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DE69524844D1 - Speicherdaten-Sicherung für ferroelektrischen Speicher - Google Patents

Speicherdaten-Sicherung für ferroelektrischen Speicher

Info

Publication number
DE69524844D1
DE69524844D1 DE69524844T DE69524844T DE69524844D1 DE 69524844 D1 DE69524844 D1 DE 69524844D1 DE 69524844 T DE69524844 T DE 69524844T DE 69524844 T DE69524844 T DE 69524844T DE 69524844 D1 DE69524844 D1 DE 69524844D1
Authority
DE
Germany
Prior art keywords
storage
data backup
ferroelectric
storage data
ferroelectric storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69524844T
Other languages
English (en)
Other versions
DE69524844T2 (de
Inventor
Tetsuya Ohtsuki
Hiroki Koike
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE69524844D1 publication Critical patent/DE69524844D1/de
Application granted granted Critical
Publication of DE69524844T2 publication Critical patent/DE69524844T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/10—Decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
DE69524844T 1994-10-27 1995-10-27 Speicherdaten-Sicherung für ferroelektrischen Speicher Expired - Lifetime DE69524844T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6263751A JP2576425B2 (ja) 1994-10-27 1994-10-27 強誘電体メモリ装置

Publications (2)

Publication Number Publication Date
DE69524844D1 true DE69524844D1 (de) 2002-02-07
DE69524844T2 DE69524844T2 (de) 2002-09-19

Family

ID=17393790

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69524844T Expired - Lifetime DE69524844T2 (de) 1994-10-27 1995-10-27 Speicherdaten-Sicherung für ferroelektrischen Speicher

Country Status (5)

Country Link
US (1) US5574679A (de)
EP (1) EP0709851B1 (de)
JP (1) JP2576425B2 (de)
KR (1) KR100214351B1 (de)
DE (1) DE69524844T2 (de)

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US5592410A (en) * 1995-04-10 1997-01-07 Ramtron International Corporation Circuit and method for reducing a compensation of a ferroelectric capacitor by multiple pulsing of the plate line following a write operation
JPH09120685A (ja) * 1995-10-24 1997-05-06 Sony Corp 強誘電体記憶装置
KR100206713B1 (ko) * 1996-10-09 1999-07-01 윤종용 강유전체 메모리 장치에서의 비파괴적 억세싱 방법 및 그 억세싱 회로
KR100306823B1 (ko) * 1997-06-02 2001-11-30 윤종용 강유전체메모리셀들을구비한불휘발성메모리장치
KR100255956B1 (ko) * 1997-07-16 2000-05-01 윤종용 강유전체 메모리 장치 및 그것의 데이터 보호 방법
US5923603A (en) * 1997-08-20 1999-07-13 Micron Technology, Inc. Equilibrate circuit for dynamic plate sensing memories
KR100297874B1 (ko) 1997-09-08 2001-10-24 윤종용 강유전체랜덤액세스메모리장치
US5986919A (en) * 1997-11-14 1999-11-16 Ramtron International Corporation Reference cell configuration for a 1T/1C ferroelectric memory
US5969980A (en) * 1997-11-14 1999-10-19 Ramtron International Corporation Sense amplifier configuration for a 1T/1C ferroelectric memory
KR19990047442A (ko) * 1997-12-04 1999-07-05 윤종용 불 휘발성 반도체 메모리 장치
US6157979A (en) * 1998-03-14 2000-12-05 Advanced Technology Materials, Inc. Programmable controlling device with non-volatile ferroelectric state-machines for restarting processor when power is restored with execution states retained in said non-volatile state-machines on power down
US5898609A (en) * 1998-05-29 1999-04-27 Samsung Electronics Co., Ltd. Ferroelectric memory having circuit for discharging pyroelectric charges
KR100335266B1 (ko) * 1998-06-30 2002-10-19 주식회사 하이닉스반도체 반도체메모리장치
JP2000123578A (ja) 1998-10-13 2000-04-28 Sharp Corp 半導体メモリ装置
US6201731B1 (en) * 1999-05-28 2001-03-13 Celis Semiconductor Corporation Electronic memory with disturb prevention function
US6178138B1 (en) * 1999-09-21 2001-01-23 Celis Semiconductor Corporation Asynchronously addressable clocked memory device and method of operating same
KR100348576B1 (ko) * 1999-09-30 2002-08-13 동부전자 주식회사 강유전체 메모리
DE10005619A1 (de) * 2000-02-09 2001-08-30 Infineon Technologies Ag Integrierter Halbleiterspeicher mit Speicherzellen mit ferroelektrischem Speichereffekt
JP3829041B2 (ja) 2000-03-08 2006-10-04 株式会社東芝 強誘電体メモリ
US6566698B2 (en) * 2000-05-26 2003-05-20 Sony Corporation Ferroelectric-type nonvolatile semiconductor memory and operation method thereof
JP2002042496A (ja) * 2000-07-26 2002-02-08 Matsushita Electric Ind Co Ltd 強誘電体メモリ
JP3992449B2 (ja) * 2001-03-29 2007-10-17 富士通株式会社 半導体記憶装置
JP3776857B2 (ja) * 2001-10-16 2006-05-17 株式会社東芝 半導体集積回路装置
KR100527571B1 (ko) * 2002-08-30 2005-11-09 주식회사 하이닉스반도체 불휘발성 메모리 칩의 저전압 감지 수단 및 감지 방법,그리고 그 감지 수단을 이용하는 저전압 감지 시스템
JP4133166B2 (ja) * 2002-09-25 2008-08-13 株式会社ルネサステクノロジ 不揮発性半導体記憶装置
JP2004118923A (ja) * 2002-09-25 2004-04-15 Toshiba Corp 磁気ランダムアクセスメモリ
KR100665844B1 (ko) * 2005-01-04 2007-01-09 삼성전자주식회사 강유전체 메모리 장치 및 그의 구동방법
JP4646634B2 (ja) 2005-01-05 2011-03-09 ルネサスエレクトロニクス株式会社 半導体装置
JP2007207342A (ja) * 2006-02-01 2007-08-16 Renesas Technology Corp 不揮発性記憶装置
JP4908560B2 (ja) * 2009-08-31 2012-04-04 株式会社東芝 強誘電体メモリ及びメモリシステム
US8437169B2 (en) * 2010-12-20 2013-05-07 Texas Instruments Incorporated Fast response circuits and methods for FRAM power loss protection
CN102831931B (zh) * 2011-06-17 2015-04-08 中国科学院上海微系统与信息技术研究所 具有掉电数据保持功能的触发器
US10867653B2 (en) 2018-04-20 2020-12-15 Micron Technology, Inc. Access schemes for protecting stored data in a memory device
US10636469B2 (en) 2018-05-09 2020-04-28 Micron Technology, Inc. Cell voltage accumulation discharge
US10622050B2 (en) 2018-05-09 2020-04-14 Micron Technology, Inc. Ferroelectric memory plate power reduction
US11521979B2 (en) 2020-12-04 2022-12-06 Micron Technology, Inc. Power gating in a memory device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4198698A (en) * 1978-12-06 1980-04-15 Fairchild Camera And Instrument Corporation Chip select power-down control circuitry
JPS5827439Y2 (ja) * 1979-04-18 1983-06-14 シャープ株式会社 モリの番地選択回路
JPS62214597A (ja) * 1986-03-17 1987-09-21 Fujitsu Ltd 不揮発性メモリ回路
US4873664A (en) * 1987-02-12 1989-10-10 Ramtron Corporation Self restoring ferroelectric memory
EP0293798B2 (de) * 1987-06-02 1998-12-30 National Semiconductor Corporation Nichtflüchtige Speicheranordnung mit einem kapazitiven ferroelektrischen Speicherelement
DE4110407A1 (de) * 1990-03-30 1991-10-02 Toshiba Kawasaki Kk Halbleiter-speicheranordnung
JP3169599B2 (ja) * 1990-08-03 2001-05-28 株式会社日立製作所 半導体装置、その駆動方法、その読み出し方法
US5253205A (en) * 1991-09-05 1993-10-12 Nippon Steel Semiconductor Corporation Bit line and cell plate clamp circuit for a DRAM
US5416747A (en) * 1992-07-15 1995-05-16 Kawasaki Steel Corporation Semiconductor memory driven at low voltage
JPH06215599A (ja) * 1993-01-13 1994-08-05 Nec Corp 半導体記憶回路
US5331601A (en) * 1993-02-04 1994-07-19 United Memories, Inc. DRAM variable row select
JP3278981B2 (ja) * 1993-06-23 2002-04-30 株式会社日立製作所 半導体メモリ
US5477176A (en) * 1994-06-02 1995-12-19 Motorola Inc. Power-on reset circuit for preventing multiple word line selections during power-up of an integrated circuit memory

Also Published As

Publication number Publication date
EP0709851A3 (de) 1997-11-12
US5574679A (en) 1996-11-12
EP0709851B1 (de) 2002-01-02
JPH08124377A (ja) 1996-05-17
EP0709851A2 (de) 1996-05-01
JP2576425B2 (ja) 1997-01-29
KR960015595A (ko) 1996-05-22
DE69524844T2 (de) 2002-09-19
KR100214351B1 (ko) 1999-08-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition