DE3869311D1 - Roentgenanalysegeraet. - Google Patents

Roentgenanalysegeraet.

Info

Publication number: DE3869311D1
Authority: DE; Germany
Prior art keywords: analysis device; ray analysis; ray; analysis
Prior art date: 1987-10-16
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE8888202185T

Other languages

English (en)

Inventor

Tol Maurits Willem Van

Johannes Henricus Anton Bueter

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Koninklijke Philips NV

Original Assignee

Philips Gloeilampenfabrieken NV

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1987-10-16

Filing date

1988-10-03

Publication date

1992-04-23

1988-10-03 Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV

1992-04-23 Application granted granted Critical

1992-04-23 Publication of DE3869311D1 publication Critical patent/DE3869311D1/de

2008-10-04 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

Physics & Mathematics (AREA)
Chemical & Material Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Analytical Chemistry (AREA)
High Energy & Nuclear Physics (AREA)
Engineering & Computer Science (AREA)
Crystallography & Structural Chemistry (AREA)
Health & Medical Sciences (AREA)
Spectroscopy & Molecular Physics (AREA)
General Engineering & Computer Science (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Analysing Materials By The Use Of Radiation (AREA)

DE8888202185T 1987-10-16 1988-10-03 Roentgenanalysegeraet. Expired - Lifetime DE3869311D1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
NL8702475A NL8702475A (nl)	1987-10-16	1987-10-16	Roentgen analyse apparaat.

Publications (1)

Publication Number	Publication Date
DE3869311D1 true DE3869311D1 (de)	1992-04-23

Family

ID=19850782

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE8888202185T Expired - Lifetime DE3869311D1 (de)	1987-10-16	1988-10-03	Roentgenanalysegeraet.

Country Status (5)

Country	Link
US (1)	US4885760A (de)
EP (1)	EP0312155B1 (de)
JP (1)	JPH01132943A (de)
DE (1)	DE3869311D1 (de)
NL (1)	NL8702475A (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE4102850A1 (de) *	1991-01-31	1992-08-06	Philips Patentverwaltung	Roentgenographisches spannungsmessgeraet
US5268954A (en) *	1992-10-14	1993-12-07	Wisconsin Alumni Research Foundation	Mounting apparatus for double crystal monochromators and the like
CN105632578B (zh) *	2015-03-10	2018-02-23	深圳市禾苗分析仪器有限公司	直线驱动式x射线单色器及其应用

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3445653A (en) *	1964-10-10	1969-05-20	Hitachi Ltd	X-ray monochromator of linear type
GB1183702A (en) *	1966-03-30	1970-03-11	Ass Elect Ind	Improvements relating to X-Ray Analysing Apparatus.
US3566111A (en) *	1967-06-19	1971-02-23	Siemens Ag	Apparatus for varying the detector slit width in fully focusing x-ray spectrometers
NL7803026A (nl) *	1978-03-21	1979-09-25	Philips Nv	Instelmechanisme.
US4446568A (en) *	1981-06-05	1984-05-01	California Institute Of Technology	Versatile focusing radiation analyzer
NL184386C (nl) *	1983-03-15	1989-07-03	Eindhoven Tech Hogeschool	Kinematisch roentgenanalyse-apparaat.
US4807268A (en) *	1983-11-04	1989-02-21	University Of Southern California	Scanning monochrometer crystal and method of formation

1987
- 1987-10-16 NL NL8702475A patent/NL8702475A/nl not_active Application Discontinuation
1988
- 1988-09-27 US US07/250,023 patent/US4885760A/en not_active Expired - Fee Related
- 1988-10-03 DE DE8888202185T patent/DE3869311D1/de not_active Expired - Lifetime
- 1988-10-03 EP EP88202185A patent/EP0312155B1/de not_active Expired
- 1988-10-13 JP JP63256043A patent/JPH01132943A/ja active Pending

Also Published As

Publication number	Publication date
US4885760A (en)	1989-12-05
JPH01132943A (ja)	1989-05-25
NL8702475A (nl)	1989-05-16
EP0312155A1 (de)	1989-04-19
EP0312155B1 (de)	1992-03-18

Publication	Publication Date	Title
DE3481084D1 (de)	1990-02-22	Untersuchungsgeraet.
DE3887547D1 (de)	1994-03-17	Abbildungsgerät.
DE3850057D1 (de)	1994-07-14	Bilderzeugungsgerät.
DE3854467D1 (de)	1995-10-19	Bilderzeugungsgerät.
DE3851968D1 (de)	1994-12-08	Bilderzeugungsgerät.
DE3850702D1 (de)	1994-08-25	Bilderzeugungsgerät.
DE3887937D1 (de)	1994-03-31	Inspektionsvorrichtung.
DE3854559D1 (de)	1995-11-16	Bilderzeugungsgerät.
DE3780012D1 (de)	1992-07-30	Diagnostisches geraet.
DE3750322D1 (de)	1994-09-08	Bilderzeugungsgerät.
DE3751239D1 (de)	1995-05-18	Bilderzeugungsgerät.
DE3851722D1 (de)	1994-11-10	Bilderzeugungsgerät.
DE3851278D1 (de)	1994-10-06	Bilderzeugungsgerät.
DE3887825D1 (de)	1994-03-24	Bilderzeugungsgerät.
DE3851795D1 (de)	1994-11-17	Bilderzeugungsgerät.
DE3885254D1 (de)	1993-12-02	Bilderzeugungsgerät.
DE3764362D1 (de)	1990-09-20	Detektorvorrichtung.
DE3767818D1 (de)	1991-03-07	Analysegeraet.
DE3851671D1 (de)	1994-11-03	Bilderzeugungsgerät.
DE58904738D1 (de)	1993-07-22	Roentgendiagnostikvorrichtung.
DE3851034D1 (de)	1994-09-15	Bilderzeugungsgerät.
DE3851670D1 (de)	1994-11-03	Bilderzeugungsgerät.
DE3865034D1 (de)	1991-10-31	Ultraschall-untersuchungsgeraet.
DE3883923D1 (de)	1993-10-14	Bilderzeugungsgerät.
DE3884668D1 (de)	1993-11-11	Bilderzeugungsgerät.

Legal Events

Date	Code	Title	Description
1993-04-15	8364	No opposition during term of opposition
1994-10-06	8339	Ceased/non-payment of the annual fee