DE60044355D1 - PHOTO DETECTOR - Google Patents
PHOTO DETECTORInfo
- Publication number
- DE60044355D1 DE60044355D1 DE60044355T DE60044355T DE60044355D1 DE 60044355 D1 DE60044355 D1 DE 60044355D1 DE 60044355 T DE60044355 T DE 60044355T DE 60044355 T DE60044355 T DE 60044355T DE 60044355 D1 DE60044355 D1 DE 60044355D1
- Authority
- DE
- Germany
- Prior art keywords
- photo detector
- photo
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J1/46—Electric circuits using a capacitor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/70—Circuitry for compensating brightness variation in the scene
- H04N23/76—Circuitry for compensating brightness variation in the scene by influencing the image signals
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/95—Circuit arrangements
- H10F77/953—Circuit arrangements for devices having potential barriers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Light Receiving Elements (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11982499A JP4358351B2 (en) | 1999-04-27 | 1999-04-27 | Photodetector |
PCT/JP2000/002789 WO2000065317A1 (en) | 1999-04-27 | 2000-04-27 | Photodetector |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60044355D1 true DE60044355D1 (en) | 2010-06-17 |
Family
ID=14771173
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60044355T Expired - Lifetime DE60044355D1 (en) | 1999-04-27 | 2000-04-27 | PHOTO DETECTOR |
Country Status (6)
Country | Link |
---|---|
US (1) | US6757627B2 (en) |
EP (1) | EP1197735B1 (en) |
JP (1) | JP4358351B2 (en) |
AU (1) | AU4144200A (en) |
DE (1) | DE60044355D1 (en) |
WO (1) | WO2000065317A1 (en) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4119052B2 (en) * | 1999-07-16 | 2008-07-16 | 浜松ホトニクス株式会社 | Photodetector |
WO2001011870A1 (en) * | 1999-08-05 | 2001-02-15 | Hamamatsu Photonics K.K. | Solid-state imaging device and range finding device |
US6606798B2 (en) | 2001-02-23 | 2003-08-19 | Black & Decker Inc. | Laser level |
JP4722332B2 (en) * | 2001-06-18 | 2011-07-13 | 浜松ホトニクス株式会社 | Photodetector |
JP4293588B2 (en) * | 2002-12-16 | 2009-07-08 | 浜松ホトニクス株式会社 | Photodetector |
JP2004200794A (en) * | 2002-12-16 | 2004-07-15 | Hamamatsu Photonics Kk | Optical detector |
JP4663956B2 (en) * | 2002-12-25 | 2011-04-06 | 浜松ホトニクス株式会社 | Photodetector |
JP2004264034A (en) * | 2003-01-24 | 2004-09-24 | Hamamatsu Photonics Kk | Photodetector |
KR100568226B1 (en) * | 2003-11-14 | 2006-04-07 | 삼성전자주식회사 | Power supply voltage measuring device |
JP4440680B2 (en) | 2004-03-18 | 2010-03-24 | 浜松ホトニクス株式会社 | Photodetector |
JP4314172B2 (en) * | 2004-08-30 | 2009-08-12 | シャープ株式会社 | Amplification type solid-state imaging device |
JP2008258885A (en) * | 2007-04-04 | 2008-10-23 | Texas Instr Japan Ltd | Imaging apparatus and driving method of imaging apparatus |
DE102007030985B4 (en) * | 2007-07-04 | 2009-04-09 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Image sensor, method of operating an image sensor and computer program |
JP5868065B2 (en) * | 2011-08-05 | 2016-02-24 | キヤノン株式会社 | Imaging device |
US9128195B2 (en) * | 2012-03-28 | 2015-09-08 | Luxen Technologies, Inc. | Increasing dynamic range for x-ray image sensor |
WO2015105314A1 (en) * | 2014-01-07 | 2015-07-16 | Samsung Electronics Co., Ltd. | Radiation detector, tomography imaging apparatus thereof, and radiation detecting apparatus thereof |
CN111565032B (en) * | 2019-02-13 | 2023-11-10 | 上海耕岩智能科技有限公司 | Signal conversion circuit and signal readout circuit architecture |
JPWO2022250043A1 (en) * | 2021-05-27 | 2022-12-01 | ||
TWI822381B (en) * | 2021-10-06 | 2023-11-11 | 昇佳電子股份有限公司 | Light sensor circuit |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6390852A (en) * | 1986-10-03 | 1988-04-21 | Nec Corp | Output circuit of charge coupled device |
US4902886A (en) * | 1989-01-23 | 1990-02-20 | Hewlett-Packard Company | Noise reduction for photodiode arrays |
JPH04364679A (en) * | 1991-06-12 | 1992-12-17 | Hitachi Ltd | Solid-state image pickup device |
US5329312A (en) * | 1992-08-17 | 1994-07-12 | Eastman Kodak Company | DC level control circuitry for CCD images |
US5276508A (en) * | 1992-11-05 | 1994-01-04 | Eastman Kodak Company | Analog signal processor for electronic imaging system providing highly accurate reproduction of images |
JP2719086B2 (en) * | 1993-03-19 | 1998-02-25 | 浜松ホトニクス株式会社 | Photodetector |
US5949483A (en) * | 1994-01-28 | 1999-09-07 | California Institute Of Technology | Active pixel sensor array with multiresolution readout |
JP3550589B2 (en) * | 1994-05-16 | 2004-08-04 | 株式会社ニコン | Image reading device |
US6025875A (en) * | 1995-10-23 | 2000-02-15 | National Semiconductor Corporation | Analog signal sampler for imaging systems |
US6018364A (en) * | 1996-02-06 | 2000-01-25 | Analog Devices Inc | Correlated double sampling method and apparatus |
US5838176A (en) * | 1996-07-11 | 1998-11-17 | Foveonics, Inc. | Correlated double sampling circuit |
US6031570A (en) * | 1997-03-19 | 2000-02-29 | Omnivision Technologies, Inc. | Image acquisition and processing system |
JP3527911B2 (en) * | 1997-05-20 | 2004-05-17 | 富士電機デバイステクノロジー株式会社 | Optical sensor monitor circuit |
JP4489850B2 (en) * | 1997-05-28 | 2010-06-23 | 浜松ホトニクス株式会社 | Solid-state imaging device |
US5877715A (en) * | 1997-06-12 | 1999-03-02 | International Business Machines Corporation | Correlated double sampling with up/down counter |
US6201572B1 (en) * | 1998-02-02 | 2001-03-13 | Agilent Technologies, Inc. | Analog current mode assisted differential to single-ended read-out channel operable with an active pixel sensor |
-
1999
- 1999-04-27 JP JP11982499A patent/JP4358351B2/en not_active Expired - Lifetime
-
2000
- 2000-04-27 AU AU41442/00A patent/AU4144200A/en not_active Abandoned
- 2000-04-27 EP EP00921071A patent/EP1197735B1/en not_active Expired - Lifetime
- 2000-04-27 DE DE60044355T patent/DE60044355D1/en not_active Expired - Lifetime
- 2000-04-27 WO PCT/JP2000/002789 patent/WO2000065317A1/en active Application Filing
-
2001
- 2001-10-26 US US09/983,922 patent/US6757627B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2000310561A (en) | 2000-11-07 |
EP1197735A1 (en) | 2002-04-17 |
EP1197735A4 (en) | 2005-12-28 |
JP4358351B2 (en) | 2009-11-04 |
US6757627B2 (en) | 2004-06-29 |
US20020029122A1 (en) | 2002-03-07 |
AU4144200A (en) | 2000-11-10 |
EP1197735B1 (en) | 2010-05-05 |
WO2000065317A1 (en) | 2000-11-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |