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DE69428964D1 - Verfahren zur Analyse von Metallen mittels Sekundärionenmassenspektrometrie und Verfahren zur Vorbereitung einer Standardprobe dafür - Google Patents

Verfahren zur Analyse von Metallen mittels Sekundärionenmassenspektrometrie und Verfahren zur Vorbereitung einer Standardprobe dafür

Info

Publication number
DE69428964D1
DE69428964D1 DE69428964T DE69428964T DE69428964D1 DE 69428964 D1 DE69428964 D1 DE 69428964D1 DE 69428964 T DE69428964 T DE 69428964T DE 69428964 T DE69428964 T DE 69428964T DE 69428964 D1 DE69428964 D1 DE 69428964D1
Authority
DE
Germany
Prior art keywords
methods
preparing
mass spectrometry
standard sample
ion mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69428964T
Other languages
English (en)
Other versions
DE69428964T2 (de
Inventor
Shoji Oishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
National Institute of Advanced Industrial Science and Technology AIST
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Institute of Advanced Industrial Science and Technology AIST filed Critical National Institute of Advanced Industrial Science and Technology AIST
Publication of DE69428964D1 publication Critical patent/DE69428964D1/de
Application granted granted Critical
Publication of DE69428964T2 publication Critical patent/DE69428964T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N2001/2893—Preparing calibration standards

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE1994628964 1993-11-30 1994-05-31 Verfahren zur Analyse von Metallen mittels Sekundärionenmassenspektrometrie und Verfahren zur Vorbereitung einer Standardprobe dafür Expired - Fee Related DE69428964T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5326206A JP2726816B2 (ja) 1993-11-30 1993-11-30 二次イオン質量分析法及びそれに用いる標準試料の調製方法

Publications (2)

Publication Number Publication Date
DE69428964D1 true DE69428964D1 (de) 2001-12-13
DE69428964T2 DE69428964T2 (de) 2002-06-06

Family

ID=18185194

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1994628964 Expired - Fee Related DE69428964T2 (de) 1993-11-30 1994-05-31 Verfahren zur Analyse von Metallen mittels Sekundärionenmassenspektrometrie und Verfahren zur Vorbereitung einer Standardprobe dafür

Country Status (3)

Country Link
EP (1) EP0655618B1 (de)
JP (1) JP2726816B2 (de)
DE (1) DE69428964T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2442342A1 (en) 2001-03-19 2002-09-26 Gyros Ab A microfluidic system (edi)
US6717136B2 (en) 2001-03-19 2004-04-06 Gyros Ab Microfludic system (EDI)
EP1384076B1 (de) 2001-03-19 2012-07-25 Gyros Patent Ab Charakterisierung von reaktionsvariablen
WO2005052551A1 (ja) 2003-11-26 2005-06-09 Mitsubishi Denki Kabushiki Kaisha 微量含有物の分析方法
JP4711326B2 (ja) 2003-12-22 2011-06-29 キヤノン株式会社 検定試料および検量線の作製方法
JP5164145B2 (ja) * 2007-11-20 2013-03-13 独立行政法人産業技術総合研究所 二次イオン質量分析装置
JP6727722B2 (ja) 2016-11-29 2020-07-22 株式会社日立製作所 気流型分析システムの標準試料作成方法
CN107449648B (zh) * 2017-06-30 2019-09-27 中国科学院广州地球化学研究所 一种适用于二次离子质谱仪分析的矿石矿物的样品靶的制备方法
KR102785278B1 (ko) * 2021-11-09 2025-03-20 한국산업기술시험원 중금속을 함유하는 미세먼지 인증표준물질 제조방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2083622B (en) * 1980-06-23 1984-03-07 Baldeck Charles M Apparatus for collecting a component from a gas mixture
JPH0654286B2 (ja) * 1986-06-02 1994-07-20 株式会社島津製作所 レ−ザイオン化質量分析計用試料作成方法および試料台
JPH01114735A (ja) * 1987-10-28 1989-05-08 Sumitomo Electric Ind Ltd 分析装置の試料作製方法
SU1546517A1 (ru) * 1988-07-04 1990-02-28 Институт физической химии им.Л.В.Писаржевского АН УССР Способ обработки вольфрамовой проволоки
JP2539558B2 (ja) * 1991-08-23 1996-10-02 日本碍子株式会社 自動分析装置
JP2539557B2 (ja) * 1991-08-23 1996-10-02 日本碍子株式会社 分析試料の前処理方法

Also Published As

Publication number Publication date
EP0655618B1 (de) 2001-11-07
EP0655618A2 (de) 1995-05-31
JP2726816B2 (ja) 1998-03-11
EP0655618A3 (de) 1996-06-12
DE69428964T2 (de) 2002-06-06
JPH07151714A (ja) 1995-06-16

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee