DE69111513D1 - Halbleiterherstellungseinrichtung. - Google Patents
Halbleiterherstellungseinrichtung.Info
- Publication number
- DE69111513D1 DE69111513D1 DE69111513T DE69111513T DE69111513D1 DE 69111513 D1 DE69111513 D1 DE 69111513D1 DE 69111513 T DE69111513 T DE 69111513T DE 69111513 T DE69111513 T DE 69111513T DE 69111513 D1 DE69111513 D1 DE 69111513D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor manufacturing
- manufacturing facility
- facility
- semiconductor
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting substrates others than wafers, e.g. chips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Led Device Packages (AREA)
- Jigs For Machine Tools (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2129106A JP2566042B2 (ja) | 1990-05-21 | 1990-05-21 | 光半導体製造装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69111513D1 true DE69111513D1 (de) | 1995-08-31 |
DE69111513T2 DE69111513T2 (de) | 1996-02-15 |
Family
ID=15001221
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69111513T Expired - Fee Related DE69111513T2 (de) | 1990-05-21 | 1991-05-21 | Halbleiterherstellungseinrichtung. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5154729A (de) |
EP (1) | EP0458246B1 (de) |
JP (1) | JP2566042B2 (de) |
KR (1) | KR940006508B1 (de) |
DE (1) | DE69111513T2 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07153721A (ja) * | 1993-11-26 | 1995-06-16 | Seiko Seiki Co Ltd | ダイシング装置 |
US5745364A (en) * | 1994-12-28 | 1998-04-28 | Nec Corporation | Method of producing semiconductor wafer |
JP4657590B2 (ja) | 2002-08-28 | 2011-03-23 | オイレス工業株式会社 | 滑り軸受及びそれを具備した軸受機構 |
JP4391217B2 (ja) * | 2003-12-16 | 2009-12-24 | 株式会社トプコン | 表面検査装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3564568A (en) * | 1968-08-22 | 1971-02-16 | Mallory & Co Inc P R | Method of locating and holding semiconductor wafer |
US3709378A (en) * | 1971-03-04 | 1973-01-09 | Ibm | Aligning and orienting apparatus |
US4125252A (en) * | 1974-10-01 | 1978-11-14 | Jeumont-Schneider | Power semiconductor assembly and the method and apparatus for assembly thereof |
JPS52124168A (en) * | 1976-04-12 | 1977-10-18 | Matsushita Electric Ind Co Ltd | Method of assembling electronic device circuit |
JPS57138587A (en) * | 1981-02-13 | 1982-08-26 | Matsushita Electric Ind Co Ltd | Shifter for article |
US4519295A (en) * | 1983-06-02 | 1985-05-28 | Allied Corporation | Vacuum brake boosters |
JPH03136232A (ja) * | 1989-08-31 | 1991-06-11 | Dainippon Screen Mfg Co Ltd | 基板の表面処理装置 |
-
1990
- 1990-05-21 JP JP2129106A patent/JP2566042B2/ja not_active Expired - Fee Related
-
1991
- 1991-05-20 US US07/702,400 patent/US5154729A/en not_active Expired - Lifetime
- 1991-05-20 KR KR1019910008152A patent/KR940006508B1/ko not_active IP Right Cessation
- 1991-05-21 EP EP91108150A patent/EP0458246B1/de not_active Expired - Lifetime
- 1991-05-21 DE DE69111513T patent/DE69111513T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0458246A1 (de) | 1991-11-27 |
JPH0425150A (ja) | 1992-01-28 |
KR940006508B1 (ko) | 1994-07-21 |
EP0458246B1 (de) | 1995-07-26 |
US5154729A (en) | 1992-10-13 |
DE69111513T2 (de) | 1996-02-15 |
JP2566042B2 (ja) | 1996-12-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |