DE59106652D1 - Contacting device for testing purposes. - Google Patents

Contacting device for testing purposes.

Info

Publication number: DE59106652D1
Authority: DE; Germany
Prior art keywords: contacting device; testing purposes; testing; purposes; contacting
Prior art date: 1990-07-25
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE59106652T

Other languages

German (de)

Inventor

Manfred Prokopp

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

ATG Luther and Maelzer GmbH

Original Assignee

atg electronic GmbH

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1990-07-25

Filing date

1991-05-11

Publication date

1995-11-16

1991-05-11 Application filed by atg electronic GmbH filed Critical atg electronic GmbH

1995-11-16 Application granted granted Critical

1995-11-16 Publication of DE59106652D1 publication Critical patent/DE59106652D1/en

2011-05-12 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually

Landscapes

Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
General Engineering & Computer Science (AREA)
Tests Of Electronic Circuits (AREA)

DE59106652T 1990-07-25 1991-05-11 Contacting device for testing purposes. Expired - Lifetime DE59106652D1 (en)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
DE4023621		1990-07-25
DE4109684A DE4109684C2 (en)	1990-07-25	1991-03-23	Contacting device for testing purposes

Publications (1)

Publication Number	Publication Date
DE59106652D1 true DE59106652D1 (en)	1995-11-16

Family

ID=6410989

Family Applications (2)

Application Number	Title	Priority Date	Filing Date
DE4109684A Expired - Lifetime DE4109684C2 (en)	1990-07-25	1991-03-23	Contacting device for testing purposes
DE59106652T Expired - Lifetime DE59106652D1 (en)	1990-07-25	1991-05-11	Contacting device for testing purposes.

Family Applications Before (1)

Application Number	Title	Priority Date	Filing Date
DE4109684A Expired - Lifetime DE4109684C2 (en)	1990-07-25	1991-03-23	Contacting device for testing purposes

Country Status (1)

Country	Link
DE (2)	DE4109684C2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE4414770A1 (en) *	1994-04-27	1995-11-02	Hubert Driller	Test system for assembled and bare printed circuit boards
DE4441347C2 (en) *	1994-11-21	1998-10-29	Peter Fritzsche	Method for testing electronic circuits on printed circuit boards and device for carrying out the method
DE19503329C2 (en) *	1995-02-02	2000-05-18	Ita Ingb Testaufgaben Gmbh	Test device for electronic printed circuit boards
DE19703982B4 (en) *	1997-02-03	2004-06-09	Atg Test Systems Gmbh & Co.Kg	Method for testing printed circuit boards
DE19748029C2 (en) *	1997-10-30	2001-02-01	Siemens Nixdorf Inf Syst	Method for testing assemblies having electrical components
DE10043728C2 (en) *	2000-09-05	2003-12-04	Atg Test Systems Gmbh	Method for testing printed circuit boards and use of a device for carrying out the method
DE10043726C2 (en) *	2000-09-05	2003-12-04	Atg Test Systems Gmbh	Method for testing circuit boards with a parallel tester and apparatus for carrying out the method
DE10220343B4 (en) *	2002-05-07	2007-04-05	Atg Test Systems Gmbh & Co. Kg Reicholzheim	Apparatus and method for testing printed circuit boards and probes

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB2038489A (en) *	1978-11-10	1980-07-23	Gen Electric Co Ltd	Arrangement for testing electric circuits on printed wiring boards
GB2039489B (en) *	1979-01-17	1983-01-26	Madaliev S	Powdered modified epoxy resin
US4626780A (en) *	1985-02-01	1986-12-02	Virginia Panel Corporation	Tri-axis automated test system for printed circuit boards

1991
- 1991-03-23 DE DE4109684A patent/DE4109684C2/en not_active Expired - Lifetime
- 1991-05-11 DE DE59106652T patent/DE59106652D1/en not_active Expired - Lifetime

Also Published As

Publication number	Publication date
DE4109684C2 (en)	2001-07-12
DE4109684A1 (en)	1992-01-30

Publication	Publication Date	Title
DE59101509D1 (en)	1994-06-01	TESTING DEVICE FOR BANKNOTES.
DE69007113D1 (en)	1994-04-07	TEST DEVICE FOR THERMAL IMAGING DEVICES.
DE68923796D1 (en)	1995-09-14	ANTI-STEEL DEVICE FOR EYEGLASSES.
DE69103930D1 (en)	1994-10-20	Measuring probe test.
DE68923378D1 (en)	1995-08-10	CONNECTING DEVICE FOR PIPES.
DE3887937D1 (en)	1994-03-31	Inspection device.
DE69112173D1 (en)	1995-09-21	Holding device for flat part base.
DE69025388D1 (en)	1996-03-28	Maximum likelihood sequence assessment device
DE69012837D1 (en)	1994-10-27	MEASURING DEVICE.
DE69109659D1 (en)	1995-06-14	MEASURING DEVICE FOR HARVESTED PRODUCTS.
DE69001445D1 (en)	1993-06-03	MEASURING DEVICE.
DE69012674D1 (en)	1994-10-27	Examination device for pipes.
DE59102989D1 (en)	1994-10-27	Holding device for sacks.
DE69105345D1 (en)	1995-01-12	Holding device for engines.
DE69014180D1 (en)	1994-12-22	Evaluation apparatus for lenses.
DE59102374D1 (en)	1994-09-01	ULTRASONIC TESTING DEVICE.
DE69024016D1 (en)	1996-01-18	Measuring device.
DE3483249D1 (en)	1990-10-25	SIMPLIFIED TEST DEVICE.
DE69109064D1 (en)	1995-05-24	HOLDING DEVICE FOR BATTERIES.
NO881557L (en)	1988-10-17	DEVICE FOR TESTING MISSIL SYSTEMS.
DE59105716D1 (en)	1995-07-20	Eye test device.
DE69106290D1 (en)	1995-02-09	Test device.
DE69015565D1 (en)	1995-02-09	Ultrasonic testing device.
DE3781143D1 (en)	1992-09-17	TEST DEVICE.
DE59106652D1 (en)	1995-11-16	Contacting device for testing purposes.

Legal Events

Date	Code	Title	Description
1996-08-01	8327	Change in the person/name/address of the patent owner	Owner name: ATG TEST SYSTEMS GMBH, 97877 WERTHEIM, DE ADAPTRON
1996-11-07	8364	No opposition during term of opposition
2000-05-18	8327	Change in the person/name/address of the patent owner	Owner name: ATG TEST SYSTEMS GMBH, 97877 WERTHEIM, DE
2000-07-13	8327	Change in the person/name/address of the patent owner	Owner name: ATG TEST SYSTEMS GMBH & CO.KG, 97877 WERTHEIM, DE
2008-03-13	8327	Change in the person/name/address of the patent owner	Owner name: ATG LUTHER & MAELZER GMBH, 50668 KOELN, DE