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DE69419014D1 - Ionenquelle und messenspektrometer mit einer solchen ionenquelle - Google Patents

Ionenquelle und messenspektrometer mit einer solchen ionenquelle

Info

Publication number
DE69419014D1
DE69419014D1 DE69419014T DE69419014T DE69419014D1 DE 69419014 D1 DE69419014 D1 DE 69419014D1 DE 69419014 T DE69419014 T DE 69419014T DE 69419014 T DE69419014 T DE 69419014T DE 69419014 D1 DE69419014 D1 DE 69419014D1
Authority
DE
Germany
Prior art keywords
ion source
measurement spectrometer
spectrometer
measurement
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69419014T
Other languages
English (en)
Other versions
DE69419014T2 (de
Inventor
Stephen Mullock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kore Technology Ltd
Original Assignee
Kore Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kore Technology Ltd filed Critical Kore Technology Ltd
Application granted granted Critical
Publication of DE69419014D1 publication Critical patent/DE69419014D1/de
Publication of DE69419014T2 publication Critical patent/DE69419014T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Tubes For Measurement (AREA)
DE69419014T 1993-03-04 1994-03-03 Ionenquelle und messenspektrometer mit einer solchen ionenquelle Expired - Fee Related DE69419014T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB939304462A GB9304462D0 (en) 1993-03-04 1993-03-04 Mass spectrometer
PCT/GB1994/000407 WO1994020978A1 (en) 1993-03-04 1994-03-03 Ion gun and mass spectrometer employing the same

Publications (2)

Publication Number Publication Date
DE69419014D1 true DE69419014D1 (de) 1999-07-15
DE69419014T2 DE69419014T2 (de) 1999-10-21

Family

ID=10731487

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69419014T Expired - Fee Related DE69419014T2 (de) 1993-03-04 1994-03-03 Ionenquelle und messenspektrometer mit einer solchen ionenquelle

Country Status (7)

Country Link
US (1) US5563410A (de)
EP (1) EP0687381B1 (de)
JP (1) JP3556667B2 (de)
AU (1) AU6146194A (de)
DE (1) DE69419014T2 (de)
GB (1) GB9304462D0 (de)
WO (1) WO1994020978A1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US6002127A (en) 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5641959A (en) * 1995-12-21 1997-06-24 Bruker-Franzen Analytik Gmbh Method for improved mass resolution with a TOF-LD source
US5864137A (en) * 1996-10-01 1999-01-26 Genetrace Systems, Inc. Mass spectrometer
CA2270132A1 (en) 1996-11-06 1998-05-14 Sequenom, Inc. Dna diagnostics based on mass spectrometry
CA2274587A1 (en) 1996-12-10 1998-06-18 Genetrace Systems Inc. Releasable nonvolatile mass-label molecules
JP3470724B2 (ja) * 1998-01-23 2003-11-25 マイクロマス・リミテッド 飛行時間質量分析計及びそれに対する二重利得検出器
US6204508B1 (en) * 1998-08-07 2001-03-20 Axcelis Technologies, Inc. Toroidal filament for plasma generation
ATE423221T1 (de) 2000-06-13 2009-03-15 Univ Boston Verwendung von mass-matched nukleotide in der analyse von oligonukleotidmischungen sowie in der hoch-multiplexen nukleinsäuresequenzierung
US7084395B2 (en) * 2001-05-25 2006-08-01 Ionwerks, Inc. Time-of-flight mass spectrometer for monitoring of fast processes
US6683299B2 (en) 2001-05-25 2004-01-27 Ionwerks Time-of-flight mass spectrometer for monitoring of fast processes
US7019286B2 (en) * 2001-05-25 2006-03-28 Ionwerks, Inc. Time-of-flight mass spectrometer for monitoring of fast processes
AUPR892101A0 (en) * 2001-11-16 2001-12-13 Proteome Systems Ltd High resolution automated maldi data analysis
US6791079B2 (en) * 2002-01-29 2004-09-14 Yuri Glukhoy Mass spectrometer based on the use of quadrupole lenses with angular gradient of the electrostatic field
US6777699B1 (en) 2002-03-25 2004-08-17 George H. Miley Methods, apparatus, and systems involving ion beam generation
JP3658397B2 (ja) * 2002-06-28 2005-06-08 キヤノン株式会社 飛行時間型二次イオン質量分析法による素子の情報取得方法、および、情報取得装置
JP2004024203A (ja) * 2002-06-28 2004-01-29 Canon Inc 飛行時間型二次イオン質量分析法によるｒｎａの分析方法
GB0218454D0 (en) * 2002-08-08 2002-09-18 Micromass Ltd Mass spectrometer
US7049583B2 (en) * 2002-08-08 2006-05-23 Micromass Uk Limited Mass spectrometer
GB0310696D0 (en) * 2003-05-09 2003-06-11 Micromass Ltd Mass spectrometer
US7902529B2 (en) * 2007-08-02 2011-03-08 Thermo Finnigan Llc Method and apparatus for selectively providing electrons in an ion source
JP5425798B2 (ja) * 2007-11-06 2014-02-26 ジ アリゾナ ボード オブ リージェンツ オン ビハーフ オブ ザ ユニバーシティ オブ アリゾナ ガス中の蒸気としての化合物を分析するための高感度イオン検出装置及び方法
US10165929B2 (en) 2009-06-18 2019-01-01 Endochoice, Inc. Compact multi-viewing element endoscope system
US9587292B2 (en) * 2009-10-01 2017-03-07 Advanced Applied Physics Solutions, Inc. Method and apparatus for isolating the radioisotope molybdenum-99
US10876202B2 (en) 2010-04-21 2020-12-29 University Of North Texas Controlled deposition of metal and metal cluster ions by surface field patterning in soft-landing devices
US8651048B2 (en) * 2010-04-21 2014-02-18 University Of North Texas Controlled deposition of metal and metal cluster ions by surface field patterning in soft-landing devices
EP2615623B1 (de) * 2010-09-08 2021-06-16 Shimadzu Corporation Flugzeitpunkt-massenspektrometer
JP6180952B2 (ja) 2014-01-31 2017-08-16 東芝メモリ株式会社 デバイス製造装置及び磁気デバイスの製造方法
DE102016110495B4 (de) * 2016-06-07 2018-03-29 Vacom Vakuum Komponenten & Messtechnik Gmbh Vorrichtung und Verfahren zum Erzeugen, Speichern und Freisetzen von Ionen aus einer umgebenden Restgasatmosphäre

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4458149A (en) * 1981-07-14 1984-07-03 Patrick Luis Muga Time-of-flight mass spectrometer
WO1993003916A1 (en) * 1991-08-20 1993-03-04 E.I. Du Pont De Nemours And Company Composite shaped article
US5070240B1 (en) * 1990-08-29 1996-09-10 Univ Brigham Young Apparatus and methods for trace component analysis
GB9021629D0 (en) * 1990-10-04 1990-11-21 Superion Ltd Apparatus for and method of producing ion beams
US5365070A (en) * 1992-04-29 1994-11-15 The Regents Of The University Of California Negative ion beam injection apparatus with magnetic shield and electron removal means
US5464985A (en) * 1993-10-01 1995-11-07 The Johns Hopkins University Non-linear field reflectron

Also Published As

Publication number Publication date
WO1994020978A1 (en) 1994-09-15
GB9304462D0 (en) 1993-04-21
DE69419014T2 (de) 1999-10-21
AU6146194A (en) 1994-09-26
EP0687381A1 (de) 1995-12-20
JPH08507640A (ja) 1996-08-13
JP3556667B2 (ja) 2004-08-18
US5563410A (en) 1996-10-08
EP0687381B1 (de) 1999-06-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee