[go: up one dir, main page]

DE69637471D1 - Thermisches messeinrichtung mit schnell reagierender kalibrationsvorrichtung - Google Patents

Thermisches messeinrichtung mit schnell reagierender kalibrationsvorrichtung

Info

Publication number
DE69637471D1
DE69637471D1 DE69637471T DE69637471T DE69637471D1 DE 69637471 D1 DE69637471 D1 DE 69637471D1 DE 69637471 T DE69637471 T DE 69637471T DE 69637471 T DE69637471 T DE 69637471T DE 69637471 D1 DE69637471 D1 DE 69637471D1
Authority
DE
Germany
Prior art keywords
fast
thermal measuring
measuring device
reactive
calibration device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69637471T
Other languages
English (en)
Other versions
DE69637471T2 (de
Inventor
Timothy Ashley
Charles Thomas Elliott
Neil Thomson Gordon
Ralph Stephen Hall
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qinetiq Ltd
Original Assignee
Qinetiq Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qinetiq Ltd filed Critical Qinetiq Ltd
Publication of DE69637471D1 publication Critical patent/DE69637471D1/de
Application granted granted Critical
Publication of DE69637471T2 publication Critical patent/DE69637471T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F41—WEAPONS
    • F41G—WEAPON SIGHTS; AIMING
    • F41G7/00—Direction control systems for self-propelled missiles
    • F41G7/001—Devices or systems for testing or checking
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F41—WEAPONS
    • F41G—WEAPON SIGHTS; AIMING
    • F41G7/00—Direction control systems for self-propelled missiles
    • F41G7/20—Direction control systems for self-propelled missiles based on continuous observation of target position
    • F41G7/22—Homing guidance systems
    • F41G7/2253—Passive homing systems, i.e. comprising a receiver and do not requiring an active illumination of the target
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F41—WEAPONS
    • F41G—WEAPON SIGHTS; AIMING
    • F41G7/00—Direction control systems for self-propelled missiles
    • F41G7/20—Direction control systems for self-propelled missiles based on continuous observation of target position
    • F41G7/22—Homing guidance systems
    • F41G7/2273—Homing guidance systems characterised by the type of waves
    • F41G7/2293—Homing guidance systems characterised by the type of waves using electromagnetic waves other than radio waves
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
    • H04N23/23—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only from thermal infrared radiation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/61—Noise processing, e.g. detecting, correcting, reducing or removing noise the noise originating only from the lens unit, e.g. flare, shading, vignetting or "cos4"

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Combustion & Propulsion (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radiation Pyrometers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
DE69637471T 1995-07-31 1996-07-29 Thermisches messeinrichtung mit schnell reagierender kalibrationsvorrichtung Expired - Lifetime DE69637471T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9515682 1995-07-31
GB9515682A GB2303988A (en) 1995-07-31 1995-07-31 Thermal imaging system with detector array calibration mode
PCT/GB1996/001805 WO1997005742A1 (en) 1995-07-31 1996-07-29 Thermal sensing system having a fast response calibration device

Publications (2)

Publication Number Publication Date
DE69637471D1 true DE69637471D1 (de) 2008-05-08
DE69637471T2 DE69637471T2 (de) 2009-04-16

Family

ID=10778540

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69637471T Expired - Lifetime DE69637471T2 (de) 1995-07-31 1996-07-29 Thermisches messeinrichtung mit schnell reagierender kalibrationsvorrichtung

Country Status (10)

Country Link
US (1) US6127679A (de)
EP (1) EP0842581B1 (de)
JP (1) JP2000500226A (de)
KR (1) KR100402194B1 (de)
CN (1) CN1196321C (de)
CA (1) CA2226495C (de)
DE (1) DE69637471T2 (de)
GB (1) GB2303988A (de)
PL (1) PL181075B1 (de)
WO (1) WO1997005742A1 (de)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2319141B (en) * 1995-10-02 2000-03-08 Secr Defence Thermal imaging system
GB2314227B (en) * 1996-06-14 1998-12-23 Simage Oy Calibration method and system for imaging devices
DE19715983C1 (de) * 1997-04-17 1998-09-24 Aeg Infrarot Module Gmbh Verfahren zum Korrigieren der Grauwerte von Bildern einer digitalen Infrarot-Kamera
EP1018260B1 (de) 1997-09-26 2002-08-07 QinetiQ Limited Sensorvorrichtung
US6864916B1 (en) * 1999-06-04 2005-03-08 The Trustees Of Columbia University In The City Of New York Apparatus and method for high dynamic range imaging using spatially varying exposures
US7084905B1 (en) 2000-02-23 2006-08-01 The Trustees Of Columbia University In The City Of New York Method and apparatus for obtaining high dynamic range images
US6728016B1 (en) 2000-06-05 2004-04-27 Calient Networks, Inc. Safe procedure for moving mirrors in an optical cross-connect switch
US6587611B1 (en) 2000-06-06 2003-07-01 Calient Networks, Inc. Maintaining path integrity in an optical switch
GB0205482D0 (en) * 2002-03-08 2002-04-24 Bae Systems Plc Improvements in or relating to infra red camera calibration
US6737639B2 (en) * 2002-03-27 2004-05-18 Raytheon Company Display uniformity calibration system and method for a staring forward looking infrared sensor
SE0301137D0 (sv) 2003-04-16 2003-04-16 Saab Ab Optiskt system samt ett målsökande system innefattande ett optiskt system
US7433097B2 (en) * 2003-04-18 2008-10-07 Hewlett-Packard Development Company, L.P. Optical image scanner with moveable calibration target
US7422365B2 (en) * 2003-04-25 2008-09-09 Land Instruments International Limited Thermal imaging system and method
US7071462B2 (en) * 2003-06-16 2006-07-04 Raytek Corporation Calibration system and method to correct distortion of thermal images from in-line and rotary thermoforming machines
DE10340515B4 (de) * 2003-09-03 2007-04-19 Carl Zeiss Optronics Gmbh Verfahren und Einrichtung zur Inhomogenitätskorrektur und Kalibrierung von optronischen Kameras mit Hilfe aufgenommener Bilder und Darstellen physikalischer Größen
US7081614B2 (en) * 2004-05-21 2006-07-25 Raytheon Company Optical sensor system with built-in optical test capability
US7880777B2 (en) * 2005-05-26 2011-02-01 Fluke Corporation Method for fixed pattern noise reduction in infrared imaging cameras
JP4806584B2 (ja) * 2006-04-27 2011-11-02 富士通セミコンダクター株式会社 画像処理方法及び画像処理回路
WO2008027294A2 (en) 2006-08-25 2008-03-06 Bbn Technologies Corp. Systems and methods for synchronizing communication networks
US8240912B2 (en) * 2008-08-15 2012-08-14 Fluke Corporation Multi-zone non-contact spot thermometer
US8376610B2 (en) * 2008-09-09 2013-02-19 Fluke Corporation Automated self calibration in optical detectors
WO2011053678A1 (en) 2009-10-28 2011-05-05 The Trustees Of Columbia University In The City Of New York Methods and systems for coded rolling shutter
US9108338B2 (en) * 2011-04-13 2015-08-18 Align Technology, Inc. Methods and systems for thermal forming an object
US9083946B2 (en) * 2012-02-21 2015-07-14 Rockwell Automation Technologies, Inc. System to detect failed pixels in a sensor array
US9024253B2 (en) * 2012-08-21 2015-05-05 Raytheon Company Calibration system for detector
FR3000789B1 (fr) * 2013-01-09 2015-02-27 Thales Sa Pointe avant d'aeronef avec dispositif de calibration d'un detecteur ir et procede de calibration
US20140267758A1 (en) * 2013-03-15 2014-09-18 Pelco, Inc. Stereo infrared detector
US10057509B2 (en) * 2014-05-30 2018-08-21 Flir Systems, Inc. Multiple-sensor imaging system
JP5915949B2 (ja) * 2014-06-25 2016-05-11 パナソニックＩｐマネジメント株式会社 投影システム
CN105092046B (zh) * 2015-05-15 2018-10-30 中国计量科学研究院 一种自校准地表红外辐射测温系统
KR20170003359U (ko) 2016-03-18 2017-09-27 이지혜 척추 교정 벨트
US10263330B2 (en) * 2016-05-26 2019-04-16 Nokia Solutions And Networks Oy Antenna elements and apparatus suitable for AAS calibration by selective couplerline and TRX RF subgroups
KR101947256B1 (ko) * 2017-03-06 2019-02-12 동의대학교 산학협력단 고온계측이 가능한 교정곡선 산출 방법
KR101863498B1 (ko) * 2017-04-04 2018-05-31 동의대학교 산학협력단 고온계측이 가능한 교정곡선 산출 시스템
KR101846017B1 (ko) * 2017-09-18 2018-04-05 엘아이지넥스원 주식회사 노이즈 영상 생성 장치 및 방법
CN108254083B (zh) * 2018-01-18 2019-06-14 武汉格物优信科技有限公司 一种红外图像固定图案噪声抑制和评估方法
RU2729946C1 (ru) * 2019-11-20 2020-08-13 Российская Федерация, от имени которой выступает Государственная корпорация по космической деятельности "РОСКОСМОС" Способ полетной абсолютной радиометрической калибровки с использованием зондирующего сигнала
US11614365B1 (en) 2021-04-13 2023-03-28 Bae Systems Information And Electronic Systems Integration Inc. Luminescent cold shield paneling for infrared camera continuous non-uniformity correction
DE102023002291A1 (de) * 2023-06-06 2024-12-12 Diehl Defence Gmbh & Co. Kg Suchkopfmesssystem und Messverfahren zur optischen Vermessung eines Suchkopfs

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4419692A (en) * 1981-12-31 1983-12-06 Texas Medical Instruments, Inc. High speed infrared imaging system
US4789788A (en) * 1987-01-15 1988-12-06 The Boeing Company Optically pumped radiation source
US5023459A (en) * 1987-04-17 1991-06-11 Ford Aerospace & Communications Corporation Miniature multi-temperature radiometric reference
US4948964A (en) * 1988-01-14 1990-08-14 Texas Instruments Incorporated Artificial target for automatic gain normalization
DE3836294A1 (de) * 1988-10-25 1990-04-26 Eltro Gmbh Waermebildgeraet mit detektorausgleich
US5302824A (en) * 1992-12-01 1994-04-12 Hughes Aircraft Company Measurement of relative detector gain
CA2110368C (en) * 1992-12-07 1999-11-23 Gary M. Lindgren Wide dynamic range non-uniformity compensation for infrared focal plane arrays
US5354987A (en) * 1992-12-07 1994-10-11 Texas Instruments Incorporated Calibrating focal plane arrays using multiple variable radiometric sources
US5343040A (en) * 1993-06-10 1994-08-30 Martin Marietta Corporation Thermal reference technique for flir sensors
US5820261A (en) * 1995-07-26 1998-10-13 Applied Materials, Inc. Method and apparatus for infrared pyrometer calibration in a rapid thermal processing system

Also Published As

Publication number Publication date
KR19990036107A (ko) 1999-05-25
CA2226495A1 (en) 1997-02-13
KR100402194B1 (ko) 2004-02-11
GB2303988A (en) 1997-03-05
EP0842581A1 (de) 1998-05-20
GB9515682D0 (en) 1995-09-27
PL324754A1 (en) 1998-06-08
CA2226495C (en) 2005-03-22
JP2000500226A (ja) 2000-01-11
DE69637471T2 (de) 2009-04-16
WO1997005742A1 (en) 1997-02-13
PL181075B1 (pl) 2001-05-31
CN1196321C (zh) 2005-04-06
EP0842581B1 (de) 2008-03-26
CN1192313A (zh) 1998-09-02
US6127679A (en) 2000-10-03

Similar Documents

Publication Publication Date Title
DE69637471D1 (de) Thermisches messeinrichtung mit schnell reagierender kalibrationsvorrichtung
DE59712810D1 (de) Temperaturmessvorrichtung
DE69329068D1 (de) Sensorwiderstandmessschaltung
DE69417156D1 (de) Temperaturmessgerät
DE59606841D1 (de) Positionsmesseinrichtung
DE69614301D1 (de) Digitaler Messgerät
DE59606738D1 (de) Längen- oder Winkelmesseinrichtung
DE69223356D1 (de) Fixiervorrichtung mit Temperaturmesseinrichtung
KR970002263A (ko) 거리 측정 장치
NO953121D0 (no) Sensoranordning for temperaturmåling
DE59609930D1 (de) Temperaturfühleranordnung
DE59610542D1 (de) Messeinrichtung
DE59610150D1 (de) Temperaturfühleranordnung
DE59600753D1 (de) Schraubvorrichtung mit Messeinrichtung
DE59609428D1 (de) Lichtelektrische Positionsmesseinrichtung
DE59610094D1 (de) Optisches system mit grossen messbereichen
DE69521805D1 (de) Messinstrument mit digitaler rückstelleinrichtung
DE69607294D1 (de) V-Kolbenmotor mit Messaufnahmevorrichtung
DE59508231D1 (de) Positionsmesseinrichtung
DE69608740D1 (de) Lasermessgerät
DE59604361D1 (de) Photoelektrische Längen- oder Winkelmesseinrichtung
DE69425933D1 (de) Temperaturmessvorrichtung
DE59604109D1 (de) Winkelmesseinrichtung
FR2752054B1 (fr) Dispositif de mesure de temperature
DE69618368D1 (de) Messgerät mit Vibrationselement

Legal Events

Date Code Title Description
8364 No opposition during term of opposition