of resistors R3 and R4. Also coupled between resistors R3 and R4 and the collectors of transistors Q3 and Q4 is a third resistor R5 and a capacitor C I which form a frequency compensation circuit to stabilize the amplifier.
  • the collector of transistor Q3 is also connected to the non inverting node of operational amplifier (op amp) 54 and the collector of transistor Q4 is connected to the inverting node of the op amp 54.
  • the output of the op omp 54 is the output of the electrometer 22.
  • the op amp LF 351 is avoilable from National Semiconductor.
  • the output line 22 is also connected through resistor R6 to one side of the primary feedback resistor Rl, mentioned previously, with the other side of this resistor coupled bock to the input gate electrode to the first amplifier 50.
  • the output signal developed across resistor R 1, the primary feedback resistor, times the voltage gain of the amplifier, which is described below, produces the output voltage of the electrometer.
  • This amplifier is, in a sense, an ion current-to-voltage converter.
  • the importance of the input amplifier 50 and the use of J-FET transistors is that they provide extremely low leakage currents and low noise.
  • the loading amplifier 52 which is connected with amplifier 50 in a cascade configuration eliminates the Miller Effect capacity between the input gate and drain on the transistor QI thus reducing the noise in the amplifier by minimizing the effective input capacity of the amplifier 50.
  • resistor R6 Also connected between resistor R6 and primary feedback resistor RI is pair of resistors R7 and R8 which respectively connect to the drains J-FET transistors Q5 and Q6 (E 174's from National Semiconductor) whose sources are commonly connected through circuit ground.
  • the gates of these transistors are respectively connected to a positive voltage source (+15V) through a pair of resistors R9 and RIO. This voltage (+15V) keeps the switches normally open. Connecting the gates to ground turns the switches on. These transistors act as switches to change the effective feedback resistance of the preamplifier.
  • the sources of the transistors Q1 and Q2 are connected in common to the collector of c first of a pair of NPN transistors Q7 and Q8 (a chip AD810 from Analog Devices Inc.).
  • the emitter of transistor Q7 is connected to a negative voltage source (-15V) and to the emitter of the second transistor Q8.
  • the bases of these transistors Q7 and Q8 are connected in common to the collector of the second transistor Q8 and through a resistor R9 to a positive voltage source (+15V).
  • the function of the transistors Q7 and Q8 is to supply a constant current to the J-FET transistors QI and Q2, so that the latter operate of the proper operating level. It is also noted that the gate electrode of transistor Q2 is also connected through a resistor RI I to an offset adjustment device 60 which comprises primarily a variable resistor R12 connected between a positive voltage source (+10V) and a negative voltage source (-10V). This permits voltage adjustment to compensate for the offset voltage which exists between transistors Q and Q2 and effectively nullifies this difference.
  • Temperature sensor 36 is element AD590 from Analog Device Inc., and is a device whose output current is proportional to the temperature.
  • thermo-electric module 38 which in turn controls the substrate temperature.
  • the positive side of temperature sensor 36 is also connected through a resistor R13. to the inverting or summing node of an operational amplifier 62 (one half LF 353 of National Semiconductor). This negative current is summed together with the positive current from the temperature set device comprising a fixed resistor R 14 to +10V and fixed resistor R15 to the variable resistor R2 connected between the positive voltcge source and ground (as is the non-inverting node of Op Amp 62). Also connected to the inverting node of Op Amp 62 is the RC network 66 which in turn is connected to the emitter side of the Darlington NPN transistor Q9.
  • the base of Darlington pair Q9 is connected to the output node of the op amp 62 through a second RC network 70 while the collector is connected to the negative side of the thermo-electric module 32.
  • the purpose of the two RC networks 66 and 70 is to optimize loop stability (prevent oscillation) and to optimize the response time of the system.
  • the positive side of the thermo-electric module is connected to a positive voltage source (+5V).
  • the purpose of the Darlington amplifier is to handle the larger current required by the thermo-electric module 32(1 amp maximum).
  • Resistors R2, R14 and R15 are the temperature control resistors for the thermo-electric module control circuit. A positive current is forced into the summing node, the inverting node of the op amp 62, the amount of this current being adjusted by adjusting the value of R2. In order for this amplifier 62 to stabilize at the summing node value, the currents must equal zero because the non inverting input node is grounded. This means that the current from the temperature sensor 36, which is an oppositely directed current, must be applied to the summing node.
  • op amp 62 will force transistor G9, and this amplifier 62, will force the output transistor Q9 to deliver the amount of current necessary to the thermo-electric module 32 to change the temperature and this, in turn, will cause the output of the temperature sensor 36 to change its current output so the negative current from the temperature sensor will cancel out the positive current from the temperature set device 64.
  • the initial adjustment of the temperature is set by adjusting resistor R2.
  • the feedback resistor RI has an effective shunt capacity (total distributed and shunt capacities) of less than .0! picofarads and is typically .005 picofarads so the response time, which is a function of the effective shunt capacity of the and the value of R 1 is fast.
  • the ambient temperature operating range may be extended by cascading of the thermoelectric devices which is accomplished by mounting a thermoelectric module atop another thermoelectric module thereby essentially combining the capacities of the thermoelectric modules.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

A high speed temperature controlled, microcircuit electrometer comprising a preamplifier (32) with a very high resistance feedback resistor (R1) and temperature sensor on a substrate which is temperature controlled by a thermo- electric module on which the substrate (34) is mounted and which is held within a very small range by temperature control circuitry. The preamplifier (32), feedback resistor (R1), temperature sensor and thermo-electric module (38) are all enclosed in a hermetically sealed, dry gas environment, maintained at an essentially constant temperature, to reduce the effects of hostile environments, such as temperature changes, vibration, contamination, and humidity. This electrometer operates at high speed and is highly responsive to small current values such as ion currents generated by ionized gas molecules in a mass spectrometer.

Description

    BACKGROUND OF THE INVENTION
  • This invention relates to electrometers and has for its principal object the reduction of the effects of environmental changes on high impedance electrometers operating in hostile environments such as temperature changes, vibration, contamination, and humidity and the increase substantially the speed of response.
  • In the art of mass spectrometry where this invention is useful, it is necessary to accurately detect or measure very small currents, ion currents, in the order of I femto ampere, to determine the constituency of a gas. Additionally it may be necessary to measure these changes rapidly.
  • To do this, a detector must operate with high speed and be highly sensitive to detect such small current values. Today's measuring devices have been unable to meet this criteria. For example, today's detectors respond to an input current change in 30 to 100 milliseconds (10% to 90% time) whereas with this invention not only is it able to measure low values of current (I femto amp) but is able to do so in less than I millisecond response time. With this invention the capabilities of a mass spectrometer are no longer inhibited since the response time of the electrometer is now typically 100 times faster than the prior art electrometer.
  • Thus, an object of this invention is to provide a very sensitive high impedance electrometer capable of operating with a mass spectrometer so as to measure extremely low current values and which has a fast response time so as to improve the operation of mass spectrometers.
  • Another object of this invention is to provide a high impedance electrometer having improved performance (speed and sensitivity) due to the minimization of the effects of internal shunt capacitances in and around the high impedance components.
  • Other and additional objects of this invention will become apparent to those skilled in the art from a study of the drawings and the description thereof and from the more detailed description of the invention hereinafter, as for example, the use of this invention with any device having very small output currents which need on electrometer of this type to measure these currents quickly.
  • SUMMARY OF THE INVENTION
  • The high speed temperature controlled electrometer of this invention which meets the foregoing objects and which is an improvement over prior art devices of this type comprises a preamplifier having a very high resistance feedback resistor (a small "chip" type) all mounted on a temperature controlled substrate. The temperature of the substrate is controlled by a thermo-electric module which uses the Peltier effect to cool the substrate on which the substrate is mounted in heat exchange relationship and which is controlled by a temperature control circuit connected to a temperature sensor. The temperature sensor is also mounted on the substrate and, the substrate and thermo-electric module are all enclosed in a hermetically sealed housing. Controlling the temperature of the substrate, and enclosing the temperature sensor, preamplifier and feedback resistor in this housing where the substrate is controlled to a specific temperature within a tolerance of less than ± 0.05°C over an ambient range of at least 40°C, all of the disadvantages of the prior art due to humidity and sensitivity are eliminated. By being able to connect the electrometer directly to a mass spectrometer, and by using chip type components with short, small diameter (I mil) interconnecting leads essentially eliminates vibration problems and the reduction of shunt capacitances to increase the speed of response will be apparent from the detailed description of the circuitry.
  • BRIEF DESCRIPTION OF THE DRAWINGS
    • Figure 1 is perspective partially exploded view of the physical components (hardware) of the invention;
    • Figure 2 is a simplified schematic of the components of the invention; and
    • Figure 3 is a detailed schematic of the components illustrated in Figure 2.
    DETAILED DESCRIPTION OF THE INVENTION
  • In Figures and 2, there is shown a high speed temperature controlled electrometer comprising this invention indicated in its entirety as 10. The electrometer components are enclosed in a housing 12 formed, in part, by a metallic heat sink 14 which extends beyond one wall of the housing (also metallic) to be connected to another heat conductive means (not shown). A lid 16 is hermetrically sealed to the housing to form an enclosure in which an inert gas, such as dry nitrogen, is placed. The sealing of the electrometer components within this enclosure in a dry nitrogen environment eliminates the effect of contaminants and humidity on the components.
  • The electrometer components comprise a plurality of input and output, respectively, pins 18 with one pair 20 and 22 forming the input and output of the electrometer, shown as conductor lines more clearly in Figure 2 while others form connections to a temperature controller circuit 24 which is also enclosed in a housing shown as a dashed block diagram 26. A high resistance feedback resistor R I is connected to lines 20 and 22 and in parallel between the input 28 and output 30 of a preamplifier 32. The feedback resistor R1 which can be considered as part of the preamplifier 32 are mounted on o substrate 34 together with a temperature sensor 36 which senses the temperature of the substrate 34 and thus senses the temperature of the feedback resistor R1 and preamplifier 32. Substrate 34 is mounted in heat conducting relationship on a thermo-electric module 38 which controls the temperature of the substrate. The thermo-electric module is mounted in heat conducting relationship on the heat sink tab 14. The heat sink tab may be mounted in a heat conducting relationship to a heat absorbing element (not shown). Potentiometer R2 is used to set the substrate 34 to a desired temperature.
  • Any variation from the temperature selected for the substrate is sensed by the temperature sensor which sends an error signal to the temperature controller 24 and this deviation from the selected temperature is fed back as a correction signal to the thermo-electric module 38 to return the substrate to the selected temperature. This is very important because the resistance of the feedback resistor R1 and other components in the preamplifier change their characteristics significantly due to changes in temperature. Thus, by controlling module 38, within a minimum temperature range, the temperature problems, that existed in the prior art electromelers, is eliminated. That is to say, this thermo-electric module operating on the Peltier effect cools the substrate and the temperature is controlled to within + 0.05°C over an ambient change of at least 400. By holding the temperature of the substrate essentially constant, effects of temperature on the feedback resistor, circuit leakage current and offset voltage are eliminated even though the ambient temperature changes. By connecting the input of the electrometer directly to the output of the mass spectrometer, the problem of vibration has been eliminated since the so called "flying lead" that was used heretofore between the prior art electrometer and the output of the mass spectrometer has been eliminated. Also, by using microcircuit components which utilize interconnects which are extremely short and of small diameter (small mass) vibration sensitivity in the circuit is greatly reduced. Typically, R is 0.002 in. end the longest interconnect is 0.1 in. of 0.00 thickness.
  • The manner in which the foregoing temperature control and fast response time due to the greatly minimized shunt capacitances in the circuitry will be apparent from the following description of the circuitry as shown in Figure 3.
  • In this Figure, the various components of the circuitry of the electrometer and the temperature controller will be described before the function and operation thereof is described. It should also be noted that in this figure, the previously identified components will bear the same reference numeral as they have in the prior figures.
  • All of the components enclosed within the dashed block 12 representing the housing, except for the thermo-electric module 38, comprises the preamplifier 32 and all of the components in the second dashed block 26 representing the controller housing comprise the temperature controller 24 and the two are interconnected by any suitable means such as by an interconnect cable 40. By way of explanation, also, in use of a mass spectrometer, there are a number of these electrometers and temperature controllers; only one pair being shown.
  • The output from the mass spectrometer or any other device, (input 20) is coupled to a first amplifier stage 50 comprising a pair of J-FET transistors Q 1 and Q2 shown as a chip AD 833A from Analog Devices Inc. Input 20 is connected to the gate electrode of transistor QI and the source electrode of the transistor is coupled in common with the source electrode of the second transistor Q2. The drain electrodes of each of these two transistors are connected to the emitter electrodes of a pair of bipolar NPN transistors Q3 and Q4 disclosed as chip AD 810 from Analog Devices Inc. and which comprises a second amplifier 52 and is the load for the first amplifier 50. The base electrodes are respectively connected in common and their collector electrodes are coupled to a positive voltage source through a pair of resistors R3 and R4. Also coupled between resistors R3 and R4 and the collectors of transistors Q3 and Q4 is a third resistor R5 and a capacitor C I which form a frequency compensation circuit to stabilize the amplifier.
  • The collector of transistor Q3 is also connected to the non inverting node of operational amplifier (op amp) 54 and the collector of transistor Q4 is connected to the inverting node of the op amp 54. The output of the op omp 54 is the output of the electrometer 22. The op amp LF 351 is avoilable from National Semiconductor.
  • The output line 22 is also connected through resistor R6 to one side of the primary feedback resistor Rl, mentioned previously, with the other side of this resistor coupled bock to the input gate electrode to the first amplifier 50. The output signal developed across resistor R 1, the primary feedback resistor, times the voltage gain of the amplifier, which is described below, produces the output voltage of the electrometer. This amplifier is, in a sense, an ion current-to-voltage converter.
  • The importance of the input amplifier 50 and the use of J-FET transistors is that they provide extremely low leakage currents and low noise. The loading amplifier 52 which is connected with amplifier 50 in a cascade configuration eliminates the Miller Effect capacity between the input gate and drain on the transistor QI thus reducing the noise in the amplifier by minimizing the effective input capacity of the amplifier 50.
  • Also connected between resistor R6 and primary feedback resistor RI is pair of resistors R7 and R8 which respectively connect to the drains J-FET transistors Q5 and Q6 (E 174's from National Semiconductor) whose sources are commonly connected through circuit ground. The gates of these transistors are respectively connected to a positive voltage source (+15V) through a pair of resistors R9 and RIO. This voltage (+15V) keeps the switches normally open. Connecting the gates to ground turns the switches on. These transistors act as switches to change the effective feedback resistance of the preamplifier. The energization of either of these switches, transistors Q5 or Q6, places one end of resistors R7 or R8 to ground and since these resistors act as a voltage divider with resistor R6, the ratio of their resistances provide the voltage division which causes the gain to change in the preamplifier. (R7 = 2K, R8 = 22K and R6 = 200K). With both Q5 and Q6 off (open) the effective value of the feedback resistance is R1 itself. By energizing (turning on) Q5 or Q6 the effective value of the feedback resistor can be increased to 10 times R1 or 100 times R1 respectively. It should be noted that values of R6, R7. and R8 may be chosen to accommodate most any desired gain change.
  • Referring again to the first amplifier 50, it is to be noted that the sources of the transistors Q1 and Q2 are connected in common to the collector of c first of a pair of NPN transistors Q7 and Q8 (a chip AD810 from Analog Devices Inc.). The emitter of transistor Q7 is connected to a negative voltage source (-15V) and to the emitter of the second transistor Q8. The bases of these transistors Q7 and Q8 are connected in common to the collector of the second transistor Q8 and through a resistor R9 to a positive voltage source (+15V).
  • The function of the transistors Q7 and Q8 is to supply a constant current to the J-FET transistors QI and Q2, so that the latter operate of the proper operating level. It is also noted that the gate electrode of transistor Q2 is also connected through a resistor RI I to an offset adjustment device 60 which comprises primarily a variable resistor R12 connected between a positive voltage source (+10V) and a negative voltage source (-10V). This permits voltage adjustment to compensate for the offset voltage which exists between transistors Q and Q2 and effectively nullifies this difference.
  • Finally, the negative voltage source (-15V) is connected to the negative side of the temperature sensor 36; the positive side of which is connected to the temperature control circuitry 24 to be described. Temperature sensor 36 is element AD590 from Analog Device Inc., and is a device whose output current is proportional to the temperature.
  • The output of this device is used in the control loop to control the current thru of the thermo-electric module 38 which in turn controls the substrate temperature.
  • The positive side of temperature sensor 36 is also connected through a resistor R13. to the inverting or summing node of an operational amplifier 62 (one half LF 353 of National Semiconductor). This negative current is summed together with the positive current from the temperature set device comprising a fixed resistor R 14 to +10V and fixed resistor R15 to the variable resistor R2 connected between the positive voltcge source and ground (as is the non-inverting node of Op Amp 62). Also connected to the inverting node of Op Amp 62 is the RC network 66 which in turn is connected to the emitter side of the Darlington NPN transistor Q9. The base of Darlington pair Q9 is connected to the output node of the op amp 62 through a second RC network 70 while the collector is connected to the negative side of the thermo-electric module 32. The purpose of the two RC networks 66 and 70 is to optimize loop stability (prevent oscillation) and to optimize the response time of the system. The positive side of the thermo-electric module is connected to a positive voltage source (+5V). The purpose of the Darlington amplifier is to handle the larger current required by the thermo-electric module 32(1 amp maximum).
  • Resistors R2, R14 and R15 are the temperature control resistors for the thermo-electric module control circuit. A positive current is forced into the summing node, the inverting node of the op amp 62, the amount of this current being adjusted by adjusting the value of R2. In order for this amplifier 62 to stabilize at the summing node value, the currents must equal zero because the non inverting input node is grounded. This means that the current from the temperature sensor 36, which is an oppositely directed current, must be applied to the summing node. Otherwise op amp 62 will force transistor G9, and this amplifier 62, will force the output transistor Q9 to deliver the amount of current necessary to the thermo-electric module 32 to change the temperature and this, in turn, will cause the output of the temperature sensor 36 to change its current output so the negative current from the temperature sensor will cancel out the positive current from the temperature set device 64. The initial adjustment of the temperature is set by adjusting resistor R2.
  • From the foregoing there is disclosed an extemely fast acting sensitive electrometer. The feedback resistor RI has an effective shunt capacity (total distributed and shunt capacities) of less than .0! picofarads and is typically .005 picofarads so the response time, which is a function of the effective shunt capacity of the and the value of R 1 is fast.
  • Too, while the values of the various components (resistors, capacitors, etc.) and voltage levels are shown, they were shown to simplify the description of the invention and those skilled in the art may use different valued components and voltage levels depending upon the specifications of the commercially available items.
  • Additionally, the ambient temperature operating range may be extended by cascading of the thermoelectric devices which is accomplished by mounting a thermoelectric module atop another thermoelectric module thereby essentially combining the capacities of the thermoelectric modules.

Claims (10)

1. An electrometer for measuring extremely low currents, in the order of ion current level_s, comprising:
on input and an output,
preamplifier means connected to said input and adopted to convert the current applied to said input to a voltage corresponding in value to the value of said input current,
sensor means for sensing the temperature of said preamplifier during its operation, and
means for controlling the temperature of said preamplifier and sensor means during operation so as to maintain said preamplifier and sensor within a predetermined range of temperature.
2. The electrometer as claimed in claim I wherein said preamplifier means is disposed oo a heat conducting substrate,
thermo-electric means,
said substrate being disposed on said thermo-electric means,
said sensor means and preamplifier means being responsive to the temperature of said thermo-electric means, and said control means being coupled to both means said sensor means and said thermo-electric means for maintaining the temperature of said substrate in a predetermined temperature level.
3. The electrometer as claimed in claim 2 wherein said preamplifier means comprises a first amplifier, a second amplifier and a third amplifier,
said first amplifier comprising a pair of JFET transistors,
said second amplifier being connected to the output of said first amplifier and comprising a pair of bipolar transistors, and
said third amplifier being coupled to said second amplifier and comprising an operational amplifier.
4. The electrometer as claimed in claim 3 further including a high feedback resistance between the input and the output, said resistance being located on said substrate.
5. The electrometer as claimed in claim 4 wherein means are provided for maintaining the current to said first amplifier at a predetermined level.
6. The electrometer as claimed in claim 5 wherein means are provided for adjusting the gain of said amplifier means.
7. The electrometer as claimed in claim 6 wherein said means for adjusting the gain comprises a pair of FET transistors arranged to operate as switches and located between said high resistance feedback and said outputs.
8. The electrometer as claimed in claim 7 wherein said temperature control device comprises a control amplifier means and means for adjusting the current flow from said to amplifier means so as to cdjust the temperature of said electro-thermal means.
9. The electrometer as claimed in claim 8 wherein the input to said control amplfier means is connected to said temperature sensor and responsive to the current generated thereby due to changes in temperature and wherein the output of said control amplifier means is connected to said thermo-electric means to control the latters temperature according to the temperature of the sensor means.
10. The electrometer as claimed in claim 9 wherein said preamplifier means, sensor means, feedback resistance means and thermo-electric means are enclosed in a hermetically sealed housing to protect the enclosed items from humidity and contaminants.
EP81106685A 1980-10-14 1981-08-27 High speed temperature controlled electrometer Expired EP0049754B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/196,997 US4370615A (en) 1980-10-14 1980-10-14 High speed temperature controlled electrometer
US196997 2002-07-16

Publications (2)

Publication Number Publication Date
EP0049754A1 true EP0049754A1 (en) 1982-04-21
EP0049754B1 EP0049754B1 (en) 1986-03-05

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EP81106685A Expired EP0049754B1 (en) 1980-10-14 1981-08-27 High speed temperature controlled electrometer

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US (1) US4370615A (en)
EP (1) EP0049754B1 (en)
JP (2) JPS5793265A (en)
DE (1) DE3173979D1 (en)

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DE3614529A1 (en) * 1985-05-01 1986-11-06 General Electric Co., Schenectady, N.Y. FEMTO AMPEREMETER
EP0286365A3 (en) * 1987-04-09 1989-12-13 Vg Instruments Group Limited High stability mass spectrometer
DE4410705A1 (en) * 1994-03-28 1995-10-05 Christof Kaufmann Temperature measuring error compensation method for electrical sensor e.g. strain gauge
EP0733909A1 (en) * 1995-03-24 1996-09-25 Interuniversitair Micro Elektronica Centrum Vzw Method and apparatus for local temperature sensing for use in performing high resolution in-situ measurement
US5833365A (en) * 1995-03-24 1998-11-10 Interuniversitair Micro-Electronika Centrum Vzw Method for local temperature sensing for use in performing high resolution in-situ parameter measurements
WO2008079177A3 (en) * 2006-10-12 2008-12-24 Washington Savannah River Comp Industrial universal electrometer

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US4843344A (en) * 1986-10-09 1989-06-27 Monroe Electronics, Inc. High voltage amplifier
JPH0440373A (en) * 1990-06-05 1992-02-10 Agency Of Ind Science & Technol Current/voltage conversion circuit
USH1095H (en) 1991-05-08 1992-08-04 The United States Of America As Represented By The United States Department Of Energy Cooled, temperature controlled electrometer
US5157352A (en) * 1991-11-04 1992-10-20 Electronic Instrumentation And Technology Inc. Bias current control for operational amplifier current/voltage converters
US5488301A (en) * 1994-12-19 1996-01-30 Xerox Corporation Electrostatic voltmeter employing a differential cascode
DE10041879B4 (en) * 2000-08-25 2006-08-10 Hella Kgaa Hueck & Co. Method and device for current measurement
US20080273572A1 (en) * 2006-06-02 2008-11-06 James Madison University Thermal detector for chemical or biological agents
EP1936390A1 (en) * 2006-12-20 2008-06-25 Ecole Polytechnique Federale De Lausanne Epfl - Sti - Imm - Lmis3 Semiconductor device for measuring ultra small electrical currents and small voltages
US8278909B2 (en) * 2009-07-16 2012-10-02 Mks Instruments, Inc. Wide-dynamic range electrometer with a fast response
US10062825B2 (en) * 2012-06-28 2018-08-28 City University Of Hong Kong Thermo-electric generator module

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AT232126B (en) * 1960-10-17 1964-03-10 Norma Gmbh Arrangement for the compensation of the temperature error and the heating error of electrical measuring devices
DE2061559A1 (en) * 1970-12-15 1972-07-13 Micro Therm Gmbh Device for temperature monitoring and control of electronic components
US4095253A (en) * 1975-11-29 1978-06-13 Hitachi, Ltd. Single in-line high power resin-packaged semiconductor device having an improved heat dissipator

Cited By (8)

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DE3614529A1 (en) * 1985-05-01 1986-11-06 General Electric Co., Schenectady, N.Y. FEMTO AMPEREMETER
FR2581458A1 (en) * 1985-05-01 1986-11-07 Gen Electric FEMTOAMPEREMETRE
EP0286365A3 (en) * 1987-04-09 1989-12-13 Vg Instruments Group Limited High stability mass spectrometer
DE4410705A1 (en) * 1994-03-28 1995-10-05 Christof Kaufmann Temperature measuring error compensation method for electrical sensor e.g. strain gauge
DE4410705C2 (en) * 1994-03-28 2000-05-18 Christof Kaufmann Measuring device for measuring a physical quantity
EP0733909A1 (en) * 1995-03-24 1996-09-25 Interuniversitair Micro Elektronica Centrum Vzw Method and apparatus for local temperature sensing for use in performing high resolution in-situ measurement
US5833365A (en) * 1995-03-24 1998-11-10 Interuniversitair Micro-Electronika Centrum Vzw Method for local temperature sensing for use in performing high resolution in-situ parameter measurements
WO2008079177A3 (en) * 2006-10-12 2008-12-24 Washington Savannah River Comp Industrial universal electrometer

Also Published As

Publication number Publication date
JPH0522863Y2 (en) 1993-06-11
EP0049754B1 (en) 1986-03-05
JPS5793265A (en) 1982-06-10
US4370615A (en) 1983-01-25
DE3173979D1 (en) 1986-04-10
JPH02105167U (en) 1990-08-21

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