DE4039743A1 - Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values - Google Patents
Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined valuesInfo
- Publication number
- DE4039743A1 DE4039743A1 DE19904039743 DE4039743A DE4039743A1 DE 4039743 A1 DE4039743 A1 DE 4039743A1 DE 19904039743 DE19904039743 DE 19904039743 DE 4039743 A DE4039743 A DE 4039743A DE 4039743 A1 DE4039743 A1 DE 4039743A1
- Authority
- DE
- Germany
- Prior art keywords
- correction values
- measurement
- optical imaging
- values
- error correction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Die Erfindung findet im Zusammenhang mit optischen Durchmessermeßgeräten, die beispielsweise in der kabel- und walzgutherstellenden Industrie eingesetzt werden, Anwendung.The invention takes place in connection with optical Diameter measuring devices that are used, for example, in and the rolling industry, Application.
Es ist ein Verfahren zur Korrektur der optischen Abbildungsfehler des "Research Institute of Electrical Engineering" in Prag bekannt, bei dem anstelle des Meßgutes eine festgelegte Anzahl Prüfnormale in das Meßfeld eingebracht werden. Ausgehend davon, daß im Bereich der optischen Achse keine Abbildungsfehler auftreten, und unter der Bedingung, daß die Mitte der Prüfnormale exakt durch die optische Achse verläuft, können so eine angemessene Anzahl Korrekturwerte ermittelt werden. Dabei kann aber davon ausgegangen werden, daß das Wechseln der Prüfnormale recht aufwendig ist, da die mechanische Befestigung sehr exakt ausfallen muß. Außerdem wird bei einer größeren Anzahl von Prüfnormalen der Abgleichaufwand entsprechend hoch.It is a method of correcting the optical Image errors of the "Research Institute of Electrical Engineering "in Prague, where instead of A defined number of test standards in the Measuring field are introduced. Assuming that in Region of the optical axis no aberrations occur, and on the condition that the middle of the Test standards run exactly through the optical axis, can determine an appropriate number of correction values will. But it can be assumed that the Changing the test standards is quite complex because the mechanical attachment must be very precise. In addition, with a larger number of Test standards the adjustment effort correspondingly high.
Eine weitere Möglichkeit, die Korrekturwerte zu ermitteln, basiert auf dem Gedanken, eine Objektkante um definierte Wegstrecken parallel durch das Meßfeld zu verschieben. Dazu ist aber eine inkrementelle Längenmeßeinrichtung notwendig, um die Verschiebewege exakt zu ermitteln. Der meßtechnische Aufwand steigt erheblich.Another way to determine the correction values is based on the idea of defining an object edge around To move distances parallel through the measuring field. But this is an incremental length measuring device necessary to determine the displacement paths exactly. The metrological effort increases significantly.
Die DE-OS 33 05 129 beschreibt ein Verfahren und eine Vorrichtung zur Kalibrierung einer zum Messen einer Dimension eines Körpers dienenden Meßvorrichtung. Dabei unterscheiden sich die Abbildungsverfahren derart, daß im beschriebenen Verfahren eine Meßskala als Hintergrund im eigentlichen Meßfeld dient, wobei diese abwechselnd von zwei Lampen beleuchtet wird, die entsprechend vom Mikrorechner gesteuert zu- bzw. abgeschaltet werden müssen. Dieses Verfahren ist für den vorliegenden Sachverhalt nicht anwendbar, da bei dem vorliegenden Abbildungssystem nach DD-WP 1 52 988 das Meßgut von hinten beleuchtet wird und somit der Hintergrund nicht für die Aufnahme einer Meßskala - wie in obengenannter Patentschrift beschrieben - dienen kann.DE-OS 33 05 129 describes a method and a Device for calibrating one for measuring one Dimension of a body-serving measuring device. Here the imaging methods differ in such a way that in described a measurement scale as a background in the actual measuring field, which alternates from two lamps is lit, which is accordingly from Microcomputer controlled on or off have to. This procedure is for the present The facts are not applicable, as in the present case Imaging system according to DD-WP 1 52 988 the measured material from behind is illuminated and therefore the background is not for the Recording a measuring scale - as in the above Patent specification described - can serve.
Das von uns beschriebene Verfahren erfaßt die Korrekturwerte in der Meßebene des Systems einmalig.The procedure described by us covers the Correction values in the measuring level of the system are unique.
Der Erfindung liegt das Problem zugrunde, ein Verfahren zu schaffen, das es ermöglicht, die Korrekturwerte für die Korrektur optischer Abbildungsfehler in Durchmessermeßgeräten auf der Basis von CCD-Zeilen in einem Arbeitsgang zu ermitteln.The invention is based on the problem of a method create that enables the correction values for the Correction of optical aberrations in diameter measuring devices based on CCD lines in one operation to determine.
Erfindungsgemäß wird das Problem so gelöst, daß auf dem als Normal eingesetzten Strichraster mit definierten Abständen y₁ . . . yn der Striche die Abstände xi der Striche gemessen und die Korrekturwerte ki durch Subtraktion von den realen Abständen y ermittelt werden.According to the invention the problem is solved in such a way that on the line grid used as normal with defined intervals y 1. . . y n of the lines, the distances x i of the lines are measured and the correction values k i are determined by subtracting from the real distances y.
Die weitere Ausgestaltung des erfindungsgemäßen Verfahrens sieht vor, zwischen den ermittelten Korrekturwerten ki eine Interpolation durchzuführen.The further embodiment of the method according to the invention provides for an interpolation between the determined correction values k i .
Die Anwendung der Erfindung führt zu einer Minimierung des Aufwandes zur Ermittlung der Korrekturwerte.The application of the invention leads to a minimization the effort to determine the correction values.
Anhand eines Beispieles soll das erfindungsgemäße Verfahren näher erläutert werden.Using an example, the inventive Procedures are explained in more detail.
Bei Durchmessermeßgeräten mit CCD-Zeile wird anstelle des Meßgutes ein Strichraster 2 mit definierten Abständen y₁ . . . yn der Striche eingebracht. Das Strichraster 2 wird derart angeordnet, daß die Striche mit Hilfe der Strahlungsquelle 1 und der Optik 4 auf der CCD-Zeile 3 abgebildet werden und so der Abstand x₁ . . . xn der Striche gemessen werden kann. In diameter measuring devices with a CCD line, a line grid 2 with defined distances y 1 is used instead of the material to be measured. . . y n introduced the strokes. The line grid 2 is arranged such that the lines are imaged on the CCD line 3 with the aid of the radiation source 1 and the optics 4 and so the distance x 1 . . . x n of the lines can be measured.
Die Korrekturwerte k₁ . . . kn werden dann durch Subtraktion der bekannten Abstände y₁ . . . yn und der gemessenen Abstände x₁ . . . xn ermittelt. Die ermittelten Korrekturwerte werden in einem Festwertspeicher abgespeichert und durch das Meßgerät bei der Ermittlung der Meßwerte während des Betriebes mit ausgewertet.The correction values k₁. . . k n are then y₁ by subtracting the known distances. . . y n and the measured distances x₁. . . x n determined. The correction values determined are stored in a read-only memory and are also evaluated by the measuring device when determining the measured values during operation.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19904039743 DE4039743A1 (en) | 1990-12-08 | 1990-12-08 | Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19904039743 DE4039743A1 (en) | 1990-12-08 | 1990-12-08 | Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values |
Publications (1)
Publication Number | Publication Date |
---|---|
DE4039743A1 true DE4039743A1 (en) | 1992-06-11 |
Family
ID=6420190
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19904039743 Ceased DE4039743A1 (en) | 1990-12-08 | 1990-12-08 | Optical imaging error correction in cable dia. measurement - subtracting measured values for standard pattern from defined values |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE4039743A1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1219922A2 (en) * | 2000-12-28 | 2002-07-03 | INB Vision AG | Procedure to improve the exactness of optical 3D-measuring |
DE10065120A1 (en) * | 2000-12-28 | 2002-07-11 | Inb Vision Ag | Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position |
CN104949620A (en) * | 2014-03-28 | 2015-09-30 | 株式会社三丰 | Correction device and correction method for optical measuring apparatus |
US11257205B2 (en) * | 2015-12-21 | 2022-02-22 | Mitutoyo Corporation | Image measuring method and apparatus |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4129384A (en) * | 1977-06-08 | 1978-12-12 | Batelle Memorial Institute | Optical extensometer |
DE3305129A1 (en) * | 1982-02-16 | 1983-09-01 | Osakeyhtiö Decon AB, 02201 Espoo | Method and device for calibrating a measuring device which serves to measure a dimension of a body |
-
1990
- 1990-12-08 DE DE19904039743 patent/DE4039743A1/en not_active Ceased
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4129384A (en) * | 1977-06-08 | 1978-12-12 | Batelle Memorial Institute | Optical extensometer |
DE3305129A1 (en) * | 1982-02-16 | 1983-09-01 | Osakeyhtiö Decon AB, 02201 Espoo | Method and device for calibrating a measuring device which serves to measure a dimension of a body |
Non-Patent Citations (1)
Title |
---|
DE-Buch: Internationales Wörterbuch der Metrologie, 1. Aufl., Benth Verlag, Berlin, Köln, 1984, Stichpunkte 3.10 u. 3.14 * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1219922A2 (en) * | 2000-12-28 | 2002-07-03 | INB Vision AG | Procedure to improve the exactness of optical 3D-measuring |
DE10065120A1 (en) * | 2000-12-28 | 2002-07-11 | Inb Vision Ag | Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position |
DE10065120C2 (en) * | 2000-12-28 | 2003-03-20 | Inb Vision Ag | Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position |
EP1219922A3 (en) * | 2000-12-28 | 2004-01-21 | INB Vision AG | Procedure to improve the exactness of optical 3D-measuring |
CN104949620A (en) * | 2014-03-28 | 2015-09-30 | 株式会社三丰 | Correction device and correction method for optical measuring apparatus |
CN104949620B (en) * | 2014-03-28 | 2019-07-23 | 株式会社三丰 | Calibration equipment and bearing calibration for optical measuring device |
US11257205B2 (en) * | 2015-12-21 | 2022-02-22 | Mitutoyo Corporation | Image measuring method and apparatus |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8131 | Rejection |