DE69013236D1 - Messanordnung für Oberflächen-Widerstand. - Google Patents
Messanordnung für Oberflächen-Widerstand.Info
- Publication number
- DE69013236D1 DE69013236D1 DE69013236T DE69013236T DE69013236D1 DE 69013236 D1 DE69013236 D1 DE 69013236D1 DE 69013236 T DE69013236 T DE 69013236T DE 69013236 T DE69013236 T DE 69013236T DE 69013236 D1 DE69013236 D1 DE 69013236D1
- Authority
- DE
- Germany
- Prior art keywords
- surface resistance
- measuring arrangement
- measuring
- arrangement
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8907726A FR2648236B1 (fr) | 1989-06-12 | 1989-06-12 | Appareil de mesure d'impedance surfacique |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69013236D1 true DE69013236D1 (de) | 1994-11-17 |
DE69013236T2 DE69013236T2 (de) | 1995-05-11 |
Family
ID=9382606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69013236T Expired - Fee Related DE69013236T2 (de) | 1989-06-12 | 1990-06-08 | Messanordnung für Oberflächen-Widerstand. |
Country Status (7)
Country | Link |
---|---|
US (1) | US5086274A (de) |
EP (1) | EP0403344B1 (de) |
BR (1) | BR9002779A (de) |
CA (1) | CA2018689C (de) |
DE (1) | DE69013236T2 (de) |
FR (1) | FR2648236B1 (de) |
IL (1) | IL94707A0 (de) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2043347A1 (en) * | 1990-05-30 | 1991-12-01 | Yukio Kohmura | Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibres using method and system |
US5453689A (en) * | 1991-12-06 | 1995-09-26 | Massachusetts Institute Of Technology | Magnetometer having periodic winding structure and material property estimator |
DE69330265T2 (de) * | 1992-11-25 | 2002-02-07 | Simmonds Precision Products Inc., Akron | Datenverarbeitungsstrukturen und Methoden |
US5433115A (en) * | 1993-06-14 | 1995-07-18 | Simmonds Precision Products, Inc. | Contactless interrogation of sensors for smart structures |
US5581248A (en) * | 1993-06-14 | 1996-12-03 | Simmonds Precision Products, Inc. | Embeddable device for contactless interrogation of sensors for smart structures |
US5602540A (en) * | 1993-06-14 | 1997-02-11 | Simmonds Precision Products Inc. | Fluid gauging apparatus with inductive interrogation |
US5515041A (en) * | 1993-06-14 | 1996-05-07 | Simmonds Precision Products Inc. | Composite shaft monitoring system |
JP3011090U (ja) * | 1994-11-11 | 1995-05-16 | 株式会社キョクトー | スポット溶接のナゲットの検査装置 |
US5698978A (en) * | 1995-05-15 | 1997-12-16 | Northrop Grumman Corporation | System and method for measuring electromagnetic radiation absorption |
US5793206A (en) * | 1995-08-25 | 1998-08-11 | Jentek Sensors, Inc. | Meandering winding test circuit |
US5936401A (en) * | 1996-09-19 | 1999-08-10 | The United States Of America As Represented By The Secretary Of The Air Force | Device and process for measuring electrical properties at a plurality of locations on thin film superconductors |
AU6532898A (en) * | 1997-01-06 | 1998-08-03 | Jentek Sensors, Inc. | Magnetometer and dielectrometer detection of subsurface objects |
US6486673B1 (en) | 1997-01-06 | 2002-11-26 | Jentek Sensors, Inc. | Segmented field dielectrometer |
US6781387B2 (en) | 1997-01-06 | 2004-08-24 | Jentek Sensors, Inc. | Inspection method using penetrant and dielectrometer |
WO1998037429A1 (en) * | 1997-02-21 | 1998-08-27 | Pemstar, Inc. | A magnetic recording head tester |
US6534974B1 (en) | 1997-02-21 | 2003-03-18 | Pemstar, Inc, | Magnetic head tester with write coil and read coil |
WO1998040732A1 (en) | 1997-03-13 | 1998-09-17 | Jentek Sensors, Inc. | Magnetometer detection of fatigue damage in aircraft |
CA2308166C (en) | 1997-10-29 | 2007-09-04 | Jentek Sensors, Inc. | Absolute property measurement with air calibration |
AU1405199A (en) | 1997-11-14 | 1999-06-07 | Jentek Sensors, Inc. | Multiple frequency quantitative coating characterization |
GB2354589B (en) | 1998-05-12 | 2003-10-08 | Jentek Sensors Inc | Methods for utilizing dielectrometry signals using estimation grids |
US6346807B1 (en) * | 1999-10-22 | 2002-02-12 | Bently Nevada Corporation | Digital eddy current proximity system: apparatus and method |
KR100505929B1 (ko) * | 2003-03-31 | 2005-08-04 | 삼성광주전자 주식회사 | 압축기 및 압축기의 배관연결방법 |
US7950289B2 (en) * | 2006-02-03 | 2011-05-31 | Bae Systems Plc | Damage sensors |
US8550609B2 (en) * | 2007-11-21 | 2013-10-08 | Xerox Corporation | System and method for measuring a supply of solid ink in a solid ink printer |
WO2017089591A1 (fr) | 2015-11-27 | 2017-06-01 | Airbus Safran Launchers Sas | Pale pour éolienne comprenant une couche de métallisation ayant un grammage optimisé |
CA3015868C (en) * | 2016-03-16 | 2020-06-16 | Ihi Corporation | Method for inspecting electroconductive composite material and device for inspecting electroconductive composite material |
JP6494551B2 (ja) * | 2016-03-28 | 2019-04-03 | アンリツ株式会社 | 電界強度分布測定装置及び電界強度分布測定方法 |
CN109188083A (zh) * | 2018-08-28 | 2019-01-11 | 深圳市信维通信股份有限公司 | 一种lds天线的rf一致性与线路阻抗检测系统及方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2629004A (en) * | 1947-06-10 | 1953-02-17 | Maurice L Greenough | Electrical micrometer |
US3441840A (en) * | 1967-03-31 | 1969-04-29 | Martin Marietta Corp | Electronic thickness meter having direct readout of coating thickness |
US3764897A (en) * | 1971-12-28 | 1973-10-09 | Singer Co | Electromagnetic thickness gauging using a transmitting coil shaped to provide a constant field over a range of measuring distances |
US3848183A (en) * | 1973-04-20 | 1974-11-12 | Magnaflux Corp | Eddy current testing system having concentric coils, one being movable for balancing |
CH568569A5 (de) * | 1974-02-06 | 1975-10-31 | Bbc Brown Boveri & Cie | |
US4095180A (en) * | 1975-12-29 | 1978-06-13 | K. J. Law Engineers, Inc. | Method and apparatus for testing conductivity using eddy currents |
US4042876A (en) * | 1976-04-29 | 1977-08-16 | The United States Of America As Represented By The United States Energy Research And Development Administration | Eddy current gauge for monitoring displacement using printed circuit coil |
US4383218A (en) * | 1978-12-29 | 1983-05-10 | The Boeing Company | Eddy current flow detection including compensation for system variables such as lift-off |
US4351031A (en) * | 1980-11-07 | 1982-09-21 | Magnaflux Corporation | Nondestructive testing system having automatic set-up means |
US4706020A (en) * | 1983-12-12 | 1987-11-10 | General Electric Company | High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material |
-
1989
- 1989-06-12 FR FR8907726A patent/FR2648236B1/fr not_active Expired - Lifetime
-
1990
- 1990-06-08 EP EP90401578A patent/EP0403344B1/de not_active Expired - Lifetime
- 1990-06-08 DE DE69013236T patent/DE69013236T2/de not_active Expired - Fee Related
- 1990-06-11 CA CA002018689A patent/CA2018689C/en not_active Expired - Fee Related
- 1990-06-11 US US07/535,498 patent/US5086274A/en not_active Expired - Lifetime
- 1990-06-12 BR BR909002779A patent/BR9002779A/pt not_active Application Discontinuation
- 1990-06-12 IL IL94707A patent/IL94707A0/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CA2018689A1 (en) | 1990-12-12 |
US5086274A (en) | 1992-02-04 |
BR9002779A (pt) | 1991-08-20 |
IL94707A0 (en) | 1991-04-15 |
DE69013236T2 (de) | 1995-05-11 |
FR2648236A1 (fr) | 1990-12-14 |
EP0403344B1 (de) | 1994-10-12 |
EP0403344A1 (de) | 1990-12-19 |
FR2648236B1 (fr) | 1991-12-20 |
CA2018689C (en) | 1994-09-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |