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DE60140314D1 - Ionenspeicher - Google Patents

Ionenspeicher

Info

Publication number
DE60140314D1
DE60140314D1 DE60140314T DE60140314T DE60140314D1 DE 60140314 D1 DE60140314 D1 DE 60140314D1 DE 60140314 T DE60140314 T DE 60140314T DE 60140314 T DE60140314 T DE 60140314T DE 60140314 D1 DE60140314 D1 DE 60140314D1
Authority
DE
Germany
Prior art keywords
ion memory
ion
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60140314T
Other languages
English (en)
Inventor
Donald K Smith
Stephen Horne
Matthew M Besen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MKS Instruments Inc
Original Assignee
MKS Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MKS Instruments Inc filed Critical MKS Instruments Inc
Application granted granted Critical
Publication of DE60140314D1 publication Critical patent/DE60140314D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/424Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/02Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/202Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/422Two-dimensional RF ion traps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426Methods for controlling ions
    • H01J49/427Ejection and selection methods

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE60140314T 2000-12-14 2001-12-14 Ionenspeicher Expired - Lifetime DE60140314D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US25555600P 2000-12-14 2000-12-14
PCT/US2001/048469 WO2002049067A2 (en) 2000-12-14 2001-12-14 Ion storage system

Publications (1)

Publication Number Publication Date
DE60140314D1 true DE60140314D1 (de) 2009-12-10

Family

ID=22968851

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60140314T Expired - Lifetime DE60140314D1 (de) 2000-12-14 2001-12-14 Ionenspeicher

Country Status (4)

Country Link
US (2) US6781119B2 (de)
EP (1) EP1366507B1 (de)
DE (1) DE60140314D1 (de)
WO (1) WO2002049067A2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1366507B1 (de) * 2000-12-14 2009-10-28 MKS Instruments, Inc. Ionenspeicher
GB2415541B (en) * 2004-06-21 2009-09-23 Thermo Finnigan Llc RF power supply for a mass spectrometer
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
GB0809950D0 (en) * 2008-05-30 2008-07-09 Thermo Fisher Scient Bremen Mass spectrometer
US8508127B2 (en) * 2010-03-09 2013-08-13 Cree, Inc. High CRI lighting device with added long-wavelength blue color
JP2014526046A (ja) 2011-08-05 2014-10-02 アカデミア シニカ 高速プロテオミクスのためのステップ走査式イオントラップ質量分析
WO2013066881A2 (en) * 2011-10-31 2013-05-10 Brooks Automation, Inc. Method and apparatus for tuning an electrostatic ion trap
SG11201405610PA (en) * 2012-03-13 2014-11-27 Mks Instr Inc Trace gas concentration in art ms traps
WO2014149846A2 (en) * 2013-03-15 2014-09-25 1St Detect Corporation A mass spectrometer system having an external detector
GB2551110B (en) 2016-05-23 2020-03-11 Thermo Fisher Scient Bremen Gmbh Ion injection to an electrostatic trap
WO2021023972A1 (en) * 2019-08-02 2021-02-11 Cambridge Enterprise Limited Particle sensor and sensing method
GB202314347D0 (en) * 2023-09-19 2023-11-01 Smiths Detection Watford Ltd Method and apparatus

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT528250A (de) * 1953-12-24
US3527939A (en) * 1968-08-29 1970-09-08 Gen Electric Three-dimensional quadrupole mass spectrometer and gauge
US5274233A (en) * 1991-02-28 1993-12-28 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5399857A (en) * 1993-05-28 1995-03-21 The Johns Hopkins University Method and apparatus for trapping ions by increasing trapping voltage during ion introduction
DE4324224C1 (de) * 1993-07-20 1994-10-06 Bruker Franzen Analytik Gmbh Quadrupol-Ionenfallen mit schaltbaren Multipol-Anteilen
DE19501823A1 (de) * 1995-01-21 1996-07-25 Bruker Franzen Analytik Gmbh Verfahren zur Regelung der Erzeugungsraten für massenselektives Einspeichern von Ionen in Ionenfallen
DE19523860A1 (de) * 1995-06-30 1997-01-02 Bruker Franzen Analytik Gmbh Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung
US5714755A (en) * 1996-03-01 1998-02-03 Varian Associates, Inc. Mass scanning method using an ion trap mass spectrometer
US5650617A (en) * 1996-07-30 1997-07-22 Varian Associates, Inc. Method for trapping ions into ion traps and ion trap mass spectrometer system thereof
JP3496458B2 (ja) * 1997-06-10 2004-02-09 株式会社日立製作所 イオントラップ質量分析装置及びイオントラップ質量分析方法
WO2000038312A1 (en) * 1998-12-21 2000-06-29 Shimadzu Research Laboratory (Europe) Ltd Method of fast start and/or fast termination of a radio frequency resonator
US6545268B1 (en) * 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
EP1366507B1 (de) * 2000-12-14 2009-10-28 MKS Instruments, Inc. Ionenspeicher

Also Published As

Publication number Publication date
US20020162957A1 (en) 2002-11-07
US20040217285A1 (en) 2004-11-04
US6781119B2 (en) 2004-08-24
EP1366507A2 (de) 2003-12-03
WO2002049067A2 (en) 2002-06-20
WO2002049067A3 (en) 2003-10-09
EP1366507B1 (de) 2009-10-28

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Legal Events

Date Code Title Description
8328 Change in the person/name/address of the agent

Representative=s name: HOESSLE PATENTANWAELTE PARTNERSCHAFT, 70173 STUTTG

8364 No opposition during term of opposition