DE60140314D1 - Ionenspeicher - Google Patents
IonenspeicherInfo
- Publication number
- DE60140314D1 DE60140314D1 DE60140314T DE60140314T DE60140314D1 DE 60140314 D1 DE60140314 D1 DE 60140314D1 DE 60140314 T DE60140314 T DE 60140314T DE 60140314 T DE60140314 T DE 60140314T DE 60140314 D1 DE60140314 D1 DE 60140314D1
- Authority
- DE
- Germany
- Prior art keywords
- ion memory
- ion
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/202—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US25555600P | 2000-12-14 | 2000-12-14 | |
PCT/US2001/048469 WO2002049067A2 (en) | 2000-12-14 | 2001-12-14 | Ion storage system |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60140314D1 true DE60140314D1 (de) | 2009-12-10 |
Family
ID=22968851
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60140314T Expired - Lifetime DE60140314D1 (de) | 2000-12-14 | 2001-12-14 | Ionenspeicher |
Country Status (4)
Country | Link |
---|---|
US (2) | US6781119B2 (de) |
EP (1) | EP1366507B1 (de) |
DE (1) | DE60140314D1 (de) |
WO (1) | WO2002049067A2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1366507B1 (de) * | 2000-12-14 | 2009-10-28 | MKS Instruments, Inc. | Ionenspeicher |
GB2415541B (en) * | 2004-06-21 | 2009-09-23 | Thermo Finnigan Llc | RF power supply for a mass spectrometer |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
GB0809950D0 (en) * | 2008-05-30 | 2008-07-09 | Thermo Fisher Scient Bremen | Mass spectrometer |
US8508127B2 (en) * | 2010-03-09 | 2013-08-13 | Cree, Inc. | High CRI lighting device with added long-wavelength blue color |
JP2014526046A (ja) | 2011-08-05 | 2014-10-02 | アカデミア シニカ | 高速プロテオミクスのためのステップ走査式イオントラップ質量分析 |
WO2013066881A2 (en) * | 2011-10-31 | 2013-05-10 | Brooks Automation, Inc. | Method and apparatus for tuning an electrostatic ion trap |
SG11201405610PA (en) * | 2012-03-13 | 2014-11-27 | Mks Instr Inc | Trace gas concentration in art ms traps |
WO2014149846A2 (en) * | 2013-03-15 | 2014-09-25 | 1St Detect Corporation | A mass spectrometer system having an external detector |
GB2551110B (en) | 2016-05-23 | 2020-03-11 | Thermo Fisher Scient Bremen Gmbh | Ion injection to an electrostatic trap |
WO2021023972A1 (en) * | 2019-08-02 | 2021-02-11 | Cambridge Enterprise Limited | Particle sensor and sensing method |
GB202314347D0 (en) * | 2023-09-19 | 2023-11-01 | Smiths Detection Watford Ltd | Method and apparatus |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT528250A (de) * | 1953-12-24 | |||
US3527939A (en) * | 1968-08-29 | 1970-09-08 | Gen Electric | Three-dimensional quadrupole mass spectrometer and gauge |
US5274233A (en) * | 1991-02-28 | 1993-12-28 | Teledyne Mec | Mass spectrometry method using supplemental AC voltage signals |
US5399857A (en) * | 1993-05-28 | 1995-03-21 | The Johns Hopkins University | Method and apparatus for trapping ions by increasing trapping voltage during ion introduction |
DE4324224C1 (de) * | 1993-07-20 | 1994-10-06 | Bruker Franzen Analytik Gmbh | Quadrupol-Ionenfallen mit schaltbaren Multipol-Anteilen |
DE19501823A1 (de) * | 1995-01-21 | 1996-07-25 | Bruker Franzen Analytik Gmbh | Verfahren zur Regelung der Erzeugungsraten für massenselektives Einspeichern von Ionen in Ionenfallen |
DE19523860A1 (de) * | 1995-06-30 | 1997-01-02 | Bruker Franzen Analytik Gmbh | Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung |
US5714755A (en) * | 1996-03-01 | 1998-02-03 | Varian Associates, Inc. | Mass scanning method using an ion trap mass spectrometer |
US5650617A (en) * | 1996-07-30 | 1997-07-22 | Varian Associates, Inc. | Method for trapping ions into ion traps and ion trap mass spectrometer system thereof |
JP3496458B2 (ja) * | 1997-06-10 | 2004-02-09 | 株式会社日立製作所 | イオントラップ質量分析装置及びイオントラップ質量分析方法 |
WO2000038312A1 (en) * | 1998-12-21 | 2000-06-29 | Shimadzu Research Laboratory (Europe) Ltd | Method of fast start and/or fast termination of a radio frequency resonator |
US6545268B1 (en) * | 2000-04-10 | 2003-04-08 | Perseptive Biosystems | Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis |
EP1366507B1 (de) * | 2000-12-14 | 2009-10-28 | MKS Instruments, Inc. | Ionenspeicher |
-
2001
- 2001-12-14 EP EP01987395A patent/EP1366507B1/de not_active Expired - Lifetime
- 2001-12-14 US US10/017,766 patent/US6781119B2/en not_active Expired - Lifetime
- 2001-12-14 DE DE60140314T patent/DE60140314D1/de not_active Expired - Lifetime
- 2001-12-14 WO PCT/US2001/048469 patent/WO2002049067A2/en active Application Filing
-
2004
- 2004-05-27 US US10/855,578 patent/US20040217285A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20020162957A1 (en) | 2002-11-07 |
US20040217285A1 (en) | 2004-11-04 |
US6781119B2 (en) | 2004-08-24 |
EP1366507A2 (de) | 2003-12-03 |
WO2002049067A2 (en) | 2002-06-20 |
WO2002049067A3 (en) | 2003-10-09 |
EP1366507B1 (de) | 2009-10-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8328 | Change in the person/name/address of the agent |
Representative=s name: HOESSLE PATENTANWAELTE PARTNERSCHAFT, 70173 STUTTG |
|
8364 | No opposition during term of opposition |