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DE69817689D1 - Modellbasiertes Diagnosesystem mit automatisierten Verfahren für Auswahl von folgendem Test - Google Patents

Modellbasiertes Diagnosesystem mit automatisierten Verfahren für Auswahl von folgendem Test

Info

Publication number
DE69817689D1
DE69817689D1 DE69817689T DE69817689T DE69817689D1 DE 69817689 D1 DE69817689 D1 DE 69817689D1 DE 69817689 T DE69817689 T DE 69817689T DE 69817689 T DE69817689 T DE 69817689T DE 69817689 D1 DE69817689 D1 DE 69817689D1
Authority
DE
Germany
Prior art keywords
selecting
model
diagnostic system
following test
based diagnostic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69817689T
Other languages
English (en)
Other versions
DE69817689T2 (de
Inventor
Valery Kanevsky
Lee A Barford
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE69817689D1 publication Critical patent/DE69817689D1/de
Application granted granted Critical
Publication of DE69817689T2 publication Critical patent/DE69817689T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing And Monitoring For Control Systems (AREA)
DE69817689T 1997-06-26 1998-06-26 Modellbasiertes Diagnosesystem mit automatisierten Verfahren für Auswahl von folgendem Test Expired - Fee Related DE69817689T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/882,791 US6167352A (en) 1997-06-26 1997-06-26 Model-based diagnostic system with automated procedures for next test selection
US882791 1997-06-26

Publications (2)

Publication Number Publication Date
DE69817689D1 true DE69817689D1 (de) 2003-10-09
DE69817689T2 DE69817689T2 (de) 2004-07-15

Family

ID=25381339

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69817689T Expired - Fee Related DE69817689T2 (de) 1997-06-26 1998-06-26 Modellbasiertes Diagnosesystem mit automatisierten Verfahren für Auswahl von folgendem Test

Country Status (5)

Country Link
US (1) US6167352A (de)
EP (1) EP0887733B1 (de)
JP (1) JP4271282B2 (de)
KR (1) KR100520629B1 (de)
DE (1) DE69817689T2 (de)

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US6882271B2 (en) 2002-11-12 2005-04-19 Koninklijke Philips Electronics N.V. Automated medical imaging system repair diagnostics
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US7143310B2 (en) * 2003-01-22 2006-11-28 Sun Microsystems Inc. Generating standalone MIDlets from a testing harness
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US7296190B2 (en) * 2003-01-29 2007-11-13 Sun Microsystems, Inc. Parallel text execution on low-end emulators and devices
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US7287190B2 (en) * 2004-01-29 2007-10-23 Sun Microsystems, Inc. Simultaneous execution of test suites on different platforms
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US7165191B1 (en) 2004-01-29 2007-01-16 Sun Microsystems, Inc. Automated verification of user interface tests on low-end emulators and devices
US7913002B2 (en) * 2004-08-20 2011-03-22 Advantest Corporation Test apparatus, configuration method, and device interface
US20060095822A1 (en) * 2004-11-01 2006-05-04 Fong Luk Generation of test vectors for testing electronic circuits taking into account of defect probability
US7899646B2 (en) * 2004-11-02 2011-03-01 Agilent Technologies, Inc. Method for comparing a value to a threshold in the presence of uncertainty
EP1662477A1 (de) * 2004-11-26 2006-05-31 Barco N.V. Test oder Kalibrierung angezeigter Graustufen
US7050922B1 (en) * 2005-01-14 2006-05-23 Agilent Technologies, Inc. Method for optimizing test order, and machine-readable media storing sequences of instructions to perform same
US8320235B2 (en) * 2006-02-17 2012-11-27 Advantest (Singapore) Pte Ltd Self-repair system and method for providing resource failure tolerance
WO2007096971A1 (ja) * 2006-02-23 2007-08-30 Fujitsu Limited 保守ガイダンス表示装置、保守ガイダンス表示方法、保守ガイダンス表示プログラム
US8423226B2 (en) 2006-06-14 2013-04-16 Service Solutions U.S. Llc Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US9081883B2 (en) 2006-06-14 2015-07-14 Bosch Automotive Service Solutions Inc. Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US7643916B2 (en) 2006-06-14 2010-01-05 Spx Corporation Vehicle state tracking method and apparatus for diagnostic testing
US8762165B2 (en) 2006-06-14 2014-06-24 Bosch Automotive Service Solutions Llc Optimizing test procedures for a subject under test
US8428813B2 (en) 2006-06-14 2013-04-23 Service Solutions Us Llc Dynamic decision sequencing method and apparatus for optimizing a diagnostic test plan
US7673210B2 (en) * 2006-10-12 2010-03-02 Agilent Technologies, Inc. Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test
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US7991580B2 (en) * 2008-04-16 2011-08-02 Honeywell International Inc. Benchmarking diagnostic algorithms
US8239094B2 (en) 2008-04-23 2012-08-07 Spx Corporation Test requirement list for diagnostic tests
US8174996B2 (en) * 2008-06-24 2012-05-08 Verizon Patent And Licensing Inc. Adaptive test system for network function and performance evaluation
US8648700B2 (en) 2009-06-23 2014-02-11 Bosch Automotive Service Solutions Llc Alerts issued upon component detection failure
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US10042741B2 (en) * 2011-02-28 2018-08-07 Synopsys, Inc. Determining a subset of tests
WO2014185812A1 (en) * 2013-05-14 2014-11-20 Siemens Aktiengesellschaft Diagnostics of a mechanical part
JP6378231B2 (ja) 2016-03-17 2018-08-22 ファナック株式会社 機械の試験を実施する試験システム
KR102098595B1 (ko) 2019-03-27 2020-04-08 이종훈 좌변기 변좌 자동 승하강 장치
US11815560B2 (en) 2020-02-12 2023-11-14 Dit-Mco International Llc Methods and systems for wire harness test results analysis
DE102020208306B4 (de) 2020-07-02 2022-05-19 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren und Vorrichtung zum Testen einer elektronischen Komponente mithilfe von Maschinenlernverfahren
US11379352B1 (en) 2020-12-15 2022-07-05 International Business Machines Corporation System testing infrastructure with hidden variable, hidden attribute, and hidden value detection
US11132273B1 (en) 2020-12-15 2021-09-28 International Business Machines Corporation System testing infrastructure with hidden variable, hidden attribute, and hidden value detection
US11113167B1 (en) 2020-12-15 2021-09-07 International Business Machines Corporation System testing infrastructure with hidden variable, hidden attribute, and hidden value detection
US11204848B1 (en) 2020-12-15 2021-12-21 International Business Machines Corporation System testing infrastructure with hidden variable, hidden attribute, and hidden value detection
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US11586517B1 (en) * 2022-01-27 2023-02-21 International Business Machines Corporation Automated internet of things device testing including modifying a device table to generate an association table
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US5561762A (en) * 1995-06-06 1996-10-01 Union Switch & Signal Inc. Malicious fault list generation method

Also Published As

Publication number Publication date
US6167352A (en) 2000-12-26
KR100520629B1 (ko) 2005-12-21
DE69817689T2 (de) 2004-07-15
KR19990007234A (ko) 1999-01-25
EP0887733A2 (de) 1998-12-30
JPH1172361A (ja) 1999-03-16
EP0887733A3 (de) 1999-08-04
JP4271282B2 (ja) 2009-06-03
EP0887733B1 (de) 2003-09-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee