DE69229714D1 - Vorrichtung zur chemischen Abscheidung aus der Dampfphase unter Gebrauch von flüssigem Ausgangsmaterial - Google Patents
Vorrichtung zur chemischen Abscheidung aus der Dampfphase unter Gebrauch von flüssigem AusgangsmaterialInfo
- Publication number
- DE69229714D1 DE69229714D1 DE69229714T DE69229714T DE69229714D1 DE 69229714 D1 DE69229714 D1 DE 69229714D1 DE 69229714 T DE69229714 T DE 69229714T DE 69229714 T DE69229714 T DE 69229714T DE 69229714 D1 DE69229714 D1 DE 69229714D1
- Authority
- DE
- Germany
- Prior art keywords
- vapor deposition
- starting material
- chemical vapor
- deposition apparatus
- liquid starting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005229 chemical vapour deposition Methods 0.000 title 1
- 239000007788 liquid Substances 0.000 title 1
- 239000007858 starting material Substances 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/4557—Heated nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
- C23C16/20—Deposition of aluminium only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4485—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation without using carrier gas in contact with the source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/935—Gas flow control
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP34505791 | 1991-12-26 | ||
JP34506691 | 1991-12-26 | ||
JP33880092A JP3155845B2 (ja) | 1992-12-18 | 1992-12-18 | 薄膜形成法及び装置 |
JP33880392A JPH06188202A (ja) | 1992-12-18 | 1992-12-18 | Cvd装置 |
JP33879992A JP3363498B2 (ja) | 1992-12-18 | 1992-12-18 | 液体気化装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69229714D1 true DE69229714D1 (de) | 1999-09-09 |
DE69229714T2 DE69229714T2 (de) | 2000-04-27 |
Family
ID=27531247
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69229714T Expired - Fee Related DE69229714T2 (de) | 1991-12-26 | 1992-12-23 | Vorrichtung zur chemischen Abscheidung aus der Dampfphase unter Gebrauch von flüssigem Ausgangsmaterial |
Country Status (3)
Country | Link |
---|---|
US (2) | US5447568A (de) |
EP (1) | EP0548944B1 (de) |
DE (1) | DE69229714T2 (de) |
Families Citing this family (50)
Publication number | Priority date | Publication date | Assignee | Title |
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ATE205963T1 (de) * | 1990-05-31 | 2001-10-15 | Canon Kk | Halbleiteranordnung mit verbesserter leitungsführung |
US6004885A (en) | 1991-12-26 | 1999-12-21 | Canon Kabushiki Kaisha | Thin film formation on semiconductor wafer |
US5647945A (en) * | 1993-08-25 | 1997-07-15 | Tokyo Electron Limited | Vacuum processing apparatus |
US6047713A (en) * | 1994-02-03 | 2000-04-11 | Applied Materials, Inc. | Method for cleaning a throttle valve |
US5480678A (en) * | 1994-11-16 | 1996-01-02 | The B. F. Goodrich Company | Apparatus for use with CVI/CVD processes |
EP0792384B1 (de) * | 1994-11-16 | 1998-10-28 | The B.F. Goodrich Company | Vorrichtung zur druckfeld cvd/cvi, verfahren und produkt |
FR2727693A1 (fr) * | 1994-12-06 | 1996-06-07 | Centre Nat Rech Scient | Reacteur pour le depot de couches minces en phase vapeur (cvd) |
US5595605A (en) * | 1995-10-11 | 1997-01-21 | United Microelectronics Corp. | Apparatus for preventing the unstable growth rate of oxide caused by water vapor remaining in the inlet pipes of a horizontal driven field oxidation tube |
JP2867946B2 (ja) * | 1996-03-13 | 1999-03-10 | 日本電気株式会社 | 気相成長装置 |
JP3591977B2 (ja) * | 1996-03-18 | 2004-11-24 | キヤノン株式会社 | マイクロ波プラズマcvd法を用いた膜堆積方法および膜堆積装置 |
JP3555717B2 (ja) * | 1996-05-09 | 2004-08-18 | シャープ株式会社 | 半導体製造方法 |
US5849644A (en) * | 1996-08-13 | 1998-12-15 | Micron Technology, Inc. | Semiconductor processing methods of chemical vapor depositing SiO2 on a substrate |
US20010012700A1 (en) * | 1998-12-15 | 2001-08-09 | Klaus F. Schuegraf | Semiconductor processing methods of chemical vapor depositing sio2 on a substrate |
US5835678A (en) * | 1996-10-03 | 1998-11-10 | Emcore Corporation | Liquid vaporizer system and method |
US5835677A (en) * | 1996-10-03 | 1998-11-10 | Emcore Corporation | Liquid vaporizer system and method |
RU2099440C1 (ru) * | 1997-01-24 | 1997-12-20 | Плазма Текнололоджи Лимитед | Способ обработки поверхностей и устройство для его осуществления |
KR100524204B1 (ko) * | 1998-01-07 | 2006-01-27 | 동경 엘렉트론 주식회사 | 가스 처리장치 |
US6358323B1 (en) * | 1998-07-21 | 2002-03-19 | Applied Materials, Inc. | Method and apparatus for improved control of process and purge material in a substrate processing system |
JP2000091289A (ja) * | 1998-09-10 | 2000-03-31 | Hitachi Ltd | 半導体集積回路装置の製造方法 |
US6217659B1 (en) * | 1998-10-16 | 2001-04-17 | Air Products And Chemical, Inc. | Dynamic blending gas delivery system and method |
US6669988B2 (en) | 2001-08-20 | 2003-12-30 | Goodrich Corporation | Hardware assembly for CVI/CVD processes |
US7476419B2 (en) | 1998-10-23 | 2009-01-13 | Goodrich Corporation | Method for measurement of weight during a CVI/CVD process |
TW582050B (en) | 1999-03-03 | 2004-04-01 | Ebara Corp | Apparatus and method for processing substrate |
US6194030B1 (en) | 1999-03-18 | 2001-02-27 | International Business Machines Corporation | Chemical vapor deposition velocity control apparatus |
US6984415B2 (en) * | 1999-08-20 | 2006-01-10 | International Business Machines Corporation | Delivery systems for gases for gases via the sublimation of solid precursors |
US6100587A (en) | 1999-08-26 | 2000-08-08 | Lucent Technologies Inc. | Silicon carbide barrier layers for porous low dielectric constant materials |
KR100360494B1 (ko) * | 1999-09-21 | 2002-11-13 | 삼성전자 주식회사 | 기화장치 |
DE10007059A1 (de) * | 2000-02-16 | 2001-08-23 | Aixtron Ag | Verfahren und Vorrichtung zur Herstellung von beschichteten Substraten mittels Kondensationsbeschichtung |
US6443435B1 (en) * | 2000-10-23 | 2002-09-03 | Applied Materials, Inc. | Vaporization of precursors at point of use |
JP4791637B2 (ja) * | 2001-01-22 | 2011-10-12 | キヤノンアネルバ株式会社 | Cvd装置とこれを用いた処理方法 |
KR100922241B1 (ko) * | 2001-02-09 | 2009-10-15 | 도쿄엘렉트론가부시키가이샤 | 성막 장치 및 샤워헤드 구조체 |
US20040250763A1 (en) * | 2002-01-11 | 2004-12-16 | Ovshinsky Stanford R. | Fountain cathode for large area plasma deposition |
JP3828821B2 (ja) * | 2002-03-13 | 2006-10-04 | 株式会社堀場エステック | 液体材料気化供給装置 |
US6790475B2 (en) | 2002-04-09 | 2004-09-14 | Wafermasters Inc. | Source gas delivery |
JP3883918B2 (ja) * | 2002-07-15 | 2007-02-21 | 日本エー・エス・エム株式会社 | 枚葉式cvd装置及び枚葉式cvd装置を用いた薄膜形成方法 |
KR100509231B1 (ko) * | 2003-01-03 | 2005-08-22 | 주식회사 아이피에스 | 박막증착용 반응용기 |
WO2005007928A1 (en) * | 2003-07-22 | 2005-01-27 | Lg Electronics Inc. | Plasma surface processing system and supply device for plasma processing solution therefor |
US7433511B2 (en) * | 2003-10-17 | 2008-10-07 | Hewlett-Packard Development Company, L.P. | Color adjustment using black generation and under color removal |
FR2868434B1 (fr) * | 2004-04-06 | 2007-04-20 | Neyco Sa | Procedes de revetement d'un substrat et de formation d'un film colore et dispositif associe |
JP4625495B2 (ja) * | 2005-03-30 | 2011-02-02 | 三益半導体工業株式会社 | スピンエッチング方法及び装置 |
JP4803578B2 (ja) * | 2005-12-08 | 2011-10-26 | 東京エレクトロン株式会社 | 成膜方法 |
US9157152B2 (en) * | 2007-03-29 | 2015-10-13 | Tokyo Electron Limited | Vapor deposition system |
KR101173645B1 (ko) * | 2007-12-31 | 2012-08-20 | (주)에이디에스 | 가스 분사 유닛 및 이를 구비하는 박막 증착 장치 |
KR101092586B1 (ko) * | 2010-03-15 | 2011-12-13 | 정원국 | n형 및 p형 도핑을 위한 위성 성장챔버들을 구비한 MOCVD 장치 |
US20130118408A1 (en) * | 2011-11-10 | 2013-05-16 | Saint-Gobain Ceramics & Plastics, Inc. | System for use in the formation of semiconductor crystalline materials |
DE102014101410A1 (de) * | 2014-02-05 | 2015-08-06 | Endress + Hauser Gmbh + Co. Kg | Vorrichtung zur Bestimmung oder Überwachung des Füllstands eines in einemBehälter gelagerten Füllguts |
KR101980729B1 (ko) * | 2017-05-17 | 2019-08-29 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
EP3642386B1 (de) * | 2017-06-21 | 2024-04-03 | Picosun Oy | Vorrichtung und verfahren zur substratverarbeitung |
CN109962164A (zh) * | 2019-03-26 | 2019-07-02 | 暨南大学 | 一种恒温气体处理装置、包含有三维-二维钙钛矿薄膜的太阳能电池及其制备方法 |
CN111558358A (zh) * | 2020-04-07 | 2020-08-21 | 宜昌苏鹏科技有限公司 | 一种薄膜反应器及其用于烷基蒽醌连续化生产的工艺 |
Family Cites Families (15)
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US4154192A (en) * | 1976-12-10 | 1979-05-15 | Mitsubishi Denki Kabushiki Kaisha | Manufacturing apparatus for semiconductor devices |
JPS591671A (ja) * | 1982-05-28 | 1984-01-07 | Fujitsu Ltd | プラズマcvd装置 |
US4517220A (en) * | 1983-08-15 | 1985-05-14 | Motorola, Inc. | Deposition and diffusion source control means and method |
US4717596A (en) * | 1985-10-30 | 1988-01-05 | International Business Machines Corporation | Method for vacuum vapor deposition with improved mass flow control |
GB2195663B (en) * | 1986-08-15 | 1990-08-22 | Nippon Telegraph & Telephone | Chemical vapour deposition method and apparatus therefor |
EP0382987A1 (de) * | 1989-02-13 | 1990-08-22 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Gasversorgungsanlage |
NL8900980A (nl) * | 1989-04-19 | 1990-11-16 | Asm Europ | Werkwijze voor het voorzien in een gedoseerde dampstroom alsmede inrichting voor het uitvoeren daarvan. |
PT95232B (pt) * | 1989-09-09 | 1998-06-30 | Canon Kk | Processo de producao de uma pelicula de aluminio depositada |
DE69006809T2 (de) * | 1989-09-12 | 1994-09-15 | Shinetsu Chemical Co | Vorrichtung für die Verdampfung und Bereitstellung von Organometallverbindungen. |
DE69026566T2 (de) * | 1989-09-26 | 1996-11-14 | Canon Kk | Verfahren zur Herstellung von einer abgeschiedenen Metallschicht, die Aluminium als Hauptkomponent enthält, mit Anwendung von Alkalimetallaluminiumhydride |
JP2726118B2 (ja) * | 1989-09-26 | 1998-03-11 | キヤノン株式会社 | 堆積膜形成法 |
JP2721023B2 (ja) * | 1989-09-26 | 1998-03-04 | キヤノン株式会社 | 堆積膜形成法 |
JPH0784662B2 (ja) * | 1989-12-12 | 1995-09-13 | アプライドマテリアルズジャパン株式会社 | 化学的気相成長方法とその装置 |
US5316796A (en) * | 1990-03-09 | 1994-05-31 | Nippon Telegraph And Telephone Corporation | Process for growing a thin metallic film |
JP2563958Y2 (ja) * | 1993-08-30 | 1998-03-04 | 本田技研工業株式会社 | チェーンガイド装置 |
-
1992
- 1992-12-22 US US07/995,039 patent/US5447568A/en not_active Expired - Lifetime
- 1992-12-23 DE DE69229714T patent/DE69229714T2/de not_active Expired - Fee Related
- 1992-12-23 EP EP92121888A patent/EP0548944B1/de not_active Expired - Lifetime
-
1995
- 1995-05-25 US US08/449,748 patent/US5580822A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0548944A1 (de) | 1993-06-30 |
US5447568A (en) | 1995-09-05 |
US5580822A (en) | 1996-12-03 |
EP0548944B1 (de) | 1999-08-04 |
DE69229714T2 (de) | 2000-04-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |